Search Results for Reliability. - Narrowed by: Online Library
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ps$003d300$0026isd$003dtrue?dt=list
2026-01-10T16:30:52Z
Reliability
ent://SD_ILS/0/SD_ILS:233427
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Meyer, J. Patrick.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Structural reliability
ent://SD_ILS/0/SD_ILS:297978
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Lemaire, Maurice. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability engineering
ent://SD_ILS/0/SD_ILS:341870
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kapur, Kailash C., 1941- author. Pecht, Michael, author.<br/>Preferred Shelf Number ONLINE(341870.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a>
MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a>
Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
MEMS Reliability
ent://SD_ILS/0/SD_ILS:172486
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Hartzell, Allyson L. author. da Silva, Mark G. author. Shea, Herbert R. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Bayesian Reliability
ent://SD_ILS/0/SD_ILS:167542
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Hamada, Michael S. author. Wilson, Alyson G. author. Reese, C. Shane. author. Martz, Harry F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability fundamentals
ent://SD_ILS/0/SD_ILS:255215
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Cătuneanu, Vasile M. Mihalache, Adrian.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Ensuring software reliability
ent://SD_ILS/0/SD_ILS:542468
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Neufelder, Ann Marie, 1960- author.<br/>Preferred Shelf Number QA76.76 .R44 N48 1992<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439832752">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
System Software Reliability
ent://SD_ILS/0/SD_ILS:175367
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Pham, Hoang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design for reliability
ent://SD_ILS/0/SD_ILS:249382
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Raheja, Dev. Gullo, Louis J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Practical system reliability
ent://SD_ILS/0/SD_ILS:153146
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of MEMS
ent://SD_ILS/0/SD_ILS:303632
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Tsuchiya, Toshiyuki. Tabata, Osamu, 1956- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design for reliability
ent://SD_ILS/0/SD_ILS:543493
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Crow, Dana. Feinberg, Alec.<br/>Preferred Shelf Number TK7836 .D473 2001<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315220192">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Practical reliability engineering
ent://SD_ILS/0/SD_ILS:305563
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author O'Connor, Patrick P. Kleyner, Andre. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Improving machinery reliability
ent://SD_ILS/0/SD_ILS:153828
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bloch, Heinz P., 1933-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probabilistic reliability models
ent://SD_ILS/0/SD_ILS:299523
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Ushakov, I. A. (Igorʹ Alekseevich)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a>
Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Statistical reliability engineering
ent://SD_ILS/0/SD_ILS:295099
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Pavlov, I. V. Ushakov, I. A. (Igorʹ Alekseevich) Chakravarty, Sumantra. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probabilistic reliability engineering
ent://SD_ILS/0/SD_ILS:295101
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Ushakov, I. A. (Igorʹ Alekseevich) Falk, James. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Optimal Maintenance
ent://SD_ILS/0/SD_ILS:175380
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Wang, Hongzhou. author. Pham, Hoang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Maintenance Theory of Reliability
ent://SD_ILS/0/SD_ILS:175323
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Safety Engineering
ent://SD_ILS/0/SD_ILS:176193
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Verma, Ajit Kumar. author. Srividya, Ajit. author. Karanki, Durga Rao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Engineering design reliability handbook
ent://SD_ILS/0/SD_ILS:544208
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren.<br/>Preferred Shelf Number TA174 .E544 2005<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135513825">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Reliability of large systems
ent://SD_ILS/0/SD_ILS:254513
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kołowrocki, Krzysztof.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power-system reliability calculations
ent://SD_ILS/0/SD_ILS:220175
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Billinton, Roy. Ringlee, Robert J., joint author. Wood, Allen J., joint author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Circuit Design for Reliability
ent://SD_ILS/0/SD_ILS:529164
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Reis, Ricardo. editor. Cao, Yu. editor. Wirth, Gilson. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-4078-9">https://doi.org/10.1007/978-1-4614-4078-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic Models in Reliability
ent://SD_ILS/0/SD_ILS:332363
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Aven, Terje. author. Jensen, Uwe. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332363.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Network Reliability and Resilience
ent://SD_ILS/0/SD_ILS:195005
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Gertsbakh, Ilya. author. Shpungin, Yoseph. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Life cycle reliability engineering
ent://SD_ILS/0/SD_ILS:296926
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Yang, Guangbin, 1964- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied reliability for engineers
ent://SD_ILS/0/SD_ILS:565385
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dhillon, B. S. (Balbir S.), 1947- author.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003132103">https://www.taylorfrancis.com/books/9781003132103</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reinforced concrete structural reliability
ent://SD_ILS/0/SD_ILS:543776
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author El-Reedy, Mohamed Abdallah., author.<br/>Preferred Shelf Number TA683 .E47 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439874172">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Quantile-Based Reliability Analysis
ent://SD_ILS/0/SD_ILS:330556
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Nair, N. Unnikrishnan. author. Sankaran, P.G. author. Balakrishnan, N. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(330556.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electronic thin-film reliability
ent://SD_ILS/0/SD_ILS:278156
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Tu, K. N. (King-Ning), 1937-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electric power distribution reliability
ent://SD_ILS/0/SD_ILS:543516
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Brown, Richard E., 1969, author.<br/>Preferred Shelf Number TK3091 .B76 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315222332">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Reliability-based Structural Design
ent://SD_ILS/0/SD_ILS:175421
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Choi, Seung-Kyum. author. Canfield, Robert A. author. Grandhi, Ramana V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Six Sigma
ent://SD_ILS/0/SD_ILS:165709
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kumar, U Dinesh. author. Crocker, John. author. Chitra, T. author. Saranga, Haritha. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electric power distribution reliability
ent://SD_ILS/0/SD_ILS:539124
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Brown, Richard E., 1969- author.<br/>Preferred Shelf Number TK3091 .B76 2002 EB<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429164682">https://www.taylorfrancis.com/books/9780429164682</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Lubrication and reliability handbook
ent://SD_ILS/0/SD_ILS:256333
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Neale, M. J. (Michael John)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fatigue design and reliability
ent://SD_ILS/0/SD_ILS:254466
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland) Marquis, G. (Gary) Solin, J. European Structural Integrity Society.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of reliability engineering
ent://SD_ILS/0/SD_ILS:295100
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Ushakov, I. A. (Igorʹ Alekseevich) Harrison, Robert A. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applications in Reliability and Statistical Computing
ent://SD_ILS/0/SD_ILS:527152
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Pham, Hoang. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-21232-1">https://doi.org/10.1007/978-3-031-21232-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Introduction to Quality and Reliability Engineering
ent://SD_ILS/0/SD_ILS:529803
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Jiang, Renyan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-662-47215-6">https://doi.org/10.1007/978-3-662-47215-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Innovations in Power Systems Reliability
ent://SD_ILS/0/SD_ILS:168417
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Anders, George. editor. Vaccaro, Alfredo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Nonparametric Statistics in Reliability
ent://SD_ILS/0/SD_ILS:168426
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Gámiz, M. Luz. author. Kulasekera, K. B. author. Limnios, Nikolaos. author. Lindqvist, Bo Henry. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Software Reliability Assessment with OR Applications
ent://SD_ILS/0/SD_ILS:168454
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kapur, P.K. author. Pham, Hoang. author. Gupta, A. author. Jha, P.C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-204-9">http://dx.doi.org/10.1007/978-0-85729-204-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fatigue and Fracture Reliability Engineering
ent://SD_ILS/0/SD_ILS:168458
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Xiong, J.J. author. Shenoi, R.A. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-218-6">http://dx.doi.org/10.1007/978-0-85729-218-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Mining Equipment Reliability, Maintainability, and Safety
ent://SD_ILS/0/SD_ILS:144346
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dhillon, Balbir S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advanced Reliability Models and Maintenance Policies
ent://SD_ILS/0/SD_ILS:175800
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-294-4">http://dx.doi.org/10.1007/978-1-84800-294-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Product Reliability Specification and Performance
ent://SD_ILS/0/SD_ILS:175790
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Murthy, Dodderi Narshima Prabhakar. author. Rausand, Marvin. author. Østerås, Trond. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-271-5">http://dx.doi.org/10.1007/978-1-84800-271-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Predictive Analytics in System Reliability
ent://SD_ILS/0/SD_ILS:526781
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kumar, Vijay. editor. Pham, Hoang. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-05347-4">https://doi.org/10.1007/978-3-031-05347-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Improving product reliability strategies and implementation
ent://SD_ILS/0/SD_ILS:295695
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Levin, Mark, 1959- Kalal, Ted T.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://ezproxy.lib.monash.edu.au/login?url=http://catdir.loc.gov/catdir/description/wiley039/2003045083.html">Full text available from Wiley InterScience</a>
<a href="http://ezproxy.lib.monash.edu.au/login?url=http://dx.doi.org/10.1002/0470014024">Authentication may be required</a>
John Wiley <a href="http://dx.doi.org/10.1002/0470014024">http://dx.doi.org/10.1002/0470014024</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932">http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic models in reliability engineering
ent://SD_ILS/0/SD_ILS:554549
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Cui, Lirong, 1960- editor. Frenkel, Ilia, 1950- editor. Lisnianski, Anatoly, editor.<br/>Preferred Shelf Number TA169 .S759 2020 EB<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429331527">https://www.taylorfrancis.com/books/9780429331527</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
KRIGING IN SLOPE RELIABILITY ANALYSIS
ent://SD_ILS/0/SD_ILS:589037
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Liu, Lei-Lei. Li, Jing-Ze. Huang, Lei.<br/>Preferred Shelf Number TN272.7<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003475156">https://www.taylorfrancis.com/books/9781003475156</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability modelling with information measures
ent://SD_ILS/0/SD_ILS:562731
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Nair, N. Unnikrishnan, 1945- author. Sunoj, S. M., 1972- author. Rajesh, G., 1971- author.<br/>Preferred Shelf Number TA169 .N3526 2022 EB<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003309635">https://www.taylorfrancis.com/books/9781003309635</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
RELIABILITY ENGINEERING a life cycle approach.
