Search Results for Reliability (Engineering) -- Statistical methods. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability$002b$002528Engineering$002529$002b--$002bStatistical$002bmethods.$0026te$003dILS$0026ps$003d300? 2024-11-04T19:25:53Z Semi-Markov processes : applications in system reliability and maintenance ent://SD_ILS/0/SD_ILS:355517 2024-11-04T19:25:53Z 2024-11-04T19:25:53Z Author&#160;Grabski, Franciszek, author.<br/>Preferred Shelf Number&#160;ONLINE(355517.1)<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128005187">http://www.sciencedirect.com/science/book/9780128005187</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modern industrial statistics : with applications in R, MINITAB and JMP ent://SD_ILS/0/SD_ILS:341751 2024-11-04T19:25:53Z 2024-11-04T19:25:53Z Author&#160;Kenett, Ron.&#160;Amberti, Daniele, contributor.&#160;Zacks, Shelemyahu, 1932-<br/>Preferred Shelf Number&#160;ONLINE(341751.1)<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118763667">http://dx.doi.org/10.1002/9781118763667</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications ent://SD_ILS/0/SD_ILS:306566 2024-11-04T19:25:53Z 2024-11-04T19:25:53Z Author&#160;Wu, Bin, author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applications of statistics and probability in civil engineering ent://SD_ILS/0/SD_ILS:290066 2024-11-04T19:25:53Z 2024-11-04T19:25:53Z Author&#160;International Conference on Applications of Statistics and Probability in Civil Engineering (2011 : Z&iquest;rich, Switzerland)&#160;Faber, M. H. (Michael Havbro)&#160;Kh&#818;ler, Jochen, 1972-&#160;Nishijima, Kazuyoshi.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203144794">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Flowgraph models for multistate time-to-event data ent://SD_ILS/0/SD_ILS:301633 2024-11-04T19:25:53Z 2024-11-04T19:25:53Z Author&#160;Huzurbazar, Aparna V., 1966-&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471686565">http://dx.doi.org/10.1002/0471686565</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical reliability engineering ent://SD_ILS/0/SD_ILS:295099 2024-11-04T19:25:53Z 2024-11-04T19:25:53Z Author&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Pavlov, I. V.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Chakravarty, Sumantra.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability modelling : A statistical approach ent://SD_ILS/0/SD_ILS:78139 2024-11-04T19:25:53Z 2024-11-04T19:25:53Z Author&#160;Wolstenholme, Linda C.<br/>Preferred Shelf Number&#160;TA 169 W65 1999<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Guidelines for improving plant reliability through data collection and analysis ent://SD_ILS/0/SD_ILS:300022 2024-11-04T19:25:53Z 2024-11-04T19:25:53Z Author&#160;American Institute of Chemical Engineers. Center for Chemical Process Safety.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical methods for reliability data ent://SD_ILS/0/SD_ILS:85080 2024-11-04T19:25:53Z 2024-11-04T19:25:53Z Author&#160;Meeker, William Q.&#160;Escobar, Luis A., ort. yaz.<br/>Preferred Shelf Number&#160;TS 173 M44 1998<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> System reliability theory models and statistical methods ent://SD_ILS/0/SD_ILS:295270 2024-11-04T19:25:53Z 2024-11-04T19:25:53Z Author&#160;H&oslash;yland, Arnljot, 1924-&#160;Rausand, Marvin.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316900">http://dx.doi.org/10.1002/9780470316900</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html">http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/30072858.html">http://catalog.hathitrust.org/api/volumes/oclc/30072858.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis and prediction a methodology oriented treatment ent://SD_ILS/0/SD_ILS:255244 2024-11-04T19:25:53Z 2024-11-04T19:25:53Z Author&#160;Misra, Krishna B., 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444896063">http://www.sciencedirect.com/science/book/9780444896063</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated testing statistical models, test plans and data analyses ent://SD_ILS/0/SD_ILS:295259 2024-11-04T19:25:53Z 2024-11-04T19:25:53Z Author&#160;Nelson, Wayne, 1936-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a> HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>