Search Results for Reliability. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026ic$003dtrue$0026ps$003d300? 2024-11-05T22:32:57Z Reliability ent://SD_ILS/0/SD_ILS:233427 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Meyer, J. Patrick.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural reliability ent://SD_ILS/0/SD_ILS:297978 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Lemaire, Maurice.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability engineering ent://SD_ILS/0/SD_ILS:341870 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Kapur, Kailash C., 1941- author.&#160;Pecht, Michael, author.<br/>Preferred Shelf Number&#160;ONLINE(341870.1)<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a> MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability ent://SD_ILS/0/SD_ILS:364907 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Tobias, Paul A.&#160;Trindade, David C.<br/>Preferred Shelf Number&#160;TA169 T63 2012<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> MEMS Reliability ent://SD_ILS/0/SD_ILS:172486 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Hartzell, Allyson L. author.&#160;da Silva, Mark G. author.&#160;Shea, Herbert R. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bayesian Reliability ent://SD_ILS/0/SD_ILS:167542 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Hamada, Michael S. author.&#160;Wilson, Alyson G. author.&#160;Reese, C. Shane. author.&#160;Martz, Harry F. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability fundamentals ent://SD_ILS/0/SD_ILS:255215 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;C&#259;tuneanu, Vasile M.&#160;Mihalache, Adrian.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ensuring software reliability ent://SD_ILS/0/SD_ILS:289793 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Neufelder, Ann Marie, 1960-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439832752">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System Software Reliability ent://SD_ILS/0/SD_ILS:175367 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:249382 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Raheja, Dev.&#160;Gullo, Louis J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical system reliability ent://SD_ILS/0/SD_ILS:153146 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Bauer, Eric.&#160;Zhang, Xuemei.&#160;Kimber, Douglas A.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of MEMS ent://SD_ILS/0/SD_ILS:303632 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Tsuchiya, Toshiyuki.&#160;Tabata, Osamu, 1956-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:285886 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Crow, Dana.&#160;Feinberg, Alec.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420040845">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical reliability engineering ent://SD_ILS/0/SD_ILS:305563 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;O'Connor, Patrick P.&#160;Kleyner, Andre.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Improving machinery reliability ent://SD_ILS/0/SD_ILS:153828 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Bloch, Heinz P., 1933-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability in pragmatics ent://SD_ILS/0/SD_ILS:357581 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;McCready, Eric (Eric S.), author.<br/>Preferred Shelf Number&#160;P99.4.P72 M445 2015<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Probabilistic reliability models ent://SD_ILS/0/SD_ILS:299523 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Ushakov, I. A. (Igor&#697; Alekseevich)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical reliability engineering ent://SD_ILS/0/SD_ILS:295099 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Pavlov, I. V.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Chakravarty, Sumantra.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic reliability engineering ent://SD_ILS/0/SD_ILS:295101 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Falk, James.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer systems reliability. ent://SD_ILS/0/SD_ILS:58893 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Preferred Shelf Number&#160;TK 7885 C65 1974 V.20<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Reliability and Optimal Maintenance ent://SD_ILS/0/SD_ILS:175380 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Wang, Hongzhou. author.&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintenance Theory of Reliability ent://SD_ILS/0/SD_ILS:175323 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Safety Engineering ent://SD_ILS/0/SD_ILS:176193 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Verma, Ajit Kumar. author.&#160;Srividya, Ajit. author.&#160;Karanki, Durga Rao. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> IEEE Transactions on reliability. ent://SD_ILS/0/SD_ILS:226884 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Preferred Shelf Number&#160;ALFABET&#304;K V.12 1963<br/>Format:&#160;Continuing Resources&#160;Other<br/>Availability&#160;Beytepe Library~30&#160;~0<br/> Engineering design reliability handbook ent://SD_ILS/0/SD_ILS:287313 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of large systems ent://SD_ILS/0/SD_ILS:254513 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Ko&#322;owrocki, Krzysztof.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power-system reliability calculations ent://SD_ILS/0/SD_ILS:220175 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Billinton, Roy.&#160;Ringlee, Robert J., joint author.&#160;Wood, Allen J., joint author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability theory and practice ent://SD_ILS/0/SD_ILS:47596 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Bazovsky, Igor.<br/>Preferred Shelf Number&#160;TA 168 B33 1961<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Stochastic Models in Reliability ent://SD_ILS/0/SD_ILS:332363 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Aven, Terje. author.