Search Results for Reliability. - Narrowed by: English SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ic$003dtrue$0026ps$003d300? 2024-10-31T08:51:08Z Reliability ent://SD_ILS/0/SD_ILS:233427 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Meyer, J. Patrick.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural reliability ent://SD_ILS/0/SD_ILS:297978 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Lemaire, Maurice.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability engineering ent://SD_ILS/0/SD_ILS:341870 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Kapur, Kailash C., 1941- author.&#160;Pecht, Michael, author.<br/>Preferred Shelf Number&#160;ONLINE(341870.1)<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a> MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability ent://SD_ILS/0/SD_ILS:364907 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Tobias, Paul A.&#160;Trindade, David C.<br/>Preferred Shelf Number&#160;TA169 T63 2012<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> MEMS Reliability ent://SD_ILS/0/SD_ILS:172486 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Hartzell, Allyson L. author.&#160;da Silva, Mark G. author.&#160;Shea, Herbert R. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bayesian Reliability ent://SD_ILS/0/SD_ILS:167542 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Hamada, Michael S. author.&#160;Wilson, Alyson G. author.&#160;Reese, C. Shane. author.&#160;Martz, Harry F. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability fundamentals ent://SD_ILS/0/SD_ILS:255215 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;C&#259;tuneanu, Vasile M.&#160;Mihalache, Adrian.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ensuring software reliability ent://SD_ILS/0/SD_ILS:289793 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Neufelder, Ann Marie, 1960-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439832752">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System Software Reliability ent://SD_ILS/0/SD_ILS:175367 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical system reliability ent://SD_ILS/0/SD_ILS:153146 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Bauer, Eric.&#160;Zhang, Xuemei.&#160;Kimber, Douglas A.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of MEMS ent://SD_ILS/0/SD_ILS:303632 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Tsuchiya, Toshiyuki.&#160;Tabata, Osamu, 1956-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:285886 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Crow, Dana.&#160;Feinberg, Alec.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420040845">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical reliability engineering ent://SD_ILS/0/SD_ILS:305563 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;O'Connor, Patrick P.&#160;Kleyner, Andre.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Improving machinery reliability ent://SD_ILS/0/SD_ILS:153828 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Bloch, Heinz P., 1933-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability in pragmatics ent://SD_ILS/0/SD_ILS:357581 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;McCready, Eric (Eric S.), author.<br/>Preferred Shelf Number&#160;P99.4.P72 M445 2015<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Probabilistic reliability models ent://SD_ILS/0/SD_ILS:299523 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Ushakov, I. A. (Igor&#697; Alekseevich)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical reliability engineering ent://SD_ILS/0/SD_ILS:295099 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Pavlov, I. V.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Chakravarty, Sumantra.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic reliability engineering ent://SD_ILS/0/SD_ILS:295101 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Falk, James.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer systems reliability. ent://SD_ILS/0/SD_ILS:58893 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Preferred Shelf Number&#160;TK 7885 C65 1974 V.20<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Reliability and Optimal Maintenance ent://SD_ILS/0/SD_ILS:175380 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Wang, Hongzhou. author.&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintenance Theory of Reliability ent://SD_ILS/0/SD_ILS:175323 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Safety Engineering ent://SD_ILS/0/SD_ILS:176193 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Verma, Ajit Kumar. author.&#160;Srividya, Ajit. author.&#160;Karanki, Durga Rao. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Engineering design reliability handbook ent://SD_ILS/0/SD_ILS:287313 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of large systems ent://SD_ILS/0/SD_ILS:254513 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Ko&#322;owrocki, Krzysztof.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power-system reliability calculations ent://SD_ILS/0/SD_ILS:220175 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Billinton, Roy.&#160;Ringlee, Robert J., joint author.&#160;Wood, Allen J., joint author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability theory and practice ent://SD_ILS/0/SD_ILS:47596 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Bazovsky, Igor.<br/>Preferred Shelf Number&#160;TA 168 B33 1961<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Stochastic Models in Reliability ent://SD_ILS/0/SD_ILS:332363 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Aven, Terje. author.&#160;Jensen, Uwe. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332363.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Network Reliability and Resilience ent://SD_ILS/0/SD_ILS:195005 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Gertsbakh, Ilya. author.&#160;Shpungin, Yoseph. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Life cycle reliability engineering ent://SD_ILS/0/SD_ILS:296926 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Yang, Guangbin, 1964-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and validity assessment ent://SD_ILS/0/SD_ILS:7092 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Carmines, Edward G.<br/>Preferred Shelf Number&#160;H 61 C26 1979<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Mathematical theory of reliability ent://SD_ILS/0/SD_ILS:35404 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Barlow, Richard E.&#160;Proschan Frank. , ort. yaz.<br/>Preferred Shelf Number&#160;QA 273 B3 1965<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Reinforced concrete structural reliability ent://SD_ILS/0/SD_ILS:291660 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;El-Reedy, Mohamed Abdallah.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439874172">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quantile-Based Reliability Analysis ent://SD_ILS/0/SD_ILS:330556 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Nair, N. Unnikrishnan. author.&#160;Sankaran, P.G. author.&#160;Balakrishnan, N. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(330556.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronic thin-film reliability ent://SD_ILS/0/SD_ILS:278156 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Tu, K. N. (King-Ning), 1937-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:285664 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Brown, Richard E., 1969-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780849375682">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability-based Structural Design ent://SD_ILS/0/SD_ILS:175421 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Choi, Seung-Kyum. author.&#160;Canfield, Robert A. author.&#160;Grandhi, Ramana V. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Six Sigma ent://SD_ILS/0/SD_ILS:165709 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Kumar, U Dinesh. author.&#160;Crocker, John. author.&#160;Chitra, T. author.&#160;Saranga, Haritha. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:287445 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Brown, Richard E., 1969-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780824744281">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lubrication and reliability handbook ent://SD_ILS/0/SD_ILS:256333 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Neale, M. J. (Michael John)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fatigue design and reliability ent://SD_ILS/0/SD_ILS:254466 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)&#160;Marquis, G. (Gary)&#160;Solin, J.&#160;European Structural Integrity Society.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of reliability engineering ent://SD_ILS/0/SD_ILS:295100 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Harrison, Robert A.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Introduction to reliability engineering ent://SD_ILS/0/SD_ILS:47611 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Lewis, Elmer Eugene, 1938-<br/>Preferred Shelf Number&#160;TA 169 L47 1987<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Innovations in Power Systems Reliability ent://SD_ILS/0/SD_ILS:168417 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Anders, George. editor.&#160;Vaccaro, Alfredo. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Nonparametric Statistics in Reliability ent://SD_ILS/0/SD_ILS:168426 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;G&aacute;miz, M. Luz. author.&#160;Kulasekera, K. B. author.&#160;Limnios, Nikolaos. author.&#160;Lindqvist, Bo Henry. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software Reliability Assessment with OR Applications ent://SD_ILS/0/SD_ILS:168454 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Kapur, P.K. author.&#160;Pham, Hoang. author.&#160;Gupta, A. author.&#160;Jha, P.C. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-204-9">http://dx.doi.org/10.1007/978-0-85729-204-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fatigue and Fracture Reliability Engineering ent://SD_ILS/0/SD_ILS:168458 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Xiong, J.J. author.&#160;Shenoi, R.A. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-218-6">http://dx.doi.org/10.1007/978-0-85729-218-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mining Equipment Reliability, Maintainability, and Safety ent://SD_ILS/0/SD_ILS:144346 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dhillon, Balbir S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Product Reliability Specification and Performance ent://SD_ILS/0/SD_ILS:175790 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Murthy, Dodderi Narshima Prabhakar. author.&#160;Rausand, Marvin. author.&#160;&Oslash;ster&aring;s, Trond. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-271-5">http://dx.doi.org/10.1007/978-1-84800-271-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advanced Reliability Models and Maintenance Policies ent://SD_ILS/0/SD_ILS:175800 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-294-4">http://dx.doi.org/10.1007/978-1-84800-294-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Improving product reliability strategies and implementation ent://SD_ILS/0/SD_ILS:295695 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Levin, Mark, 1959-&#160;Kalal, Ted T.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://ezproxy.lib.monash.edu.au/login?url=http://catdir.loc.gov/catdir/description/wiley039/2003045083.html">Full text available from Wiley InterScience</a> <a href="http://ezproxy.lib.monash.edu.au/login?url=http://dx.doi.org/10.1002/0470014024">Authentication may be required</a> John Wiley <a href="http://dx.doi.org/10.1002/0470014024">http://dx.doi.org/10.1002/0470014024</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932">http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> In-Service Fatigue Reliability of Structures ent://SD_ILS/0/SD_ILS:401041 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Petinov, Sergei V. