Search Results for Reliability. - Narrowed by: Electronic Library
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026ps$003d300?
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Reliability
ent://SD_ILS/0/SD_ILS:233427
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Author Meyer, J. Patrick.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Structural reliability
ent://SD_ILS/0/SD_ILS:297978
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Author Lemaire, Maurice. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability engineering
ent://SD_ILS/0/SD_ILS:341870
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Author Kapur, Kailash C., 1941- author. Pecht, Michael, author.<br/>Preferred Shelf Number ONLINE(341870.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a>
MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a>
Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
MEMS Reliability
ent://SD_ILS/0/SD_ILS:172486
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Author Hartzell, Allyson L. author. da Silva, Mark G. author. Shea, Herbert R. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Bayesian Reliability
ent://SD_ILS/0/SD_ILS:167542
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Author Hamada, Michael S. author. Wilson, Alyson G. author. Reese, C. Shane. author. Martz, Harry F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability fundamentals
ent://SD_ILS/0/SD_ILS:255215
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Author Cătuneanu, Vasile M. Mihalache, Adrian.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
System Software Reliability
ent://SD_ILS/0/SD_ILS:175367
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Author Pham, Hoang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design for reliability
ent://SD_ILS/0/SD_ILS:249382
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Author Raheja, Dev. Gullo, Louis J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Practical system reliability
ent://SD_ILS/0/SD_ILS:153146
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Author Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of MEMS
ent://SD_ILS/0/SD_ILS:303632
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Author Tsuchiya, Toshiyuki. Tabata, Osamu, 1956- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Practical reliability engineering
ent://SD_ILS/0/SD_ILS:305563
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Author O'Connor, Patrick P. Kleyner, Andre. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Improving machinery reliability
ent://SD_ILS/0/SD_ILS:153828
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Author Bloch, Heinz P., 1933-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probabilistic reliability models
ent://SD_ILS/0/SD_ILS:299523
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Author Ushakov, I. A. (Igorʹ Alekseevich)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a>
Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Statistical reliability engineering
ent://SD_ILS/0/SD_ILS:295099
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Author Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Pavlov, I. V. Ushakov, I. A. (Igorʹ Alekseevich) Chakravarty, Sumantra. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probabilistic reliability engineering
ent://SD_ILS/0/SD_ILS:295101
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Author Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Ushakov, I. A. (Igorʹ Alekseevich) Falk, James. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Optimal Maintenance
ent://SD_ILS/0/SD_ILS:175380
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Author Wang, Hongzhou. author. Pham, Hoang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Maintenance Theory of Reliability
ent://SD_ILS/0/SD_ILS:175323
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Author Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Safety Engineering
ent://SD_ILS/0/SD_ILS:176193
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Author Verma, Ajit Kumar. author. Srividya, Ajit. author. Karanki, Durga Rao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of large systems
ent://SD_ILS/0/SD_ILS:254513
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Author Kołowrocki, Krzysztof.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power-system reliability calculations
ent://SD_ILS/0/SD_ILS:220175
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Author Billinton, Roy. Ringlee, Robert J., joint author. Wood, Allen J., joint author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Circuit Design for Reliability
ent://SD_ILS/0/SD_ILS:529164
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Author Reis, Ricardo. editor. Cao, Yu. editor. Wirth, Gilson. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-4078-9">https://doi.org/10.1007/978-1-4614-4078-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic Models in Reliability
ent://SD_ILS/0/SD_ILS:332363
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Author Aven, Terje. author. Jensen, Uwe. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332363.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Network Reliability and Resilience
ent://SD_ILS/0/SD_ILS:195005
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Author Gertsbakh, Ilya. author. Shpungin, Yoseph. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Life cycle reliability engineering
ent://SD_ILS/0/SD_ILS:296926
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Author Yang, Guangbin, 1964- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quantile-Based Reliability Analysis
ent://SD_ILS/0/SD_ILS:330556
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Author Nair, N. Unnikrishnan. author. Sankaran, P.G. author. Balakrishnan, N. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(330556.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electronic thin-film reliability
ent://SD_ILS/0/SD_ILS:278156
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Author Tu, K. N. (King-Ning), 1937-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability-based Structural Design
ent://SD_ILS/0/SD_ILS:175421
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Author Choi, Seung-Kyum. author. Canfield, Robert A. author. Grandhi, Ramana V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Six Sigma
ent://SD_ILS/0/SD_ILS:165709
