Search Results for Reliability. - Narrowed by: E-Book - English - Electronic books. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dITYPE$002509Material$002bType$0025091$00253AE-KITAP$002509E-Book$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dSUBJECT$002509Subject$002509Electronic$002bbooks.$002509Electronic$002bbooks.$0026ps$003d300? 2024-09-10T13:55:15Z Structural reliability ent://SD_ILS/0/SD_ILS:297978 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Lemaire, Maurice.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical system reliability ent://SD_ILS/0/SD_ILS:153146 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Bauer, Eric.&#160;Zhang, Xuemei.&#160;Kimber, Douglas A.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic reliability models ent://SD_ILS/0/SD_ILS:299523 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Ushakov, I. A. (Igor&#697; Alekseevich)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated reliability and durability testing technology ent://SD_ILS/0/SD_ILS:297827 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Klyatis, Lev M.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a> ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multistate systems reliability theory with applications ent://SD_ILS/0/SD_ILS:298781 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Natvig, Bent, 1946-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10469650">http://site.ebrary.com/lib/alltitles/Doc?id=10469650</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability modeling, prediction, and optimization ent://SD_ILS/0/SD_ILS:300337 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Rules of thumb for maintenance and reliability engineers ent://SD_ILS/0/SD_ILS:306517 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Smith, Ricky.&#160;Mobley, R. Keith, 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability technology principles and practice of failure prevention in electronic systems ent://SD_ILS/0/SD_ILS:298817 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Pascoe, Norman.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781119991366">Available by subscription from Safari Books Online</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470980101">http://dx.doi.org/10.1002/9780470980101</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9780470980101">http://onlinelibrary.wiley.com/book/10.1002/9780470980101</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41740">http://www.books24x7.com/marc.asp?bookid=41740</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Importance measures in reliability, risk, and optimization principles and applications ent://SD_ILS/0/SD_ILS:299386 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Kuo, Way, 1951-&#160;Zhu, Xiaoyan.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10559415">http://site.ebrary.com/lib/alltitles/Doc?id=10559415</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Using the Weibull distribution reliability, modeling, and inference ent://SD_ILS/0/SD_ILS:299479 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;McCool, John, 1936-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://lib.myilibrary.com?id=388380">Connect to MyiLibrary resource.</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118351994">http://dx.doi.org/10.1002/9781118351994</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=51285">http://www.books24x7.com/marc.asp?bookid=51285</a> ebrary <a href="http://site.ebrary.com/id/10593122">http://site.ebrary.com/id/10593122</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=894399">http://swb.eblib.com/patron/FullRecord.aspx?p=894399</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Spacecraft reliability and multi-state failures a statistical approach ent://SD_ILS/0/SD_ILS:305721 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Saleh, Joseph H., 1971-&#160;Castet, Jean-Fran&ccedil;ois.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697462">Click here to view book</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41710">http://www.books24x7.com/marc.asp?bookid=41710</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Corrosion, wear, fatigue, and reliability of ceramics a collection of papers presented at the 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008, Daytona Beach, Florida ent://SD_ILS/0/SD_ILS:297457 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.)&#160;Salem, J. A. (Jonathan A.), 1960-&#160;Fuller, Edwin R.&#160;Ohji, T. (Tatsuki)&#160;Wereszczak, Andrew.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470456347">http://dx.doi.org/10.1002/9780470456347</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297839">http://site.ebrary.com/lib/alltitles/Doc?id=10297839</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust design methodology for reliability exploring the effects of variation and uncertainty ent://SD_ILS/0/SD_ILS:298396 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Bergman, Bo, 1943-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, maintainability and risk practical methods for engineers ent://SD_ILS/0/SD_ILS:254854 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Smith, David John, 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Effective FMEAs achieving safe, reliable, and economical products and processes using failure mode and effects analysis ent://SD_ILS/0/SD_ILS:299377 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Carlson, Carl (Carl Seymour)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118312575">http://dx.doi.org/10.1002/9781118312575</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=46749">http://www.books24x7.com/marc.asp?bookid=46749</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10558143">http://site.ebrary.com/lib/alltitles/Doc?id=10558143</a> ebrary <a href="http://site.ebrary.com/id/10558143">http://site.ebrary.com/id/10558143</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic design for optimization and robustness for engineers ent://SD_ILS/0/SD_ILS:341796 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Dodson, Bryan, 1962- author.&#160;Hammett, Patrick C., 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(Tongxi), 1941-&#160;Connally, Eric.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470950012">An electronic book accessible through the World Wide Web; click for information</a> <a href="$uhttp://onlinelibrary.wiley.com/book/10.1002/9780470950012">$uhttp://onlinelibrary.wiley.com/book/10.1002/9780470950012</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> ESD failure mechanisms and models ent://SD_ILS/0/SD_ILS:298375 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Voldman, Steven H.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software error detection through testing and analysis ent://SD_ILS/0/SD_ILS:297725 2024-09-10T13:55:15Z 2024-09-10T13:55:15Z Author&#160;Huang, J. 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