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-89318-1">https://doi.org/10.1007/978-3-319-89318-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Aspect of Cloud Computing Environment ent://SD_ILS/0/SD_ILS:399144 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Kumar, Vikas. author.&#160;Vidhyalakshmi, R. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-13-3023-0">https://doi.org/10.1007/978-981-13-3023-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor Power Devices Physics, Characteristics, Reliability ent://SD_ILS/0/SD_ILS:401906 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Lutz, Josef. author.&#160;Schlangenotto, Heinrich. author.&#160;Scheuermann, Uwe. author.&#160;De Doncker, Rik. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-70917-8">https://doi.org/10.1007/978-3-319-70917-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of large and complex systems ent://SD_ILS/0/SD_ILS:355886 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Ko&#322;owrocki, Krzysztof, author.<br/>Preferred Shelf Number&#160;ONLINE(355886.1)<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080999494">http://www.sciencedirect.com/science/book/9780080999494</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ternary Networks Reliability and Monte Carlo ent://SD_ILS/0/SD_ILS:485508 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Gertsbakh, Ilya. author.&#160;Shpungin, Yoseph. author.&#160;Vaisman, Radislav. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-06440-6">https://doi.org/10.1007/978-3-319-06440-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:489410 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability models for engineers and scientists ent://SD_ILS/0/SD_ILS:290030 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Kaminskiy, Mark, 1946-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781466565937">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electricity infrastructure reliability and vulnerabilities ent://SD_ILS/0/SD_ILS:281073 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Guerritore, Walter B.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer system reliability safety and usability ent://SD_ILS/0/SD_ILS:285390 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dhillon, B. S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781466573130">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Analog IC Reliability in Nanometer CMOS ent://SD_ILS/0/SD_ILS:331961 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Maricau, Elie. author.&#160;Gielen, Georges. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331961.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-6163-0">http://dx.doi.org/10.1007/978-1-4614-6163-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated reliability and durability testing technology ent://SD_ILS/0/SD_ILS:297827 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Klyatis, Lev M.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a> ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and maintenance networks and systems ent://SD_ILS/0/SD_ILS:286148 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Beichelt, Frank, 1942-&#160;Tittmann, Peter.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439826362">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor packaging materials interaction and reliability ent://SD_ILS/0/SD_ILS:288970 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Chen, Andrea.&#160;Lo, Randy.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439862070">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor process reliability in practice ent://SD_ILS/0/SD_ILS:293479 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Gan, Zhenghao.&#160;Wong, Waisum.&#160;Liou, Juin J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lead Free Solder Mechanics and Reliability ent://SD_ILS/0/SD_ILS:173692 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Pang, John Hock Lye. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Measures of interobserver agreement and reliability ent://SD_ILS/0/SD_ILS:291539 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Shoukri, M. M. (Mohamed M.)&#160;Shoukri, M. M. (Mohamed M.). Measures of interobserver agreement.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439810811">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multistate systems reliability theory with applications ent://SD_ILS/0/SD_ILS:298781 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Natvig, Bent, 1946-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10469650">http://site.ebrary.com/lib/alltitles/Doc?id=10469650</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Transportation systems reliability and safety ent://SD_ILS/0/SD_ILS:285187 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439846414">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor Power Devices Physics, Characteristics, Reliability ent://SD_ILS/0/SD_ILS:191586 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Lutz, Josef. author.&#160;Schlangenotto, Heinrich. author.&#160;Scheuermann, Uwe. author.&#160;De Doncker, Rik. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Functional Analysis Methods for Reliability Models ent://SD_ILS/0/SD_ILS:176727 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Gupur, Geni. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-0348-0101-0">http://dx.doi.org/10.1007/978-3-0348-0101-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Human reliability assessment theory and practice ent://SD_ILS/0/SD_ILS:287818 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Spurgin, Anthony J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420068528">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:192824 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety and reliability of bridge structures ent://SD_ILS/0/SD_ILS:285552 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Mahmoud, Khaled M.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203861585">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mathematical models for systems reliability ent://SD_ILS/0/SD_ILS:287784 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Epstein, Benjamin, 1918-&#160;Weissman, Ishay, 1940-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420080834">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Silver Metallization Stability and Reliability ent://SD_ILS/0/SD_ILS:175677 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Adams, Daniel. author.&#160;Alford, Terry L. author.&#160;Mayer, James W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Wire Ropes Tension, Endurance, Reliability ent://SD_ILS/0/SD_ILS:183848 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Feyrer, K. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-33831-4">http://dx.doi.org/10.1007/978-3-540-33831-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:185203 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Critical Infrastructure Reliability and Vulnerability ent://SD_ILS/0/SD_ILS:185336 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Murray, Alan T. editor.&#160;Grubesic, Tony H. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-68056-7">http://dx.doi.org/10.1007/978-3-540-68056-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and risk a Bayesian perspective ent://SD_ILS/0/SD_ILS:296819 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Singpurwalla, Nozer D.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Distribution reliability and power quality ent://SD_ILS/0/SD_ILS:284933 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Short, T. A. (Tom A.), 1966-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420036480">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintainability, maintenance, and reliability for engineers ent://SD_ILS/0/SD_ILS:285711 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420006780">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated quality and reliability solutions ent://SD_ILS/0/SD_ILS:254415 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Klyatis, Lev M.&#160;Klyatis, Eugene L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic Ageing and Dependence for Reliability ent://SD_ILS/0/SD_ILS:166017 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Lai, Chin-Diew. author.&#160;Xie, Min. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-34232-X">http://dx.doi.org/10.1007/0-387-34232-X</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System reliability : concepts and applications ent://SD_ILS/0/SD_ILS:392825 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Klaassen, Klaas B., 1941-&#160;Peppen, Jack C. L. van.<br/>Preferred Shelf Number&#160;QA76.5 K53 2006<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:287285 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203006139">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:119553 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dhillon, B. S.<br/>Preferred Shelf Number&#160;TS173 .D45 2005<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Case studies in reliability and maintenance ent://SD_ILS/0/SD_ILS:300226 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality and reliability in analytical chemistry ent://SD_ILS/0/SD_ILS:285938 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Aboul-Enein, Hassan Y.&#160;Stefan, Raluca-Ioana.&#160;Baiulescu, George.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420038576">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability modeling, prediction, and optimization ent://SD_ILS/0/SD_ILS:300337 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Medical device reliability and associated areas ent://SD_ILS/0/SD_ILS:285959 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420042238">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ceramics processing, reliability, tribology and wear. ent://SD_ILS/0/SD_ILS:300592 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;M&uuml;ller, G.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/3527607293">http://dx.doi.org/10.1002/3527607293</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design reliability fundamentals and applications ent://SD_ILS/0/SD_ILS:284992 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420050141">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability modelling : A statistical approach ent://SD_ILS/0/SD_ILS:78139 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Wolstenholme, Linda C.<br/>Preferred Shelf Number&#160;TA 169 W65 1999<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Statistical methods for reliability data ent://SD_ILS/0/SD_ILS:85080 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Meeker, William Q.&#160;Escobar, Luis A., ort. yaz.<br/>Preferred Shelf Number&#160;TS 173 M44 1998<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> An elementary guide to reliability ent://SD_ILS/0/SD_ILS:254325 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dummer, G. W. A. (Geoffrey William Arnold)&#160;Tooley, Michael H.&#160;Winton, R. C.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probability, statistics, reliability for engineers ent://SD_ILS/0/SD_ILS:75189 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Ayyub, Bilal M.&#160;McCuen, Richard H., 1941-<br/>Preferred Shelf Number&#160;TA 330 A99 1997<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> New trends in system reliability evaluation ent://SD_ILS/0/SD_ILS:255243 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Misra, Krishna B., 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> An elementary guide to reliability ent://SD_ILS/0/SD_ILS:48244 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dummer, Geoffrey William Arnold.