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Author Kumar, U Dinesh. author. Crocker, John. author. Chitra, T. author. Saranga, Haritha. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Lubrication and reliability handbook
ent://SD_ILS/0/SD_ILS:256333
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Author Neale, M. J. (Michael John)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fatigue design and reliability
ent://SD_ILS/0/SD_ILS:254466
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Author International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland) Marquis, G. (Gary) Solin, J. European Structural Integrity Society.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of reliability engineering
ent://SD_ILS/0/SD_ILS:295100
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Author Ushakov, I. A. (Igorʹ Alekseevich) Harrison, Robert A. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applications in Reliability and Statistical Computing
ent://SD_ILS/0/SD_ILS:527152
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Author Pham, Hoang. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-21232-1">https://doi.org/10.1007/978-3-031-21232-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Introduction to Quality and Reliability Engineering
ent://SD_ILS/0/SD_ILS:529803
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Author Jiang, Renyan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-662-47215-6">https://doi.org/10.1007/978-3-662-47215-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Innovations in Power Systems Reliability
ent://SD_ILS/0/SD_ILS:168417
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Author Anders, George. editor. Vaccaro, Alfredo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Nonparametric Statistics in Reliability
ent://SD_ILS/0/SD_ILS:168426
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Author Gámiz, M. Luz. author. Kulasekera, K. B. author. Limnios, Nikolaos. author. Lindqvist, Bo Henry. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Software Reliability Assessment with OR Applications
ent://SD_ILS/0/SD_ILS:168454
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Author Kapur, P.K. author. Pham, Hoang. author. Gupta, A. author. Jha, P.C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-204-9">http://dx.doi.org/10.1007/978-0-85729-204-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fatigue and Fracture Reliability Engineering
ent://SD_ILS/0/SD_ILS:168458
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Author Xiong, J.J. author. Shenoi, R.A. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-218-6">http://dx.doi.org/10.1007/978-0-85729-218-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Product Reliability Specification and Performance
ent://SD_ILS/0/SD_ILS:175790
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Author Murthy, Dodderi Narshima Prabhakar. author. Rausand, Marvin. author. Østerås, Trond. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-271-5">http://dx.doi.org/10.1007/978-1-84800-271-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advanced Reliability Models and Maintenance Policies
ent://SD_ILS/0/SD_ILS:175800
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Author Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-294-4">http://dx.doi.org/10.1007/978-1-84800-294-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Mining Equipment Reliability, Maintainability, and Safety
ent://SD_ILS/0/SD_ILS:144346
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Author Dhillon, Balbir S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Predictive Analytics in System Reliability
ent://SD_ILS/0/SD_ILS:526781
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Improving product reliability strategies and implementation
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2026-02-17T18:26:00Z
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Reliability Aspect of Cloud Computing Environment
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In-Service Fatigue Reliability of Structures
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Semiconductor Power Devices Physics, Characteristics, Reliability
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Wire Ropes Tension, Endurance, Reliability
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Reliability of large and complex systems
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Ternary Networks Reliability and Monte Carlo
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Reliability Engineering Theory and Practice
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Analog IC Reliability in Nanometer CMOS
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Electricity infrastructure reliability and vulnerabilities
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Lead Free Solder Mechanics and Reliability
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Reliability and availability of cloud computing
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Semiconductor process reliability in practice
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Accelerated reliability and durability testing technology
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Semiconductor Power Devices Physics, Characteristics, Reliability
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Functional Analysis Methods for Reliability Models
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Multistate systems reliability theory with applications
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Reliability Engineering Theory and Practice
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Silver Metallization Stability and Reliability
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Wire Ropes Tension, Endurance, Reliability
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Reliability Engineering Theory and Practice
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Critical Infrastructure Reliability and Vulnerability
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Stochastic Ageing and Dependence for Reliability
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Accelerated quality and reliability solutions
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Reliability and risk a Bayesian perspective
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Case studies in reliability and maintenance
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Ceramics processing, reliability, tribology and wear.
