Search Results for Reliability. - Narrowed by: Online LibrarySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ps$003d300$0026isd$003dtrue?dt=list2024-11-19T21:22:25ZReliabilityent://SD_ILS/0/SD_ILS:2334272024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Meyer, J. Patrick.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Structural reliabilityent://SD_ILS/0/SD_ILS:2979782024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Lemaire, Maurice. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:3418702024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Kapur, Kailash C., 1941- author. Pecht, Michael, author.<br/>Preferred Shelf Number ONLINE(341870.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a>
MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a>
Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>MEMS Reliabilityent://SD_ILS/0/SD_ILS:1724862024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Hartzell, Allyson L. author. da Silva, Mark G. author. Shea, Herbert R. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Bayesian Reliabilityent://SD_ILS/0/SD_ILS:1675422024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Hamada, Michael S. author. Wilson, Alyson G. author. Reese, C. Shane. author. Martz, Harry F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability fundamentalsent://SD_ILS/0/SD_ILS:2552152024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Cătuneanu, Vasile M. Mihalache, Adrian.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Ensuring software reliabilityent://SD_ILS/0/SD_ILS:2897932024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Neufelder, Ann Marie, 1960-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439832752">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>System Software Reliabilityent://SD_ILS/0/SD_ILS:1753672024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Pham, Hoang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:2493822024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Raheja, Dev. Gullo, Louis J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical system reliabilityent://SD_ILS/0/SD_ILS:1531462024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of MEMSent://SD_ILS/0/SD_ILS:3036322024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Tsuchiya, Toshiyuki. Tabata, Osamu, 1956- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:2858862024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Crow, Dana. Feinberg, Alec.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420040845">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical reliability engineeringent://SD_ILS/0/SD_ILS:3055632024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor O'Connor, Patrick P. Kleyner, Andre. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Improving machinery reliabilityent://SD_ILS/0/SD_ILS:1538282024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bloch, Heinz P., 1933-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probabilistic reliability modelsent://SD_ILS/0/SD_ILS:2995232024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Ushakov, I. A. (Igorʹ Alekseevich)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a>
Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical reliability engineeringent://SD_ILS/0/SD_ILS:2950992024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Pavlov, I. V. Ushakov, I. A. (Igorʹ Alekseevich) Chakravarty, Sumantra. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probabilistic reliability engineeringent://SD_ILS/0/SD_ILS:2951012024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Ushakov, I. A. (Igorʹ Alekseevich) Falk, James. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Optimal Maintenanceent://SD_ILS/0/SD_ILS:1753802024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Wang, Hongzhou. author. Pham, Hoang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Maintenance Theory of Reliabilityent://SD_ILS/0/SD_ILS:1753232024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Safety Engineeringent://SD_ILS/0/SD_ILS:1761932024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Verma, Ajit Kumar. author. Srividya, Ajit. author. Karanki, Durga Rao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Engineering design reliability handbookent://SD_ILS/0/SD_ILS:2873132024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of large systemsent://SD_ILS/0/SD_ILS:2545132024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Kołowrocki, Krzysztof.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Power-system reliability calculationsent://SD_ILS/0/SD_ILS:2201752024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Billinton, Roy. Ringlee, Robert J., joint author. Wood, Allen J., joint author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Stochastic Models in Reliabilityent://SD_ILS/0/SD_ILS:3323632024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Aven, Terje. author. Jensen, Uwe. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332363.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Network Reliability and Resilienceent://SD_ILS/0/SD_ILS:1950052024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Gertsbakh, Ilya. author. Shpungin, Yoseph. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Life cycle reliability engineeringent://SD_ILS/0/SD_ILS:2969262024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Yang, Guangbin, 1964- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reinforced concrete structural reliabilityent://SD_ILS/0/SD_ILS:2916602024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor El-Reedy, Mohamed Abdallah.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439874172">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quantile-Based Reliability Analysisent://SD_ILS/0/SD_ILS:3305562024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Nair, N. Unnikrishnan. author. Sankaran, P.G. author. Balakrishnan, N. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(330556.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electronic thin-film reliabilityent://SD_ILS/0/SD_ILS:2781562024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Tu, K. N. (King-Ning), 1937-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electric power distribution reliabilityent://SD_ILS/0/SD_ILS:2856642024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Brown, Richard E., 1969-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780849375682">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability-based Structural Designent://SD_ILS/0/SD_ILS:1754212024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Choi, Seung-Kyum. author. Canfield, Robert A. author. Grandhi, Ramana V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Six Sigmaent://SD_ILS/0/SD_ILS:1657092024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Kumar, U Dinesh. author. Crocker, John. author. Chitra, T. author. Saranga, Haritha. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electric power distribution reliabilityent://SD_ILS/0/SD_ILS:2874452024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Brown, Richard E., 1969-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780824744281">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:2563332024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Neale, M. J. (Michael John)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fatigue design and reliabilityent://SD_ILS/0/SD_ILS:2544662024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland) Marquis, G. (Gary) Solin, J. European Structural Integrity Society.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of reliability engineeringent://SD_ILS/0/SD_ILS:2951002024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Ushakov, I. A. (Igorʹ Alekseevich) Harrison, Robert A. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Innovations in Power Systems Reliabilityent://SD_ILS/0/SD_ILS:1684172024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Anders, George. editor. Vaccaro, Alfredo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Applied Nonparametric Statistics in Reliabilityent://SD_ILS/0/SD_ILS:1684262024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Gámiz, M. Luz. author. Kulasekera, K. B. author. Limnios, Nikolaos. author. Lindqvist, Bo Henry. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Software Reliability Assessment with OR Applicationsent://SD_ILS/0/SD_ILS:1684542024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Kapur, P.K. author. Pham, Hoang. author. Gupta, A. author. Jha, P.C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-204-9">http://dx.doi.org/10.1007/978-0-85729-204-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fatigue and Fracture Reliability Engineeringent://SD_ILS/0/SD_ILS:1684582024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Xiong, J.J. author. Shenoi, R.A. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-218-6">http://dx.doi.org/10.1007/978-0-85729-218-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Product Reliability Specification and Performanceent://SD_ILS/0/SD_ILS:1757902024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Murthy, Dodderi Narshima Prabhakar. author. Rausand, Marvin. author. Østerås, Trond. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-271-5">http://dx.doi.org/10.1007/978-1-84800-271-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advanced Reliability Models and Maintenance Policiesent://SD_ILS/0/SD_ILS:1758002024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-294-4">http://dx.doi.org/10.1007/978-1-84800-294-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mining Equipment Reliability, Maintainability, and Safetyent://SD_ILS/0/SD_ILS:1443462024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dhillon, Balbir S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Improving product reliability strategies and implementationent://SD_ILS/0/SD_ILS:2956952024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Levin, Mark, 1959- Kalal, Ted T.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://ezproxy.lib.monash.edu.au/login?url=http://catdir.loc.gov/catdir/description/wiley039/2003045083.html">Full text available from Wiley InterScience</a>
<a href="http://ezproxy.lib.monash.edu.au/login?url=http://dx.doi.org/10.1002/0470014024">Authentication may be required</a>