&#160;Winton, R. C., ort. yaz.<br/>Preferred Shelf Number&#160;TS 173 D85 1990<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> A Primer of reliability theory ent://SD_ILS/0/SD_ILS:47610 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Grosh, Doris Lloyd.<br/>Preferred Shelf Number&#160;TA 169 G76 1989<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Software engineering : design, reliability and management ent://SD_ILS/0/SD_ILS:32561 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Shooman, Martin L.<br/>Preferred Shelf Number&#160;QA 76.9.S88 S56 1983<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Reliability in the acquisitions process ent://SD_ILS/0/SD_ILS:47612 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;DePriest, D. J., ed. by&#160;Launer, R. L., ed. by<br/>Preferred Shelf Number&#160;TA 169 R44 1983<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Life testing and reliability estimation ent://SD_ILS/0/SD_ILS:35481 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Sinha, S. K.&#160;Kale, B. K., ort. yaz.<br/>Preferred Shelf Number&#160;QA 273 S64 1980<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Durability and reliability in engineering desing ent://SD_ILS/0/SD_ILS:48245 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Kivenson, Gilbert.<br/>Preferred Shelf Number&#160;TS 173 K57 1971<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Mathematical methods of reliability theory ent://SD_ILS/0/SD_ILS:47645 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Gnedenko, Boris Vladimirovich, 1912-&#160;Belyayev, Yu. K., ort. yaz.&#160;Solovyev, A. D., ort. yaz.<br/>Preferred Shelf Number&#160;TA 340 G5513 1969<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~2<br/> Stochastic Processes with Applications to Reliability Theory ent://SD_ILS/0/SD_ILS:168475 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Failure Rate Modelling for Reliability and Risk ent://SD_ILS/0/SD_ILS:175868 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Finkelstein, Maxim. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Human reliability and error in transportation systems ent://SD_ILS/0/SD_ILS:271334 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dhillon, B. S.<br/>Preferred Shelf Number&#160;TA1145 D45 2007<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Shock and Damage Models in Reliability Theory ent://SD_ILS/0/SD_ILS:175420 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Human Reliability and Error in Transportation Systems ent://SD_ILS/0/SD_ILS:175578 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dhillon, B. S. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in safety, reliability and risk management ent://SD_ILS/0/SD_ILS:342790 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;European Safety and Reliability Conference (2011 : Troyes, France)&#160;Berenguer, Christophe.&#160;Grall, Antoine.&#160;Soares, C. Guedes.<br/>Preferred Shelf Number&#160;ONLINE(342790.1)<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203135105">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety, reliability and risks associated with water, oil and gas pipelines : [proceedings of the NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines, Alexandria, Egypt, 4-8 February 2007] ent://SD_ILS/0/SD_ILS:113617 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines (2007 : Alexandria, Egypt)&#160;Elwany, Mohamed Hamdy.&#160;Pluvinage, Guy.<br/>Preferred Shelf Number&#160;TJ930 .N386 2008<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Safety-Critical Electrical Drives Topologies, Reliability, Performance ent://SD_ILS/0/SD_ILS:401112 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Bolvashenkov, Igor. author.&#160;Herzog, Hans-Georg. author.&#160;Frenkel, Ilia. author.&#160;Khvatskin, Lev. author.&#160;Lisnianski, Anatoly. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-89969-5">https://doi.org/10.1007/978-3-319-89969-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solid State Lighting Reliability Components to Systems ent://SD_ILS/0/SD_ILS:331314 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;van Driel, W.D. editor.&#160;Fan, X.J. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331314.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Compressors how to achieve high reliability &amp; availability ent://SD_ILS/0/SD_ILS:293579 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Bloch, Heinz P., 1933-&#160;Geitner, Fred K.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/compressors-how-to-achieve-high-reliability-availability">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Process plant equipment operation, control, and reliability ent://SD_ILS/0/SD_ILS:299085 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Holloway, Michael D., 1963-&#160;Nwaoha, Chikezie, 1984-&#160;Onyewuenyi, Oliver A., 1952-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118162569">http://onlinelibrary.wiley.com/book/10.1002/9781118162569</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118162569">http://dx.doi.org/10.1002/9781118162569</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lead-free solders materials reliability for electronics ent://SD_ILS/0/SD_ILS:305591 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Subramaniam, K. N., Ph. D.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119966203">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Offshore Wind Turbines Reliability, availability and maintenance ent://SD_ILS/0/SD_ILS:247956 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Tavner, Peter<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBRN013E">http://dx.doi.org/10.1049/PBRN013E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability centered maintenance (RCM) implementation made simple ent://SD_ILS/0/SD_ILS:293571 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Bloom, Neil.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/reliability-centered-maintenance-rcm">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Hydrosystems engineering reliability assessment and risk analysis ent://SD_ILS/0/SD_ILS:293215 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Tung, Yeou-Koung.&#160;Yen, Ben Chie, 1935-&#160;Melching, Charles S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of Microtechnology Interconnects, Devices and Systems ent://SD_ILS/0/SD_ILS:172420 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Liu, Johan. author.&#160;Salmela, Olli. author.&#160;Sarkka, Jussi. author.&#160;Morris, James E. author.&#160;Tegehall, Per-Erik. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolution ent://SD_ILS/0/SD_ILS:191769 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Levi, Paul. author.&#160;Kernbach, Serge. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-11692-6">http://dx.doi.org/10.1007/978-3-642-11692-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> VoIP handbook applications, technologies, reliability, and security ent://SD_ILS/0/SD_ILS:289675 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Ahson, Syed.&#160;Ilyas, Mohammad, 1953-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420070217">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solder Joint Reliability Prediction for Multiple Environments ent://SD_ILS/0/SD_ILS:167673 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Perkins, Andrew E. author.&#160;Sitaraman, Suresh K. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Rules of thumb for maintenance and reliability engineers ent://SD_ILS/0/SD_ILS:306517 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Smith, Ricky.&#160;Mobley, R. Keith, 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Emerging Nanotechnologies Test, Defect Tolerance, and Reliability ent://SD_ILS/0/SD_ILS:167204 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Tehranipoor, Mohammad. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Rules of thumb for maintenance and reliability engineers ent://SD_ILS/0/SD_ILS:149151 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Smith, Ricky.&#160;Mobley, R. Keith, 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality and Reliability of Large-Eddy Simulations ent://SD_ILS/0/SD_ILS:170230 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Meyers, Johan. editor.&#160;Geurts, Bernard J. editor.&#160;Sagaut, Pierre. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-8578-9">http://dx.doi.org/10.1007/978-1-4020-8578-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> New Computational Methods in Power System Reliability ent://SD_ILS/0/SD_ILS:187983 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Elmakias, David. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-77812-7">http://dx.doi.org/10.1007/978-3-540-77812-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solder Joint Technology Materials, Properties, and Reliability ent://SD_ILS/0/SD_ILS:166252 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Tu, King-Ning. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and risk models setting reliability requirements ent://SD_ILS/0/SD_ILS:295900 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Todinov, M. T.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and risk models : setting reliability requirements ent://SD_ILS/0/SD_ILS:119481 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Todinov, M. T.<br/>Preferred Shelf Number&#160;TA169 .T65 2005<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Practical reliability of electronic equipment and products ent://SD_ILS/0/SD_ILS:288362 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Hnatek, Eugene R.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203909089">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Managing risk and reliability of process plants ent://SD_ILS/0/SD_ILS:254721 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Tweeddale, Mark.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677349">http://www.sciencedirect.com/science/book/9780750677349</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> High reliability magnetic devices design and fabrication ent://SD_ILS/0/SD_ILS:284575 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;McLyman, Colonel William T., 1932-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203910689">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cognitive reliability and error analysis method CREAM ent://SD_ILS/0/SD_ILS:254433 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Hollnagel, Erik, 1941-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System reliability theory models and statistical methods ent://SD_ILS/0/SD_ILS:295270 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;H&oslash;yland, Arnljot, 1924-&#160;Rausand, Marvin.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316900">http://dx.doi.org/10.1002/9780470316900</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html">http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/30072858.html">http://catalog.hathitrust.org/api/volumes/oclc/30072858.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronics reliability and measurement technology nondestructive evaluation ent://SD_ILS/0/SD_ILS:254151 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Heyman, Joseph S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Recent Advances in Multi-state Systems Reliability Theory and Applications ent://SD_ILS/0/SD_ILS:401098 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Lisnianski, Anatoly. editor.&#160;Frenkel, Ilia. editor.&#160;Karagrigoriou, Alex. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-63423-4">https://doi.org/10.1007/978-3-319-63423-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practice ent://SD_ILS/0/SD_ILS:401845 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;De Felice, Fabio. editor.