Search Results for Reliability (Engineering). - Narrowed by: 2012SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability$002b$002528Engineering$002529.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092012$0025092012$0026ic$003dtrue$0026ps$003d300?2024-10-28T04:15:04ZTelecommunications system reliability engineering, theory, and practiceent://SD_ILS/0/SD_ILS:2493972024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Ayers, Mark L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Atomic Information Technology Safety and Economy of Nuclear Power Plantsent://SD_ILS/0/SD_ILS:1735232024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Woo, Taeho. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4030-6">http://dx.doi.org/10.1007/978-1-4471-4030-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Thermal Power Plant Performance Analysisent://SD_ILS/0/SD_ILS:1734162024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor de Souza, Gilberto Francisco Martha. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2309-5">http://dx.doi.org/10.1007/978-1-4471-2309-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Stochastic Systems Uncertainty Quantification and Propagationent://SD_ILS/0/SD_ILS:1734222024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Grigoriu, Mircea. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2327-9">http://dx.doi.org/10.1007/978-1-4471-2327-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Effective FMEAs achieving safe, reliable, and economical products and processes using failure mode and effects analysisent://SD_ILS/0/SD_ILS:2993772024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Carlson, Carl (Carl Seymour)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118312575">http://dx.doi.org/10.1002/9781118312575</a>
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ebrary <a href="http://site.ebrary.com/id/10558143">http://site.ebrary.com/id/10558143</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Recent Advances in System Reliability Signatures, Multi-state Systems and Statistical Inferenceent://SD_ILS/0/SD_ILS:1733902024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2207-4">http://dx.doi.org/10.1007/978-1-4471-2207-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Maintenance Management in Network Utilities Framework and Practical Implementationent://SD_ILS/0/SD_ILS:1734752024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Gómez Fernández, Juan F. author. Crespo Márquez, Adolfo. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2757-4">http://dx.doi.org/10.1007/978-1-4471-2757-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Risk and Interdependencies in Critical Infrastructures A Guideline for Analysisent://SD_ILS/0/SD_ILS:1735602024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Hokstad, Per. editor. Utne, Ingrid B. editor. Vatn, Jørn. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4661-2">http://dx.doi.org/10.1007/978-1-4471-4661-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:2493822024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Raheja, Dev. Gullo, Louis J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Infrastructure health in civil engineeringent://SD_ILS/0/SD_ILS:2893482024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Ettouney, Mohammed. Alampalli, Sreenivas.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420003758">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Machine component designent://SD_ILS/0/SD_ILS:2701362024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Juvinall, Robert C. Marshek, Kurt M. Juvinall, Robert C. Fundamentals of machine component design.<br/>Preferred Shelf Number TJ230 J88 2012<br/>Format: Books<br/>Availability Beytepe Library~2<br/>Infrastructure health in civil engineeringent://SD_ILS/0/SD_ILS:2889822024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Ettouney, Mohammed. Alampalli, Sreenivas.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439866542">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Rail human factors around the world impacts on and of people for successful rail operationsent://SD_ILS/0/SD_ILS:2891492024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Wilson, John R.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203079218">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probabilistic reliability modelsent://SD_ILS/0/SD_ILS:2995232024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Ushakov, I. A. (Igorʹ Alekseevich)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a>
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Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Analyses for Durability and System Design Lifetime A Multidisciplinary Approachent://SD_ILS/0/SD_ILS:2371582024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Saleh, Joseph H..<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511546136">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductors integrated circuit design for manufacturabilityent://SD_ILS/0/SD_ILS:2851202024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Balasinki, Artur.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439817155">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lead Free Solder Mechanics and Reliabilityent://SD_ILS/0/SD_ILS:1736922024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Pang, John Hock Lye. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Applied reliabilityent://SD_ILS/0/SD_ILS:3649072024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Tobias, Paul A. Trindade, David C.<br/>Preferred Shelf Number TA169 T63 2012<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Reliability and maintenance networks and systemsent://SD_ILS/0/SD_ILS:2861482024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Beichelt, Frank, 1942- Tittmann, Peter.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439826362">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Accelerated reliability and durability testing technologyent://SD_ILS/0/SD_ILS:2978272024-10-28T04:15:04Z2024-10-28T04:15:04ZAuthor Klyatis, Lev M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a>
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