ent://SD_ILS/0/SD_ILS:575297
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bradley, Edgar.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003326489">https://www.taylorfrancis.com/books/9781003326489</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Philosophies of structural safety and reliability
ent://SD_ILS/0/SD_ILS:582933
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Raĭzer, V. D. (Vladimir Davidovich), author. Elishakoff, Isaac, author.<br/>Preferred Shelf Number TA656<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003265993">https://www.taylorfrancis.com/books/9781003265993</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The reliability of generating data
ent://SD_ILS/0/SD_ILS:552847
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Krippendorff, Klaus, author.<br/>Preferred Shelf Number QA76.9 .Q36<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003112020">https://www.taylorfrancis.com/books/9781003112020</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Cloud reliability engineering : technologies and tools
ent://SD_ILS/0/SD_ILS:571108
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Raj, Pethuru, editor. Achary, Rathnakar, editor.<br/>Preferred Shelf Number QA76.585 .C568 2021<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003030973">https://www.taylorfrancis.com/books/9781003030973</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, maintainability, and safety for engineers
ent://SD_ILS/0/SD_ILS:590317
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dhillon, B. S., author.<br/>Preferred Shelf Number TS173<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429340574">https://www.taylorfrancis.com/books/9780429340574</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Aspect of Cloud Computing Environment
ent://SD_ILS/0/SD_ILS:399144
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kumar, Vikas. author. Vidhyalakshmi, R. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-3023-0">https://doi.org/10.1007/978-981-13-3023-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor Power Devices Physics, Characteristics, Reliability
ent://SD_ILS/0/SD_ILS:401906
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-70917-8">https://doi.org/10.1007/978-3-319-70917-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
In-Service Fatigue Reliability of Structures
ent://SD_ILS/0/SD_ILS:401041
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Petinov, Sergei V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-89318-1">https://doi.org/10.1007/978-3-319-89318-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality and Reliability in Analytical Chemistry.
ent://SD_ILS/0/SD_ILS:540933
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Baiulescu, George E., author.<br/>Preferred Shelf Number QD75.4 .Q34<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781420038576">https://www.taylorfrancis.com/books/e/9781420038576</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9780429127441">https://www.taylorfrancis.com/books/e/9780429127441</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429127441">https://www.taylorfrancis.com/books/9780429127441</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Wire Ropes Tension, Endurance, Reliability
ent://SD_ILS/0/SD_ILS:529516
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Feyrer, Klaus. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-642-54996-0">https://doi.org/10.1007/978-3-642-54996-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Risk and reliability in geotechnical engineering
ent://SD_ILS/0/SD_ILS:544526
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Ching, Jianye, editor. Phoon, Kok-Kwang, editor.<br/>Preferred Shelf Number TA706 .R48 2015<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781482227222">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Ternary Networks Reliability and Monte Carlo
ent://SD_ILS/0/SD_ILS:485508
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Gertsbakh, Ilya. author. Shpungin, Yoseph. author. Vaisman, Radislav. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06440-6">https://doi.org/10.1007/978-3-319-06440-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:489410
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of large and complex systems
ent://SD_ILS/0/SD_ILS:355886
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kołowrocki, Krzysztof, author.<br/>Preferred Shelf Number ONLINE(355886.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080999494">http://www.sciencedirect.com/science/book/9780080999494</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability models for engineers and scientists
ent://SD_ILS/0/SD_ILS:545739
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kaminskiy, Mark, 1946, author.<br/>Preferred Shelf Number TA169 .K36 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781466565937">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Computer system reliability : safety and usability
ent://SD_ILS/0/SD_ILS:547174
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dhillon, B. S., author.<br/>Preferred Shelf Number QA76.76 .R44 D495 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781466573130">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Analog IC Reliability in Nanometer CMOS
ent://SD_ILS/0/SD_ILS:331961
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331961.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-6163-0">http://dx.doi.org/10.1007/978-1-4614-6163-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electricity infrastructure reliability and vulnerabilities
ent://SD_ILS/0/SD_ILS:281073
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Guerritore, Walter B.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Accelerated reliability and durability testing technology
ent://SD_ILS/0/SD_ILS:297827
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Klyatis, Lev M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and availability of cloud computing
ent://SD_ILS/0/SD_ILS:249383
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor process reliability in practice
ent://SD_ILS/0/SD_ILS:293479
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Lead Free Solder Mechanics and Reliability
ent://SD_ILS/0/SD_ILS:173692
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Pang, John Hock Lye. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and maintenance : networks and systems
ent://SD_ILS/0/SD_ILS:546172
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Beichelt, Frank, 1942, author. Tittmann, Peter.<br/>Preferred Shelf Number TA169 .B45 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439826362">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Semiconductor packaging : materials interaction and reliability
ent://SD_ILS/0/SD_ILS:546600
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Chen, Andrea., author. Lo, Randy.<br/>Preferred Shelf Number TK7870.15 .C54 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439862070">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Measures of interobserver agreement and reliability
ent://SD_ILS/0/SD_ILS:539074
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Shoukri, M. M. (Mohamed M.), author. Shoukri, M. M. (Mohamed M.). Measures of interobserver agreement.<br/>Preferred Shelf Number RC71.3 .S478 2011<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439810811">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Multistate systems reliability theory with applications
ent://SD_ILS/0/SD_ILS:298781
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Natvig, Bent, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10469650">http://site.ebrary.com/lib/alltitles/Doc?id=10469650</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Functional Analysis Methods for Reliability Models
ent://SD_ILS/0/SD_ILS:176727
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Gupur, Geni. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-0348-0101-0">http://dx.doi.org/10.1007/978-3-0348-0101-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor Power Devices Physics, Characteristics, Reliability
ent://SD_ILS/0/SD_ILS:191586
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transportation systems reliability and safety
ent://SD_ILS/0/SD_ILS:539600
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number TA1145 .D453 2011<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439846414">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Human reliability assessment : theory and practice
ent://SD_ILS/0/SD_ILS:540046
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Spurgin, Anthony J., author.<br/>Preferred Shelf Number TA166 .S685 2010<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420068528">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:192824
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Safety and reliability of bridge structures
ent://SD_ILS/0/SD_ILS:545232
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Mahmoud, Khaled M.<br/>Preferred Shelf Number TG300 .M34 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135172435">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Mathematical models for systems reliability
ent://SD_ILS/0/SD_ILS:538905
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Epstein, Benjamin, 1918, author. Weissman, Ishay, 1940-<br/>Preferred Shelf Number TA169 .E67 2008<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420080834">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Silver Metallization Stability and Reliability
ent://SD_ILS/0/SD_ILS:175677
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Adams, Daniel. author. Alford, Terry L. author. Mayer, James W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:185203
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Critical Infrastructure Reliability and Vulnerability
ent://SD_ILS/0/SD_ILS:185336
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Murray, Alan T. editor. Grubesic, Tony H. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-68056-7">http://dx.doi.org/10.1007/978-3-540-68056-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Wire Ropes Tension, Endurance, Reliability
ent://SD_ILS/0/SD_ILS:183848
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Feyrer, K. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-33831-4">http://dx.doi.org/10.1007/978-3-540-33831-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Distribution reliability and power quality
ent://SD_ILS/0/SD_ILS:543499
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Short, T. A. (Tom A.), 1966- author.<br/>Preferred Shelf Number TK3091 .S465 2006<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420036480">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Maintainability, maintenance, and reliability for engineers
ent://SD_ILS/0/SD_ILS:545920
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number TA168 .D53 2006<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420006780">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Reliability and risk a Bayesian perspective
ent://SD_ILS/0/SD_ILS:296819
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Singpurwalla, Nozer D. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Accelerated quality and reliability solutions
ent://SD_ILS/0/SD_ILS:254415
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Klyatis, Lev M. Klyatis, Eugene L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic Ageing and Dependence for Reliability
ent://SD_ILS/0/SD_ILS:166017
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Lai, Chin-Diew. author. Xie, Min. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-34232-X">http://dx.doi.org/10.1007/0-387-34232-X</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, quality, and safety for engineers
ent://SD_ILS/0/SD_ILS:547810
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number TS173 .D495 2005<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135484071">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Case studies in reliability and maintenance
ent://SD_ILS/0/SD_ILS:300226
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Blischke, W. R., 1934- Murthy, D. N. P. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability modeling, prediction, and optimization
ent://SD_ILS/0/SD_ILS:300337
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Ceramics processing, reliability, tribology and wear.