&#160;Petrillo, Antonella. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-62319-1">https://doi.org/10.1007/978-3-319-62319-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Point Processes for Reliability Analysis Shocks and Repairable Systems ent://SD_ILS/0/SD_ILS:402392 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Cha, Ji Hwan. author.&#160;Finkelstein, Maxim. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-73540-5">https://doi.org/10.1007/978-3-319-73540-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Human Reliability, Error, and Human Factors in Power Generation ent://SD_ILS/0/SD_ILS:487643 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dhillon, B. S. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-04019-6">https://doi.org/10.1007/978-3-319-04019-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Monte Carlo Simulation Method for System Reliability and Risk Analysis ent://SD_ILS/0/SD_ILS:331017 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Zio, Enrico. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331017.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4588-2">http://dx.doi.org/10.1007/978-1-4471-4588-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Principles of Loads and Failure Mechanisms Applications in Maintenance, Reliability and Design ent://SD_ILS/0/SD_ILS:331097 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Tinga, T. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331097.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4917-0">http://dx.doi.org/10.1007/978-1-4471-4917-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic Reliability and Maintenance Modeling Essays in Honor of Professor Shunji Osaki on his 70th Birthday ent://SD_ILS/0/SD_ILS:331109 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dohi, Tadashi. editor.&#160;Nakagawa, Toshio. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331109.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4971-2">http://dx.doi.org/10.1007/978-1-4471-4971-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic Modeling for Reliability Shocks, Burn-in and Heterogeneous populations ent://SD_ILS/0/SD_ILS:331121 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Finkelstein, Maxim. author.&#160;Cha, Ji Hwan. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331121.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-5028-2">http://dx.doi.org/10.1007/978-1-4471-5028-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Recent Advances in System Reliability Signatures, Multi-state Systems and Statistical Inference ent://SD_ILS/0/SD_ILS:173390 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Lisnianski, Anatoly. editor.&#160;Frenkel, Ilia. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-2207-4">http://dx.doi.org/10.1007/978-1-4471-2207-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability technology principles and practice of failure prevention in electronic systems ent://SD_ILS/0/SD_ILS:298817 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Pascoe, Norman.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781119991366">Available by subscription from Safari Books Online</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470980101">http://dx.doi.org/10.1002/9780470980101</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9780470980101">http://onlinelibrary.wiley.com/book/10.1002/9780470980101</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41740">http://www.books24x7.com/marc.asp?bookid=41740</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections ent://SD_ILS/0/SD_ILS:168486 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Tan, Cher Ming. author.&#160;Li, Wei. author.&#160;Gan, Zhenghao. author.&#160;Hou, Yuejin. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Safety of Complex Technical Systems and Processes Modeling &ndash; Identification &ndash; Prediction - Optimization ent://SD_ILS/0/SD_ILS:168571 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Ko&#322;owrocki, Krzysztof. author.&#160;Soszy&#324;ska-Budny, Joanna. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-694-8">http://dx.doi.org/10.1007/978-0-85729-694-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Simulation Methods for Reliability and Availability of Complex Systems ent://SD_ILS/0/SD_ILS:175923 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Faulin, Javier. editor.&#160;Juan, Angel A. editor.&#160;Martorell, Sebasti&aacute;n. editor.&#160;Ram&iacute;rez-M&aacute;rquez, Jos&eacute;-Emmanuel. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84882-213-9">http://dx.doi.org/10.1007/978-1-84882-213-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Complex System Reliability Multichannel Systems with Imperfect Fault Coverage ent://SD_ILS/0/SD_ILS:176244 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Myers, Albert. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-414-2">http://dx.doi.org/10.1007/978-1-84996-414-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Recent Advances in Reliability and Quality in Design ent://SD_ILS/0/SD_ILS:175716 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Pham, Hoang. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-113-8">http://dx.doi.org/10.1007/978-1-84800-113-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Reliability and Quality Fundamentals, Methods and Procedures ent://SD_ILS/0/SD_ILS:175443 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dhillon, B. S. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-498-4">http://dx.doi.org/10.1007/978-1-84628-498-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Universal Generating Function in Reliability Analysis and Optimization ent://SD_ILS/0/SD_ILS:175337 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Levitin, Gregory. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-245-4">http://dx.doi.org/10.1007/1-84628-245-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fracture mechanics. 1, Analysis of reliability and quality control ent://SD_ILS/0/SD_ILS:305424 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Grous, Ammar, author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a> Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems ent://SD_ILS/0/SD_ILS:175839 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Seong, Poong Hyun. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-384-2">http://dx.doi.org/10.1007/978-1-84800-384-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Security and Reliability of Damaged Structures and Defective Materials ent://SD_ILS/0/SD_ILS:204889 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Pluvinage, Guy. editor.&#160;Sedmak, Aleksandar. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-2792-4">http://dx.doi.org/10.1007/978-90-481-2792-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines ent://SD_ILS/0/SD_ILS:169842 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Pluvinage, Guy. editor.&#160;Elwany, Mohamed Hamdy. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-6526-2">http://dx.doi.org/10.1007/978-1-4020-6526-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Guidelines for improving plant reliability through data collection and analysis ent://SD_ILS/0/SD_ILS:300022 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;American Institute of Chemical Engineers. Center for Chemical Process Safety.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety and reliability : methodology and applications : proceedings of the European Safety and Reliability Conference, Esrel 2014, Wroc&iquest;&#784;&#432;aw, Poland, 14-18 September 2014 ent://SD_ILS/0/SD_ILS:356984 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;European Safety and Reliability Conference (2014 : Wroc&iquest;&#784;&#432;aw, Poland)&#160;Nowakowski, Tomasz, editor.<br/>Preferred Shelf Number&#160;ONLINE(356984.1)<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781315736976">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety, reliability, risk and life-cycle performance of structures and infrastructures : proceedings of the 11th International Conference on Structural Safety and Reliability, New York, USA, 16-20 June 2013 ent://SD_ILS/0/SD_ILS:356919 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;International Conference on Structural Safety and Reliability (11th : 2013 : New York). Sponsor.&#160;Deodatis, G. (George), editor.&#160;Ellingwood, Bruce R., editor.&#160;Frangopol, Dan M., editor.<br/>Preferred Shelf Number&#160;ONLINE(356919.1)<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781315884882">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in product development and reliability III selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, China ent://SD_ILS/0/SD_ILS:279620 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China)&#160;Gao, L., editor of compilation.&#160;Li, W. D., editor of compilation.&#160;Zhao, Y. X., editor of compilation.&#160;Li, X. Y., editor of compilation.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, risk, and safety theory and applications : proceedings of the European Safety and Reliability Conference, ESREL 2009 : Prague, Czech Republic, 7-19 September 2009 ent://SD_ILS/0/SD_ILS:288317 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;European Safety and Reliability Conference (2009 : Prague, Czech Republic)&#160;Bri?, Radim.&#160;Soares, C. Guedes.&#160;Martorell, Sebasti&#505;.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203859759">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and optimization of structural systems proceedings of Reliability and Optimization of Structural Systems, Tum, M&iquest;nchen, Germany, 7-10 April 2010 ent://SD_ILS/0/SD_ILS:289242 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Reliability and Optimization of Structural Systems (2010 : Tum, M&iquest;nchen, Germany)&#160;Straub, D.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203841419">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety, reliability and risk of structures, infrastructures and engineering systems proceedings of the Tenth International Conference on Structural Safety and Reliability (ICOSSAR2009), Osaka, Japan, 13-17 September 2009 ent://SD_ILS/0/SD_ILS:288858 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;International Conference on Structural Safety and Reliability (10th : 2009 : Osaka, Japan)&#160;Furuta, Hitoshi.&#160;Frangopol, Dan M.&#160;Shinozuka, Masanobu.&#160;Hirokane, Michiyuki.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439847657">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521134 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Guiochet, J&eacute;r&eacute;mie. editor.&#160;Tonetta, Stefano. editor.&#160;Bitsch, Friedemann. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;XX(521134.1)<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521137 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Guiochet, J&eacute;r&eacute;mie. editor.&#160;Tonetta, Stefano. editor.&#160;Schoitsch, Erwin. editor.&#160;Roy, Matthieu. editor.&#160;Bitsch, Friedemann. editor.<br/>Preferred Shelf Number&#160;XX(521137.1)<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-40953-0">https://doi.org/10.1007/978-3-031-40953-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification 5th International Conference, RSSRail 2023, Berlin, Germany, October 10-12, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521180 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Milius, Birgit. editor.&#160;Collart-Dutilleul, Simon. editor.&#160;Lecomte, Thierry. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;XX(521180.1)<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-43366-5">https://doi.org/10.1007/978-3-031-43366-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 38th International Conference, SAFECOMP 2019, Turku, Finland, September 11&ndash;13, 2019, Proceedings ent://SD_ILS/0/SD_ILS:483736 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331&#160;Troubitsyna, Elena. editor.