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Reliability modeling, prediction, and optimization
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Semiconductor memories technology, testing, and reliability
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An elementary guide to reliability
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New trends in system reliability evaluation
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Interconnect Reliability in Advanced Memory Device Packaging
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2026-02-17T18:26:00Z
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Stochastic Processes with Applications to Reliability Theory
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Failure Rate Modelling for Reliability and Risk
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Human Reliability and Error in Transportation Systems
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Shock and Damage Models in Reliability Theory
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Lifetime Reliability-aware Design of Integrated Circuits
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2026-02-17T18:26:00Z
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Safety-Critical Electrical Drives Topologies, Reliability, Performance
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2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Bolvashenkov, Igor. author. Herzog, Hans-Georg. author. Frenkel, Ilia. author. Khvatskin, Lev. author. Lisnianski, Anatoly. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-89969-5">https://doi.org/10.1007/978-3-319-89969-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solid State Lighting Reliability Components to Systems
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Offshore Wind Turbines Reliability, availability and maintenance
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Telecommunications system reliability engineering, theory, and practice
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Compressors how to achieve high reliability & availability
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Process plant equipment operation, control, and reliability
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2026-02-17T18:26:00Z
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Lead-free solders materials reliability for electronics
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Reliability of Microtechnology Interconnects, Devices and Systems
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Reliability centered maintenance (RCM) implementation made simple
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Hydrosystems engineering reliability assessment and risk analysis
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Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolution
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Solder Joint Reliability Prediction for Multiple Environments
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Reliability wearout mechanisms in advanced CMOS technologies
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Quality and Reliability of Large-Eddy Simulations
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Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
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New Computational Methods in Power System Reliability
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Rules of thumb for maintenance and reliability engineers
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Rules of thumb for maintenance and reliability engineers
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Solder Joint Technology Materials, Properties, and Reliability
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Reliability and risk models setting reliability requirements
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Managing risk and reliability of process plants
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Cognitive reliability and error analysis method CREAM
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System reliability theory models and statistical methods
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Electronics reliability and measurement technology nondestructive evaluation
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Design of Mechanical Systems Accelerated Lifecycle Testing and Reliability
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Which-Is-Better (WIB): Problems in Reliability Theory
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2026-02-17T18:26:00Z
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Advances in Reliability and Maintainability Methods and Engineering Applications Essays in Honor of Professor Hong-Zhong Huang on his 60th Birthday
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2026-02-17T18:26:00Z
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Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practice
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Point Processes for Reliability Analysis Shocks and Repairable Systems
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Recent Advances in Multi-state Systems Reliability Theory and Applications
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Human Reliability, Error, and Human Factors in Power Generation
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The Monte Carlo Simulation Method for System Reliability and Risk Analysis
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Stochastic Reliability and Maintenance Modeling Essays in Honor of Professor Shunji Osaki on his 70th Birthday
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Stochastic Modeling for Reliability Shocks, Burn-in and Heterogeneous populations
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Principles of Loads and Failure Mechanisms Applications in Maintenance, Reliability and Design
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Recent Advances in System Reliability Signatures, Multi-state Systems and Statistical Inference
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2026-02-17T18:26:00Z
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
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2026-02-17T18:26:00Z
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Reliability and Safety of Complex Technical Systems and Processes Modeling – Identification – Prediction - Optimization