ent://SD_ILS/0/SD_ILS:300592
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Müller, G. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/3527607293">http://dx.doi.org/10.1002/3527607293</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Medical device reliability and associated areas
ent://SD_ILS/0/SD_ILS:540912
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number R855.3 .D47 2000<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Design reliability : fundamentals and applications
ent://SD_ILS/0/SD_ILS:540572
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number TA174 .D4929 1999<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor memories technology, testing, and reliability
ent://SD_ILS/0/SD_ILS:249739
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Sharma, Ashok K. IEEE Solid-State Circuits Council.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
An elementary guide to reliability
ent://SD_ILS/0/SD_ILS:254325
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dummer, G. W. A. (Geoffrey William Arnold) Tooley, Michael H. Winton, R. C.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
New trends in system reliability evaluation
ent://SD_ILS/0/SD_ILS:255243
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Misra, Krishna B., 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Safety and Reliability Methodology and Applications.
ent://SD_ILS/0/SD_ILS:545362
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Preferred Shelf Number TA169.7<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429226823">https://www.taylorfrancis.com/books/9780429226823</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Interconnect Reliability in Advanced Memory Device Packaging
ent://SD_ILS/0/SD_ILS:526838
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-26708-6">https://doi.org/10.1007/978-3-031-26708-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic Processes with Applications to Reliability Theory
ent://SD_ILS/0/SD_ILS:168475
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Failure Rate Modelling for Reliability and Risk
ent://SD_ILS/0/SD_ILS:175868
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Shock and Damage Models in Reliability Theory
ent://SD_ILS/0/SD_ILS:175420
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Human Reliability and Error in Transportation Systems
ent://SD_ILS/0/SD_ILS:175578
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dhillon, B. S. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
System Reliability and Security Techniques and Methodologies.
ent://SD_ILS/0/SD_ILS:576623
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Iqbal, Javaid. Masoodi, Faheem Syeed. Ahmad Malik, Ishfaq. Khurshid, Shozab. Saraf, Iqra.<br/>Preferred Shelf Number QA76.9 .A25<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032624983">https://www.taylorfrancis.com/books/9781032624983</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied reliability, usability, and quality for engineers
ent://SD_ILS/0/SD_ILS:579176
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dhillon, B. S. (Balbir S.), 1947- author.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003298571">https://www.taylorfrancis.com/books/9781003298571</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Lifetime Reliability-aware Design of Integrated Circuits
ent://SD_ILS/0/SD_ILS:527089
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Raji, Mohsen. author. Ghavami, Behnam. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-15345-7">https://doi.org/10.1007/978-3-031-15345-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and safety of cable-supported bridges
ent://SD_ILS/0/SD_ILS:585766
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Lu, Naiwei, editor. Liu, Yang (Of Haerbin gong ye da xue), editor. Noori, Mohammad, editor.<br/>Preferred Shelf Number TG405<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003170594">https://www.taylorfrancis.com/books/9781003170594</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Safety-Critical Electrical Drives Topologies, Reliability, Performance
ent://SD_ILS/0/SD_ILS:401112
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bolvashenkov, Igor. author. Herzog, Hans-Georg. author. Frenkel, Ilia. author. Khvatskin, Lev. author. Lisnianski, Anatoly. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-89969-5">https://doi.org/10.1007/978-3-319-89969-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Risk and Reliability : Coastal and Hydraulic Engineering
ent://SD_ILS/0/SD_ILS:541176
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Reeve, Dominic, author.<br/>Preferred Shelf Number TC205 .R448 2014<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781482266351">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Solid State Lighting Reliability Components to Systems
ent://SD_ILS/0/SD_ILS:331314
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author van Driel, W.D. editor. Fan, X.J. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331314.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Process plant equipment operation, control, and reliability
ent://SD_ILS/0/SD_ILS:299085
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Holloway, Michael D., 1963- Nwaoha, Chikezie, 1984- Onyewuenyi, Oliver A., 1952-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118162569">http://onlinelibrary.wiley.com/book/10.1002/9781118162569</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118162569">http://dx.doi.org/10.1002/9781118162569</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Offshore Wind Turbines Reliability, availability and maintenance
ent://SD_ILS/0/SD_ILS:247956
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Tavner, Peter<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBRN013E">http://dx.doi.org/10.1049/PBRN013E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Telecommunications system reliability engineering, theory, and practice
ent://SD_ILS/0/SD_ILS:249397
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Ayers, Mark L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Compressors how to achieve high reliability & availability
ent://SD_ILS/0/SD_ILS:293579
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bloch, Heinz P., 1933- Geitner, Fred K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/compressors-how-to-achieve-high-reliability-availability">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Lead-free solders materials reliability for electronics
ent://SD_ILS/0/SD_ILS:305591
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Subramaniam, K. N., Ph. D. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119966203">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Hydrosystems engineering reliability assessment and risk analysis
ent://SD_ILS/0/SD_ILS:293215
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Tung, Yeou-Koung. Yen, Ben Chie, 1935- Melching, Charles S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability centered maintenance (RCM) implementation made simple
ent://SD_ILS/0/SD_ILS:293571
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bloom, Neil.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/reliability-centered-maintenance-rcm">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of Microtechnology Interconnects, Devices and Systems
ent://SD_ILS/0/SD_ILS:172420
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Liu, Johan. author. Salmela, Olli. author. Sarkka, Jussi. author. Morris, James E. author. Tegehall, Per-Erik. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolution
ent://SD_ILS/0/SD_ILS:191769
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Levi, Paul. author. Kernbach, Serge. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-11692-6">http://dx.doi.org/10.1007/978-3-642-11692-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability wearout mechanisms in advanced CMOS technologies
ent://SD_ILS/0/SD_ILS:249574
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solder Joint Reliability Prediction for Multiple Environments
ent://SD_ILS/0/SD_ILS:167673
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Perkins, Andrew E. author. Sitaraman, Suresh K. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VoIP handbook : applications, technologies, reliability, and security
ent://SD_ILS/0/SD_ILS:547478
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Ahson, Syed. Ilyas, Mohammad, 1953-<br/>Preferred Shelf Number TK5105.8865 .V658 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420070217">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Rules of thumb for maintenance and reliability engineers
ent://SD_ILS/0/SD_ILS:306517
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Smith, Ricky. Mobley, R. Keith, 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Rules of thumb for maintenance and reliability engineers
ent://SD_ILS/0/SD_ILS:149151
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Smith, Ricky. Mobley, R. Keith, 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality and Reliability of Large-Eddy Simulations
ent://SD_ILS/0/SD_ILS:170230
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Meyers, Johan. editor. Geurts, Bernard J. editor. Sagaut, Pierre. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8578-9">http://dx.doi.org/10.1007/978-1-4020-8578-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
New Computational Methods in Power System Reliability
ent://SD_ILS/0/SD_ILS:187983
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Elmakias, David. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-77812-7">http://dx.doi.org/10.1007/978-3-540-77812-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solder Joint Technology Materials, Properties, and Reliability
ent://SD_ILS/0/SD_ILS:166252
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Tu, King-Ning. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and risk models setting reliability requirements
ent://SD_ILS/0/SD_ILS:295900
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Todinov, M. T. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Practical reliability of electronic equipment and products
ent://SD_ILS/0/SD_ILS:545333
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Hnatek, Eugene R., author.<br/>Preferred Shelf Number TK7870.23 .H53 2003<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135564438">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Managing risk and reliability of process plants
ent://SD_ILS/0/SD_ILS:254721
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Tweeddale, Mark.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677349">http://www.sciencedirect.com/science/book/9780750677349</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
High reliability magnetic devices : design and fabrication
ent://SD_ILS/0/SD_ILS:547829
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author McLyman, Colonel William T., 1932, author.<br/>Preferred Shelf Number TK454.4 .M3 M35 2002<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135563738">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Cognitive reliability and error analysis method CREAM
ent://SD_ILS/0/SD_ILS:254433
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Hollnagel, Erik, 1941-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
System reliability theory models and statistical methods
ent://SD_ILS/0/SD_ILS:295270
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Høyland, Arnljot, 1924- Rausand, Marvin.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316900">http://dx.doi.org/10.1002/9780470316900</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html">http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/30072858.html">http://catalog.hathitrust.org/api/volumes/oclc/30072858.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electronics reliability and measurement technology nondestructive evaluation
ent://SD_ILS/0/SD_ILS:254151
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Heyman, Joseph S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Which-Is-Better (WIB): Problems in Reliability Theory
ent://SD_ILS/0/SD_ILS:526867
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Mizutani, Satoshi. author. Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-27316-2">https://doi.org/10.1007/978-3-031-27316-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Reliability and Maintainability Methods and Engineering Applications Essays in Honor of Professor Hong-Zhong Huang on his 60th Birthday
ent://SD_ILS/0/SD_ILS:527804
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Liu, Yu. editor. Wang, Dong. editor. Mi, Jinhua. editor. Li, He. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-28859-3">https://doi.org/10.1007/978-3-031-28859-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design of Mechanical Systems Accelerated Lifecycle Testing and Reliability
ent://SD_ILS/0/SD_ILS:526829
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Woo, Seongwoo. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-28938-5">https://doi.org/10.1007/978-3-031-28938-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Point Processes for Reliability Analysis Shocks and Repairable Systems