&#160;Jensen, Uwe. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332363.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Network Reliability and Resilience ent://SD_ILS/0/SD_ILS:195005 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Gertsbakh, Ilya. author.&#160;Shpungin, Yoseph. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Life cycle reliability engineering ent://SD_ILS/0/SD_ILS:296926 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Yang, Guangbin, 1964-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and validity assessment ent://SD_ILS/0/SD_ILS:7092 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Carmines, Edward G.<br/>Preferred Shelf Number&#160;H 61 C26 1979<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Mathematical theory of reliability ent://SD_ILS/0/SD_ILS:35404 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Barlow, Richard E.&#160;Proschan Frank. , ort. yaz.<br/>Preferred Shelf Number&#160;QA 273 B3 1965<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Reinforced concrete structural reliability ent://SD_ILS/0/SD_ILS:291660 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;El-Reedy, Mohamed Abdallah.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439874172">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quantile-Based Reliability Analysis ent://SD_ILS/0/SD_ILS:330556 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Nair, N. Unnikrishnan. author.&#160;Sankaran, P.G. author.&#160;Balakrishnan, N. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(330556.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronic thin-film reliability ent://SD_ILS/0/SD_ILS:278156 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Tu, K. N. (King-Ning), 1937-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:285664 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Brown, Richard E., 1969-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780849375682">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability-based Structural Design ent://SD_ILS/0/SD_ILS:175421 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Choi, Seung-Kyum. author.&#160;Canfield, Robert A. author.&#160;Grandhi, Ramana V. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Six Sigma ent://SD_ILS/0/SD_ILS:165709 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Kumar, U Dinesh. author.&#160;Crocker, John. author.&#160;Chitra, T. author.&#160;Saranga, Haritha. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:287445 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Brown, Richard E., 1969-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780824744281">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lubrication and reliability handbook ent://SD_ILS/0/SD_ILS:256333 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Neale, M. J. (Michael John)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fatigue design and reliability ent://SD_ILS/0/SD_ILS:254466 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)&#160;Marquis, G. (Gary)&#160;Solin, J.&#160;European Structural Integrity Society.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of reliability engineering ent://SD_ILS/0/SD_ILS:295100 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Ushakov, I. A. 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href="http://dx.doi.org/10.1007/978-1-4614-6163-0">http://dx.doi.org/10.1007/978-1-4614-6163-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electricity infrastructure reliability and vulnerabilities ent://SD_ILS/0/SD_ILS:281073 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Guerritore, Walter B.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer system reliability safety and usability ent://SD_ILS/0/SD_ILS:285390 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Dhillon, B. 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A. (Tom A.), 1966-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420036480">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System reliability : concepts and applications ent://SD_ILS/0/SD_ILS:392825 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Klaassen, Klaas B., 1941-&#160;Peppen, Jack C. L. van.<br/>Preferred Shelf Number&#160;QA76.5 K53 2006<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:287285 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203006139">Distributed by publisher. 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P.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality and reliability in analytical chemistry ent://SD_ILS/0/SD_ILS:285938 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Aboul-Enein, Hassan Y.&#160;Stefan, Raluca-Ioana.&#160;Baiulescu, George.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420038576">Distributed by publisher. 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S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420042238">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design reliability fundamentals and applications ent://SD_ILS/0/SD_ILS:284992 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420050141">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability modelling : A statistical approach ent://SD_ILS/0/SD_ILS:78139 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Wolstenholme, Linda C.<br/>Preferred Shelf Number&#160;TA 169 W65 1999<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Statistical methods for reliability data ent://SD_ILS/0/SD_ILS:85080 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Meeker, William Q.&#160;Escobar, Luis A., ort. yaz.<br/>Preferred Shelf Number&#160;TS 173 M44 1998<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> An elementary guide to reliability ent://SD_ILS/0/SD_ILS:254325 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Dummer, G. W. A. (Geoffrey William Arnold)&#160;Tooley, Michael H.