ent://SD_ILS/0/SD_ILS:168571
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Reliability technology principles and practice of failure prevention in electronic systems
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Simulation Methods for Reliability and Availability of Complex Systems
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2026-02-17T18:26:00Z
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Complex System Reliability Multichannel Systems with Imperfect Fault Coverage
ent://SD_ILS/0/SD_ILS:176244
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2026-02-17T18:26:00Z
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Recent Advances in Reliability and Quality in Design
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2026-02-17T18:26:00Z
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Applied Reliability and Quality Fundamentals, Methods and Procedures
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2026-02-17T18:26:00Z
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The Universal Generating Function in Reliability Analysis and Optimization
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2026-02-17T18:26:00Z
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Fracture mechanics. 1, Analysis of reliability and quality control
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2026-02-17T18:26:00Z
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Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems
ent://SD_ILS/0/SD_ILS:175839
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Security and Reliability of Damaged Structures and Defective Materials
ent://SD_ILS/0/SD_ILS:204889
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines
ent://SD_ILS/0/SD_ILS:169842
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Pluvinage, Guy. editor. Elwany, Mohamed Hamdy. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-6526-2">http://dx.doi.org/10.1007/978-1-4020-6526-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Guidelines for improving plant reliability through data collection and analysis
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2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The theory and applications of reliability with emphasis on Bayesian and nonparametric methods
ent://SD_ILS/0/SD_ILS:256115
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in product development and reliability III selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, China
ent://SD_ILS/0/SD_ILS:279620
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China) Gao, L., editor of compilation. Li, W. D., editor of compilation. Zhao, Y. X., editor of compilation. Li, X. Y., editor of compilation.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521137
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Roy, Matthieu. editor. Bitsch, Friedemann. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-40953-0">https://doi.org/10.1007/978-3-031-40953-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification 5th International Conference, RSSRail 2023, Berlin, Germany, October 10-12, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521180
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Milius, Birgit. editor. Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-43366-5">https://doi.org/10.1007/978-3-031-43366-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521134
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Bitsch, Friedemann. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Statistics in Transportation and Communication Selected Papers from the 22nd International Multidisciplinary Conference on Reliability and Statistics in Transportation and Communication: Artificial Intelligence in Transportation, RelStat-2022, October 20-21, 2022, Riga, Latvia
ent://SD_ILS/0/SD_ILS:527300
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-26655-3">https://doi.org/10.1007/978-3-031-26655-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering and Computational Intelligence for Complex Systems Design, Analysis and Evaluation
ent://SD_ILS/0/SD_ILS:528444
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author van Gulijk, Coen. editor. (orcid)0000-0003-4541-2693 Zaitseva, Elena. editor. Kvassay, Miroslav. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-40997-4">https://doi.org/10.1007/978-3-031-40997-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Intelligent Reliability and Maintainability of Energy Infrastructure Assets
ent://SD_ILS/0/SD_ILS:526952
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Li, He. author. Peng, Weiwen. author. Adumene, Sidum. author. Yazdi, Mohammad. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-29962-9">https://doi.org/10.1007/978-3-031-29962-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022)
ent://SD_ILS/0/SD_ILS:528353
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Senthil Kumar, C. editor. Sujatha, R. editor. Muthukumar, R. editor. Rao, K. Balaji. editor. Prakash, Raghu V. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-5049-2">https://doi.org/10.1007/978-981-99-5049-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ICPER 2020 Proceedings of the 7th International Conference on Production, Energy and Reliability
ent://SD_ILS/0/SD_ILS:527387
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Ahmad, Faiz. editor. Al-Kayiem, Hussain H. editor. King Soon, William Pao. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-19-1939-8">https://doi.org/10.1007/978-981-19-1939-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 38th International Conference, SAFECOMP 2019, Turku, Finland, September 11–13, 2019, Proceedings
ent://SD_ILS/0/SD_ILS:483736
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 Troubitsyna, Elena. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-26601-1">https://doi.org/10.1007/978-3-030-26601-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification Third International Conference, RSSRail 2019, Lille, France, June 4–6, 2019, Proceedings
ent://SD_ILS/0/SD_ILS:486274
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-18744-6">https://doi.org/10.1007/978-3-030-18744-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Systems 14th EAI International Conference, Qshine 2018, Ho Chi Minh City, Vietnam, December 3–4, 2018, Proceedings
ent://SD_ILS/0/SD_ILS:486900
