Search Results for Reliability.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026ic$003dtrue$0026ps$003d300?2024-11-05T22:32:57ZReliabilityent://SD_ILS/0/SD_ILS:2334272024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Meyer, J. Patrick.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Structural reliabilityent://SD_ILS/0/SD_ILS:2979782024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Lemaire, Maurice. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:3418702024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Kapur, Kailash C., 1941- author. Pecht, Michael, author.<br/>Preferred Shelf Number ONLINE(341870.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a>
MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a>
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MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:2858862024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Crow, Dana. Feinberg, Alec.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420040845">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical reliability engineeringent://SD_ILS/0/SD_ILS:3055632024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor O'Connor, Patrick P. Kleyner, Andre. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Improving machinery reliabilityent://SD_ILS/0/SD_ILS:1538282024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Bloch, Heinz P., 1933-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability in pragmaticsent://SD_ILS/0/SD_ILS:3575812024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor McCready, Eric (Eric S.), author.<br/>Preferred Shelf Number P99.4.P72 M445 2015<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Probabilistic reliability modelsent://SD_ILS/0/SD_ILS:2995232024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Ushakov, I. A. (Igorʹ Alekseevich)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a>
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Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical reliability engineeringent://SD_ILS/0/SD_ILS:2950992024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Pavlov, I. V. Ushakov, I. A. (Igorʹ Alekseevich) Chakravarty, Sumantra. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probabilistic reliability engineeringent://SD_ILS/0/SD_ILS:2951012024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Ushakov, I. A. (Igorʹ Alekseevich) Falk, James. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer systems reliability.ent://SD_ILS/0/SD_ILS:588932024-11-05T22:32:57Z2024-11-05T22:32:57ZPreferred Shelf Number TK 7885 C65 1974 V.20<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Reliability and Optimal Maintenanceent://SD_ILS/0/SD_ILS:1753802024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Wang, Hongzhou. author. Pham, Hoang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Maintenance Theory of Reliabilityent://SD_ILS/0/SD_ILS:1753232024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Safety Engineeringent://SD_ILS/0/SD_ILS:1761932024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Verma, Ajit Kumar. author. Srividya, Ajit. author. Karanki, Durga Rao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>IEEE Transactions on reliability.ent://SD_ILS/0/SD_ILS:2268842024-11-05T22:32:57Z2024-11-05T22:32:57ZPreferred Shelf Number ALFABETİK V.12 1963<br/>Format: Continuing Resources Other<br/>Availability Beytepe Library~30 ~0<br/>Engineering design reliability handbookent://SD_ILS/0/SD_ILS:2873132024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. 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(King-Ning), 1937-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electric power distribution reliabilityent://SD_ILS/0/SD_ILS:2856642024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Brown, Richard E., 1969-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780849375682">Distributed by publisher. 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Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:2563332024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Neale, M. J. (Michael John)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fatigue design and reliabilityent://SD_ILS/0/SD_ILS:2544662024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland) Marquis, G. 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HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Ceramics processing, reliability, tribology and wear.ent://SD_ILS/0/SD_ILS:3005922024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Müller, G. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/3527607293">http://dx.doi.org/10.1002/3527607293</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Medical device reliability and associated areasent://SD_ILS/0/SD_ILS:2859592024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420042238">Distributed by publisher. 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C., ort. yaz.<br/>Preferred Shelf Number TS 173 D85 1990<br/>Format: Books<br/>Availability Beytepe Library~1<br/>A Primer of reliability theoryent://SD_ILS/0/SD_ILS:476102024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Grosh, Doris Lloyd.<br/>Preferred Shelf Number TA 169 G76 1989<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Reliability in the acquisitions processent://SD_ILS/0/SD_ILS:476122024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor DePriest, D. J., ed. by Launer, R. L., ed. by<br/>Preferred Shelf Number TA 169 R44 1983<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Software engineering : design, reliability and managementent://SD_ILS/0/SD_ILS:325612024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Shooman, Martin L.<br/>Preferred Shelf Number QA 76.9.S88 S56 1983<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Life testing and reliability estimationent://SD_ILS/0/SD_ILS:354812024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Sinha, S. K. Kale, B. 