John Wiley <a href="http://dx.doi.org/10.1002/0470014024">http://dx.doi.org/10.1002/0470014024</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932">http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>In-Service Fatigue Reliability of Structuresent://SD_ILS/0/SD_ILS:4010412024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Petinov, Sergei V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-89318-1">https://doi.org/10.1007/978-3-319-89318-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Aspect of Cloud Computing Environmentent://SD_ILS/0/SD_ILS:3991442024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Kumar, Vikas. author. Vidhyalakshmi, R. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-3023-0">https://doi.org/10.1007/978-981-13-3023-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor Power Devices Physics, Characteristics, Reliabilityent://SD_ILS/0/SD_ILS:4019062024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-70917-8">https://doi.org/10.1007/978-3-319-70917-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Ternary Networks Reliability and Monte Carloent://SD_ILS/0/SD_ILS:4855082024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Gertsbakh, Ilya. author. Shpungin, Yoseph. author. Vaisman, Radislav. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06440-6">https://doi.org/10.1007/978-3-319-06440-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:4894102024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of large and complex systemsent://SD_ILS/0/SD_ILS:3558862024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Kołowrocki, Krzysztof, author.<br/>Preferred Shelf Number ONLINE(355886.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080999494">http://www.sciencedirect.com/science/book/9780080999494</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer system reliability safety and usabilityent://SD_ILS/0/SD_ILS:2853902024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dhillon, B. S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781466573130">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability models for engineers and scientistsent://SD_ILS/0/SD_ILS:2900302024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Kaminskiy, Mark, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781466565937">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electricity infrastructure reliability and vulnerabilitiesent://SD_ILS/0/SD_ILS:2810732024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Guerritore, Walter B.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Analog IC Reliability in Nanometer CMOSent://SD_ILS/0/SD_ILS:3319612024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331961.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-6163-0">http://dx.doi.org/10.1007/978-1-4614-6163-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Accelerated reliability and durability testing technologyent://SD_ILS/0/SD_ILS:2978272024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Klyatis, Lev M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and maintenance networks and systemsent://SD_ILS/0/SD_ILS:2861482024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Beichelt, Frank, 1942- Tittmann, Peter.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439826362">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor process reliability in practiceent://SD_ILS/0/SD_ILS:2934792024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and availability of cloud computingent://SD_ILS/0/SD_ILS:2493832024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lead Free Solder Mechanics and Reliabilityent://SD_ILS/0/SD_ILS:1736922024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Pang, John Hock Lye. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor packaging materials interaction and reliabilityent://SD_ILS/0/SD_ILS:2889702024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Chen, Andrea. Lo, Randy.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439862070">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transportation systems reliability and safetyent://SD_ILS/0/SD_ILS:2851872024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439846414">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Measures of interobserver agreement and reliabilityent://SD_ILS/0/SD_ILS:2915392024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Shoukri, M. M. (Mohamed M.) Shoukri, M. M. (Mohamed M.). Measures of interobserver agreement.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439810811">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Multistate systems reliability theory with applicationsent://SD_ILS/0/SD_ILS:2987812024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Natvig, Bent, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10469650">http://site.ebrary.com/lib/alltitles/Doc?id=10469650</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Functional Analysis Methods for Reliability Modelsent://SD_ILS/0/SD_ILS:1767272024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Gupur, Geni. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-0348-0101-0">http://dx.doi.org/10.1007/978-3-0348-0101-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor Power Devices Physics, Characteristics, Reliabilityent://SD_ILS/0/SD_ILS:1915862024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human reliability assessment theory and practiceent://SD_ILS/0/SD_ILS:2878182024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Spurgin, Anthony J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420068528">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:1928242024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety and reliability of bridge structuresent://SD_ILS/0/SD_ILS:2855522024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Mahmoud, Khaled M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203861585">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Silver Metallization Stability and Reliabilityent://SD_ILS/0/SD_ILS:1756772024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Adams, Daniel. author. Alford, Terry L. author. Mayer, James W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mathematical models for systems reliabilityent://SD_ILS/0/SD_ILS:2877842024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Epstein, Benjamin, 1918- Weissman, Ishay, 1940-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420080834">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Wire Ropes Tension, Endurance, Reliabilityent://SD_ILS/0/SD_ILS:1838482024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Feyrer, K. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-33831-4">http://dx.doi.org/10.1007/978-3-540-33831-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Critical Infrastructure Reliability and Vulnerabilityent://SD_ILS/0/SD_ILS:1853362024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Murray, Alan T. editor. Grubesic, Tony H. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-68056-7">http://dx.doi.org/10.1007/978-3-540-68056-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:1852032024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and risk a Bayesian perspectiveent://SD_ILS/0/SD_ILS:2968192024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Singpurwalla, Nozer D. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Distribution reliability and power qualityent://SD_ILS/0/SD_ILS:2849332024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Short, T. A. (Tom A.), 1966-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420036480">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Maintainability, maintenance, and reliability for engineersent://SD_ILS/0/SD_ILS:2857112024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420006780">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Accelerated quality and reliability solutionsent://SD_ILS/0/SD_ILS:2544152024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Klyatis, Lev M. Klyatis, Eugene L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Stochastic Ageing and Dependence for Reliabilityent://SD_ILS/0/SD_ILS:1660172024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Lai, Chin-Diew. author. Xie, Min. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-34232-X">http://dx.doi.org/10.1007/0-387-34232-X</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, quality, and safety for engineersent://SD_ILS/0/SD_ILS:2872852024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203006139">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Case studies in reliability and maintenanceent://SD_ILS/0/SD_ILS:3002262024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Blischke, W. R., 1934- Murthy, D. N. P. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality and reliability in analytical chemistryent://SD_ILS/0/SD_ILS:2859382024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Aboul-Enein, Hassan Y. Stefan, Raluca-Ioana. Baiulescu, George.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420038576">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Medical device reliability and associated areasent://SD_ILS/0/SD_ILS:2859592024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420042238">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Ceramics processing, reliability, tribology and wear.ent://SD_ILS/0/SD_ILS:3005922024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Müller, G. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/3527607293">http://dx.doi.org/10.1002/3527607293</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability modeling, prediction, and optimizationent://SD_ILS/0/SD_ILS:3003372024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design reliability fundamentals and applicationsent://SD_ILS/0/SD_ILS:2849922024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420050141">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor memories technology, testing, and reliabilityent://SD_ILS/0/SD_ILS:2497392024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Sharma, Ashok K. IEEE Solid-State Circuits Council.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>An elementary guide to reliabilityent://SD_ILS/0/SD_ILS:2543252024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dummer, G. W. A. (Geoffrey William Arnold) Tooley, Michael H. Winton, R. C.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>New trends in system reliability evaluationent://SD_ILS/0/SD_ILS:2552432024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Misra, Krishna B., 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Stochastic Processes with Applications to Reliability Theoryent://SD_ILS/0/SD_ILS:1684752024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Failure Rate Modelling for Reliability and Riskent://SD_ILS/0/SD_ILS:1758682024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Shock and Damage Models in Reliability Theoryent://SD_ILS/0/SD_ILS:1754202024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human Reliability and Error in Transportation Systemsent://SD_ILS/0/SD_ILS:1755782024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dhillon, B. S. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in safety, reliability and risk managementent://SD_ILS/0/SD_ILS:3427902024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor European Safety and Reliability Conference (2011 : Troyes, France) Berenguer, Christophe. Grall, Antoine. Soares, C. Guedes.<br/>Preferred Shelf Number ONLINE(342790.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203135105">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety-Critical Electrical Drives Topologies, Reliability, Performanceent://SD_ILS/0/SD_ILS:4011122024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bolvashenkov, Igor. author. Herzog, Hans-Georg. author. Frenkel, Ilia. author. Khvatskin, Lev. author. Lisnianski, Anatoly. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-89969-5">https://doi.org/10.1007/978-3-319-89969-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Solid State Lighting Reliability Components to Systemsent://SD_ILS/0/SD_ILS:3313142024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor van Driel, W.D. editor. Fan, X.J. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331314.