&#160;Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-030-26601-1">https://doi.org/10.1007/978-3-030-26601-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2019 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Turku, Finland, September 10, 2019, Proceedings ent://SD_ILS/0/SD_ILS:484867 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331&#160;Troubitsyna, Elena. editor.&#160;Gashi, Ilir. editor.&#160;Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443&#160;Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-030-26250-1">https://doi.org/10.1007/978-3-030-26250-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering ent://SD_ILS/0/SD_ILS:485213 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Ali, Syed Riffat. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2018 International Conference on Human Error, Reliability, Resilience, and Performance, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USA ent://SD_ILS/0/SD_ILS:485921 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Boring, Ronald L. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-94391-6">https://doi.org/10.1007/978-3-319-94391-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic Models in Reliability, Network Security and System Safety Essays Dedicated to Professor Jinhua Cao on the Occasion of His 80th Birthday ent://SD_ILS/0/SD_ILS:486029 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Li, Quan-Lin. editor.&#160;Wang, Jinting. editor.&#160;Yu, Hai-Bo. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-15-0864-6">https://doi.org/10.1007/978-981-15-0864-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:482935 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Statistics in Transportation and Communication Selected Papers from the 18th International Conference on Reliability and Statistics in Transportation and Communication, RelStat&rsquo;18, 17-20 October 2018, Riga, Latvia ent://SD_ILS/0/SD_ILS:486996 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Kabashkin, Igor. editor.&#160;Yatskiv (Jackiva), Irina. editor.&#160;Prentkovskis, Olegas. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-030-12450-2">https://doi.org/10.1007/978-3-030-12450-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of Selective Laser Melted AlSi12 Alloy for Quasistatic and Fatigue Applications ent://SD_ILS/0/SD_ILS:487045 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Siddique, Shafaqat. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-658-23425-6">https://doi.org/10.1007/978-3-658-23425-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification Third International Conference, RSSRail 2019, Lille, France, June 4&ndash;6, 2019, Proceedings ent://SD_ILS/0/SD_ILS:486274 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Collart-Dutilleul, Simon. editor.&#160;Lecomte, Thierry. editor.&#160;Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-030-18744-6">https://doi.org/10.1007/978-3-030-18744-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Systems 14th EAI International Conference, Qshine 2018, Ho Chi Minh City, Vietnam, December 3&ndash;4, 2018, Proceedings ent://SD_ILS/0/SD_ILS:486900 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Duong, Trung Q. editor.&#160;Vo, Nguyen-Son. editor.&#160;Phan, Van Ca. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-030-14413-5">https://doi.org/10.1007/978-3-030-14413-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Systems 13th International Conference, QShine 2017, Dalian, China, December 16 -17, 2017, Proceedings ent://SD_ILS/0/SD_ILS:400873 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Wang, Lei. editor.&#160;Qiu, Tie. editor.&#160;Zhao, Wenbing. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-78078-8">https://doi.org/10.1007/978-3-319-78078-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliability ent://SD_ILS/0/SD_ILS:400290 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Jahanshahi, Mohsen. author.&#160;Bistouni, Fathollah. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-78473-1">https://doi.org/10.1007/978-3-319-78473-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17&ndash;21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USA ent://SD_ILS/0/SD_ILS:401830 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Boring, Ronald Laurids. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-60645-3">https://doi.org/10.1007/978-3-319-60645-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliability ent://SD_ILS/0/SD_ILS:460117 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Suganuma, Katsuaki, editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780081020944">https://www.sciencedirect.com/science/book/9780081020944</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2018 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, V&auml;ster&aring;s, Sweden, September 18, 2018, Proceedings ent://SD_ILS/0/SD_ILS:399783 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Gallina, Barbara. editor. (orcid)0000-0002-6952-1053&#160;Skavhaug, Amund. editor.&#160;Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443&#160;Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-99229-7">https://doi.org/10.1007/978-3-319-99229-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, V&auml;ster&aring;s, Sweden, September 19-21, 2018, Proceedings ent://SD_ILS/0/SD_ILS:400344 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Gallina, Barbara. editor. (orcid)0000-0002-6952-1053&#160;Skavhaug, Amund. editor.&#160;Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-99130-6">https://doi.org/10.1007/978-3-319-99130-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solid State Lighting Reliability Part 2 Components to Systems ent://SD_ILS/0/SD_ILS:401528 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;van Driel, Willem Dirk. editor.&#160;Fan, Xuejun. editor.&#160;Zhang, Guo Qi. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat&rsquo;17, 18-21 October, 2017, Riga, Latvia ent://SD_ILS/0/SD_ILS:402395 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Kabashkin, Igor. editor.&#160;Yatskiv, Irina. editor.&#160;Prentkovskis, Olegas. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-74454-4">https://doi.org/10.1007/978-3-319-74454-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip ent://SD_ILS/0/SD_ILS:401348 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Wang, Zheng. author.&#160;Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-10-1073-6">https://doi.org/10.1007/978-981-10-1073-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semi-Markov processes : applications in system reliability and maintenance ent://SD_ILS/0/SD_ILS:355517 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Grabski, Franciszek, author.<br/>Preferred Shelf Number&#160;ONLINE(355517.1)<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128005187">http://www.sciencedirect.com/science/book/9780128005187</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2015 Workshops, ASSURE, DECSoS. ISSE, ReSA4CI, and SASSUR, Delft, The Netherlands, September 22, 2015, Proceedings ent://SD_ILS/0/SD_ILS:519092 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Koornneef, Floor. editor.&#160;van Gulijk, Coen. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;XX(519092.1)<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-24249-1">https://doi.org/10.1007/978-3-319-24249-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 34th International Conference, SAFECOMP 2015, Delft, The Netherlands, September 23-25, 2015, Proceedings ent://SD_ILS/0/SD_ILS:519026 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Koornneef, Floor. editor.&#160;van Gulijk, Coen. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;XX(519026.1)<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-24255-2">https://doi.org/10.1007/978-3-319-24255-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Chemical and biochemical technology : materials, processing, and reliability ent://SD_ILS/0/SD_ILS:356545 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Varfolomeev, Serge&iquest;&#784;&#432;i Dmitrievich, editor.<br/>Preferred Shelf Number&#160;ONLINE(356545.1)<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781482257625">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of inter-rater reliability : the definitive guide to measuring the extent of agreement among raters ent://SD_ILS/0/SD_ILS:338633 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Gwet, Kilem Li, author<br/>Preferred Shelf Number&#160;QA278 G8 2014<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1&#160;Health Sciences Library~1<br/> Reliability and failure of electronic materials and devices ent://SD_ILS/0/SD_ILS:355485 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Ohring, Milton, 1936-&#160;Kasprzak, Lucian.<br/>Preferred Shelf Number&#160;ONLINE(355485.1)<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability prediction from burn-in data fit to reliability models ent://SD_ILS/0/SD_ILS:355921 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Bernstein, Joseph.<br/>Preferred Shelf Number&#160;ONLINE(355921.1)<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128007471">http://www.sciencedirect.com/science/book/9780128007471</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamentals of reliability engineering : applications in multistage interconnection networks ent://SD_ILS/0/SD_ILS:342010 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Gunawan, Indra.<br/>Preferred Shelf Number&#160;ONLINE(342010.1)<br/>Electronic Access&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a> Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079">http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079</a> Ebook Library <a href="http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0">http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0</a> ebrary <a href="http://site.ebrary.com/id/10843879">http://site.ebrary.com/id/10843879</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of safety-critical systems : theory and application ent://SD_ILS/0/SD_ILS:341773 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Rausand, Marvin.<br/>Preferred Shelf Number&#160;ONLINE(341773.1)<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653">http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118776353">http://dx.doi.org/10.1002/9781118776353</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Flash Memories Economic Principles of Performance, Cost and Reliability Optimization ent://SD_ILS/0/SD_ILS:488848 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Richter, Detlev. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-94-007-6082-0">https://doi.org/10.1007/978-94-007-6082-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Availability, Reliability, and Security in Information Systems IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2014 and 4th InternationalWorkshop on Security and Cognitive Informatics for Homeland Defense, SeCIHD 2014, Fribourg, Switzerland, September 8-12, 2014. Proceedings ent://SD_ILS/0/SD_ILS:489055 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Teufel, Stephanie. editor.&#160;A Min, Tjoa. editor.&#160;You, Illsun. editor.&#160;Weippl, Edgar. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-10975-6">https://doi.org/10.1007/978-3-319-10975-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2014 Workshops: ASCoMS, DECSoS, DEVVARTS, ISSE, ReSA4CI, SASSUR. Florence, Italy, September 8-9, 2014, Proceedings ent://SD_ILS/0/SD_ILS:485676 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Bondavalli, Andrea. editor.&#160;Ceccarelli, Andrea. editor.