&#160;Winton, R. C.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor memories technology, testing, and reliability ent://SD_ILS/0/SD_ILS:249739 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Sharma, Ashok K.&#160;IEEE Solid-State Circuits Council.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probability, statistics, reliability for engineers ent://SD_ILS/0/SD_ILS:75189 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Ayyub, Bilal M.&#160;McCuen, Richard H., 1941-<br/>Preferred Shelf Number&#160;TA 330 A99 1997<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> New trends in system reliability evaluation ent://SD_ILS/0/SD_ILS:255243 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Misra, Krishna B., 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> An elementary guide to reliability ent://SD_ILS/0/SD_ILS:48244 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Dummer, Geoffrey William Arnold.&#160;Winton, R. C., ort. yaz.<br/>Preferred Shelf Number&#160;TS 173 D85 1990<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> A Primer of reliability theory ent://SD_ILS/0/SD_ILS:47610 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Grosh, Doris Lloyd.<br/>Preferred Shelf Number&#160;TA 169 G76 1989<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Reliability in the acquisitions process ent://SD_ILS/0/SD_ILS:47612 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;DePriest, D. J., ed. by&#160;Launer, R. L., ed. by<br/>Preferred Shelf Number&#160;TA 169 R44 1983<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Software engineering : design, reliability and management ent://SD_ILS/0/SD_ILS:32561 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Shooman, Martin L.<br/>Preferred Shelf Number&#160;QA 76.9.S88 S56 1983<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Life testing and reliability estimation ent://SD_ILS/0/SD_ILS:35481 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Sinha, S. K.&#160;Kale, B. K., ort. yaz.<br/>Preferred Shelf Number&#160;QA 273 S64 1980<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Durability and reliability in engineering desing ent://SD_ILS/0/SD_ILS:48245 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Kivenson, Gilbert.<br/>Preferred Shelf Number&#160;TS 173 K57 1971<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Mathematical methods of reliability theory ent://SD_ILS/0/SD_ILS:47645 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Gnedenko, Boris Vladimirovich, 1912-&#160;Belyayev, Yu. K., ort. yaz.&#160;Solovyev, A. D., ort. yaz.<br/>Preferred Shelf Number&#160;TA 340 G5513 1969<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~2<br/> Stochastic Processes with Applications to Reliability Theory ent://SD_ILS/0/SD_ILS:168475 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Failure Rate Modelling for Reliability and Risk ent://SD_ILS/0/SD_ILS:175868 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Finkelstein, Maxim. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Shock and Damage Models in Reliability Theory ent://SD_ILS/0/SD_ILS:175420 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Human Reliability and Error in Transportation Systems ent://SD_ILS/0/SD_ILS:175578 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Dhillon, B. S. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Human reliability and error in transportation systems ent://SD_ILS/0/SD_ILS:271334 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Dhillon, B. S.<br/>Preferred Shelf Number&#160;TA1145 D45 2007<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> IEEE Transactions on device and materials reliability. ent://SD_ILS/0/SD_ILS:226837 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Preferred Shelf Number&#160;ALFABET&#304;K V.3 2003<br/>Format:&#160;Continuing Resources&#160;Other<br/>Availability&#160;Beytepe Library~1&#160;~0<br/> Advances in safety, reliability and risk management ent://SD_ILS/0/SD_ILS:342790 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;European Safety and Reliability Conference (2011 : Troyes, France)&#160;Berenguer, Christophe.&#160;Grall, Antoine.&#160;Soares, C. Guedes.<br/>Preferred Shelf Number&#160;ONLINE(342790.1)<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203135105">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety, reliability and risks associated with water, oil and gas pipelines : [proceedings of the NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines, Alexandria, Egypt, 4-8 February 2007] ent://SD_ILS/0/SD_ILS:113617 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines (2007 : Alexandria, Egypt)&#160;Elwany, Mohamed Hamdy.&#160;Pluvinage, Guy.<br/>Preferred Shelf Number&#160;TJ930 .N386 2008<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Safety-Critical Electrical Drives Topologies, Reliability, Performance ent://SD_ILS/0/SD_ILS:401112 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Bolvashenkov, Igor. author.&#160;Herzog, Hans-Georg. author.&#160;Frenkel, Ilia. author.&#160;Khvatskin, Lev. author.&#160;Lisnianski, Anatoly. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-89969-5">https://doi.org/10.1007/978-3-319-89969-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solid State Lighting Reliability Components to Systems ent://SD_ILS/0/SD_ILS:331314 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;van Driel, W.D. editor.&#160;Fan, X.J. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331314.