ent://SD_ILS/0/SD_ILS:402392
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Cha, Ji Hwan. author. Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-73540-5">https://doi.org/10.1007/978-3-319-73540-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Recent Advances in Multi-state Systems Reliability Theory and Applications
ent://SD_ILS/0/SD_ILS:401098
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. Karagrigoriou, Alex. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-63423-4">https://doi.org/10.1007/978-3-319-63423-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practice
ent://SD_ILS/0/SD_ILS:401845
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author De Felice, Fabio. editor. Petrillo, Antonella. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-62319-1">https://doi.org/10.1007/978-3-319-62319-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Human Reliability, Error, and Human Factors in Power Generation
ent://SD_ILS/0/SD_ILS:487643
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dhillon, B. S. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-04019-6">https://doi.org/10.1007/978-3-319-04019-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The Monte Carlo Simulation Method for System Reliability and Risk Analysis
ent://SD_ILS/0/SD_ILS:331017
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Zio, Enrico. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331017.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4588-2">http://dx.doi.org/10.1007/978-1-4471-4588-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Principles of Loads and Failure Mechanisms Applications in Maintenance, Reliability and Design
ent://SD_ILS/0/SD_ILS:331097
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Tinga, T. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331097.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4917-0">http://dx.doi.org/10.1007/978-1-4471-4917-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic Reliability and Maintenance Modeling Essays in Honor of Professor Shunji Osaki on his 70th Birthday
ent://SD_ILS/0/SD_ILS:331109
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dohi, Tadashi. editor. Nakagawa, Toshio. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331109.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4971-2">http://dx.doi.org/10.1007/978-1-4471-4971-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic Modeling for Reliability Shocks, Burn-in and Heterogeneous populations
ent://SD_ILS/0/SD_ILS:331121
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Finkelstein, Maxim. author. Cha, Ji Hwan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331121.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-5028-2">http://dx.doi.org/10.1007/978-1-4471-5028-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Recent Advances in System Reliability Signatures, Multi-state Systems and Statistical Inference
ent://SD_ILS/0/SD_ILS:173390
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2207-4">http://dx.doi.org/10.1007/978-1-4471-2207-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability technology principles and practice of failure prevention in electronic systems
ent://SD_ILS/0/SD_ILS:298817
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Pascoe, Norman.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://proquest.safaribooksonline.com/?fpi=9781119991366">Available by subscription from Safari Books Online</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470980101">http://dx.doi.org/10.1002/9780470980101</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470980101">http://onlinelibrary.wiley.com/book/10.1002/9780470980101</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41740">http://www.books24x7.com/marc.asp?bookid=41740</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
ent://SD_ILS/0/SD_ILS:168486
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Safety of Complex Technical Systems and Processes Modeling – Identification – Prediction - Optimization
ent://SD_ILS/0/SD_ILS:168571
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kołowrocki, Krzysztof. author. Soszyńska-Budny, Joanna. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-694-8">http://dx.doi.org/10.1007/978-0-85729-694-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Simulation Methods for Reliability and Availability of Complex Systems
ent://SD_ILS/0/SD_ILS:175923
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Faulin, Javier. editor. Juan, Angel A. editor. Martorell, Sebastián. editor. Ramírez-Márquez, José-Emmanuel. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84882-213-9">http://dx.doi.org/10.1007/978-1-84882-213-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Complex System Reliability Multichannel Systems with Imperfect Fault Coverage
ent://SD_ILS/0/SD_ILS:176244
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Myers, Albert. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-414-2">http://dx.doi.org/10.1007/978-1-84996-414-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Recent Advances in Reliability and Quality in Design
ent://SD_ILS/0/SD_ILS:175716
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Pham, Hoang. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-113-8">http://dx.doi.org/10.1007/978-1-84800-113-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Reliability and Quality Fundamentals, Methods and Procedures
ent://SD_ILS/0/SD_ILS:175443
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dhillon, B. S. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-498-4">http://dx.doi.org/10.1007/978-1-84628-498-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The Universal Generating Function in Reliability Analysis and Optimization
ent://SD_ILS/0/SD_ILS:175337
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Levitin, Gregory. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-245-4">http://dx.doi.org/10.1007/1-84628-245-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Designing faultless mechanical products based on advanced reliability analysis
ent://SD_ILS/0/SD_ILS:590951
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Woo, Seongwoo, 1966- author.<br/>Preferred Shelf Number TS173<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003451471">https://www.taylorfrancis.com/books/9781003451471</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
System reliability analysis : transition from binary to multi-state models
ent://SD_ILS/0/SD_ILS:591002
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kumar, Akshay, editor. Ram, Mangey, editor. Gaonkar, Rajesh S. Prabhu, editor. Klochkov, Yury, editor.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003546214">https://www.taylorfrancis.com/books/9781003546214</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and maintenance modeling with optimization : advances and applications
ent://SD_ILS/0/SD_ILS:562446
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kimura, Mitsutaka, editor.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003095231">https://www.taylorfrancis.com/books/9781003095231</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Industrial reliability and safety engineering : applications and practices
ent://SD_ILS/0/SD_ILS:578979
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Panchal, Dilbagh, editor.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003140092">https://www.taylorfrancis.com/books/9781003140092</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Statistical modeling of reliability structures and industrial processes
ent://SD_ILS/0/SD_ILS:564431
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Triantafyllou, Ioannis S., editor. Ram, Mangey, editor.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003203124">https://www.taylorfrancis.com/books/9781003203124</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design of mechanical systems based on statistics : a guide to improving product reliability
ent://SD_ILS/0/SD_ILS:585409
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Woo, Seong-woo, author.<br/>Preferred Shelf Number TJ245.5<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429022050">https://www.taylorfrancis.com/books/9780429022050</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability management and engineering : challenges and future trends
ent://SD_ILS/0/SD_ILS:583504
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Garg, Harish, editor. Ram, Mangey, editor.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429268922">https://www.taylorfrancis.com/books/9780429268922</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fracture mechanics. 1, Analysis of reliability and quality control
ent://SD_ILS/0/SD_ILS:305424
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Grous, Ammar, author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a>
Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems
ent://SD_ILS/0/SD_ILS:175839
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Seong, Poong Hyun. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-384-2">http://dx.doi.org/10.1007/978-1-84800-384-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Security and Reliability of Damaged Structures and Defective Materials
ent://SD_ILS/0/SD_ILS:204889
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Pluvinage, Guy. editor. Sedmak, Aleksandar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-2792-4">http://dx.doi.org/10.1007/978-90-481-2792-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines
ent://SD_ILS/0/SD_ILS:169842
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Pluvinage, Guy. editor. Elwany, Mohamed Hamdy. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-6526-2">http://dx.doi.org/10.1007/978-1-4020-6526-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Guidelines for improving plant reliability through data collection and analysis
ent://SD_ILS/0/SD_ILS:300022
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The theory and applications of reliability with emphasis on Bayesian and nonparametric methods
ent://SD_ILS/0/SD_ILS:256115
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Recent Advances in Reliability and Maintenance Modeling : Proceedings of the 11th Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling (APARM 2024, Nagoya, Japan, 26-30 August 2024)
ent://SD_ILS/0/SD_ILS:561997
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling (11th : 2024 : Nagoya, Japan). Okamura, Hiroyuki, editor. Inoue, Shinji, editor. Xiao, Xiao, editor.<br/>Preferred Shelf Number TA342<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003491309">https://www.taylorfrancis.com/books/9781003491309</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in product development and reliability III selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, China
ent://SD_ILS/0/SD_ILS:279620
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China) Gao, L., editor of compilation. Li, W. D., editor of compilation. Zhao, Y. X., editor of compilation. Li, X. Y., editor of compilation.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and optimization of structural systems : proceedings of Reliability and Optimization of Structural Systems, Tum, Munchen, Germany, 7-10 April 2010
ent://SD_ILS/0/SD_ILS:542232
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Reliability and Optimization of Structural Systems (2010 : Tum, Munchen, Germany) Straub, D.<br/>Preferred Shelf Number TA658.2 .R45 2010<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781136898563">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Reliability, risk and safety : theory and applications : proceedings of the European Safety and Reliability Conference, ESREL 2009, Prague, Czech Republic, 7-10 September 2009
ent://SD_ILS/0/SD_ILS:542234
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author European Safety and Reliability Conference (2009 : Prague, Czech Republic) Briš, Radim, 1957- Martorell, Sebastián. Soares, C. Guedes.<br/>Preferred Shelf Number TA169.7 .E975 2009 EB<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9780429206504">https://www.taylorfrancis.com/books/9780429206504</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429206504">https://www.taylorfrancis.com/books/9780429206504</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Safety, reliability and risk of structures, infrastructures and engineering systems proceedings of the Tenth International Conference on Structural Safety and Reliability (ICOSSAR2009), Osaka, Japan, 13-17 September 2009
ent://SD_ILS/0/SD_ILS:546575
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author International Conference on Structural Safety and Reliability (10th : 2009 : Osaka, Japan) CRC Press.<br/>Preferred Shelf Number TA168 .I58 2009<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781439847657">https://www.taylorfrancis.com/books/9781439847657</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367803667">https://www.taylorfrancis.com/books/9780367803667</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
SYSTEM RELIABILITY, RISK, LONGEVITY, SUSTAINABILITY AND OPTIMAL DECISION MAKING ... emphasis on marine structures.