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S.<br/>Preferred Shelf Number TA1145 D45 2007<br/>Format: Books<br/>Availability Beytepe Library~1<br/>IEEE Transactions on device and materials reliability.ent://SD_ILS/0/SD_ILS:2268372024-11-05T22:32:57Z2024-11-05T22:32:57ZPreferred Shelf Number ALFABETİK V.3 2003<br/>Format: Continuing Resources Other<br/>Availability Beytepe Library~1 ~0<br/>Advances in safety, reliability and risk managementent://SD_ILS/0/SD_ILS:3427902024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor European Safety and Reliability Conference (2011 : Troyes, France) Berenguer, Christophe. Grall, Antoine. Soares, C. Guedes.<br/>Preferred Shelf Number ONLINE(342790.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203135105">Distributed by publisher. 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John Wiley <a href="http://dx.doi.org/10.1002/9781118162569">http://dx.doi.org/10.1002/9781118162569</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lead-free solders materials reliability for electronicsent://SD_ILS/0/SD_ILS:3055912024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Subramaniam, K. N., Ph. D. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119966203">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Offshore Wind Turbines Reliability, availability and maintenanceent://SD_ILS/0/SD_ILS:2479562024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Tavner, Peter<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBRN013E">http://dx.doi.org/10.1049/PBRN013E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Compressors how to achieve high reliability & availabilityent://SD_ILS/0/SD_ILS:2935792024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Bloch, Heinz P., 1933- Geitner, Fred K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/compressors-how-to-achieve-high-reliability-availability">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of Microtechnology Interconnects, Devices and Systemsent://SD_ILS/0/SD_ILS:1724202024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Liu, Johan. author. Salmela, Olli. author. Sarkka, Jussi. author. Morris, James E. author. Tegehall, Per-Erik. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Hydrosystems engineering reliability assessment and risk analysisent://SD_ILS/0/SD_ILS:2932152024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Tung, Yeou-Koung. Yen, Ben Chie, 1935- Melching, Charles S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability centered maintenance (RCM) implementation made simpleent://SD_ILS/0/SD_ILS:2935712024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Bloom, Neil.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/reliability-centered-maintenance-rcm">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolutionent://SD_ILS/0/SD_ILS:1917692024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Levi, Paul. author. Kernbach, Serge. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-11692-6">http://dx.doi.org/10.1007/978-3-642-11692-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Solder Joint Reliability Prediction for Multiple Environmentsent://SD_ILS/0/SD_ILS:1676732024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Perkins, Andrew E. author. Sitaraman, Suresh K. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability wearout mechanisms in advanced CMOS technologiesent://SD_ILS/0/SD_ILS:2495742024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VoIP handbook applications, technologies, reliability, and securityent://SD_ILS/0/SD_ILS:2896752024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Ahson, Syed. Ilyas, Mohammad, 1953-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420070217">Distributed by publisher. 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Keith, 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Solder Joint Technology Materials, Properties, and Reliabilityent://SD_ILS/0/SD_ILS:1662522024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Tu, King-Ning. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and risk models setting reliability requirementsent://SD_ILS/0/SD_ILS:2959002024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Todinov, M. 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(David John), 1943 June 22-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Data Analysis Theory and Applications to Reliability and Inference, Data Mining, Bioinformatics, Lifetime Data, and Neural Networksent://SD_ILS/0/SD_ILS:1682922024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Skiadas, Christos H. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4799-5">http://dx.doi.org/10.1007/978-0-8176-4799-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mathematical and Statistical Models and Methods in Reliability Applications to Medicine, Finance, and Quality Controlent://SD_ILS/0/SD_ILS:1683332024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Rykov, V.V. editor. Balakrishnan, N. editor. Nikulin, M.S. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4971-5">http://dx.doi.org/10.1007/978-0-8176-4971-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probability and Statistical Models Foundations for Problems in Reliability and Financial Mathematicsent://SD_ILS/0/SD_ILS:1683372024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Gupta, Arjun K. author. Zeng, Wei-Bin. author. Wu, Yanhong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4987-6">http://dx.doi.org/10.1007/978-0-8176-4987-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Process risk and reliability management operational integrity managementent://SD_ILS/0/SD_ILS:1472192024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Sutton, Ian S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Degradation Modeling Applications to Reliability, Survival Analysis, and Financeent://SD_ILS/0/SD_ILS:1683212024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Nikulin, M.S. editor. Limnios, Nikolaos. editor. Balakrishnan, N. editor. Kahle, Waltraud. editor. Huber-Carol, Catherine. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4924-1">http://dx.doi.org/10.1007/978-0-8176-4924-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 29th International Conference, SAFECOMP 2010, Vienna, Austria, September 14-17, 2010. 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Proceedingsent://SD_ILS/0/SD_ILS:1909602024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Buth, Bettina. editor. Rabe, Gerd. editor. Seyfarth, Till. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-04468-7">http://dx.doi.org/10.1007/978-3-642-04468-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Power distribution system reliability practical methods and applicationsent://SD_ILS/0/SD_ILS:2495632024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Chowdhury, Ali A. Koval, D. O. 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John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability analysis and prediction with warranty data issues, strategies, and methodsent://SD_ILS/0/SD_ILS:2860482024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Rai, Bharatendra K. Singh, Nanua.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439803264">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human reliability, error, and human factors in engineering maintenance with reference to aviation and power generationent://SD_ILS/0/SD_ILS:2868932024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439803844">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Corrosion, wear, fatigue, and reliability of ceramics a collection of papers presented at the 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008, Daytona Beach, Floridaent://SD_ILS/0/SD_ILS:2974572024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.) Salem, J. A. (Jonathan A.), 1960- Fuller, Edwin R. Ohji, T. (Tatsuki) Wereszczak, Andrew.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470456347">http://dx.doi.org/10.1002/9780470456347</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297839">http://site.ebrary.com/lib/alltitles/Doc?id=10297839</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>İki parametreli üstel dağılımda rekor değerler ile ortak değişim katsayısı ve güvenirlik tahmin edicileri = Common coefficient of variation and reliability estimators using record values in two parameter exponential distributionent://SD_ILS/0/SD_ILS:1246412024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Bıyıklı, Nurten.<br/>Preferred Shelf Number TEZ/9030 .B59 2009<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysisent://SD_ILS/0/SD_ILS:1670302024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Limnios, Nikolaos. author. Barbu, Vlad Stefan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-73173-5">http://dx.doi.org/10.1007/978-0-387-73173-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Engineering design reliability applications for the aerospace, automotive, and ship industriesent://SD_ILS/0/SD_ILS:1530402024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren. CRC Press.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Developments in Telecommunications With a Focus on SS7 Network Reliabilityent://SD_ILS/0/SD_ILS:1873292024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Rufa, Gerhard. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74986-8">http://dx.doi.org/10.1007/978-3-540-74986-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 27th International Conference, SAFECOMP 2008 Newcastle upon Tyne, UK, September 22-25, 2008 Proceedingsent://SD_ILS/0/SD_ILS:1888942024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Harrison, Michael D. editor. Sujan, Mark-Alexander. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-87698-4">http://dx.doi.org/10.1007/978-3-540-87698-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliabilityent://SD_ILS/0/SD_ILS:1839932024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Bertsche, Bernd. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-34282-3">http://dx.doi.org/10.1007/978-3-540-34282-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Next Generation Wireless LANs Throughput, Robustness, and Reliability in 802.11nent://SD_ILS/0/SD_ILS:2360242024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Perahia, Eldad. Stacey, Robert.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511541032">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Tutorial on hardware and software reliability, maintainability, and availabilityent://SD_ILS/0/SD_ILS:2498142024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Schneidewind, Norman.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9780470610985">http://dx.doi.org/10.1002/9780470610985</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9780470146316">http://dx.doi.org/10.1002/9780470146316</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Micro- and opto-electronic materials and structures : physics, mechanics, design, reliability, packagingent://SD_ILS/0/SD_ILS:1104482024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Suhir, Ephraim. Lee, Y. C. Wong, C. P.<br/>Preferred Shelf Number TK7874 .M438 2007 V.1<br/>Format: Books<br/>Availability Beytepe Library~2<br/>IUTAM Symposium on Mechanics and Reliability of Actuating Materials Proceedings of the IUTAM Symposium held in Beijing, China, 1–3 September, 2004ent://SD_ILS/0/SD_ILS:1690882024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Yang, W. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-4131-4">http://dx.doi.org/10.1007/1-4020-4131-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 25th International Conference, SAFECOMP 2006, Gdansk, Poland, September 27-29, 2006. Proceedingsent://SD_ILS/0/SD_ILS:1848592024-11-05T22:32:57Z2024-11-05T22:32:57ZAuthor Górski, Janusz. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11875567">http://dx.doi.org/10.1007/11875567</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>