Search Results for Reliability. - Narrowed by: Scheuermann, Uwe. author. - E-Book - English
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dAUTHOR$002509Author$002509Scheuermann$00252C$002bUwe.$002bauthor.$002509Scheuermann$00252C$002bUwe.$002bauthor.$0026qf$003dITYPE$002509Material$002bType$0025091$00253AE-KITAP$002509E-Book$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ps$003d300?
2024-09-10T14:17:45Z
Semiconductor Power Devices Physics, Characteristics, Reliability
ent://SD_ILS/0/SD_ILS:401906
2024-09-10T14:17:45Z
2024-09-10T14:17:45Z
Author Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-70917-8">https://doi.org/10.1007/978-3-319-70917-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor Power Devices Physics, Characteristics, Reliability
ent://SD_ILS/0/SD_ILS:191586
2024-09-10T14:17:45Z
2024-09-10T14:17:45Z
Author Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>