ent://SD_ILS/0/SD_ILS:580432
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Frangopol, Dan M. Kim, Sunyong, 1976- author.<br/>Preferred Shelf Number TC1665<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003542827">https://www.taylorfrancis.com/books/9781003542827</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The iron triangle of energy : how to improve energy cost, reliability, and emissions
ent://SD_ILS/0/SD_ILS:551570
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Miller, Ronald L., author.<br/>Preferred Shelf Number TJ163.2<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9788770046848">https://www.taylorfrancis.com/books/9788770046848</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Long-term strength of materials : reliability assessment and lifetime prediction of engineering structures
ent://SD_ILS/0/SD_ILS:584038
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Chudnovsky, Alexander, author. Sehanobish, Kalyan, author.<br/>Preferred Shelf Number TA405<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003359845">https://www.taylorfrancis.com/books/9781003359845</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
THEORY AND PRACTICE OF DECISION MAKING IN REGULATION, DIAGNOSTICS AND RELIABILITY OF MACHINES
ent://SD_ILS/0/SD_ILS:588241
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Lindstedt, Paweł. Grądzki, Rafał. Golak, Karol.<br/>Preferred Shelf Number HD30.23<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032638447">https://www.taylorfrancis.com/books/9781032638447</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Statistics in Transportation and Communication Selected Papers from the 22nd International Multidisciplinary Conference on Reliability and Statistics in Transportation and Communication: Artificial Intelligence in Transportation, RelStat-2022, October 20-21, 2022, Riga, Latvia
ent://SD_ILS/0/SD_ILS:527300
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-26655-3">https://doi.org/10.1007/978-3-031-26655-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering and Computational Intelligence for Complex Systems Design, Analysis and Evaluation
ent://SD_ILS/0/SD_ILS:528444
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author van Gulijk, Coen. editor. (orcid)0000-0003-4541-2693 Zaitseva, Elena. editor. Kvassay, Miroslav. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-40997-4">https://doi.org/10.1007/978-3-031-40997-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ORGANIC AND INORGANIC LIGHT EMITTING DIODES reliability issues and.
ent://SD_ILS/0/SD_ILS:553105
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Subash, T. D., editor. Ajayan, J., editor. Grabinski, Władysław, editor.<br/>Preferred Shelf Number TK7871.89 .L53<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003340577">https://www.taylorfrancis.com/books/9781003340577</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ICPER 2020 Proceedings of the 7th International Conference on Production, Energy and Reliability
ent://SD_ILS/0/SD_ILS:527387
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Ahmad, Faiz. editor. Al-Kayiem, Hussain H. editor. King Soon, William Pao. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-19-1939-8">https://doi.org/10.1007/978-981-19-1939-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521137
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Roy, Matthieu. editor. Bitsch, Friedemann. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-40953-0">https://doi.org/10.1007/978-3-031-40953-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification 5th International Conference, RSSRail 2023, Berlin, Germany, October 10-12, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521180
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Milius, Birgit. editor. Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-43366-5">https://doi.org/10.1007/978-3-031-43366-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521134
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Bitsch, Friedemann. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022)
ent://SD_ILS/0/SD_ILS:528353
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Senthil Kumar, C. editor. Sujatha, R. editor. Muthukumar, R. editor. Rao, K. Balaji. editor. Prakash, Raghu V. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-5049-2">https://doi.org/10.1007/978-981-99-5049-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
What every engineer should know about reliability and risk analysis
ent://SD_ILS/0/SD_ILS:565637
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Modarres, M. (Mohammad), author. Groth, Katrina, author.<br/>Preferred Shelf Number TA169 .M63 2023<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003307495">https://www.taylorfrancis.com/books/9781003307495</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
LEADERSHIP STYLES AND JOB PERFORMANCE the impact of fake leadership on organizational reliability.
