Search Results for Reliability.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026ps$003d300$0026isd$003dtrue?dt=list2024-11-27T13:13:51ZReliabilityent://SD_ILS/0/SD_ILS:2334272024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Meyer, J. Patrick.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Structural reliabilityent://SD_ILS/0/SD_ILS:2979782024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Lemaire, Maurice. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:3418702024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Kapur, Kailash C., 1941- author. Pecht, Michael, author.<br/>Preferred Shelf Number ONLINE(341870.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a>
MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a>
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MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:2858862024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Crow, Dana. Feinberg, Alec.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420040845">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical reliability engineeringent://SD_ILS/0/SD_ILS:3055632024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor O'Connor, Patrick P. Kleyner, Andre. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Improving machinery reliabilityent://SD_ILS/0/SD_ILS:1538282024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Bloch, Heinz P., 1933-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability in pragmaticsent://SD_ILS/0/SD_ILS:3575812024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor McCready, Eric (Eric S.), author.<br/>Preferred Shelf Number P99.4.P72 M445 2015<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Probabilistic reliability modelsent://SD_ILS/0/SD_ILS:2995232024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Ushakov, I. A. (Igorʹ Alekseevich)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a>
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Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical reliability engineeringent://SD_ILS/0/SD_ILS:2950992024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Pavlov, I. V. Ushakov, I. A. (Igorʹ Alekseevich) Chakravarty, Sumantra. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probabilistic reliability engineeringent://SD_ILS/0/SD_ILS:2951012024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Ushakov, I. A. (Igorʹ Alekseevich) Falk, James. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer systems reliability.ent://SD_ILS/0/SD_ILS:588932024-11-27T13:13:51Z2024-11-27T13:13:51ZPreferred Shelf Number TK 7885 C65 1974 V.20<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Reliability and Optimal Maintenanceent://SD_ILS/0/SD_ILS:1753802024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Wang, Hongzhou. author. Pham, Hoang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Maintenance Theory of Reliabilityent://SD_ILS/0/SD_ILS:1753232024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Safety Engineeringent://SD_ILS/0/SD_ILS:1761932024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Verma, Ajit Kumar. author. Srividya, Ajit. author. Karanki, Durga Rao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>IEEE Transactions on reliability.ent://SD_ILS/0/SD_ILS:2268842024-11-27T13:13:51Z2024-11-27T13:13:51ZPreferred Shelf Number ALFABETİK V.12 1963<br/>Format: Continuing Resources Other<br/>Availability Beytepe Library~30 ~0<br/>Engineering design reliability handbookent://SD_ILS/0/SD_ILS:2873132024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. 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Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quantile-Based Reliability Analysisent://SD_ILS/0/SD_ILS:3305562024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Nair, N. Unnikrishnan. author. Sankaran, P.G. author. Balakrishnan, N. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(330556.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electronic thin-film reliabilityent://SD_ILS/0/SD_ILS:2781562024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Tu, K. N. (King-Ning), 1937-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electric power distribution reliabilityent://SD_ILS/0/SD_ILS:2856642024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Brown, Richard E., 1969-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780849375682">Distributed by publisher. 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Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:2563332024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Neale, M. J. (Michael John)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fatigue design and reliabilityent://SD_ILS/0/SD_ILS:2544662024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland) Marquis, G. (Gary) Solin, J. European Structural Integrity Society.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of reliability engineeringent://SD_ILS/0/SD_ILS:2951002024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Ushakov, I. A. (Igorʹ Alekseevich) Harrison, Robert A. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Introduction to reliability engineeringent://SD_ILS/0/SD_ILS:476112024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Lewis, Elmer Eugene, 1938-<br/>Preferred Shelf Number TA 169 L47 1987<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Innovations in Power Systems Reliabilityent://SD_ILS/0/SD_ILS:1684172024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Anders, George. editor. Vaccaro, Alfredo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Applied Nonparametric Statistics in Reliabilityent://SD_ILS/0/SD_ILS:1684262024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Gámiz, M. 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C., ort. yaz.<br/>Preferred Shelf Number TS 173 D85 1990<br/>Format: Books<br/>Availability Beytepe Library~1<br/>A Primer of reliability theoryent://SD_ILS/0/SD_ILS:476102024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Grosh, Doris Lloyd.<br/>Preferred Shelf Number TA 169 G76 1989<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Reliability in the acquisitions processent://SD_ILS/0/SD_ILS:476122024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor DePriest, D. J., ed. by Launer, R. L., ed. by<br/>Preferred Shelf Number TA 169 R44 1983<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Software engineering : design, reliability and managementent://SD_ILS/0/SD_ILS:325612024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Shooman, Martin L.