&#160;Ortmeier, Frank. editor. (orcid)0000-0001-6186-4142&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-10557-4">https://doi.org/10.1007/978-3-319-10557-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications ent://SD_ILS/0/SD_ILS:489246 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Franco, Jacopo. author.&#160;Kaczer, Ben. author.&#160;Groeseneken, Guido. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-94-007-7663-0">https://doi.org/10.1007/978-94-007-7663-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 33rd International Conference, SAFECOM 2014, Florence, Italy, September 10-12, 2014. Proceedings ent://SD_ILS/0/SD_ILS:482801 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Bondavalli, Andrea. editor.&#160;Di Giandomenico, Felicita. editor. (orcid)0000-0002-8760-7299&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-10506-2">https://doi.org/10.1007/978-3-319-10506-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Rail human factors supporting reliability, safety and cost reduction ent://SD_ILS/0/SD_ILS:291107 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dadashi, Nastaran.&#160;Scott, Anita.&#160;Wilson, John R.&#160;Mills, Ann.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203759721">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic Orders in Reliability and Risk In Honor of Professor Moshe Shaked ent://SD_ILS/0/SD_ILS:332149 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Li, Haijun. editor.&#160;Li, Xiaohu. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332149.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-6892-9">http://dx.doi.org/10.1007/978-1-4614-6892-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:332682 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332682.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Networks 9th International Conference, QShine 2013, Greader Noida, India, January 11-12, 2013, Revised Selected Papers ent://SD_ILS/0/SD_ILS:334505 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Singh, Karan. editor.&#160;Awasthi, Amit K. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(334505.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-37949-9">http://dx.doi.org/10.1007/978-3-642-37949-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings ent://SD_ILS/0/SD_ILS:335005 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Bitsch, Friedemann. editor.&#160;Guiochet, J&eacute;r&eacute;mie. editor.&#160;Ka&acirc;niche, Mohamed. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(335005.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-40793-2">http://dx.doi.org/10.1007/978-3-642-40793-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices. ent://SD_ILS/0/SD_ILS:305286 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Epperlein, Peter W.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118481882">http://dx.doi.org/10.1002/9781118481882</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optimal Stochastic Control Schemes within a Structural Reliability Framework ent://SD_ILS/0/SD_ILS:332864 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Leira, Bernt J. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332864.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-01405-0">http://dx.doi.org/10.1007/978-3-319-01405-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications ent://SD_ILS/0/SD_ILS:306566 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Wu, Bin, author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ent://SD_ILS/0/SD_ILS:331478 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Ueda, Osamu. editor.&#160;Pearton, Stephen J. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331478.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-4337-7">http://dx.doi.org/10.1007/978-1-4614-4337-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Availability, Reliability, and Security in Information Systems and HCI IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2013, Regensburg, Germany, September 2-6, 2013. Proceedings ent://SD_ILS/0/SD_ILS:334958 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Cuzzocrea, Alfredo. editor.&#160;Kittl, Christian. editor.&#160;Simos, Dimitris E. editor.&#160;Weippl, Edgar. editor.&#160;Xu, Lida. editor.<br/>Preferred Shelf Number&#160;ONLINE(334958.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Risk Evaluation of Wind Integrated Power Systems ent://SD_ILS/0/SD_ILS:335484 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Billinton, Roy. editor.&#160;Karki, Rajesh. editor.&#160;Verma, Ajit Kumar. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(335484.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-81-322-0987-4">http://dx.doi.org/10.1007/978-81-322-0987-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Early Software Reliability Prediction A Fuzzy Logic Approach ent://SD_ILS/0/SD_ILS:335512 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Pandey, Ajeet Kumar. author.&#160;Goyal, Neeraj Kumar. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(335512.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-81-322-1176-1">http://dx.doi.org/10.1007/978-81-322-1176-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Gas and oil reliability engineering modeling and analysis ent://SD_ILS/0/SD_ILS:145907 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Calixto, Eduardo.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples ent://SD_ILS/0/SD_ILS:365001 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Taylor, Zachary, 1959-&#160;Ranganathan, Subramanyam.&#160;IEEE Xplore (Online Service), distributor.&#160;Wiley, publisher.<br/>Preferred Shelf Number&#160;ONLINE(365001.1)<br/>Electronic Access&#160;Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric utility resource planning economics, reliability, and decision-making ent://SD_ILS/0/SD_ILS:290780 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Sim, Steven.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439884096">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Pattern recognition for reliability assessment of water distribution networks ent://SD_ILS/0/SD_ILS:285385 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Trifunovi?, Nemanja.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781466558021">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Importance measures in reliability, risk, and optimization principles and applications ent://SD_ILS/0/SD_ILS:299386 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Kuo, Way, 1951-&#160;Zhu, Xiaoyan.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10559415">http://site.ebrary.com/lib/alltitles/Doc?id=10559415</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Using the Weibull distribution reliability, modeling, and inference ent://SD_ILS/0/SD_ILS:299479 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;McCool, John, 1936-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://lib.myilibrary.com?id=388380">Connect to MyiLibrary resource.</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118351994">http://dx.doi.org/10.1002/9781118351994</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=51285">http://www.books24x7.com/marc.asp?bookid=51285</a> ebrary <a href="http://site.ebrary.com/id/10593122">http://site.ebrary.com/id/10593122</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=894399">http://swb.eblib.com/patron/FullRecord.aspx?p=894399</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems ent://SD_ILS/0/SD_ILS:305462 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Bauer, Eric.&#160;Adams, Randee.&#160;Eustace, Dan.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119941378">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papers ent://SD_ILS/0/SD_ILS:196648 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Zhang, Xi. editor.&#160;Qiao, Daji. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-29222-4">http://dx.doi.org/10.1007/978-3-642-29222-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2012 Workshops: Sassur, ASCoMS, DESEC4LCCI, ERCIM/EWICS, IWDE, Magdeburg, Germany, September 25-28, 2012. Proceedings ent://SD_ILS/0/SD_ILS:197419 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Ortmeier, Frank. editor.&#160;Daniel, Peter. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33675-1">http://dx.doi.org/10.1007/978-3-642-33675-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 31st International Conference, SAFECOMP 2012, Magdeburg, Germany, September 25-28, 2012. Proceedings ent://SD_ILS/0/SD_ILS:197420 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Ortmeier, Frank. editor.&#160;Daniel, Peter. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33678-2">http://dx.doi.org/10.1007/978-3-642-33678-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, Availability and Serviceability of Networks-on-Chip ent://SD_ILS/0/SD_ILS:173779 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Cota, &Eacute;rika. author.&#160;Morais Amory, Alexandre. author.&#160;Soares Lubaszewski, Marcelo. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0791-1">http://dx.doi.org/10.1007/978-1-4614-0791-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliability ent://SD_ILS/0/SD_ILS:173816 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Levinson, David M. editor.&#160;Liu, Henry X. editor.&#160;Bell, Michael. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power Electronic Packaging Design, Assembly Process, Reliability and Modeling ent://SD_ILS/0/SD_ILS:173841 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Liu, Yong. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Non-Destructive Assessment of Concrete Structures: Reliability and Limits of Single and Combined Techniques State-of-the-Art Report of the RILEM Technical Committee 207-INR ent://SD_ILS/0/SD_ILS:206444 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Breysse, Denys. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-2736-6">http://dx.doi.org/10.1007/978-94-007-2736-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multidisciplinary Research and Practice for Information Systems IFIP WG 8.4, 8.9/TC 5 International Cross-Domain Conference and Workshop on Availability, Reliability, and Security, CD-ARES 2012, Prague, Czech Republic, August 20-24, 2012. Proceedings ent://SD_ILS/0/SD_ILS:197227 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Quirchmayr, Gerald. editor.&#160;Basl, Josef. editor.&#160;You, Ilsun. editor.&#160;Xu, Lida. editor.&#160;Weippl, Edgar. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-32498-7">http://dx.doi.org/10.1007/978-3-642-32498-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modeling and simulation for microelectronic packaging assembly manufacture, reliability, and testing ent://SD_ILS/0/SD_ILS:298653 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Liu, S. (Sheng), 1963-&#160;Liu, Yong, 1962-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470827826">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probability, statistics, and reliability for engineers and scientists ent://SD_ILS/0/SD_ILS:312915 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Ayyub, Bilal M., author.&#160;McCuen, Richard H., 1941-<br/>Preferred Shelf Number&#160;ONLINE(312915.1)<br/>Electronic Access&#160;Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpPSRESE01">http://app.knovel.com/web/toc.v/cid:kpPSRESE01</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Spacecraft reliability and multi-state failures a statistical approach ent://SD_ILS/0/SD_ILS:305721 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Saleh, Joseph H., 1971-&#160;Castet, Jean-Fran&ccedil;ois.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697462">Click here to view book</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41710">http://www.books24x7.com/marc.asp?bookid=41710</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Engineering Basic Concepts and Applications in ICT ent://SD_ILS/0/SD_ILS:194550 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Lazzaroni, Massimo. author.