ent://SD_ILS/0/SD_ILS:565979
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bieńkowska, Agnieszka, author. Tworek, Katarzyna, author.<br/>Preferred Shelf Number HD57.7<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032664194">https://www.taylorfrancis.com/books/9781032664194</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Multi-criteria decision models in software reliability : methods and applications
ent://SD_ILS/0/SD_ILS:571883
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Mishra, Ashish (Ashish Kumar), editor. Dieu Linh, Nguyen Thi, editor. Bhardwaj, Manish (Professor of computer science and engineering), editor. Pinto, Carla M. A. (Computer scientist), editor.<br/>Preferred Shelf Number QA76.76 .R44 M85 2023<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367816414">https://www.taylorfrancis.com/books/9780367816414</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Modeling remaining useful life dynamics in reliability engineering
ent://SD_ILS/0/SD_ILS:579104
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Dersin, Pierre, author.<br/>Preferred Shelf Number TS173<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003250685">https://www.taylorfrancis.com/books/9781003250685</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ELECTRIC UTILITY RESOURCE PLANNING; ECONOMICS, RELIABILITY, AND DECISION-MAKING
ent://SD_ILS/0/SD_ILS:555995
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Sim, Steven.<br/>Preferred Shelf Number TK1001<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003301509">https://www.taylorfrancis.com/books/9781003301509</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Intelligent Reliability and Maintainability of Energy Infrastructure Assets
ent://SD_ILS/0/SD_ILS:526952
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Li, He. author. Peng, Weiwen. author. Adumene, Sidum. author. Yazdi, Mohammad. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-29962-9">https://doi.org/10.1007/978-3-031-29962-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Performance, reliability, and availability evaluation of computational systems. Volume 1, Performance and background
ent://SD_ILS/0/SD_ILS:585932
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Maciel, Paulo Romero Martins, author.<br/>Preferred Shelf Number QA76<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003306016">https://www.taylorfrancis.com/books/9781003306016</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Performance, reliability, and availability evaluation of computational systems. Volume 2, Reliability, availability modeling, measuring, and data analysis
ent://SD_ILS/0/SD_ILS:585933
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Maciel, Paulo Romero Martins, author.<br/>Preferred Shelf Number QA76<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003306030">https://www.taylorfrancis.com/books/9781003306030</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Information technology in contemporary organizations : redefining IT management for organizational reliability
ent://SD_ILS/0/SD_ILS:590844
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Tworek, Katarzyna, author.<br/>Preferred Shelf Number HD30.213<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003365044">https://www.taylorfrancis.com/books/9781003365044</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optimal reliability-based design of structures against several natural hazards
ent://SD_ILS/0/SD_ILS:558659
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Ang, Alfredo Hua-Sing, 1930- author. De Leon, David (De Leon Escobido), author. Fan, Wenliang, author.<br/>Preferred Shelf Number TA658 .A56 2022<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003177289">https://www.taylorfrancis.com/books/9781003177289</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Dynamic Management and Leadership in Education : High Reliability Techniques for Schools and Universities
ent://SD_ILS/0/SD_ILS:567409
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kelly, Anthony, 1957- author.<br/>Preferred Shelf Number LB2806 .K45 2022<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003217220">https://www.taylorfrancis.com/books/9781003217220</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Validity and reliability in built environment research : a selection of case studies
ent://SD_ILS/0/SD_ILS:569018
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Ahmed, Vian, editor. Opoku, Alex, editor. Olanipekun, Ayokunle, editor. Sutrisna, Monty, editor.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429243226">https://www.taylorfrancis.com/books/9780429243226</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Total manufacturing assurance : controlling product quality, reliability, and safety
ent://SD_ILS/0/SD_ILS:575150
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Brauer, Douglas, author. Cesarone, John, author.<br/>Preferred Shelf Number TS156.6<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003208051">https://www.taylorfrancis.com/books/9781003208051</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability-based design in soil and rock engineering
ent://SD_ILS/0/SD_ILS:551889
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Low, Bak Kong, author.<br/>Preferred Shelf Number TA705<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003112297">https://www.taylorfrancis.com/books/9781003112297</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
DISCRETE STOCHASTIC MODELS AND APPLICATIONS FOR RELIABILITY ENGINEERING AND STATISTICAL QUALITY CONTROL
ent://SD_ILS/0/SD_ILS:589623
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Eryilmaz, Serkan.<br/>Preferred Shelf Number QA274.2<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003160632">https://www.taylorfrancis.com/books/9781003160632</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Thermal and reliability criteria for nuclear fuel safety
ent://SD_ILS/0/SD_ILS:554086
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Maksymov, Maksym. Alyokhina, Svitlana. Brunetkin, Oleksandr.<br/>Preferred Shelf Number TK9360<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003339816">https://www.taylorfrancis.com/books/9781003339816</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Modern diagnostic X-ray sources : technology, manufacturing, reliability
ent://SD_ILS/0/SD_ILS:560465
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Behling, Rolf, author.<br/>Preferred Shelf Number RC78<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003095408">https://www.taylorfrancis.com/books/9781003095408</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
A comprehensive critique of student evaluation of teaching : critical perspectives on validity, reliability, and impartiality
ent://SD_ILS/0/SD_ILS:573999
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Clayson, Dennis E., author.<br/>Preferred Shelf Number LB2333 .C57 2021<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003091462">https://www.taylorfrancis.com/books/9781003091462</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Achieving Product Reliability : A Key to Business Success.
ent://SD_ILS/0/SD_ILS:563478
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Doganaksoy, Necip, 1960- author. Meeker, William Q., author. Hahn, Gerald J., author.<br/>Preferred Shelf Number TS156<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003181361">https://www.taylorfrancis.com/books/9781003181361</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Safety, security, and reliability of robotic systems algorithms, applications, and technologies
ent://SD_ILS/0/SD_ILS:556594
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Gupta, Brij, 1982- editor. Nedjah, Nadia, editor.<br/>Preferred Shelf Number TJ211.49<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003031352">https://www.taylorfrancis.com/books/9781003031352</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability-based analysis and design of structures and infrastructure
ent://SD_ILS/0/SD_ILS:585816
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Farsangi, Ehsan Noroozinejad, editor.<br/>Preferred Shelf Number TA658<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003194613">https://www.taylorfrancis.com/books/9781003194613</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Synesis : the unification of productivity, quality, safety and reliability
ent://SD_ILS/0/SD_ILS:570100
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Hollnagel, Erik, 1941- author.<br/>Preferred Shelf Number HD58.9<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003038245">https://www.taylorfrancis.com/books/9781003038245</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power systems control and reliability : electric power design and enhancement
ent://SD_ILS/0/SD_ILS:562263
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Qamber, Isa S., author.<br/>Preferred Shelf Number TK1001 .Q36 2020<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429287015">https://www.taylorfrancis.com/books/9780429287015</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Organizational reliability : human resources, information technology and management
ent://SD_ILS/0/SD_ILS:558536
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bieńkowska, Agnieszka, author. Tworek, Katarzyna, author. Zabłocka-Kluczka, Anna, author.<br/>Preferred Shelf Number HF5549 .B4594 2020<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003047995">https://www.taylorfrancis.com/books/9781003047995</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:482935
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Systems 14th EAI International Conference, Qshine 2018, Ho Chi Minh City, Vietnam, December 3–4, 2018, Proceedings
ent://SD_ILS/0/SD_ILS:486900
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Duong, Trung Q. editor. Vo, Nguyen-Son. editor. Phan, Van Ca. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-14413-5">https://doi.org/10.1007/978-3-030-14413-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Statistics in Transportation and Communication Selected Papers from the 18th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’18, 17-20 October 2018, Riga, Latvia
ent://SD_ILS/0/SD_ILS:486996
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kabashkin, Igor. editor. Yatskiv (Jackiva), Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-12450-2">https://doi.org/10.1007/978-3-030-12450-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of Selective Laser Melted AlSi12 Alloy for Quasistatic and Fatigue Applications
ent://SD_ILS/0/SD_ILS:487045
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Siddique, Shafaqat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-658-23425-6">https://doi.org/10.1007/978-3-658-23425-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 38th International Conference, SAFECOMP 2019, Turku, Finland, September 11–13, 2019, Proceedings
ent://SD_ILS/0/SD_ILS:483736
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 Troubitsyna, Elena. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-26601-1">https://doi.org/10.1007/978-3-030-26601-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2019 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Turku, Finland, September 10, 2019, Proceedings
ent://SD_ILS/0/SD_ILS:484867
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 Troubitsyna, Elena. editor. Gashi, Ilir. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-26250-1">https://doi.org/10.1007/978-3-030-26250-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering
ent://SD_ILS/0/SD_ILS:485213
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Ali, Syed Riffat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2018 International Conference on Human Error, Reliability, Resilience, and Performance, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USA
ent://SD_ILS/0/SD_ILS:485921
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Boring, Ronald L. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-94391-6">https://doi.org/10.1007/978-3-319-94391-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic Models in Reliability, Network Security and System Safety Essays Dedicated to Professor Jinhua Cao on the Occasion of His 80th Birthday
ent://SD_ILS/0/SD_ILS:486029
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Li, Quan-Lin. editor. Wang, Jinting. editor. Yu, Hai-Bo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-15-0864-6">https://doi.org/10.1007/978-981-15-0864-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification Third International Conference, RSSRail 2019, Lille, France, June 4–6, 2019, Proceedings
ent://SD_ILS/0/SD_ILS:486274
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-18744-6">https://doi.org/10.1007/978-3-030-18744-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2018 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Västerås, Sweden, September 18, 2018, Proceedings
ent://SD_ILS/0/SD_ILS:399783
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-99229-7">https://doi.org/10.1007/978-3-319-99229-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
ent://SD_ILS/0/SD_ILS:401348
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Wang, Zheng. author. Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-1073-6">https://doi.org/10.1007/978-981-10-1073-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solid State Lighting Reliability Part 2 Components to Systems
ent://SD_ILS/0/SD_ILS:401528
