Search Results for Reliability (Engineering) -- Statistical methods. - Narrowed by: Electronic Library
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Semi-Markov processes : applications in system reliability and maintenance
ent://SD_ILS/0/SD_ILS:355517
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Author Grabski, Franciszek, author.<br/>Preferred Shelf Number ONLINE(355517.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128005187">http://www.sciencedirect.com/science/book/9780128005187</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Modern industrial statistics : with applications in R, MINITAB and JMP
ent://SD_ILS/0/SD_ILS:341751
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Author Kenett, Ron. Amberti, Daniele, contributor. Zacks, Shelemyahu, 1932-<br/>Preferred Shelf Number ONLINE(341751.1)<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118763667">http://dx.doi.org/10.1002/9781118763667</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications
ent://SD_ILS/0/SD_ILS:306566
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Author Wu, Bin, author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Flowgraph models for multistate time-to-event data
ent://SD_ILS/0/SD_ILS:301633
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Author Huzurbazar, Aparna V., 1966- John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471686565">http://dx.doi.org/10.1002/0471686565</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Statistical reliability engineering
ent://SD_ILS/0/SD_ILS:295099
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Author Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Pavlov, I. V. Ushakov, I. A. (Igorʹ Alekseevich) Chakravarty, Sumantra. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Guidelines for improving plant reliability through data collection and analysis
ent://SD_ILS/0/SD_ILS:300022
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Author American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
System reliability theory models and statistical methods
ent://SD_ILS/0/SD_ILS:295270
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Author Høyland, Arnljot, 1924- Rausand, Marvin.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316900">http://dx.doi.org/10.1002/9780470316900</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html">http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/30072858.html">http://catalog.hathitrust.org/api/volumes/oclc/30072858.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability analysis and prediction a methodology oriented treatment
ent://SD_ILS/0/SD_ILS:255244
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Author Misra, Krishna B., 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444896063">http://www.sciencedirect.com/science/book/9780444896063</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Accelerated testing statistical models, test plans and data analyses
ent://SD_ILS/0/SD_ILS:295259
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Author Nelson, Wayne, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a>
HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>