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Duong, Trung Q. editor. Vo, Nguyen-Son. editor. Phan, Van Ca. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-14413-5">https://doi.org/10.1007/978-3-030-14413-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:482935
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2019 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Turku, Finland, September 10, 2019, Proceedings
ent://SD_ILS/0/SD_ILS:484867
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 Troubitsyna, Elena. editor. Gashi, Ilir. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-26250-1">https://doi.org/10.1007/978-3-030-26250-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering
ent://SD_ILS/0/SD_ILS:485213
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Ali, Syed Riffat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Statistics in Transportation and Communication Selected Papers from the 18th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’18, 17-20 October 2018, Riga, Latvia
ent://SD_ILS/0/SD_ILS:486996
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Kabashkin, Igor. editor. Yatskiv (Jackiva), Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-12450-2">https://doi.org/10.1007/978-3-030-12450-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2018 International Conference on Human Error, Reliability, Resilience, and Performance, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USA
ent://SD_ILS/0/SD_ILS:485921
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Boring, Ronald L. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-94391-6">https://doi.org/10.1007/978-3-319-94391-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic Models in Reliability, Network Security and System Safety Essays Dedicated to Professor Jinhua Cao on the Occasion of His 80th Birthday
ent://SD_ILS/0/SD_ILS:486029
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Li, Quan-Lin. editor. Wang, Jinting. editor. Yu, Hai-Bo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-15-0864-6">https://doi.org/10.1007/978-981-15-0864-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of Selective Laser Melted AlSi12 Alloy for Quasistatic and Fatigue Applications
ent://SD_ILS/0/SD_ILS:487045
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Siddique, Shafaqat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-658-23425-6">https://doi.org/10.1007/978-3-658-23425-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USA
ent://SD_ILS/0/SD_ILS:401830
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Boring, Ronald Laurids. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-60645-3">https://doi.org/10.1007/978-3-319-60645-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’17, 18-21 October, 2017, Riga, Latvia
ent://SD_ILS/0/SD_ILS:402395
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-74454-4">https://doi.org/10.1007/978-3-319-74454-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliability
ent://SD_ILS/0/SD_ILS:460117
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Suganuma, Katsuaki, editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780081020944">https://www.sciencedirect.com/science/book/9780081020944</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliability
ent://SD_ILS/0/SD_ILS:400290
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Jahanshahi, Mohsen. author. Bistouni, Fathollah. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-78473-1">https://doi.org/10.1007/978-3-319-78473-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, Västerås, Sweden, September 19-21, 2018, Proceedings
ent://SD_ILS/0/SD_ILS:400344
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-99130-6">https://doi.org/10.1007/978-3-319-99130-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Systems 13th International Conference, QShine 2017, Dalian, China, December 16 -17, 2017, Proceedings
ent://SD_ILS/0/SD_ILS:400873
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Wang, Lei. editor. Qiu, Tie. editor. Zhao, Wenbing. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-78078-8">https://doi.org/10.1007/978-3-319-78078-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2018 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Västerås, Sweden, September 18, 2018, Proceedings
ent://SD_ILS/0/SD_ILS:399783
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-99229-7">https://doi.org/10.1007/978-3-319-99229-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
ent://SD_ILS/0/SD_ILS:401348
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Wang, Zheng. author. Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-1073-6">https://doi.org/10.1007/978-981-10-1073-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solid State Lighting Reliability Part 2 Components to Systems
ent://SD_ILS/0/SD_ILS:401528
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author van Driel, Willem Dirk. editor. Fan, Xuejun. editor. Zhang, Guo Qi. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semi-Markov processes : applications in system reliability and maintenance
ent://SD_ILS/0/SD_ILS:355517
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Grabski, Franciszek, author.<br/>Preferred Shelf Number ONLINE(355517.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128005187">http://www.sciencedirect.com/science/book/9780128005187</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of Steel Columns Protected by Intumescent Coatings Subjected to Natural Fires
ent://SD_ILS/0/SD_ILS:530376
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Zhang, Chao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-662-46379-6">https://doi.org/10.1007/978-3-662-46379-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 34th International Conference, SAFECOMP 2015, Delft, The Netherlands, September 23-25, 2015, Proceedings
ent://SD_ILS/0/SD_ILS:519026
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-24255-2">https://doi.org/10.1007/978-3-319-24255-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Maintenance Overtime Policies in Reliability Theory Models with Random Working Cycles
ent://SD_ILS/0/SD_ILS:530050
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Nakagawa, Toshio. author. Zhao, Xufeng. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-20813-8">https://doi.org/10.1007/978-3-319-20813-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Availability of Quality Control Based on Wavelet Computer Vision