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Offshore Wind Turbines Reliability, availability and maintenanceent://SD_ILS/0/SD_ILS:2479562024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Tavner, Peter<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBRN013E">http://dx.doi.org/10.1049/PBRN013E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Compressors how to achieve high reliability & availabilityent://SD_ILS/0/SD_ILS:2935792024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bloch, Heinz P., 1933- Geitner, Fred K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/compressors-how-to-achieve-high-reliability-availability">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Process plant equipment operation, control, and reliabilityent://SD_ILS/0/SD_ILS:2990852024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Holloway, Michael D., 1963- Nwaoha, Chikezie, 1984- Onyewuenyi, Oliver A., 1952-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118162569">http://onlinelibrary.wiley.com/book/10.1002/9781118162569</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118162569">http://dx.doi.org/10.1002/9781118162569</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lead-free solders materials reliability for electronicsent://SD_ILS/0/SD_ILS:3055912024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Subramaniam, K. N., Ph. D. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119966203">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Telecommunications system reliability engineering, theory, and practiceent://SD_ILS/0/SD_ILS:2493972024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Ayers, Mark L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability centered maintenance (RCM) implementation made simpleent://SD_ILS/0/SD_ILS:2935712024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bloom, Neil.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/reliability-centered-maintenance-rcm">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Hydrosystems engineering reliability assessment and risk analysisent://SD_ILS/0/SD_ILS:2932152024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Tung, Yeou-Koung. Yen, Ben Chie, 1935- Melching, Charles S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of Microtechnology Interconnects, Devices and Systemsent://SD_ILS/0/SD_ILS:1724202024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Liu, Johan. author. Salmela, Olli. author. Sarkka, Jussi. author. Morris, James E. author. Tegehall, Per-Erik. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolutionent://SD_ILS/0/SD_ILS:1917692024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Levi, Paul. author. Kernbach, Serge. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-11692-6">http://dx.doi.org/10.1007/978-3-642-11692-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability wearout mechanisms in advanced CMOS technologiesent://SD_ILS/0/SD_ILS:2495742024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VoIP handbook applications, technologies, reliability, and securityent://SD_ILS/0/SD_ILS:2896752024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Ahson, Syed. Ilyas, Mohammad, 1953-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420070217">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Solder Joint Reliability Prediction for Multiple Environmentsent://SD_ILS/0/SD_ILS:1676732024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Perkins, Andrew E. author. Sitaraman, Suresh K. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Rules of thumb for maintenance and reliability engineersent://SD_ILS/0/SD_ILS:3065172024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Smith, Ricky. Mobley, R. Keith, 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Emerging Nanotechnologies Test, Defect Tolerance, and Reliabilityent://SD_ILS/0/SD_ILS:1672042024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>New Computational Methods in Power System Reliabilityent://SD_ILS/0/SD_ILS:1879832024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Elmakias, David. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-77812-7">http://dx.doi.org/10.1007/978-3-540-77812-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality and Reliability of Large-Eddy Simulationsent://SD_ILS/0/SD_ILS:1702302024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Meyers, Johan. editor. Geurts, Bernard J. editor. Sagaut, Pierre. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8578-9">http://dx.doi.org/10.1007/978-1-4020-8578-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Rules of thumb for maintenance and reliability engineersent://SD_ILS/0/SD_ILS:1491512024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Smith, Ricky. Mobley, R. Keith, 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Solder Joint Technology Materials, Properties, and Reliabilityent://SD_ILS/0/SD_ILS:1662522024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Tu, King-Ning. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and risk models setting reliability requirementsent://SD_ILS/0/SD_ILS:2959002024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Todinov, M. T. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical reliability of electronic equipment and productsent://SD_ILS/0/SD_ILS:2883622024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Hnatek, Eugene R.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203909089">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Managing risk and reliability of process plantsent://SD_ILS/0/SD_ILS:2547212024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Tweeddale, Mark.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677349">http://www.sciencedirect.com/science/book/9780750677349</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>High reliability magnetic devices design and fabricationent://SD_ILS/0/SD_ILS:2845752024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor McLyman, Colonel William T., 1932-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203910689">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Cognitive reliability and error analysis method CREAMent://SD_ILS/0/SD_ILS:2544332024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Hollnagel, Erik, 1941-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>System reliability theory models and statistical methodsent://SD_ILS/0/SD_ILS:2952702024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Høyland, Arnljot, 1924- Rausand, Marvin.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316900">http://dx.doi.org/10.1002/9780470316900</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html">http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/30072858.html">http://catalog.hathitrust.org/api/volumes/oclc/30072858.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electronics reliability and measurement technology nondestructive evaluationent://SD_ILS/0/SD_ILS:2541512024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Heyman, Joseph S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Recent Advances in Multi-state Systems Reliability Theory and Applicationsent://SD_ILS/0/SD_ILS:4010982024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. Karagrigoriou, Alex. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-63423-4">https://doi.org/10.1007/978-3-319-63423-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practiceent://SD_ILS/0/SD_ILS:4018452024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor De Felice, Fabio. editor. Petrillo, Antonella. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-62319-1">https://doi.org/10.1007/978-3-319-62319-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Point Processes for Reliability Analysis Shocks and Repairable Systemsent://SD_ILS/0/SD_ILS:4023922024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Cha, Ji Hwan. author. Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-73540-5">https://doi.org/10.1007/978-3-319-73540-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human Reliability, Error, and Human Factors in Power Generationent://SD_ILS/0/SD_ILS:4876432024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dhillon, B. S. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-04019-6">https://doi.org/10.1007/978-3-319-04019-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Monte Carlo Simulation Method for System Reliability and Risk Analysisent://SD_ILS/0/SD_ILS:3310172024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Zio, Enrico. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331017.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4588-2">http://dx.doi.org/10.1007/978-1-4471-4588-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Stochastic Reliability and Maintenance Modeling Essays in Honor of Professor Shunji Osaki on his 70th Birthdayent://SD_ILS/0/SD_ILS:3311092024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dohi, Tadashi. editor. Nakagawa, Toshio. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331109.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4971-2">http://dx.doi.org/10.1007/978-1-4471-4971-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Principles of Loads and Failure Mechanisms Applications in Maintenance, Reliability and Designent://SD_ILS/0/SD_ILS:3310972024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Tinga, T. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331097.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4917-0">http://dx.doi.org/10.1007/978-1-4471-4917-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Stochastic Modeling for Reliability Shocks, Burn-in and Heterogeneous populationsent://SD_ILS/0/SD_ILS:3311212024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Finkelstein, Maxim. author. Cha, Ji Hwan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331121.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-5028-2">http://dx.doi.org/10.1007/978-1-4471-5028-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Recent Advances in System Reliability Signatures, Multi-state Systems and Statistical Inferenceent://SD_ILS/0/SD_ILS:1733902024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2207-4">http://dx.doi.org/10.1007/978-1-4471-2207-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability technology principles and practice of failure prevention in electronic systemsent://SD_ILS/0/SD_ILS:2988172024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Pascoe, Norman.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://proquest.safaribooksonline.com/?fpi=9781119991366">Available by subscription from Safari Books Online</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470980101">http://dx.doi.org/10.1002/9780470980101</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470980101">http://onlinelibrary.wiley.com/book/10.1002/9780470980101</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41740">http://www.books24x7.com/marc.asp?bookid=41740</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Applications of Finite Element Methods for Reliability Studies on ULSI Interconnectionsent://SD_ILS/0/SD_ILS:1684862024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Safety of Complex Technical Systems and Processes Modeling – Identification – Prediction - Optimizationent://SD_ILS/0/SD_ILS:1685712024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Kołowrocki, Krzysztof. author. Soszyńska-Budny, Joanna. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-694-8">http://dx.doi.org/10.1007/978-0-85729-694-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Simulation Methods for Reliability and Availability of Complex Systemsent://SD_ILS/0/SD_ILS:1759232024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Faulin, Javier. editor. Juan, Angel A. editor. Martorell, Sebastián. editor. Ramírez-Márquez, José-Emmanuel. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84882-213-9">http://dx.doi.org/10.1007/978-1-84882-213-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Complex System Reliability Multichannel Systems with Imperfect Fault Coverageent://SD_ILS/0/SD_ILS:1762442024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Myers, Albert. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-414-2">http://dx.doi.org/10.1007/978-1-84996-414-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Recent Advances in Reliability and Quality in Designent://SD_ILS/0/SD_ILS:1757162024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Pham, Hoang. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-113-8">http://dx.doi.org/10.1007/978-1-84800-113-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Applied Reliability and Quality Fundamentals, Methods and Proceduresent://SD_ILS/0/SD_ILS:1754432024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dhillon, B. S. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-498-4">http://dx.doi.org/10.1007/978-1-84628-498-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Universal Generating Function in Reliability Analysis and Optimizationent://SD_ILS/0/SD_ILS:1753372024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Levitin, Gregory. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-245-4">http://dx.doi.org/10.1007/1-84628-245-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fracture mechanics. 1, Analysis of reliability and quality controlent://SD_ILS/0/SD_ILS:3054242024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Grous, Ammar, author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a>
Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systemsent://SD_ILS/0/SD_ILS:1758392024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Seong, Poong Hyun. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-384-2">http://dx.doi.org/10.1007/978-1-84800-384-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Security and Reliability of Damaged Structures and Defective Materialsent://SD_ILS/0/SD_ILS:2048892024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Pluvinage, Guy. editor. Sedmak, Aleksandar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-2792-4">http://dx.doi.org/10.1007/978-90-481-2792-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelinesent://SD_ILS/0/SD_ILS:1698422024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Pluvinage, Guy. editor. Elwany, Mohamed Hamdy. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-6526-2">http://dx.doi.org/10.1007/978-1-4020-6526-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Guidelines for improving plant reliability through data collection and analysisent://SD_ILS/0/SD_ILS:3000222024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety and reliability : methodology and applications : proceedings of the European Safety and Reliability Conference, Esrel 2014, Wroc¿̐ưaw, Poland, 14-18 September 2014ent://SD_ILS/0/SD_ILS:3569842024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor European Safety and Reliability Conference (2014 : Wroc¿̐ưaw, Poland) Nowakowski, Tomasz, editor.<br/>Preferred Shelf Number ONLINE(356984.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781315736976">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety, reliability, risk and life-cycle performance of structures and infrastructures : proceedings of the 11th International Conference on Structural Safety and Reliability, New York, USA, 16-20 June 2013ent://SD_ILS/0/SD_ILS:3569192024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor International Conference on Structural Safety and Reliability (11th : 2013 : New York). Sponsor. Deodatis, G. (George), editor. Ellingwood, Bruce R., editor. Frangopol, Dan M., editor.<br/>Preferred Shelf Number ONLINE(356919.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781315884882">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in product development and reliability III selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, Chinaent://SD_ILS/0/SD_ILS:2796202024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China) Gao, L., editor of compilation. Li, W. D., editor of compilation. Zhao, Y. X., editor of compilation. Li, X. Y., editor of compilation.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, risk, and safety theory and applications : proceedings of the European Safety and Reliability Conference, ESREL 2009 : Prague, Czech Republic, 7-19 September 2009ent://SD_ILS/0/SD_ILS:2883172024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor European Safety and Reliability Conference (2009 : Prague, Czech Republic) Bri?, Radim. Soares, C. Guedes. Martorell, Sebastiǹ.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203859759">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and optimization of structural systems proceedings of Reliability and Optimization of Structural Systems, Tum, M¿nchen, Germany, 7-10 April 2010ent://SD_ILS/0/SD_ILS:2892422024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Reliability and Optimization of Structural Systems (2010 : Tum, M¿nchen, Germany) Straub, D.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203841419">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety, reliability and risk of structures, infrastructures and engineering systems proceedings of the Tenth International Conference on Structural Safety and Reliability (ICOSSAR2009), Osaka, Japan, 13-17 September 2009ent://SD_ILS/0/SD_ILS:2888582024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor International Conference on Structural Safety and Reliability (10th : 2009 : Osaka, Japan) Furuta, Hitoshi. Frangopol, Dan M. Shinozuka, Masanobu. Hirokane, Michiyuki.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439847657">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211342024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Bitsch, Friedemann. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(521134.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211372024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Roy, Matthieu. editor. Bitsch, Friedemann. editor.<br/>Preferred Shelf Number XX(521137.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-40953-0">https://doi.org/10.1007/978-3-031-40953-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification 5th International Conference, RSSRail 2023, Berlin, Germany, October 10-12, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211802024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Milius, Birgit. editor. Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(521180.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-43366-5">https://doi.org/10.1007/978-3-031-43366-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Physics and Engineering Time-To-Failure Modelingent://SD_ILS/0/SD_ILS:4829352024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineeringent://SD_ILS/0/SD_ILS:4852132024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Ali, Syed Riffat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Stochastic Models in Reliability, Network Security and System Safety Essays Dedicated to Professor Jinhua Cao on the Occasion of His 80th Birthdayent://SD_ILS/0/SD_ILS:4860292024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Li, Quan-Lin. editor. Wang, Jinting. editor. Yu, Hai-Bo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-15-0864-6">https://doi.org/10.1007/978-981-15-0864-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification Third International Conference, RSSRail 2019, Lille, France, June 4–6, 2019, Proceedingsent://SD_ILS/0/SD_ILS:4862742024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-18744-6">https://doi.org/10.1007/978-3-030-18744-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security SAFECOMP 2019 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Turku, Finland, September 10, 2019, Proceedingsent://SD_ILS/0/SD_ILS:4848672024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 Troubitsyna, Elena. editor. Gashi, Ilir. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-26250-1">https://doi.org/10.1007/978-3-030-26250-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 38th International Conference, SAFECOMP 2019, Turku, Finland, September 11–13, 2019, Proceedingsent://SD_ILS/0/SD_ILS:4837362024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 Troubitsyna, Elena. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-26601-1">https://doi.org/10.1007/978-3-030-26601-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2018 International Conference on Human Error, Reliability, Resilience, and Performance, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USAent://SD_ILS/0/SD_ILS:4859212024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Boring, Ronald L. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-94391-6">https://doi.org/10.1007/978-3-319-94391-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality, Reliability, Security and Robustness in Heterogeneous Systems 14th EAI International Conference, Qshine 2018, Ho Chi Minh City, Vietnam, December 3–4, 2018, Proceedingsent://SD_ILS/0/SD_ILS:4869002024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Duong, Trung Q. editor. Vo, Nguyen-Son. editor. Phan, Van Ca. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-14413-5">https://doi.org/10.1007/978-3-030-14413-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Statistics in Transportation and Communication Selected Papers from the 18th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’18, 17-20 October 2018, Riga, Latviaent://SD_ILS/0/SD_ILS:4869962024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Kabashkin, Igor. editor. Yatskiv (Jackiva), Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-12450-2">https://doi.org/10.1007/978-3-030-12450-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of Selective Laser Melted AlSi12 Alloy for Quasistatic and Fatigue Applicationsent://SD_ILS/0/SD_ILS:4870452024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Siddique, Shafaqat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-658-23425-6">https://doi.org/10.1007/978-3-658-23425-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chipent://SD_ILS/0/SD_ILS:4013482024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Wang, Zheng. author. Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-1073-6">https://doi.org/10.1007/978-981-10-1073-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Solid State Lighting Reliability Part 2 Components to Systemsent://SD_ILS/0/SD_ILS:4015282024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor van Driel, Willem Dirk. editor. Fan, Xuejun. editor. Zhang, Guo Qi. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USAent://SD_ILS/0/SD_ILS:4018302024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Boring, Ronald Laurids. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-60645-3">https://doi.org/10.1007/978-3-319-60645-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliabilityent://SD_ILS/0/SD_ILS:4601172024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Suganuma, Katsuaki, editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780081020944">https://www.sciencedirect.com/science/book/9780081020944</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security SAFECOMP 2018 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Västerås, Sweden, September 18, 2018, Proceedingsent://SD_ILS/0/SD_ILS:3997832024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-99229-7">https://doi.org/10.1007/978-3-319-99229-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliabilityent://SD_ILS/0/SD_ILS:4002902024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Jahanshahi, Mohsen. author. Bistouni, Fathollah. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-78473-1">https://doi.org/10.1007/978-3-319-78473-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality, Reliability, Security and Robustness in Heterogeneous Systems 13th International Conference, QShine 2017, Dalian, China, December 16 -17, 2017, Proceedingsent://SD_ILS/0/SD_ILS:4008732024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Wang, Lei. editor. Qiu, Tie. editor. Zhao, Wenbing. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-78078-8">https://doi.org/10.1007/978-3-319-78078-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’17, 18-21 October, 2017, Riga, Latviaent://SD_ILS/0/SD_ILS:4023952024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-74454-4">https://doi.org/10.1007/978-3-319-74454-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, Västerås, Sweden, September 19-21, 2018, Proceedingsent://SD_ILS/0/SD_ILS:4003442024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-99130-6">https://doi.org/10.1007/978-3-319-99130-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semi-Markov processes : applications in system reliability and maintenanceent://SD_ILS/0/SD_ILS:3555172024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Grabski, Franciszek, author.<br/>Preferred Shelf Number ONLINE(355517.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128005187">http://www.sciencedirect.com/science/book/9780128005187</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Chemical and biochemical technology : materials, processing, and reliabilityent://SD_ILS/0/SD_ILS:3565452024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Varfolomeev, Serge¿̐ưi Dmitrievich, editor.<br/>Preferred Shelf Number ONLINE(356545.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781482257625">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 34th International Conference, SAFECOMP 2015, Delft, The Netherlands, September 23-25, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5190262024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(519026.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-24255-2">https://doi.org/10.1007/978-3-319-24255-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security SAFECOMP 2015 Workshops, ASSURE, DECSoS. ISSE, ReSA4CI, and SASSUR, Delft, The Netherlands, September 22, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5190922024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(519092.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-24249-1">https://doi.org/10.1007/978-3-319-24249-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security SAFECOMP 2014 Workshops: ASCoMS, DECSoS, DEVVARTS, ISSE, ReSA4CI, SASSUR. Florence, Italy, September 8-9, 2014, Proceedingsent://SD_ILS/0/SD_ILS:4856762024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bondavalli, Andrea. editor. Ceccarelli, Andrea. editor. Ortmeier, Frank. editor. (orcid)0000-0001-6186-4142 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-10557-4">https://doi.org/10.1007/978-3-319-10557-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applicationsent://SD_ILS/0/SD_ILS:4892462024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-007-7663-0">https://doi.org/10.1007/978-94-007-7663-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamentals of reliability engineering : applications in multistage interconnection networksent://SD_ILS/0/SD_ILS:3420102024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Gunawan, Indra.<br/>Preferred Shelf Number ONLINE(342010.1)<br/>Electronic Access Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a>
Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079">http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079</a>
Ebook Library <a href="http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0">http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0</a>
ebrary <a href="http://site.ebrary.com/id/10843879">http://site.ebrary.com/id/10843879</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability prediction from burn-in data fit to reliability modelsent://SD_ILS/0/SD_ILS:3559212024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bernstein, Joseph.<br/>Preferred Shelf Number ONLINE(355921.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128007471">http://www.sciencedirect.com/science/book/9780128007471</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Flash Memories Economic Principles of Performance, Cost and Reliability Optimizationent://SD_ILS/0/SD_ILS:4888482024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Richter, Detlev. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-007-6082-0">https://doi.org/10.1007/978-94-007-6082-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of safety-critical systems : theory and applicationent://SD_ILS/0/SD_ILS:3417732024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Rausand, Marvin.<br/>Preferred Shelf Number ONLINE(341773.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653">http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118776353">http://dx.doi.org/10.1002/9781118776353</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:3554852024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Ohring, Milton, 1936- Kasprzak, Lucian.<br/>Preferred Shelf Number ONLINE(355485.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 33rd International Conference, SAFECOM 2014, Florence, Italy, September 10-12, 2014. Proceedingsent://SD_ILS/0/SD_ILS:4828012024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bondavalli, Andrea. editor. Di Giandomenico, Felicita. editor. (orcid)0000-0002-8760-7299 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-10506-2">https://doi.org/10.1007/978-3-319-10506-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Availability, Reliability, and Security in Information Systems IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2014 and 4th InternationalWorkshop on Security and Cognitive Informatics for Homeland Defense, SeCIHD 2014, Fribourg, Switzerland, September 8-12, 2014. Proceedingsent://SD_ILS/0/SD_ILS:4890552024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Teufel, Stephanie. editor. A Min, Tjoa. editor. You, Illsun. editor. Weippl, Edgar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-10975-6">https://doi.org/10.1007/978-3-319-10975-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.ent://SD_ILS/0/SD_ILS:3052862024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Epperlein, Peter W.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118481882">http://dx.doi.org/10.1002/9781118481882</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applicationsent://SD_ILS/0/SD_ILS:3065662024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Wu, Bin, author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Rail human factors supporting reliability, safety and cost reductionent://SD_ILS/0/SD_ILS:2911072024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dadashi, Nastaran. Scott, Anita. Wilson, John R. Mills, Ann.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203759721">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Gas and oil reliability engineering modeling and analysisent://SD_ILS/0/SD_ILS:1459072024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Calixto, Eduardo.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Materials and Reliability Handbook for Semiconductor Optical and Electron Devicesent://SD_ILS/0/SD_ILS:3314782024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331478.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-4337-7">http://dx.doi.org/10.1007/978-1-4614-4337-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Availability, Reliability, and Security in Information Systems and HCI IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2013, Regensburg, Germany, September 2-6, 2013. Proceedingsent://SD_ILS/0/SD_ILS:3349582024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Cuzzocrea, Alfredo. editor. Kittl, Christian. editor. Simos, Dimitris E. editor. Weippl, Edgar. editor. Xu, Lida. editor.<br/>Preferred Shelf Number ONLINE(334958.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examplesent://SD_ILS/0/SD_ILS:3650012024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.<br/>Preferred Shelf Number ONLINE(365001.1)<br/>Electronic Access Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Stochastic Orders in Reliability and Risk In Honor of Professor Moshe Shakedent://SD_ILS/0/SD_ILS:3321492024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Li, Haijun. editor. Li, Xiaohu. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332149.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-6892-9">http://dx.doi.org/10.1007/978-1-4614-6892-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Physics and Engineering Time-To-Failure Modelingent://SD_ILS/0/SD_ILS:3326822024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332682.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Optimal Stochastic Control Schemes within a Structural Reliability Frameworkent://SD_ILS/0/SD_ILS:3328642024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Leira, Bernt J. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332864.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-01405-0">http://dx.doi.org/10.1007/978-3-319-01405-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedingsent://SD_ILS/0/SD_ILS:3350052024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bitsch, Friedemann. editor. Guiochet, Jérémie. editor. Kaâniche, Mohamed. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335005.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-40793-2">http://dx.doi.org/10.1007/978-3-642-40793-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Risk Evaluation of Wind Integrated Power Systemsent://SD_ILS/0/SD_ILS:3354842024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Billinton, Roy. editor. Karki, Rajesh. editor. Verma, Ajit Kumar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335484.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-81-322-0987-4">http://dx.doi.org/10.1007/978-81-322-0987-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Early Software Reliability Prediction A Fuzzy Logic Approachent://SD_ILS/0/SD_ILS:3355122024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Pandey, Ajeet Kumar. author. Goyal, Neeraj Kumar. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335512.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-81-322-1176-1">http://dx.doi.org/10.1007/978-81-322-1176-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality, Reliability, Security and Robustness in Heterogeneous Networks 9th International Conference, QShine 2013, Greader Noida, India, January 11-12, 2013, Revised Selected Papersent://SD_ILS/0/SD_ILS:3345052024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Singh, Karan. editor. Awasthi, Amit K. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334505.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-37949-9">http://dx.doi.org/10.1007/978-3-642-37949-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Pattern recognition for reliability assessment of water distribution networksent://SD_ILS/0/SD_ILS:2853852024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Trifunovi?, Nemanja.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781466558021">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Using the Weibull distribution reliability, modeling, and inferenceent://SD_ILS/0/SD_ILS:2994792024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor McCool, John, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=388380">Connect to MyiLibrary resource.</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118351994">http://dx.doi.org/10.1002/9781118351994</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=51285">http://www.books24x7.com/marc.asp?bookid=51285</a>