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Telecommunications system reliability engineering, theory, and practice ent://SD_ILS/0/SD_ILS:249397 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Ayers, Mark L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Process plant equipment operation, control, and reliability ent://SD_ILS/0/SD_ILS:299085 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Holloway, Michael D., 1963-&#160;Nwaoha, Chikezie, 1984-&#160;Onyewuenyi, Oliver A., 1952-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118162569">http://onlinelibrary.wiley.com/book/10.1002/9781118162569</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118162569">http://dx.doi.org/10.1002/9781118162569</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lead-free solders materials reliability for electronics ent://SD_ILS/0/SD_ILS:305591 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Subramaniam, K. N., Ph. D.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119966203">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Offshore Wind Turbines Reliability, availability and maintenance ent://SD_ILS/0/SD_ILS:247956 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Tavner, Peter<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBRN013E">http://dx.doi.org/10.1049/PBRN013E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Compressors how to achieve high reliability &amp; availability ent://SD_ILS/0/SD_ILS:293579 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Bloch, Heinz P., 1933-&#160;Geitner, Fred K.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/compressors-how-to-achieve-high-reliability-availability">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of Microtechnology Interconnects, Devices and Systems ent://SD_ILS/0/SD_ILS:172420 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Liu, Johan. author.&#160;Salmela, Olli. author.&#160;Sarkka, Jussi. author.&#160;Morris, James E. author.&#160;Tegehall, Per-Erik. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Hydrosystems engineering reliability assessment and risk analysis ent://SD_ILS/0/SD_ILS:293215 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Tung, Yeou-Koung.&#160;Yen, Ben Chie, 1935-&#160;Melching, Charles S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability centered maintenance (RCM) implementation made simple ent://SD_ILS/0/SD_ILS:293571 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Bloom, Neil.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/reliability-centered-maintenance-rcm">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolution ent://SD_ILS/0/SD_ILS:191769 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Levi, Paul. author.&#160;Kernbach, Serge. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-11692-6">http://dx.doi.org/10.1007/978-3-642-11692-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solder Joint Reliability Prediction for Multiple Environments ent://SD_ILS/0/SD_ILS:167673 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Perkins, Andrew E. author.&#160;Sitaraman, Suresh K. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability wearout mechanisms in advanced CMOS technologies ent://SD_ILS/0/SD_ILS:249574 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> VoIP handbook applications, technologies, reliability, and security ent://SD_ILS/0/SD_ILS:289675 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Ahson, Syed.&#160;Ilyas, Mohammad, 1953-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420070217">Distributed by publisher. 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Proceedings ent://SD_ILS/0/SD_ILS:334958 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Cuzzocrea, Alfredo. editor.&#160;Kittl, Christian. editor.&#160;Simos, Dimitris E. editor.&#160;Weippl, Edgar. editor.&#160;Xu, Lida. editor.<br/>Preferred Shelf Number&#160;ONLINE(334958.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, Availability and Serviceability of Networks-on-Chip ent://SD_ILS/0/SD_ILS:173779 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Cota, &Eacute;rika. author.&#160;Morais Amory, Alexandre. author.&#160;Soares Lubaszewski, Marcelo. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0791-1">http://dx.doi.org/10.1007/978-1-4614-0791-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliability ent://SD_ILS/0/SD_ILS:173816 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Levinson, David M. editor.&#160;Liu, Henry X. editor.&#160;Bell, Michael. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power Electronic Packaging Design, Assembly Process, Reliability and Modeling ent://SD_ILS/0/SD_ILS:173841 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Liu, Yong. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papers ent://SD_ILS/0/SD_ILS:196648 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Zhang, Xi. editor.&#160;Qiao, Daji. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-29222-4">http://dx.doi.org/10.1007/978-3-642-29222-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multidisciplinary Research and Practice for Information Systems IFIP WG 8.4, 8.9/TC 5 International Cross-Domain Conference and Workshop on Availability, Reliability, and Security, CD-ARES 2012, Prague, Czech Republic, August 20-24, 2012. 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Proceedings ent://SD_ILS/0/SD_ILS:195302 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Tjoa, A Min. editor.&#160;Quirchmayr, Gerald. editor.&#160;You, Ilsun. editor.&#160;Xu, Lida. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-23300-5">http://dx.doi.org/10.1007/978-3-642-23300-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probability, statistics, and reliability for engineers and scientists ent://SD_ILS/0/SD_ILS:312915 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Ayyub, Bilal M., author.&#160;McCuen, Richard H., 1941-<br/>Preferred Shelf Number&#160;ONLINE(312915.1)<br/>Electronic Access&#160;Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpPSRESE01">http://app.knovel.com/web/toc.v/cid:kpPSRESE01</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability in Scientific Research Improving the Dependability of Measurements, Calculations, Equipment, and Software ent://SD_ILS/0/SD_ILS:237354 2024-11-05T22:32:57Z 2024-11-05T22:32:57Z Author&#160;Walker, I. 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