&#160;Cristaldi, Loredana. author.&#160;Peretto, Lorenzo. author.&#160;Rinaldi, Paola. author.&#160;Catelani, Marcantonio. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-20983-3">http://dx.doi.org/10.1007/978-3-642-20983-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Availability, Reliability and Security for Business, Enterprise and Health Information Systems IFIP WG 8.4/8.9 International Cross Domain Conference and Workshop, ARES 2011, Vienna, Austria, August 22-26, 2011. Proceedings ent://SD_ILS/0/SD_ILS:195302 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Tjoa, A Min. editor.&#160;Quirchmayr, Gerald. editor.&#160;You, Ilsun. editor.&#160;Xu, Lida. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-23300-5">http://dx.doi.org/10.1007/978-3-642-23300-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, Maintainability and Risk Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems. ent://SD_ILS/0/SD_ILS:149176 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Smith, David J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Adhesives technology for electronic applications materials, processing, reliability ent://SD_ILS/0/SD_ILS:146014 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Licari, James J., 1930-&#160;Swanson, Dale W.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Assessment of Power System Reliability Methods and Applications ent://SD_ILS/0/SD_ILS:168569 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;&#268;epin, Marko. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-688-7">http://dx.doi.org/10.1007/978-0-85729-688-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures ent://SD_ILS/0/SD_ILS:172530 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Stanisavljevi&#263;, Milo&scaron;. author.&#160;Schmid, Alexandre. author.&#160;Leblebici, Yusuf. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6217-1">http://dx.doi.org/10.1007/978-1-4419-6217-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 30th International Conference,SAFECOMP 2011, Naples, Italy, September 19-22, 2011. Proceedings ent://SD_ILS/0/SD_ILS:195586 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Flammini, Francesco. editor.&#160;Bologna, Sandro. editor.&#160;Vittorini, Valeria. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-24270-0">http://dx.doi.org/10.1007/978-3-642-24270-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality and Reliability of Large-Eddy Simulations II ent://SD_ILS/0/SD_ILS:205784 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Salvetti, Maria Vittoria. editor.&#160;Geurts, Bernard. editor.&#160;Meyers, Johan. editor.&#160;Sagaut, Pierre. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-0231-8">http://dx.doi.org/10.1007/978-94-007-0231-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability in Scientific Research Improving the Dependability of Measurements, Calculations, Equipment, and Software ent://SD_ILS/0/SD_ILS:237354 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Walker, I. R..<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1017/CBO9780511780608">Access by subscription</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, maintainability, and risk : practical methods for engineers ent://SD_ILS/0/SD_ILS:459422 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Smith, David J. (David John), 1943 June 22-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety and reliability of industrial products, systems and structures ent://SD_ILS/0/SD_ILS:288327 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Guedes Soares, Carlos.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203818657">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mining equipment and systems theory and practice of exploitation and reliability ent://SD_ILS/0/SD_ILS:286497 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Czaplicki, Jacek M.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203852804">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical reliability engineering and analysis for system design and life-cycle sustainment ent://SD_ILS/0/SD_ILS:286084 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Wessels, William R.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420094404">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Survival analysis : reliability theory, reliability engineering, random variable, actuarial science, expected value, renewal theory, reliability theory of aging and longevity, likelihood function ent://SD_ILS/0/SD_ILS:133515 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Surhone, Lambert M.&#160;Timpledon, Miriam T.&#160;Marseken, Susan F.<br/>Preferred Shelf Number&#160;H61 .S87 2010<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Multi-state System Reliability Analysis and Optimization for Engineers and Industrial Managers ent://SD_ILS/0/SD_ILS:176221 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Lisnianski, Anatoly. author.&#160;Frenkel, Ilia. author.&#160;Ding, Yi. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-320-6">http://dx.doi.org/10.1007/978-1-84996-320-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 29th International Conference, SAFECOMP 2010, Vienna, Austria, September 14-17, 2010. Proceedings ent://SD_ILS/0/SD_ILS:193040 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Schoitsch, Erwin. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-15651-9">http://dx.doi.org/10.1007/978-3-642-15651-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Process risk and reliability management operational integrity management ent://SD_ILS/0/SD_ILS:147219 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Sutton, Ian S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in Data Analysis Theory and Applications to Reliability and Inference, Data Mining, Bioinformatics, Lifetime Data, and Neural Networks ent://SD_ILS/0/SD_ILS:168292 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Skiadas, Christos H. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-4799-5">http://dx.doi.org/10.1007/978-0-8176-4799-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in Degradation Modeling Applications to Reliability, Survival Analysis, and Finance ent://SD_ILS/0/SD_ILS:168321 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Nikulin, M.S. editor.&#160;Limnios, Nikolaos. editor.&#160;Balakrishnan, N. editor.&#160;Kahle, Waltraud. editor.&#160;Huber-Carol, Catherine. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-4924-1">http://dx.doi.org/10.1007/978-0-8176-4924-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mathematical and Statistical Models and Methods in Reliability Applications to Medicine, Finance, and Quality Control ent://SD_ILS/0/SD_ILS:168333 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Rykov, V.V. editor.&#160;Balakrishnan, N. editor.&#160;Nikulin, M.S. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-4971-5">http://dx.doi.org/10.1007/978-0-8176-4971-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probability and Statistical Models Foundations for Problems in Reliability and Financial Mathematics ent://SD_ILS/0/SD_ILS:168337 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Gupta, Arjun K. author.&#160;Zeng, Wei-Bin. author.&#160;Wu, Yanhong. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-4987-6">http://dx.doi.org/10.1007/978-0-8176-4987-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:172571 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;McPherson, J.W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Calculation of Roundabouts Capacity, Waiting Phenomena and Reliability ent://SD_ILS/0/SD_ILS:190985 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Mauro, Raffaele. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-04551-6">http://dx.doi.org/10.1007/978-3-642-04551-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability engineering and risk analysis : a practical guide ent://SD_ILS/0/SD_ILS:363877 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Modarres, M. (Mohammad)&#160;Kaminskiy, Mark, 1946-&#160;Krivtsov, Vasiliy, 1963-<br/>Preferred Shelf Number&#160;TA169 M627 2010<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Human reliability, error, and human factors in engineering maintenance with reference to aviation and power generation ent://SD_ILS/0/SD_ILS:286893 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439803844">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis and prediction with warranty data issues, strategies, and methods ent://SD_ILS/0/SD_ILS:286048 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Rai, Bharatendra K.&#160;Singh, Nanua.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439803264">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Corrosion, wear, fatigue, and reliability of ceramics a collection of papers presented at the 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008, Daytona Beach, Florida ent://SD_ILS/0/SD_ILS:297457 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.)&#160;Salem, J. A. (Jonathan A.), 1960-&#160;Fuller, Edwin R.&#160;Ohji, T. (Tatsuki)&#160;Wereszczak, Andrew.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470456347">http://dx.doi.org/10.1002/9780470456347</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297839">http://site.ebrary.com/lib/alltitles/Doc?id=10297839</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust design methodology for reliability exploring the effects of variation and uncertainty ent://SD_ILS/0/SD_ILS:298396 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Bergman, Bo, 1943-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Machine Learning in Cyber Trust Security, Privacy, and Reliability ent://SD_ILS/0/SD_ILS:167900 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Yu, Philip S. editor.&#160;Tsai, Jeffrey J. P. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-88735-7">http://dx.doi.org/10.1007/978-0-387-88735-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of Reliability, Availability, Maintainability and Safety in Engineering Design ent://SD_ILS/0/SD_ILS:175745 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Stapelberg, Rudolph Frederick. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-175-6">http://dx.doi.org/10.1007/978-1-84800-175-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality of Service in Heterogeneous Networks 6th International ICST Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2009 and 3rd International Workshop on Advanced Architectures and Algorithms for Internet Delivery and Applications, AAA-IDEA 2009, Las Palmas, Gran Canaria, November 23-25, 2009 Proceedings ent://SD_ILS/0/SD_ILS:191426 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Bartolini, Novella. editor.&#160;Nikoletseas, Sotiris. editor.&#160;Sinha, Prasun. editor.&#160;Cardellini, Valeria. editor.&#160;Mahanti, Anirban. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-10625-5">http://dx.doi.org/10.1007/978-3-642-10625-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 28th International Conference, SAFECOMP 2009, Hamburg, Germany, September 15-18, 2009. Proceedings ent://SD_ILS/0/SD_ILS:190960 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Buth, Bettina. editor.&#160;Rabe, Gerd. editor.&#160;Seyfarth, Till. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-04468-7">http://dx.doi.org/10.1007/978-3-642-04468-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lubrication and maintenance of industrial machinery best practices and reliability ent://SD_ILS/0/SD_ILS:289649 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Gresham, Robert M.&#160;Totten, George E.