ebrary <a href="http://site.ebrary.com/id/10593122">http://site.ebrary.com/id/10593122</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=894399">http://swb.eblib.com/patron/FullRecord.aspx?p=894399</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Importance measures in reliability, risk, and optimization principles and applicationsent://SD_ILS/0/SD_ILS:2993862024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Kuo, Way, 1951- Zhu, Xiaoyan.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10559415">http://site.ebrary.com/lib/alltitles/Doc?id=10559415</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systemsent://SD_ILS/0/SD_ILS:3054622024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bauer, Eric. Adams, Randee. Eustace, Dan. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119941378">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systemsent://SD_ILS/0/SD_ILS:2493512024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bauer, Eric. Adams, Randee. Eustace, Dan.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliabilityent://SD_ILS/0/SD_ILS:1738162024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Levinson, David M. editor. Liu, Henry X. editor. Bell, Michael. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Power Electronic Packaging Design, Assembly Process, Reliability and Modelingent://SD_ILS/0/SD_ILS:1738412024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Liu, Yong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papersent://SD_ILS/0/SD_ILS:1966482024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Zhang, Xi. editor. Qiao, Daji. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-29222-4">http://dx.doi.org/10.1007/978-3-642-29222-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 31st International Conference, SAFECOMP 2012, Magdeburg, Germany, September 25-28, 2012. Proceedingsent://SD_ILS/0/SD_ILS:1974202024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Ortmeier, Frank. editor. Daniel, Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33678-2">http://dx.doi.org/10.1007/978-3-642-33678-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, Availability and Serviceability of Networks-on-Chipent://SD_ILS/0/SD_ILS:1737792024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Cota, Érika. author. Morais Amory, Alexandre. author. Soares Lubaszewski, Marcelo. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0791-1">http://dx.doi.org/10.1007/978-1-4614-0791-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Non-Destructive Assessment of Concrete Structures: Reliability and Limits of Single and Combined Techniques State-of-the-Art Report of the RILEM Technical Committee 207-INRent://SD_ILS/0/SD_ILS:2064442024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Breysse, Denys. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-2736-6">http://dx.doi.org/10.1007/978-94-007-2736-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Multidisciplinary Research and Practice for Information Systems IFIP WG 8.4, 8.9/TC 5 International Cross-Domain Conference and Workshop on Availability, Reliability, and Security, CD-ARES 2012, Prague, Czech Republic, August 20-24, 2012. Proceedingsent://SD_ILS/0/SD_ILS:1972272024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Quirchmayr, Gerald. editor. Basl, Josef. editor. You, Ilsun. editor. Xu, Lida. editor. Weippl, Edgar. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-32498-7">http://dx.doi.org/10.1007/978-3-642-32498-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security SAFECOMP 2012 Workshops: Sassur, ASCoMS, DESEC4LCCI, ERCIM/EWICS, IWDE, Magdeburg, Germany, September 25-28, 2012. Proceedingsent://SD_ILS/0/SD_ILS:1974192024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Ortmeier, Frank. editor. Daniel, Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33675-1">http://dx.doi.org/10.1007/978-3-642-33675-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electric utility resource planning economics, reliability, and decision-makingent://SD_ILS/0/SD_ILS:2907802024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Sim, Steven.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439884096">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability in Scientific Research Improving the Dependability of Measurements, Calculations, Equipment, and Softwareent://SD_ILS/0/SD_ILS:2373542024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Walker, I. R..<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511780608">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probability, statistics, and reliability for engineers and scientistsent://SD_ILS/0/SD_ILS:3129152024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Ayyub, Bilal M., author. McCuen, Richard H., 1941-<br/>Preferred Shelf Number ONLINE(312915.1)<br/>Electronic Access Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpPSRESE01">http://app.knovel.com/web/toc.v/cid:kpPSRESE01</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Modeling and simulation for microelectronic packaging assembly manufacture, reliability, and testingent://SD_ILS/0/SD_ILS:2986532024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Liu, S. (Sheng), 1963- Liu, Yong, 1962- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470827826">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Spacecraft reliability and multi-state failures a statistical approachent://SD_ILS/0/SD_ILS:3057212024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Saleh, Joseph H., 1971- Castet, Jean-François. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697462">Click here to view book</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41710">http://www.books24x7.com/marc.asp?bookid=41710</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Engineering Basic Concepts and Applications in ICTent://SD_ILS/0/SD_ILS:1945502024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Lazzaroni, Massimo. author. Cristaldi, Loredana. author. Peretto, Lorenzo. author. Rinaldi, Paola. author. Catelani, Marcantonio. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-20983-3">http://dx.doi.org/10.1007/978-3-642-20983-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Assessment of Power System Reliability Methods and Applicationsent://SD_ILS/0/SD_ILS:1685692024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Čepin, Marko. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-688-7">http://dx.doi.org/10.1007/978-0-85729-688-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architecturesent://SD_ILS/0/SD_ILS:1725302024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6217-1">http://dx.doi.org/10.1007/978-1-4419-6217-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 30th International Conference,SAFECOMP 2011, Naples, Italy, September 19-22, 2011. Proceedingsent://SD_ILS/0/SD_ILS:1955862024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Flammini, Francesco. editor. Bologna, Sandro. editor. Vittorini, Valeria. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-24270-0">http://dx.doi.org/10.1007/978-3-642-24270-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality and Reliability of Large-Eddy Simulations IIent://SD_ILS/0/SD_ILS:2057842024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Salvetti, Maria Vittoria. editor. Geurts, Bernard. editor. Meyers, Johan. editor. Sagaut, Pierre. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-0231-8">http://dx.doi.org/10.1007/978-94-007-0231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Availability, Reliability and Security for Business, Enterprise and Health Information Systems IFIP WG 8.4/8.9 International Cross Domain Conference and Workshop, ARES 2011, Vienna, Austria, August 22-26, 2011. Proceedingsent://SD_ILS/0/SD_ILS:1953022024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Tjoa, A Min. editor. Quirchmayr, Gerald. editor. You, Ilsun. editor. Xu, Lida. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-23300-5">http://dx.doi.org/10.1007/978-3-642-23300-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Adhesives technology for electronic applications materials, processing, reliabilityent://SD_ILS/0/SD_ILS:1460142024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Licari, James J., 1930- Swanson, Dale W.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, Maintainability and Risk Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.ent://SD_ILS/0/SD_ILS:1491762024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Smith, David J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, maintainability, and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:4594222024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Smith, David J. (David John), 1943 June 22-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety and reliability of industrial products, systems and structuresent://SD_ILS/0/SD_ILS:2883272024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Guedes Soares, Carlos.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203818657">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical reliability engineering and analysis for system design and life-cycle sustainmentent://SD_ILS/0/SD_ILS:2860842024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Wessels, William R.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420094404">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mining equipment and systems theory and practice of exploitation and reliabilityent://SD_ILS/0/SD_ILS:2864972024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Czaplicki, Jacek M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203852804">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design for reliability information and computer-based systemsent://SD_ILS/0/SD_ILS:2498792024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bauer, Eric.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mathematical and Statistical Models and Methods in Reliability Applications to Medicine, Finance, and Quality Controlent://SD_ILS/0/SD_ILS:1683332024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Rykov, V.V. editor. Balakrishnan, N. editor. Nikulin, M.S. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4971-5">http://dx.doi.org/10.1007/978-0-8176-4971-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Physics and Engineering Time-To-Failure Modelingent://SD_ILS/0/SD_ILS:1725712024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor McPherson, J.W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Multi-state System Reliability Analysis and Optimization for Engineers and Industrial Managersent://SD_ILS/0/SD_ILS:1762212024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Lisnianski, Anatoly. author. Frenkel, Ilia. author. Ding, Yi. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-320-6">http://dx.doi.org/10.1007/978-1-84996-320-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 29th International Conference, SAFECOMP 2010, Vienna, Austria, September 14-17, 2010. Proceedingsent://SD_ILS/0/SD_ILS:1930402024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Schoitsch, Erwin. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-15651-9">http://dx.doi.org/10.1007/978-3-642-15651-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Degradation Modeling Applications to Reliability, Survival Analysis, and Financeent://SD_ILS/0/SD_ILS:1683212024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Nikulin, M.S. editor. Limnios, Nikolaos. editor. Balakrishnan, N. editor. Kahle, Waltraud. editor. Huber-Carol, Catherine. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4924-1">http://dx.doi.org/10.1007/978-0-8176-4924-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probability and Statistical Models Foundations for Problems in Reliability and Financial Mathematicsent://SD_ILS/0/SD_ILS:1683372024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Gupta, Arjun K. author. Zeng, Wei-Bin. author. Wu, Yanhong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4987-6">http://dx.doi.org/10.1007/978-0-8176-4987-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Calculation of Roundabouts Capacity, Waiting Phenomena and Reliabilityent://SD_ILS/0/SD_ILS:1909852024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Mauro, Raffaele. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-04551-6">http://dx.doi.org/10.1007/978-3-642-04551-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Process risk and reliability management operational integrity managementent://SD_ILS/0/SD_ILS:1472192024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Sutton, Ian S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Data Analysis Theory and Applications to Reliability and Inference, Data Mining, Bioinformatics, Lifetime Data, and Neural Networksent://SD_ILS/0/SD_ILS:1682922024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Skiadas, Christos H. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4799-5">http://dx.doi.org/10.1007/978-0-8176-4799-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Power distribution system reliability practical methods and applicationsent://SD_ILS/0/SD_ILS:2495632024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Chowdhury, Ali A. Koval, D. O. (Don Orest)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability analysis and prediction with warranty data issues, strategies, and methodsent://SD_ILS/0/SD_ILS:2860482024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Rai, Bharatendra K. Singh, Nanua.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439803264">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Corrosion, wear, fatigue, and reliability of ceramics a collection of papers presented at the 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008, Daytona Beach, Floridaent://SD_ILS/0/SD_ILS:2974572024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.) Salem, J. A. (Jonathan A.), 1960- Fuller, Edwin R. Ohji, T. (Tatsuki) Wereszczak, Andrew.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470456347">http://dx.doi.org/10.1002/9780470456347</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297839">http://site.ebrary.com/lib/alltitles/Doc?id=10297839</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human reliability, error, and human factors in engineering maintenance with reference to aviation and power generationent://SD_ILS/0/SD_ILS:2868932024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439803844">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Robust design methodology for reliability exploring the effects of variation and uncertaintyent://SD_ILS/0/SD_ILS:2983962024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bergman, Bo, 1943- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of Reliability, Availability, Maintainability and Safety in Engineering Designent://SD_ILS/0/SD_ILS:1757452024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Stapelberg, Rudolph Frederick. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-175-6">http://dx.doi.org/10.1007/978-1-84800-175-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Machine Learning in Cyber Trust Security, Privacy, and Reliabilityent://SD_ILS/0/SD_ILS:1679002024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Yu, Philip S. editor. Tsai, Jeffrey J. P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-88735-7">http://dx.doi.org/10.1007/978-0-387-88735-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 28th International Conference, SAFECOMP 2009, Hamburg, Germany, September 15-18, 2009. Proceedingsent://SD_ILS/0/SD_ILS:1909602024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Buth, Bettina. editor. Rabe, Gerd. editor. Seyfarth, Till. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-04468-7">http://dx.doi.org/10.1007/978-3-642-04468-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality of Service in Heterogeneous Networks 6th International ICST Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2009 and 3rd International Workshop on Advanced Architectures and Algorithms for Internet Delivery and Applications, AAA-IDEA 2009, Las Palmas, Gran Canaria, November 23-25, 2009 Proceedingsent://SD_ILS/0/SD_ILS:1914262024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bartolini, Novella. editor. Nikoletseas, Sotiris. editor. Sinha, Prasun. editor. Cardellini, Valeria. editor. Mahanti, Anirban. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-10625-5">http://dx.doi.org/10.1007/978-3-642-10625-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lubrication and maintenance of industrial machinery best practices and reliabilityent://SD_ILS/0/SD_ILS:2896492024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Gresham, Robert M. Totten, George E.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420089363">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mathematical methods in survival analysis, reliability and quality of lifeent://SD_ILS/0/SD_ILS:2975432024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Huber, Catherine.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470610985">http://dx.doi.org/10.1002/9780470610985</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability technology, human error, and quality in health careent://SD_ILS/0/SD_ILS:2850362024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420065596">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Next Generation Wireless LANs Throughput, Robustness, and Reliability in 802.11nent://SD_ILS/0/SD_ILS:2360242024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Perahia, Eldad. Stacey, Robert.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511541032">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Tutorial on hardware and software reliability, maintainability, and availabilityent://SD_ILS/0/SD_ILS:2498142024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Schneidewind, Norman.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540</a>
IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliabilityent://SD_ILS/0/SD_ILS:1839932024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bertsche, Bernd. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-34282-3">http://dx.doi.org/10.1007/978-3-540-34282-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Developments in Telecommunications With a Focus on SS7 Network Reliabilityent://SD_ILS/0/SD_ILS:1873292024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Rufa, Gerhard. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74986-8">http://dx.doi.org/10.1007/978-3-540-74986-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 27th International Conference, SAFECOMP 2008 Newcastle upon Tyne, UK, September 22-25, 2008 Proceedingsent://SD_ILS/0/SD_ILS:1888942024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Harrison, Michael D. editor. Sujan, Mark-Alexander. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-87698-4">http://dx.doi.org/10.1007/978-3-540-87698-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysisent://SD_ILS/0/SD_ILS:1670302024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Limnios, Nikolaos. author. Barbu, Vlad Stefan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-73173-5">http://dx.doi.org/10.1007/978-0-387-73173-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Engineering design reliability applications for the aerospace, automotive, and ship industriesent://SD_ILS/0/SD_ILS:1530402024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren. CRC Press.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Margins of error a study of reliability in survey measurementent://SD_ILS/0/SD_ILS:2969962024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Alwin, Duane F. (Duane Francis), 1944- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html">http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470146316">http://dx.doi.org/10.1002/9780470146316</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical plant failure analysis a guide to understanding machinery deterioration and improving equipment reliabilityent://SD_ILS/0/SD_ILS:2866202024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Sachs, Neville W.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420020007">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packagingent://SD_ILS/0/SD_ILS:1659002024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>System Signatures and their Applications in Engineering Reliabilityent://SD_ILS/0/SD_ILS:1668812024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Samaniego, Francisco J. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-71797-5">http://dx.doi.org/10.1007/978-0-387-71797-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A Guide to Lead-free Solders Physical Metallurgy and Reliabilityent://SD_ILS/0/SD_ILS:1753732024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Evans, John W. author. Engelmaier, Werner. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 26th International Conference, SAFECOMP 2007, Nuremberg, Germany, September 18-21, 2007. Proceedingsent://SD_ILS/0/SD_ILS:1873352024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Saglietti, Francesca. editor. Oster, Norbert. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-75101-4">http://dx.doi.org/10.1007/978-3-540-75101-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computational Intelligence in Reliability Engineering Evolutionary Techniques in Reliability Analysis and Optimizationent://SD_ILS/0/SD_ILS:1845342024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Levitin, Gregory. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37368-1">http://dx.doi.org/10.1007/978-3-540-37368-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computational Intelligence in Reliability Engineering New Metaheuristics, Neural and Fuzzy Techniques in Reliabilityent://SD_ILS/0/SD_ILS:1845352024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Levitin, Gregory. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37372-8">http://dx.doi.org/10.1007/978-3-540-37372-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, Life Testing and the Prediction of Service Lives For Engineers and Scientistsent://SD_ILS/0/SD_ILS:1664112024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Saunders, Sam C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-48538-6">http://dx.doi.org/10.1007/978-0-387-48538-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semi-Markov Risk Models for Finance, Insurance and Reliabilityent://SD_ILS/0/SD_ILS:1667612024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Jacques, Janssen. author. Raimondo, Manca. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-70730-1">http://dx.doi.org/10.1007/0-387-70730-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Risk-based reliability analysis and generic principles for risk reductionent://SD_ILS/0/SD_ILS:1489562024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Todinov, M. T.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>IUTAM Symposium on Mechanics and Reliability of Actuating Materials Proceedings of the IUTAM Symposium held in Beijing, China, 1–3 September, 2004ent://SD_ILS/0/SD_ILS:1690882024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Yang, W. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-4131-4">http://dx.doi.org/10.1007/1-4020-4131-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 25th International Conference, SAFECOMP 2006, Gdansk, Poland, September 27-29, 2006. Proceedingsent://SD_ILS/0/SD_ILS:1848592024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Górski, Janusz. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11875567">http://dx.doi.org/10.1007/11875567</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Adhesives technology for electronic applications materials, processes, reliabilityent://SD_ILS/0/SD_ILS:2564612024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Licari, James J., 1930- Swanson, Dale W.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815515135">http://www.sciencedirect.com/science/book/9780815515135</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Axiomatic quality integrating axiomatic design with six-sigma, reliability, and quality engineeringent://SD_ILS/0/SD_ILS:3016722024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor El-Haik, Basem.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access OverDrive (PDF) <a href="http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50">http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=227550">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=227550</a>
John Wiley <a href="http://dx.doi.org/10.1002/0471714682">http://dx.doi.org/10.1002/0471714682</a>
Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpAQIADSS2">http://app.knovel.com/web/toc.v/cid:kpAQIADSS2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Robust communications software extreme availability, reliability and scalability for carrier-grade systemsent://SD_ILS/0/SD_ILS:2956482024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Utas, Greg. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470011793">http://dx.doi.org/10.1002/0470011793</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, maintainability and risk practical methods for engineersent://SD_ILS/0/SD_ILS:2548542024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Smith, David John, 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 24th International Conference, SAFECOMP 2005, Fredrikstad, Norway, September 28-30, 2005. Proceedingsent://SD_ILS/0/SD_ILS:1830682024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Winther, Rune. editor. Gran, Bjørn Axel. editor. Dahll, Gustav. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11563228">http://dx.doi.org/10.1007/11563228</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Ranking and Selection, Multiple Comparisons, and Reliability Methodology and Applicationsent://SD_ILS/0/SD_ILS:1681182024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Balakrishnan, N. editor. Nagaraja, H. N. editor. Kannan, N. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138793">http://dx.doi.org/10.1007/b138793</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design and analysis of accelerated tests for mission critical reliabilityent://SD_ILS/0/SD_ILS:2882352024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor LuValle, Michael J. Lefevre, Bruce G. Kannan, SriRaman.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203492031">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability verification, testing and analysis in engineering designent://SD_ILS/0/SD_ILS:2856232024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Wasserman, Gary S., 1951-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203910443">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, survivability and quality of large scale telecommunications systemsent://SD_ILS/0/SD_ILS:3010932024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Stavroulakis, Peter. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470860812">http://dx.doi.org/10.1002/0470860812</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Coating materials for electronic applications polymers, processes, reliability, testingent://SD_ILS/0/SD_ILS:2548442024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Licari, James J., 1930-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815514923">http://www.sciencedirect.com/science/book/9780815514923</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mechanical reliability improvement probability and statistics for experimental testingent://SD_ILS/0/SD_ILS:2864602024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Little, R. E. (Robert Eugene), 1933- Kosikowski, D. M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203910993">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Risk, Reliability, Uncertainty, and Robustness of Water Resource Systemsent://SD_ILS/0/SD_ILS:2366372024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Bogardi, Janos J.. Kundzewicz, Zbigniew W..<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511546006">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of computer systems and networks fault tolerance, analysis and designent://SD_ILS/0/SD_ILS:3014662024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Shooman, Martin L. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/047122460X">http://dx.doi.org/10.1002/047122460X</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html">http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fault detectability in DWDM toward higher signal quality & system reliabilityent://SD_ILS/0/SD_ILS:2497132024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Kartalopoulos, Stamatios V.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Engineering maintainability how to design for reliability and easy maintenanceent://SD_ILS/0/SD_ILS:2543372024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152576">http://www.sciencedirect.com/science/book/9780884152576</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systemsent://SD_ILS/0/SD_ILS:2495942024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Pukite, Jan, 1928- Pukite, Paul.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:2563092024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Ohring, Milton, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Guardians of science fairness and reliability of peer reviewent://SD_ILS/0/SD_ILS:3005182024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Daniel, Hans-Dieter, 1955- Russey, William E. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/29859865.html">http://catalog.hathitrust.org/api/volumes/oclc/29859865.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/3527602208">http://dx.doi.org/10.1002/3527602208</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability analysis and prediction a methodology oriented treatmentent://SD_ILS/0/SD_ILS:2552442024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Misra, Krishna B., 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444896063">http://www.sciencedirect.com/science/book/9780444896063</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Guidelines for process equipment reliability data with data tablesent://SD_ILS/0/SD_ILS:3000612024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470938355">http://dx.doi.org/10.1002/9780470938355</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability theory and models stochastic failure models, optimal maintenance policies, life testing, and structuresent://SD_ILS/0/SD_ILS:2561192024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Abdel-Hameed, Mohamed S. Çınlar, E. (Erhan), 1941- Quinn, Joseph.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120414208">http://www.sciencedirect.com/science/book/9780120414208</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mathematical models for the study of the reliability of systemsent://SD_ILS/0/SD_ILS:2566732024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Kaufmann, A. (Arnold), 1911- Grouchko, Daniel. Cruon, R.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124023703">http://www.sciencedirect.com/science/book/9780124023703</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Graph theory in modern engineering computer aided design, control, optimization, reliability analysisent://SD_ILS/0/SD_ILS:2567272024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Henley, Ernest J. Williams, R. A. (Richard A.)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123408501">http://www.sciencedirect.com/science/book/9780123408501</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Implosion : lessons from national security, high reliability spacecraft, electronics, and the forces which changed thement://SD_ILS/0/SD_ILS:2493412024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Temple, L. Parker.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6480472">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6480472</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Technical System Maintenance Delay-Time-Based Modellingent://SD_ILS/0/SD_ILS:4834112024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Werbińska-Wojciechowska, Sylwia. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-10788-8">https://doi.org/10.1007/978-3-030-10788-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Engineering Design under Uncertainty and Health Prognosticsent://SD_ILS/0/SD_ILS:4873892024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Hu, Chao. author. Youn, Byeng D. author. Wang, Pingfeng. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-92574-5">https://doi.org/10.1007/978-3-319-92574-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Risk-Based Engineering An Integrated Approach to Complex Systems—Special Reference to Nuclear Plantsent://SD_ILS/0/SD_ILS:4007262024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Varde, Prabhakar V. author. Pecht, Michael G. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-0090-5">https://doi.org/10.1007/978-981-13-0090-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advanced Maintenance Policies for Shock and Damage Modelsent://SD_ILS/0/SD_ILS:3991782024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-70456-2">https://doi.org/10.1007/978-3-319-70456-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Extended Warranties, Maintenance Service and Lease Contracts Modeling and Analysis for Decision-Makingent://SD_ILS/0/SD_ILS:4843742024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Murthy, D.N.Prabhakar. author. Jack, Nat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4471-6440-1">https://doi.org/10.1007/978-1-4471-6440-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Random Maintenance Policiesent://SD_ILS/0/SD_ILS:4879232024-11-19T21:22:25Z2024-11-19T21:22:25ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4471-6575-0">https://doi.org/10.1007/978-1-4471-6575-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>