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author van Driel, Willem Dirk. editor. Fan, Xuejun. editor. Zhang, Guo Qi. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliability
ent://SD_ILS/0/SD_ILS:400290
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Jahanshahi, Mohsen. author. Bistouni, Fathollah. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-78473-1">https://doi.org/10.1007/978-3-319-78473-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, Västerås, Sweden, September 19-21, 2018, Proceedings
ent://SD_ILS/0/SD_ILS:400344
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-99130-6">https://doi.org/10.1007/978-3-319-99130-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’17, 18-21 October, 2017, Riga, Latvia
ent://SD_ILS/0/SD_ILS:402395
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-74454-4">https://doi.org/10.1007/978-3-319-74454-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliability
ent://SD_ILS/0/SD_ILS:460117
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Suganuma, Katsuaki, editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780081020944">https://www.sciencedirect.com/science/book/9780081020944</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Systems 13th International Conference, QShine 2017, Dalian, China, December 16 -17, 2017, Proceedings
ent://SD_ILS/0/SD_ILS:400873
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Wang, Lei. editor. Qiu, Tie. editor. Zhao, Wenbing. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-78078-8">https://doi.org/10.1007/978-3-319-78078-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USA
ent://SD_ILS/0/SD_ILS:401830
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Boring, Ronald Laurids. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-60645-3">https://doi.org/10.1007/978-3-319-60645-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Pattern recognition for reliability assessment of water distribution networks
ent://SD_ILS/0/SD_ILS:546715
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Trifunović, Nemanja. CRC Press LLC.<br/>Preferred Shelf Number TD481<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429097645">https://www.taylorfrancis.com/books/9780429097645</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Availability of Quality Control Based on Wavelet Computer Vision
ent://SD_ILS/0/SD_ILS:530061
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kuzmanić, Ivica. author. Vujović, Igor. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-13317-1">https://doi.org/10.1007/978-3-319-13317-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of Steel Columns Protected by Intumescent Coatings Subjected to Natural Fires
ent://SD_ILS/0/SD_ILS:530376
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Zhang, Chao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-662-46379-6">https://doi.org/10.1007/978-3-662-46379-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2015 Workshops, ASSURE, DECSoS. ISSE, ReSA4CI, and SASSUR, Delft, The Netherlands, September 22, 2015, Proceedings
ent://SD_ILS/0/SD_ILS:519092
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-24249-1">https://doi.org/10.1007/978-3-319-24249-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Numerical Methods for Reliability and Safety Assessment Multiscale and Multiphysics Systems
ent://SD_ILS/0/SD_ILS:529277
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kadry, Seifedine. editor. El Hami, Abdelkhalak. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-07167-1">https://doi.org/10.1007/978-3-319-07167-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Silicon Analog Components Device Design, Process Integration, Characterization, and Reliability
ent://SD_ILS/0/SD_ILS:529569
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-2751-7">https://doi.org/10.1007/978-1-4939-2751-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Maintenance Overtime Policies in Reliability Theory Models with Random Working Cycles
ent://SD_ILS/0/SD_ILS:530050
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Nakagawa, Toshio. author. Zhao, Xufeng. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-20813-8">https://doi.org/10.1007/978-3-319-20813-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamentals of Lead-Free Solder Interconnect Technology From Microstructures to Reliability
ent://SD_ILS/0/SD_ILS:530321
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Lee, Tae-Kyu. author. Bieler, Thomas R. author. Kim, Choong-Un. author. Ma, Hongtao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-9266-5">https://doi.org/10.1007/978-1-4614-9266-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semi-Markov processes : applications in system reliability and maintenance
ent://SD_ILS/0/SD_ILS:355517
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Grabski, Franciszek, author.<br/>Preferred Shelf Number ONLINE(355517.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128005187">http://www.sciencedirect.com/science/book/9780128005187</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Chemical and biochemical technology : materials, processing, and reliability
ent://SD_ILS/0/SD_ILS:540085
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Varfolomeev, Sergei Dmitrievich, editor.<br/>Preferred Shelf Number TP145 .C44 2015<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781482257625">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 34th International Conference, SAFECOMP 2015, Delft, The Netherlands, September 23-25, 2015, Proceedings
ent://SD_ILS/0/SD_ILS:519026
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-24255-2">https://doi.org/10.1007/978-3-319-24255-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 33rd International Conference, SAFECOM 2014, Florence, Italy, September 10-12, 2014. Proceedings
ent://SD_ILS/0/SD_ILS:482801
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bondavalli, Andrea. editor. Di Giandomenico, Felicita. editor. (orcid)0000-0002-8760-7299 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-10506-2">https://doi.org/10.1007/978-3-319-10506-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Safety, Reliability, Risk and Life-Cycle Performance of Structures and Infrastructures
ent://SD_ILS/0/SD_ILS:539366
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Deodatis, George, editor. Ellingwood, Bruce R., editor. Frangopol, Dan M., editor.<br/>Preferred Shelf Number TA656<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429227950">https://www.taylorfrancis.com/books/9780429227950</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
ent://SD_ILS/0/SD_ILS:488848
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Richter, Detlev. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-007-6082-0">https://doi.org/10.1007/978-94-007-6082-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2014 Workshops: ASCoMS, DECSoS, DEVVARTS, ISSE, ReSA4CI, SASSUR. Florence, Italy, September 8-9, 2014, Proceedings
ent://SD_ILS/0/SD_ILS:485676
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bondavalli, Andrea. editor. Ceccarelli, Andrea. editor. Ortmeier, Frank. editor. (orcid)0000-0001-6186-4142 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-10557-4">https://doi.org/10.1007/978-3-319-10557-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Availability, Reliability, and Security in Information Systems IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2014 and 4th InternationalWorkshop on Security and Cognitive Informatics for Homeland Defense, SeCIHD 2014, Fribourg, Switzerland, September 8-12, 2014. Proceedings
ent://SD_ILS/0/SD_ILS:489055
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Teufel, Stephanie. editor. A Min, Tjoa. editor. You, Illsun. editor. Weippl, Edgar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-10975-6">https://doi.org/10.1007/978-3-319-10975-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
ent://SD_ILS/0/SD_ILS:489246
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-007-7663-0">https://doi.org/10.1007/978-94-007-7663-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solder Joint Reliability Assessment Finite Element Simulation Methodology
ent://SD_ILS/0/SD_ILS:530730
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Tamin, Mohd N. author. Shaffiar, Norhashimah M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-00092-3">https://doi.org/10.1007/978-3-319-00092-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamentals of reliability engineering : applications in multistage interconnection networks
ent://SD_ILS/0/SD_ILS:342010
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Gunawan, Indra.<br/>Preferred Shelf Number ONLINE(342010.1)<br/>Electronic Access Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a>
Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079">http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079</a>
Ebook Library <a href="http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0">http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0</a>
ebrary <a href="http://site.ebrary.com/id/10843879">http://site.ebrary.com/id/10843879</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and failure of electronic materials and devices
ent://SD_ILS/0/SD_ILS:355485
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Ohring, Milton, 1936- Kasprzak, Lucian.<br/>Preferred Shelf Number ONLINE(355485.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of safety-critical systems : theory and application
ent://SD_ILS/0/SD_ILS:341773
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Rausand, Marvin.<br/>Preferred Shelf Number ONLINE(341773.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653">http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118776353">http://dx.doi.org/10.1002/9781118776353</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability prediction from burn-in data fit to reliability models
ent://SD_ILS/0/SD_ILS:355921
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bernstein, Joseph.<br/>Preferred Shelf Number ONLINE(355921.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128007471">http://www.sciencedirect.com/science/book/9780128007471</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
ent://SD_ILS/0/SD_ILS:331478
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331478.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-4337-7">http://dx.doi.org/10.1007/978-1-4614-4337-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic Orders in Reliability and Risk In Honor of Professor Moshe Shaked
ent://SD_ILS/0/SD_ILS:332149
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Li, Haijun. editor. Li, Xiaohu. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332149.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-6892-9">http://dx.doi.org/10.1007/978-1-4614-6892-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:332682
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332682.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Early Software Reliability Prediction A Fuzzy Logic Approach
ent://SD_ILS/0/SD_ILS:335512
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Pandey, Ajeet Kumar. author. Goyal, Neeraj Kumar. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335512.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-81-322-1176-1">http://dx.doi.org/10.1007/978-81-322-1176-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optimal Stochastic Control Schemes within a Structural Reliability Framework
ent://SD_ILS/0/SD_ILS:332864
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Leira, Bernt J. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332864.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-01405-0">http://dx.doi.org/10.1007/978-3-319-01405-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Networks 9th International Conference, QShine 2013, Greader Noida, India, January 11-12, 2013, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:334505
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Singh, Karan. editor. Awasthi, Amit K. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334505.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-37949-9">http://dx.doi.org/10.1007/978-3-642-37949-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Availability, Reliability, and Security in Information Systems and HCI IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2013, Regensburg, Germany, September 2-6, 2013. Proceedings
ent://SD_ILS/0/SD_ILS:334958
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Cuzzocrea, Alfredo. editor. Kittl, Christian. editor. Simos, Dimitris E. editor. Weippl, Edgar. editor. Xu, Lida. editor.<br/>Preferred Shelf Number ONLINE(334958.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Risk Evaluation of Wind Integrated Power Systems
ent://SD_ILS/0/SD_ILS:335484
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Billinton, Roy. editor. Karki, Rajesh. editor. Verma, Ajit Kumar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335484.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-81-322-0987-4">http://dx.doi.org/10.1007/978-81-322-0987-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings
ent://SD_ILS/0/SD_ILS:335005
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bitsch, Friedemann. editor. Guiochet, Jérémie. editor. Kaâniche, Mohamed. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335005.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-40793-2">http://dx.doi.org/10.1007/978-3-642-40793-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.
