Search Results for Reliability (Engineering) - Narrowed by: Electronics. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability$002b$002528Engineering$002529$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026te$003dILS$0026ps$003d300?dt=list 2024-12-23T01:05:16Z Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:489410 2024-12-23T01:05:16Z 2024-12-23T01:05:16Z Author&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:192824 2024-12-23T01:05:16Z 2024-12-23T01:05:16Z Author&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:185203 2024-12-23T01:05:16Z 2024-12-23T01:05:16Z Author&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:332682 2024-12-23T01:05:16Z 2024-12-23T01:05:16Z Author&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332682.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:172571 2024-12-23T01:05:16Z 2024-12-23T01:05:16Z Author&#160;McPherson, J.W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections ent://SD_ILS/0/SD_ILS:168486 2024-12-23T01:05:16Z 2024-12-23T01:05:16Z Author&#160;Tan, Cher Ming. author.&#160;Li, Wei. author.&#160;Gan, Zhenghao. author.&#160;Hou, Yuejin. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Measurement Uncertainty An Approach via the Mathematical Theory of Evidence ent://SD_ILS/0/SD_ILS:166341 2024-12-23T01:05:16Z 2024-12-23T01:05:16Z Author&#160;Salicone, Simona. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-46328-5">http://dx.doi.org/10.1007/978-0-387-46328-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lead Free Solder Mechanics and Reliability ent://SD_ILS/0/SD_ILS:173692 2024-12-23T01:05:16Z 2024-12-23T01:05:16Z Author&#160;Pang, John Hock Lye. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor Power Devices Physics, Characteristics, Reliability ent://SD_ILS/0/SD_ILS:191586 2024-12-23T01:05:16Z 2024-12-23T01:05:16Z Author&#160;Lutz, Josef. author.&#160;Schlangenotto, Heinrich. author.&#160;Scheuermann, Uwe. author.&#160;De Doncker, Rik. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A Guide to Lead-free Solders Physical Metallurgy and Reliability ent://SD_ILS/0/SD_ILS:175373 2024-12-23T01:05:16Z 2024-12-23T01:05:16Z Author&#160;Evans, John W. author.&#160;Engelmaier, Werner. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>