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420089363">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability technology, human error, and quality in health care ent://SD_ILS/0/SD_ILS:285036 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420065596">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mathematical methods in survival analysis, reliability and quality of life ent://SD_ILS/0/SD_ILS:297543 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Huber, Catherine.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470610985">http://dx.doi.org/10.1002/9780470610985</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Next Generation Wireless LANs Throughput, Robustness, and Reliability in 802.11n ent://SD_ILS/0/SD_ILS:236024 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Perahia, Eldad.&#160;Stacey, Robert.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1017/CBO9780511541032">Access by subscription</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Engineering design reliability applications for the aerospace, automotive, and ship industries ent://SD_ILS/0/SD_ILS:153040 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.&#160;CRC Press.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliability ent://SD_ILS/0/SD_ILS:183993 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Bertsche, Bernd. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-34282-3">http://dx.doi.org/10.1007/978-3-540-34282-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Developments in Telecommunications With a Focus on SS7 Network Reliability ent://SD_ILS/0/SD_ILS:187329 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Rufa, Gerhard. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74986-8">http://dx.doi.org/10.1007/978-3-540-74986-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysis ent://SD_ILS/0/SD_ILS:167030 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Limnios, Nikolaos. author.&#160;Barbu, Vlad Stefan. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-73173-5">http://dx.doi.org/10.1007/978-0-387-73173-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 27th International Conference, SAFECOMP 2008 Newcastle upon Tyne, UK, September 22-25, 2008 Proceedings ent://SD_ILS/0/SD_ILS:188894 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Harrison, Michael D. editor.&#160;Sujan, Mark-Alexander. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-87698-4">http://dx.doi.org/10.1007/978-3-540-87698-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Margins of error a study of reliability in survey measurement ent://SD_ILS/0/SD_ILS:296996 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Alwin, Duane F. (Duane Francis), 1944-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html">http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470146316">http://dx.doi.org/10.1002/9780470146316</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical plant failure analysis a guide to understanding machinery deterioration and improving equipment reliability ent://SD_ILS/0/SD_ILS:286620 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Sachs, Neville W.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420020007">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micro- and opto-electronic materials and structures : physics, mechanics, design, reliability, packaging ent://SD_ILS/0/SD_ILS:110448 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Suhir, Ephraim.&#160;Lee, Y. C.&#160;Wong, C. P.<br/>Preferred Shelf Number&#160;TK7874 .M438 2007 V.1<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~2<br/> Risk-based reliability analysis and generic principles for risk reduction ent://SD_ILS/0/SD_ILS:148956 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Todinov, M. T.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A Guide to Lead-free Solders Physical Metallurgy and Reliability ent://SD_ILS/0/SD_ILS:175373 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Evans, John W. author.&#160;Engelmaier, Werner. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computational Intelligence in Reliability Engineering Evolutionary Techniques in Reliability Analysis and Optimization ent://SD_ILS/0/SD_ILS:184534 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Levitin, Gregory. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-37368-1">http://dx.doi.org/10.1007/978-3-540-37368-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computational Intelligence in Reliability Engineering New Metaheuristics, Neural and Fuzzy Techniques in Reliability ent://SD_ILS/0/SD_ILS:184535 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Levitin, Gregory. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-37372-8">http://dx.doi.org/10.1007/978-3-540-37372-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, Life Testing and the Prediction of Service Lives For Engineers and Scientists ent://SD_ILS/0/SD_ILS:166411 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Saunders, Sam C. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-48538-6">http://dx.doi.org/10.1007/978-0-387-48538-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semi-Markov Risk Models for Finance, Insurance and Reliability ent://SD_ILS/0/SD_ILS:166761 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Jacques, Janssen. author.&#160;Raimondo, Manca. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-70730-1">http://dx.doi.org/10.1007/0-387-70730-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging ent://SD_ILS/0/SD_ILS:165900 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Suhir, E. editor.&#160;Lee, Y. C. editor.&#160;Wong, C. P. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System Signatures and their Applications in Engineering Reliability ent://SD_ILS/0/SD_ILS:166881 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Samaniego, Francisco J. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-71797-5">http://dx.doi.org/10.1007/978-0-387-71797-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 26th International Conference, SAFECOMP 2007, Nuremberg, Germany, September 18-21, 2007. Proceedings ent://SD_ILS/0/SD_ILS:187335 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Saglietti, Francesca. editor.&#160;Oster, Norbert. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-75101-4">http://dx.doi.org/10.1007/978-3-540-75101-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> IUTAM Symposium on Mechanics and Reliability of Actuating Materials Proceedings of the IUTAM Symposium held in Beijing, China, 1&ndash;3 September, 2004 ent://SD_ILS/0/SD_ILS:169088 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Yang, W. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-4020-4131-4">http://dx.doi.org/10.1007/1-4020-4131-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 25th International Conference, SAFECOMP 2006, Gdansk, Poland, September 27-29, 2006. Proceedings ent://SD_ILS/0/SD_ILS:184859 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;G&oacute;rski, Janusz. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11875567">http://dx.doi.org/10.1007/11875567</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust communications software extreme availability, reliability and scalability for carrier-grade systems ent://SD_ILS/0/SD_ILS:295648 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Utas, Greg.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470011793">http://dx.doi.org/10.1002/0470011793</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Axiomatic quality integrating axiomatic design with six-sigma, reliability, and quality engineering ent://SD_ILS/0/SD_ILS:301672 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;El-Haik, Basem.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;OverDrive (PDF) <a href="http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50">http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=227550">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=227550</a> John Wiley <a href="http://dx.doi.org/10.1002/0471714682">http://dx.doi.org/10.1002/0471714682</a> Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpAQIADSS2">http://app.knovel.com/web/toc.v/cid:kpAQIADSS2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust communications software : extreme availability, reliability and scalability for carrier-grade systems ent://SD_ILS/0/SD_ILS:119483 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Utas, Greg.<br/>Preferred Shelf Number&#160;TK5105.9 U83 2005<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Advances in Ranking and Selection, Multiple Comparisons, and Reliability Methodology and Applications ent://SD_ILS/0/SD_ILS:168118 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Balakrishnan, N. editor.&#160;Nagaraja, H. N. editor.&#160;Kannan, N. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138793">http://dx.doi.org/10.1007/b138793</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 24th International Conference, SAFECOMP 2005, Fredrikstad, Norway, September 28-30, 2005. Proceedings ent://SD_ILS/0/SD_ILS:183068 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Winther, Rune. editor.&#160;Gran, Bj&oslash;rn Axel. editor.&#160;Dahll, Gustav. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11563228">http://dx.doi.org/10.1007/11563228</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, maintainability and risk practical methods for engineers ent://SD_ILS/0/SD_ILS:254854 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Smith, David John, 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Adhesives technology for electronic applications materials, processes, reliability ent://SD_ILS/0/SD_ILS:256461 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Licari, James J., 1930-&#160;Swanson, Dale W.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815515135">http://www.sciencedirect.com/science/book/9780815515135</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design and analysis of accelerated tests for mission critical reliability ent://SD_ILS/0/SD_ILS:288235 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;LuValle, Michael J.&#160;Lefevre, Bruce G.&#160;Kannan, SriRaman.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203492031">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mechanical reliability improvement probability and statistics for experimental testing ent://SD_ILS/0/SD_ILS:286460 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Little, R. E. (Robert Eugene), 1933-&#160;Kosikowski, D. M.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203910993">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Coating materials for electronic applications polymers, processes, reliability, testing ent://SD_ILS/0/SD_ILS:254844 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Licari, James J., 1930-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815514923">http://www.sciencedirect.com/science/book/9780815514923</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability verification, testing and analysis in engineering design ent://SD_ILS/0/SD_ILS:285623 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Wasserman, Gary S., 1951-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203910443">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, survivability and quality of large scale telecommunications systems ent://SD_ILS/0/SD_ILS:301093 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Stavroulakis, Peter.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470860812">http://dx.doi.org/10.1002/0470860812</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of computer systems and networks fault tolerance, analysis and design ent://SD_ILS/0/SD_ILS:301466 2024-10-31T08:51:08Z 2024-10-31T08:51:08Z Author&#160;Shooman, Martin L.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/047122460X">http://dx.doi.org/10.1002/047122460X</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html">http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>