ent://SD_ILS/0/SD_ILS:305286
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Epperlein, Peter W.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118481882">http://dx.doi.org/10.1002/9781118481882</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples
ent://SD_ILS/0/SD_ILS:365001
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.<br/>Preferred Shelf Number ONLINE(365001.1)<br/>Electronic Access Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications
ent://SD_ILS/0/SD_ILS:306566
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Wu, Bin, author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Gas and oil reliability engineering modeling and analysis
ent://SD_ILS/0/SD_ILS:145907
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Calixto, Eduardo.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Using the Weibull distribution reliability, modeling, and inference
ent://SD_ILS/0/SD_ILS:299479
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author McCool, John, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=388380">Connect to MyiLibrary resource.</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118351994">http://dx.doi.org/10.1002/9781118351994</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=51285">http://www.books24x7.com/marc.asp?bookid=51285</a>
ebrary <a href="http://site.ebrary.com/id/10593122">http://site.ebrary.com/id/10593122</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=894399">http://swb.eblib.com/patron/FullRecord.aspx?p=894399</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2012 Workshops: Sassur, ASCoMS, DESEC4LCCI, ERCIM/EWICS, IWDE, Magdeburg, Germany, September 25-28, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197419
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Ortmeier, Frank. editor. Daniel, Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33675-1">http://dx.doi.org/10.1007/978-3-642-33675-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 31st International Conference, SAFECOMP 2012, Magdeburg, Germany, September 25-28, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197420
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Ortmeier, Frank. editor. Daniel, Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33678-2">http://dx.doi.org/10.1007/978-3-642-33678-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems
ent://SD_ILS/0/SD_ILS:249351
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bauer, Eric. Adams, Randee. Eustace, Dan.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Importance measures in reliability, risk, and optimization principles and applications
ent://SD_ILS/0/SD_ILS:299386
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Kuo, Way, 1951- Zhu, Xiaoyan.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10559415">http://site.ebrary.com/lib/alltitles/Doc?id=10559415</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems
ent://SD_ILS/0/SD_ILS:305462
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bauer, Eric. Adams, Randee. Eustace, Dan. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119941378">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Non-Destructive Assessment of Concrete Structures: Reliability and Limits of Single and Combined Techniques State-of-the-Art Report of the RILEM Technical Committee 207-INR
ent://SD_ILS/0/SD_ILS:206444
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Breysse, Denys. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-2736-6">http://dx.doi.org/10.1007/978-94-007-2736-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliability
ent://SD_ILS/0/SD_ILS:173816
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Levinson, David M. editor. Liu, Henry X. editor. Bell, Michael. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power Electronic Packaging Design, Assembly Process, Reliability and Modeling
ent://SD_ILS/0/SD_ILS:173841
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Liu, Yong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:196648
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Zhang, Xi. editor. Qiao, Daji. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-29222-4">http://dx.doi.org/10.1007/978-3-642-29222-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Multidisciplinary Research and Practice for Information Systems IFIP WG 8.4, 8.9/TC 5 International Cross-Domain Conference and Workshop on Availability, Reliability, and Security, CD-ARES 2012, Prague, Czech Republic, August 20-24, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197227
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Quirchmayr, Gerald. editor. Basl, Josef. editor. You, Ilsun. editor. Xu, Lida. editor. Weippl, Edgar. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-32498-7">http://dx.doi.org/10.1007/978-3-642-32498-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, Availability and Serviceability of Networks-on-Chip
ent://SD_ILS/0/SD_ILS:173779
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Cota, Érika. author. Morais Amory, Alexandre. author. Soares Lubaszewski, Marcelo. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0791-1">http://dx.doi.org/10.1007/978-1-4614-0791-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electric utility resource planning : economics, reliability, and decision-making
ent://SD_ILS/0/SD_ILS:547458
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Sim, Steven., author.<br/>Preferred Shelf Number TK1001 .S515 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315216744">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Reliability, maintainability, and risk : practical methods for engineers
ent://SD_ILS/0/SD_ILS:459422
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Smith, David J. (David John), 1943 June 22-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Modeling and simulation for microelectronic packaging assembly manufacture, reliability, and testing
ent://SD_ILS/0/SD_ILS:298653
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Liu, S. (Sheng), 1963- Liu, Yong, 1962- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470827826">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probability, statistics, and reliability for engineers and scientists
ent://SD_ILS/0/SD_ILS:312915
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Ayyub, Bilal M., author. McCuen, Richard H., 1941-<br/>Preferred Shelf Number ONLINE(312915.1)<br/>Electronic Access Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpPSRESE01">http://app.knovel.com/web/toc.v/cid:kpPSRESE01</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability in Scientific Research Improving the Dependability of Measurements, Calculations, Equipment, and Software
ent://SD_ILS/0/SD_ILS:237354
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Walker, I. R..<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511780608">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Spacecraft reliability and multi-state failures a statistical approach
ent://SD_ILS/0/SD_ILS:305721
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Saleh, Joseph H., 1971- Castet, Jean-François. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697462">Click here to view book</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41710">http://www.books24x7.com/marc.asp?bookid=41710</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality and Reliability of Large-Eddy Simulations II
ent://SD_ILS/0/SD_ILS:205784
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Salvetti, Maria Vittoria. editor. Geurts, Bernard. editor. Meyers, Johan. editor. Sagaut, Pierre. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-0231-8">http://dx.doi.org/10.1007/978-94-007-0231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
ent://SD_ILS/0/SD_ILS:172530
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6217-1">http://dx.doi.org/10.1007/978-1-4419-6217-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Basic Concepts and Applications in ICT
ent://SD_ILS/0/SD_ILS:194550
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Lazzaroni, Massimo. author. Cristaldi, Loredana. author. Peretto, Lorenzo. author. Rinaldi, Paola. author. Catelani, Marcantonio. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-20983-3">http://dx.doi.org/10.1007/978-3-642-20983-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Availability, Reliability and Security for Business, Enterprise and Health Information Systems IFIP WG 8.4/8.9 International Cross Domain Conference and Workshop, ARES 2011, Vienna, Austria, August 22-26, 2011. Proceedings
ent://SD_ILS/0/SD_ILS:195302
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Tjoa, A Min. editor. Quirchmayr, Gerald. editor. You, Ilsun. editor. Xu, Lida. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-23300-5">http://dx.doi.org/10.1007/978-3-642-23300-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Assessment of Power System Reliability Methods and Applications
ent://SD_ILS/0/SD_ILS:168569
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Čepin, Marko. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-688-7">http://dx.doi.org/10.1007/978-0-85729-688-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 30th International Conference,SAFECOMP 2011, Naples, Italy, September 19-22, 2011. Proceedings
ent://SD_ILS/0/SD_ILS:195586
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Flammini, Francesco. editor. Bologna, Sandro. editor. Vittorini, Valeria. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-24270-0">http://dx.doi.org/10.1007/978-3-642-24270-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Adhesives technology for electronic applications materials, processing, reliability
ent://SD_ILS/0/SD_ILS:146014
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Licari, James J., 1930- Swanson, Dale W.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, Maintainability and Risk Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.
ent://SD_ILS/0/SD_ILS:149176
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Smith, David J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Mining equipment and systems : theory and practice of exploitation and reliability
ent://SD_ILS/0/SD_ILS:544540
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Czaplicki, Jacek M., author.<br/>Preferred Shelf Number TN146 .C93 2010<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9780203852804">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Design for reliability information and computer-based systems
ent://SD_ILS/0/SD_ILS:249879
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Bauer, Eric.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Degradation Modeling Applications to Reliability, Survival Analysis, and Finance
ent://SD_ILS/0/SD_ILS:168321
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Nikulin, M.S. editor. Limnios, Nikolaos. editor. Balakrishnan, N. editor. Kahle, Waltraud. editor. Huber-Carol, Catherine. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4924-1">http://dx.doi.org/10.1007/978-0-8176-4924-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Mathematical and Statistical Models and Methods in Reliability Applications to Medicine, Finance, and Quality Control
ent://SD_ILS/0/SD_ILS:168333
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Rykov, V.V. editor. Balakrishnan, N. editor. Nikulin, M.S. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4971-5">http://dx.doi.org/10.1007/978-0-8176-4971-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 29th International Conference, SAFECOMP 2010, Vienna, Austria, September 14-17, 2010. Proceedings
ent://SD_ILS/0/SD_ILS:193040
2026-01-10T16:30:52Z
2026-01-10T16:30:52Z
Author Schoitsch, Erwin. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-15651-9">http://dx.doi.org/10.1007/978-3-642-15651-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>