<br/>Preferred Shelf Number QA 76.9.S88 S56 1983<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Life testing and reliability estimationent://SD_ILS/0/SD_ILS:354812024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Sinha, S. K. Kale, B. K., ort. yaz.<br/>Preferred Shelf Number QA 273 S64 1980<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Durability and reliability in engineering desingent://SD_ILS/0/SD_ILS:482452024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Kivenson, Gilbert.<br/>Preferred Shelf Number TS 173 K57 1971<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Mathematical methods of reliability theoryent://SD_ILS/0/SD_ILS:476452024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Gnedenko, Boris Vladimirovich, 1912- Belyayev, Yu. K., ort. yaz. Solovyev, A. D., ort. yaz.<br/>Preferred Shelf Number TA 340 G5513 1969<br/>Format: Books<br/>Availability Beytepe Library~2<br/>Stochastic Processes with Applications to Reliability Theoryent://SD_ILS/0/SD_ILS:1684752024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Failure Rate Modelling for Reliability and Riskent://SD_ILS/0/SD_ILS:1758682024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Shock and Damage Models in Reliability Theoryent://SD_ILS/0/SD_ILS:1754202024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human Reliability and Error in Transportation Systemsent://SD_ILS/0/SD_ILS:1755782024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Dhillon, B. 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S.<br/>Preferred Shelf Number TA1145 D45 2007<br/>Format: Books<br/>Availability Beytepe Library~1<br/>IEEE Transactions on device and materials reliability.ent://SD_ILS/0/SD_ILS:2268372024-11-27T13:13:51Z2024-11-27T13:13:51ZPreferred Shelf Number ALFABETİK V.3 2003<br/>Format: Continuing Resources Other<br/>Availability Beytepe Library~1 ~0<br/>Advances in safety, reliability and risk managementent://SD_ILS/0/SD_ILS:3427902024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor European Safety and Reliability Conference (2011 : Troyes, France) Berenguer, Christophe. Grall, Antoine. Soares, C. Guedes.<br/>Preferred Shelf Number ONLINE(342790.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203135105">Distributed by publisher. 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John Wiley <a href="http://dx.doi.org/10.1002/9781118162569">http://dx.doi.org/10.1002/9781118162569</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Offshore Wind Turbines Reliability, availability and maintenanceent://SD_ILS/0/SD_ILS:2479562024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Tavner, Peter<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBRN013E">http://dx.doi.org/10.1049/PBRN013E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Compressors how to achieve high reliability & availabilityent://SD_ILS/0/SD_ILS:2935792024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Bloch, Heinz P., 1933- Geitner, Fred K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/compressors-how-to-achieve-high-reliability-availability">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lead-free solders materials reliability for electronicsent://SD_ILS/0/SD_ILS:3055912024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Subramaniam, K. 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ISSE, ReSA4CI, and SASSUR, Delft, The Netherlands, September 22, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5190922024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(519092.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-24249-1">https://doi.org/10.1007/978-3-319-24249-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 33rd International Conference, SAFECOM 2014, Florence, Italy, September 10-12, 2014. Proceedingsent://SD_ILS/0/SD_ILS:4828012024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Bondavalli, Andrea. editor. Di Giandomenico, Felicita. editor. 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Proceedingsent://SD_ILS/0/SD_ILS:4890552024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Teufel, Stephanie. editor. A Min, Tjoa. editor. You, Illsun. editor. Weippl, Edgar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-10975-6">https://doi.org/10.1007/978-3-319-10975-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Flash Memories Economic Principles of Performance, Cost and Reliability Optimizationent://SD_ILS/0/SD_ILS:4888482024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Richter, Detlev. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-007-6082-0">https://doi.org/10.1007/978-94-007-6082-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of inter-rater reliability : the definitive guide to measuring the extent of agreement among ratersent://SD_ILS/0/SD_ILS:3386332024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Gwet, Kilem Li, author<br/>Preferred Shelf Number QA278 G8 2014<br/>Format: Books<br/>Availability Beytepe Library~1 Health Sciences Library~1<br/>Reliability of safety-critical systems : theory and applicationent://SD_ILS/0/SD_ILS:3417732024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Rausand, Marvin.<br/>Preferred Shelf Number ONLINE(341773.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653">http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297839">http://site.ebrary.com/lib/alltitles/Doc?id=10297839</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>İki parametreli üstel dağılımda rekor değerler ile ortak değişim katsayısı ve güvenirlik tahmin edicileri = Common coefficient of variation and reliability estimators using record values in two parameter exponential distributionent://SD_ILS/0/SD_ILS:1246412024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Bıyıklı, Nurten.<br/>Preferred Shelf Number TEZ/9030 .B59 2009<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Developments in Telecommunications With a Focus on SS7 Network Reliabilityent://SD_ILS/0/SD_ILS:1873292024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Rufa, Gerhard. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74986-8">http://dx.doi.org/10.1007/978-3-540-74986-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 27th International Conference, SAFECOMP 2008 Newcastle upon Tyne, UK, September 22-25, 2008 Proceedingsent://SD_ILS/0/SD_ILS:1888942024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Harrison, Michael D. editor. Sujan, Mark-Alexander. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-87698-4">http://dx.doi.org/10.1007/978-3-540-87698-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliabilityent://SD_ILS/0/SD_ILS:1839932024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Bertsche, Bernd. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-34282-3">http://dx.doi.org/10.1007/978-3-540-34282-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Engineering design reliability applications for the aerospace, automotive, and ship industriesent://SD_ILS/0/SD_ILS:1530402024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren. CRC Press.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysisent://SD_ILS/0/SD_ILS:1670302024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Limnios, Nikolaos. author. Barbu, Vlad Stefan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-73173-5">http://dx.doi.org/10.1007/978-0-387-73173-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lubrication and maintenance of industrial machinery best practices and reliabilityent://SD_ILS/0/SD_ILS:2896492024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Gresham, Robert M. Totten, George E.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420089363">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mathematical methods in survival analysis, reliability and quality of lifeent://SD_ILS/0/SD_ILS:2975432024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Huber, Catherine.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625</a>
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Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability technology, human error, and quality in health careent://SD_ILS/0/SD_ILS:2850362024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420065596">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Tutorial on hardware and software reliability, maintainability, and availabilityent://SD_ILS/0/SD_ILS:2498142024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Schneidewind, Norman.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540</a>
IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Next Generation Wireless LANs Throughput, Robustness, and Reliability in 802.11nent://SD_ILS/0/SD_ILS:2360242024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Perahia, Eldad. Stacey, Robert.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511541032">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computational Intelligence in Reliability Engineering Evolutionary Techniques in Reliability Analysis and Optimizationent://SD_ILS/0/SD_ILS:1845342024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Levitin, Gregory. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37368-1">http://dx.doi.org/10.1007/978-3-540-37368-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computational Intelligence in Reliability Engineering New Metaheuristics, Neural and Fuzzy Techniques in Reliabilityent://SD_ILS/0/SD_ILS:1845352024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Levitin, Gregory. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37372-8">http://dx.doi.org/10.1007/978-3-540-37372-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 26th International Conference, SAFECOMP 2007, Nuremberg, Germany, September 18-21, 2007. Proceedingsent://SD_ILS/0/SD_ILS:1873352024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Saglietti, Francesca. editor. Oster, Norbert. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-75101-4">http://dx.doi.org/10.1007/978-3-540-75101-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A Guide to Lead-free Solders Physical Metallurgy and Reliabilityent://SD_ILS/0/SD_ILS:1753732024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Evans, John W. author. Engelmaier, Werner. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, Life Testing and the Prediction of Service Lives For Engineers and Scientistsent://SD_ILS/0/SD_ILS:1664112024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Saunders, Sam C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-48538-6">http://dx.doi.org/10.1007/978-0-387-48538-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>System Signatures and their Applications in Engineering Reliabilityent://SD_ILS/0/SD_ILS:1668812024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Samaniego, Francisco J. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-71797-5">http://dx.doi.org/10.1007/978-0-387-71797-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semi-Markov Risk Models for Finance, Insurance and Reliabilityent://SD_ILS/0/SD_ILS:1667612024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Jacques, Janssen. author. Raimondo, Manca. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-70730-1">http://dx.doi.org/10.1007/0-387-70730-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Risk-based reliability analysis and generic principles for risk reductionent://SD_ILS/0/SD_ILS:1489562024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Todinov, M. T.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packagingent://SD_ILS/0/SD_ILS:1659002024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical plant failure analysis a guide to understanding machinery deterioration and improving equipment reliabilityent://SD_ILS/0/SD_ILS:2866202024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Sachs, Neville W.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420020007">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Margins of error a study of reliability in survey measurementent://SD_ILS/0/SD_ILS:2969962024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Alwin, Duane F. (Duane Francis), 1944- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html">http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470146316">http://dx.doi.org/10.1002/9780470146316</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Micro- and opto-electronic materials and structures : physics, mechanics, design, reliability, packagingent://SD_ILS/0/SD_ILS:1104482024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Suhir, Ephraim. Lee, Y. C. Wong, C. P.<br/>Preferred Shelf Number TK7874 .M438 2007 V.1<br/>Format: Books<br/>Availability Beytepe Library~2<br/>Computer Safety, Reliability, and Security 25th International Conference, SAFECOMP 2006, Gdansk, Poland, September 27-29, 2006. Proceedingsent://SD_ILS/0/SD_ILS:1848592024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Górski, Janusz. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11875567">http://dx.doi.org/10.1007/11875567</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>IUTAM Symposium on Mechanics and Reliability of Actuating Materials Proceedings of the IUTAM Symposium held in Beijing, China, 1–3 September, 2004ent://SD_ILS/0/SD_ILS:1690882024-11-27T13:13:51Z2024-11-27T13:13:51ZAuthor Yang, W. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-4131-4">http://dx.doi.org/10.1007/1-4020-4131-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>