ent://SD_ILS/0/SD_ILS:530061
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Kuzmanić, Ivica. author. Vujović, Igor. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-13317-1">https://doi.org/10.1007/978-3-319-13317-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamentals of Lead-Free Solder Interconnect Technology From Microstructures to Reliability
ent://SD_ILS/0/SD_ILS:530321
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Lee, Tae-Kyu. author. Bieler, Thomas R. author. Kim, Choong-Un. author. Ma, Hongtao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-9266-5">https://doi.org/10.1007/978-1-4614-9266-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2015 Workshops, ASSURE, DECSoS. ISSE, ReSA4CI, and SASSUR, Delft, The Netherlands, September 22, 2015, Proceedings
ent://SD_ILS/0/SD_ILS:519092
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-24249-1">https://doi.org/10.1007/978-3-319-24249-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Numerical Methods for Reliability and Safety Assessment Multiscale and Multiphysics Systems
ent://SD_ILS/0/SD_ILS:529277
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Kadry, Seifedine. editor. El Hami, Abdelkhalak. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-07167-1">https://doi.org/10.1007/978-3-319-07167-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Silicon Analog Components Device Design, Process Integration, Characterization, and Reliability
ent://SD_ILS/0/SD_ILS:529569
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-2751-7">https://doi.org/10.1007/978-1-4939-2751-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
ent://SD_ILS/0/SD_ILS:488848
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Richter, Detlev. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-007-6082-0">https://doi.org/10.1007/978-94-007-6082-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of safety-critical systems : theory and application
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2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Fundamentals of reliability engineering : applications in multistage interconnection networks
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Reliability prediction from burn-in data fit to reliability models
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2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Bernstein, Joseph.<br/>Preferred Shelf Number ONLINE(355921.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128007471">http://www.sciencedirect.com/science/book/9780128007471</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 33rd International Conference, SAFECOM 2014, Florence, Italy, September 10-12, 2014. Proceedings
ent://SD_ILS/0/SD_ILS:482801
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Bondavalli, Andrea. editor. Di Giandomenico, Felicita. editor. (orcid)0000-0002-8760-7299 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-10506-2">https://doi.org/10.1007/978-3-319-10506-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Availability, Reliability, and Security in Information Systems IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2014 and 4th InternationalWorkshop on Security and Cognitive Informatics for Homeland Defense, SeCIHD 2014, Fribourg, Switzerland, September 8-12, 2014. Proceedings
ent://SD_ILS/0/SD_ILS:489055
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
ent://SD_ILS/0/SD_ILS:489246
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-007-7663-0">https://doi.org/10.1007/978-94-007-7663-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and failure of electronic materials and devices
ent://SD_ILS/0/SD_ILS:355485
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Ohring, Milton, 1936- Kasprzak, Lucian.<br/>Preferred Shelf Number ONLINE(355485.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solder Joint Reliability Assessment Finite Element Simulation Methodology
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2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Tamin, Mohd N. author. Shaffiar, Norhashimah M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-00092-3">https://doi.org/10.1007/978-3-319-00092-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2014 Workshops: ASCoMS, DECSoS, DEVVARTS, ISSE, ReSA4CI, SASSUR. Florence, Italy, September 8-9, 2014, Proceedings
ent://SD_ILS/0/SD_ILS:485676
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Bondavalli, Andrea. editor. Ceccarelli, Andrea. editor. Ortmeier, Frank. editor. (orcid)0000-0001-6186-4142 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-10557-4">https://doi.org/10.1007/978-3-319-10557-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Gas and oil reliability engineering modeling and analysis
ent://SD_ILS/0/SD_ILS:145907
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Calixto, Eduardo.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Networks 9th International Conference, QShine 2013, Greader Noida, India, January 11-12, 2013, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:334505
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Availability, Reliability, and Security in Information Systems and HCI IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2013, Regensburg, Germany, September 2-6, 2013. Proceedings
ent://SD_ILS/0/SD_ILS:334958
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Cuzzocrea, Alfredo. editor. Kittl, Christian. editor. Simos, Dimitris E. editor. Weippl, Edgar. editor. Xu, Lida. editor.<br/>Preferred Shelf Number ONLINE(334958.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings
ent://SD_ILS/0/SD_ILS:335005
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Bitsch, Friedemann. editor. Guiochet, Jérémie. editor. Kaâniche, Mohamed. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335005.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-40793-2">http://dx.doi.org/10.1007/978-3-642-40793-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
ent://SD_ILS/0/SD_ILS:331478
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331478.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-4337-7">http://dx.doi.org/10.1007/978-1-4614-4337-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples
ent://SD_ILS/0/SD_ILS:365001
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.<br/>Preferred Shelf Number ONLINE(365001.1)<br/>Electronic Access Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.
