Search Results for Reliability (Engineering) - Narrowed by: Electronics.
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability$002b$002528Engineering$002529$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026ps$003d300?
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Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:489410
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Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:192824
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Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:185203
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Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:332682
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Author McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332682.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:172571
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Author McPherson, J.W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability prediction for microelectronics
ent://SD_ILS/0/SD_ILS:598968
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Author Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.<br/>Preferred Shelf Number TK7874<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
ent://SD_ILS/0/SD_ILS:168486
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Author Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Measurement Uncertainty An Approach via the Mathematical Theory of Evidence
ent://SD_ILS/0/SD_ILS:166341
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Author Salicone, Simona. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-46328-5">http://dx.doi.org/10.1007/978-0-387-46328-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electromechanical coupling theory, methodology and applications for high-performance microwave equipment
ent://SD_ILS/0/SD_ILS:597980
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Author Duan, Baoyan, author. Zhang, Shuxin (Professor of electromechanical engineering), author.<br/>Preferred Shelf Number TK7876 .D83 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advanced techniques for maintenance modeling and reliability analysis of repairable systems
ent://SD_ILS/0/SD_ILS:598651
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Author Sharma, Garima, author. Rai, Rajiv Nandan, author.<br/>Preferred Shelf Number TA169 .S53 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electrical connectors : design, manufacture, test, and selection
ent://SD_ILS/0/SD_ILS:596172
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Author Pecht, Michael, editor. Kyeong, San, editor.<br/>Preferred Shelf Number TK3521<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Systems engineering in the fourth industrial revolution : big data, novel technologies, and modern systems engineering
ent://SD_ILS/0/SD_ILS:595527
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Author Kenett, Ron, editor. Swarz, Robert S., editor. Zonnenshain, Avigdor, editor.<br/>Preferred Shelf Number TA168 .S8727 2020<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Repairable systems reliability analysis : a comprehensive framework
ent://SD_ILS/0/SD_ILS:596328
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Author Rai, Rajiv Nandan, author. Chaturvedi, Sanjay K., author. Bolia, Nomesh, author.<br/>Preferred Shelf Number QA402 .R35 2020<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Real-time embedded systems
ent://SD_ILS/0/SD_ILS:593770
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Author Wang, Jiacun, 1963- author.<br/>Preferred Shelf Number TK7895 .E42<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
ent://SD_ILS/0/SD_ILS:593728
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Author Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number TA169.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Lead Free Solder Mechanics and Reliability
ent://SD_ILS/0/SD_ILS:173692
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Author Pang, John Hock Lye. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor Power Devices Physics, Characteristics, Reliability
ent://SD_ILS/0/SD_ILS:191586
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Author Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
A Guide to Lead-free Solders Physical Metallurgy and Reliability
ent://SD_ILS/0/SD_ILS:175373
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Author Evans, John W. author. Engelmaier, Werner. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>