Search Results for Reliability. - Narrowed by: Online Library SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026te$003dILS$0026ps$003d300? 2025-03-15T17:57:08Z Reliability ent://SD_ILS/0/SD_ILS:233427 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Meyer, J. Patrick.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural reliability ent://SD_ILS/0/SD_ILS:297978 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Lemaire, Maurice.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability engineering ent://SD_ILS/0/SD_ILS:341870 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Kapur, Kailash C., 1941- author.&#160;Pecht, Michael, author.<br/>Preferred Shelf Number&#160;ONLINE(341870.1)<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a> MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> MEMS Reliability ent://SD_ILS/0/SD_ILS:172486 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Hartzell, Allyson L. author.&#160;da Silva, Mark G. author.&#160;Shea, Herbert R. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bayesian Reliability ent://SD_ILS/0/SD_ILS:167542 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Hamada, Michael S. author.&#160;Wilson, Alyson G. author.&#160;Reese, C. Shane. author.&#160;Martz, Harry F. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability fundamentals ent://SD_ILS/0/SD_ILS:255215 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;C&#259;tuneanu, Vasile M.&#160;Mihalache, Adrian.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ensuring software reliability ent://SD_ILS/0/SD_ILS:289793 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Neufelder, Ann Marie, 1960-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439832752">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System Software Reliability ent://SD_ILS/0/SD_ILS:175367 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:249382 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Raheja, Dev.&#160;Gullo, Louis J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical system reliability ent://SD_ILS/0/SD_ILS:153146 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Bauer, Eric.&#160;Zhang, Xuemei.&#160;Kimber, Douglas A.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of MEMS ent://SD_ILS/0/SD_ILS:303632 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Tsuchiya, Toshiyuki.&#160;Tabata, Osamu, 1956-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:285886 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Crow, Dana.&#160;Feinberg, Alec.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420040845">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical reliability engineering ent://SD_ILS/0/SD_ILS:305563 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;O'Connor, Patrick P.&#160;Kleyner, Andre.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Improving machinery reliability ent://SD_ILS/0/SD_ILS:153828 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Bloch, Heinz P., 1933-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic reliability models ent://SD_ILS/0/SD_ILS:299523 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Ushakov, I. A. (Igor&#697; Alekseevich)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical reliability engineering ent://SD_ILS/0/SD_ILS:295099 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Pavlov, I. V.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Chakravarty, Sumantra.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic reliability engineering ent://SD_ILS/0/SD_ILS:295101 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Falk, James.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Optimal Maintenance ent://SD_ILS/0/SD_ILS:175380 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Wang, Hongzhou. author.&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintenance Theory of Reliability ent://SD_ILS/0/SD_ILS:175323 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Safety Engineering ent://SD_ILS/0/SD_ILS:176193 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Verma, Ajit Kumar. author.&#160;Srividya, Ajit. author.&#160;Karanki, Durga Rao. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Engineering design reliability handbook ent://SD_ILS/0/SD_ILS:287313 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of large systems ent://SD_ILS/0/SD_ILS:254513 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Ko&#322;owrocki, Krzysztof.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power-system reliability calculations ent://SD_ILS/0/SD_ILS:220175 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Billinton, Roy.&#160;Ringlee, Robert J., joint author.&#160;Wood, Allen J., joint author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Circuit Design for Reliability ent://SD_ILS/0/SD_ILS:529164 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Reis, Ricardo. editor.&#160;Cao, Yu. editor.&#160;Wirth, Gilson. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-1-4614-4078-9">https://doi.org/10.1007/978-1-4614-4078-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic Models in Reliability ent://SD_ILS/0/SD_ILS:332363 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Aven, Terje. author.&#160;Jensen, Uwe. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332363.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Network Reliability and Resilience ent://SD_ILS/0/SD_ILS:195005 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Gertsbakh, Ilya. author.&#160;Shpungin, Yoseph. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Life cycle reliability engineering ent://SD_ILS/0/SD_ILS:296926 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Yang, Guangbin, 1964-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reinforced concrete structural reliability ent://SD_ILS/0/SD_ILS:291660 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;El-Reedy, Mohamed Abdallah.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439874172">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quantile-Based Reliability Analysis ent://SD_ILS/0/SD_ILS:330556 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Nair, N. Unnikrishnan. author.&#160;Sankaran, P.G. author.&#160;Balakrishnan, N. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(330556.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronic thin-film reliability ent://SD_ILS/0/SD_ILS:278156 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Tu, K. N. (King-Ning), 1937-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:285664 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Brown, Richard E., 1969-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780849375682">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability-based Structural Design ent://SD_ILS/0/SD_ILS:175421 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Choi, Seung-Kyum. author.&#160;Canfield, Robert A. author.&#160;Grandhi, Ramana V. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Six Sigma ent://SD_ILS/0/SD_ILS:165709 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Kumar, U Dinesh. author.&#160;Crocker, John. author.&#160;Chitra, T. author.&#160;Saranga, Haritha. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:287445 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Brown, Richard E., 1969-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780824744281">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lubrication and reliability handbook ent://SD_ILS/0/SD_ILS:256333 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Neale, M. J. (Michael John)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fatigue design and reliability ent://SD_ILS/0/SD_ILS:254466 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)&#160;Marquis, G. (Gary)&#160;Solin, J.&#160;European Structural Integrity Society.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of reliability engineering ent://SD_ILS/0/SD_ILS:295100 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Ushakov, I. A. 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Proceedings ent://SD_ILS/0/SD_ILS:334958 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Cuzzocrea, Alfredo. editor.&#160;Kittl, Christian. editor.&#160;Simos, Dimitris E. editor.&#160;Weippl, Edgar. editor.&#160;Xu, Lida. editor.<br/>Preferred Shelf Number&#160;ONLINE(334958.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, Availability and Serviceability of Networks-on-Chip ent://SD_ILS/0/SD_ILS:173779 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Cota, &Eacute;rika. author.&#160;Morais Amory, Alexandre. author.&#160;Soares Lubaszewski, Marcelo. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0791-1">http://dx.doi.org/10.1007/978-1-4614-0791-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliability ent://SD_ILS/0/SD_ILS:173816 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Levinson, David M. editor.&#160;Liu, Henry X. editor.&#160;Bell, Michael. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power Electronic Packaging Design, Assembly Process, Reliability and Modeling ent://SD_ILS/0/SD_ILS:173841 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Liu, Yong. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papers ent://SD_ILS/0/SD_ILS:196648 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Zhang, Xi. editor.&#160;Qiao, Daji. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-29222-4">http://dx.doi.org/10.1007/978-3-642-29222-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multidisciplinary Research and Practice for Information Systems IFIP WG 8.4, 8.9/TC 5 International Cross-Domain Conference and Workshop on Availability, Reliability, and Security, CD-ARES 2012, Prague, Czech Republic, August 20-24, 2012. 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Proceedings ent://SD_ILS/0/SD_ILS:197419 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Ortmeier, Frank. editor.&#160;Daniel, Peter. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33675-1">http://dx.doi.org/10.1007/978-3-642-33675-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 31st International Conference, SAFECOMP 2012, Magdeburg, Germany, September 25-28, 2012. 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Proceedings ent://SD_ILS/0/SD_ILS:184859 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;G&oacute;rski, Janusz. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11875567">http://dx.doi.org/10.1007/11875567</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in Ranking and Selection, Multiple Comparisons, and Reliability Methodology and Applications ent://SD_ILS/0/SD_ILS:168118 2025-03-15T17:57:08Z 2025-03-15T17:57:08Z Author&#160;Balakrishnan, N. editor.&#160;Nagaraja, H. 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