ent://SD_ILS/0/SD_ILS:305286
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:332682
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332682.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optimal Stochastic Control Schemes within a Structural Reliability Framework
ent://SD_ILS/0/SD_ILS:332864
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Leira, Bernt J. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332864.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-01405-0">http://dx.doi.org/10.1007/978-3-319-01405-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications
ent://SD_ILS/0/SD_ILS:306566
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Wu, Bin, author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Risk Evaluation of Wind Integrated Power Systems
ent://SD_ILS/0/SD_ILS:335484
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Billinton, Roy. editor. Karki, Rajesh. editor. Verma, Ajit Kumar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335484.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-81-322-0987-4">http://dx.doi.org/10.1007/978-81-322-0987-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Early Software Reliability Prediction A Fuzzy Logic Approach
ent://SD_ILS/0/SD_ILS:335512
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Pandey, Ajeet Kumar. author. Goyal, Neeraj Kumar. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335512.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-81-322-1176-1">http://dx.doi.org/10.1007/978-81-322-1176-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic Orders in Reliability and Risk In Honor of Professor Moshe Shaked
ent://SD_ILS/0/SD_ILS:332149
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Li, Haijun. editor. Li, Xiaohu. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332149.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-6892-9">http://dx.doi.org/10.1007/978-1-4614-6892-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Multidisciplinary Research and Practice for Information Systems IFIP WG 8.4, 8.9/TC 5 International Cross-Domain Conference and Workshop on Availability, Reliability, and Security, CD-ARES 2012, Prague, Czech Republic, August 20-24, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197227
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Quirchmayr, Gerald. editor. Basl, Josef. editor. You, Ilsun. editor. Xu, Lida. editor. Weippl, Edgar. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-32498-7">http://dx.doi.org/10.1007/978-3-642-32498-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security SAFECOMP 2012 Workshops: Sassur, ASCoMS, DESEC4LCCI, ERCIM/EWICS, IWDE, Magdeburg, Germany, September 25-28, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197419
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Computer Safety, Reliability, and Security 31st International Conference, SAFECOMP 2012, Magdeburg, Germany, September 25-28, 2012. Proceedings
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2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Ortmeier, Frank. editor. Daniel, Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33678-2">http://dx.doi.org/10.1007/978-3-642-33678-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliability
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2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Levinson, David M. editor. Liu, Henry X. editor. Bell, Michael. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power Electronic Packaging Design, Assembly Process, Reliability and Modeling
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2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Liu, Yong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, Availability and Serviceability of Networks-on-Chip
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2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Cota, Érika. author. Morais Amory, Alexandre. author. Soares Lubaszewski, Marcelo. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0791-1">http://dx.doi.org/10.1007/978-1-4614-0791-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Non-Destructive Assessment of Concrete Structures: Reliability and Limits of Single and Combined Techniques State-of-the-Art Report of the RILEM Technical Committee 207-INR
ent://SD_ILS/0/SD_ILS:206444
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems
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2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems
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2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Bauer, Eric. Adams, Randee. Eustace, Dan. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119941378">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Using the Weibull distribution reliability, modeling, and inference
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2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:196648
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Zhang, Xi. editor. Qiao, Daji. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-29222-4">http://dx.doi.org/10.1007/978-3-642-29222-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Importance measures in reliability, risk, and optimization principles and applications
ent://SD_ILS/0/SD_ILS:299386
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Assessment of Power System Reliability Methods and Applications
ent://SD_ILS/0/SD_ILS:168569
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Čepin, Marko. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-688-7">http://dx.doi.org/10.1007/978-0-85729-688-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
ent://SD_ILS/0/SD_ILS:172530
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6217-1">http://dx.doi.org/10.1007/978-1-4419-6217-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality and Reliability of Large-Eddy Simulations II
ent://SD_ILS/0/SD_ILS:205784
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Salvetti, Maria Vittoria. editor. Geurts, Bernard. editor. Meyers, Johan. editor. Sagaut, Pierre. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-0231-8">http://dx.doi.org/10.1007/978-94-007-0231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Adhesives technology for electronic applications materials, processing, reliability
ent://SD_ILS/0/SD_ILS:146014
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Licari, James J., 1930- Swanson, Dale W.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, Maintainability and Risk Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.
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2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Smith, David J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 30th International Conference,SAFECOMP 2011, Naples, Italy, September 19-22, 2011. Proceedings
ent://SD_ILS/0/SD_ILS:195586
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Flammini, Francesco. editor. Bologna, Sandro. editor. Vittorini, Valeria. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-24270-0">http://dx.doi.org/10.1007/978-3-642-24270-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability in Scientific Research Improving the Dependability of Measurements, Calculations, Equipment, and Software
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2026-02-17T18:26:00Z
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Reliability, maintainability, and risk : practical methods for engineers
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2026-02-17T18:26:00Z
Author Smith, David J. (David John), 1943 June 22-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Spacecraft reliability and multi-state failures a statistical approach
ent://SD_ILS/0/SD_ILS:305721
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Saleh, Joseph H., 1971- Castet, Jean-François. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a>
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Probability, statistics, and reliability for engineers and scientists
ent://SD_ILS/0/SD_ILS:312915
2026-02-17T18:26:00Z
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Author Ayyub, Bilal M., author. McCuen, Richard H., 1941-<br/>Preferred Shelf Number ONLINE(312915.1)<br/>Electronic Access Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpPSRESE01">http://app.knovel.com/web/toc.v/cid:kpPSRESE01</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Basic Concepts and Applications in ICT
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2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Lazzaroni, Massimo. author. Cristaldi, Loredana. author. Peretto, Lorenzo. author. Rinaldi, Paola. author. Catelani, Marcantonio. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-20983-3">http://dx.doi.org/10.1007/978-3-642-20983-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Availability, Reliability and Security for Business, Enterprise and Health Information Systems IFIP WG 8.4/8.9 International Cross Domain Conference and Workshop, ARES 2011, Vienna, Austria, August 22-26, 2011. Proceedings
ent://SD_ILS/0/SD_ILS:195302
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Modeling and simulation for microelectronic packaging assembly manufacture, reliability, and testing
ent://SD_ILS/0/SD_ILS:298653
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Liu, S. (Sheng), 1963- Liu, Yong, 1962- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470827826">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Data Analysis Theory and Applications to Reliability and Inference, Data Mining, Bioinformatics, Lifetime Data, and Neural Networks
ent://SD_ILS/0/SD_ILS:168292
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Skiadas, Christos H. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4799-5">http://dx.doi.org/10.1007/978-0-8176-4799-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Degradation Modeling Applications to Reliability, Survival Analysis, and Finance
ent://SD_ILS/0/SD_ILS:168321
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Nikulin, M.S. editor. Limnios, Nikolaos. editor. Balakrishnan, N. editor. Kahle, Waltraud. editor. Huber-Carol, Catherine. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4924-1">http://dx.doi.org/10.1007/978-0-8176-4924-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Mathematical and Statistical Models and Methods in Reliability Applications to Medicine, Finance, and Quality Control
ent://SD_ILS/0/SD_ILS:168333
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Probability and Statistical Models Foundations for Problems in Reliability and Financial Mathematics
ent://SD_ILS/0/SD_ILS:168337
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Gupta, Arjun K. author. Zeng, Wei-Bin. author. Wu, Yanhong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4987-6">http://dx.doi.org/10.1007/978-0-8176-4987-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:172571
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author McPherson, J.W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Multi-state System Reliability Analysis and Optimization for Engineers and Industrial Managers
ent://SD_ILS/0/SD_ILS:176221
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Lisnianski, Anatoly. author. Frenkel, Ilia. author. Ding, Yi. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-320-6">http://dx.doi.org/10.1007/978-1-84996-320-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Process risk and reliability management operational integrity management
ent://SD_ILS/0/SD_ILS:147219
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Sutton, Ian S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design for reliability information and computer-based systems
ent://SD_ILS/0/SD_ILS:249879
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Bauer, Eric.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Calculation of Roundabouts Capacity, Waiting Phenomena and Reliability
ent://SD_ILS/0/SD_ILS:190985
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Mauro, Raffaele. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-04551-6">http://dx.doi.org/10.1007/978-3-642-04551-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 29th International Conference, SAFECOMP 2010, Vienna, Austria, September 14-17, 2010. Proceedings
ent://SD_ILS/0/SD_ILS:193040
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Schoitsch, Erwin. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-15651-9">http://dx.doi.org/10.1007/978-3-642-15651-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of Reliability, Availability, Maintainability and Safety in Engineering Design
ent://SD_ILS/0/SD_ILS:175745
2026-02-17T18:26:00Z
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Author Stapelberg, Rudolph Frederick. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-175-6">http://dx.doi.org/10.1007/978-1-84800-175-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality of Service in Heterogeneous Networks 6th International ICST Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2009 and 3rd International Workshop on Advanced Architectures and Algorithms for Internet Delivery and Applications, AAA-IDEA 2009, Las Palmas, Gran Canaria, November 23-25, 2009 Proceedings
ent://SD_ILS/0/SD_ILS:191426
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Bartolini, Novella. editor. Nikoletseas, Sotiris. editor. Sinha, Prasun. editor. Cardellini, Valeria. editor. Mahanti, Anirban. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-10625-5">http://dx.doi.org/10.1007/978-3-642-10625-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Machine Learning in Cyber Trust Security, Privacy, and Reliability
ent://SD_ILS/0/SD_ILS:167900
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Yu, Philip S. editor. Tsai, Jeffrey J. P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-88735-7">http://dx.doi.org/10.1007/978-0-387-88735-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power distribution system reliability practical methods and applications
ent://SD_ILS/0/SD_ILS:249563
2026-02-17T18:26:00Z
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Author Chowdhury, Ali A. Koval, D. O. (Don Orest)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 28th International Conference, SAFECOMP 2009, Hamburg, Germany, September 15-18, 2009. Proceedings
ent://SD_ILS/0/SD_ILS:190960
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Buth, Bettina. editor. Rabe, Gerd. editor. Seyfarth, Till. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-04468-7">http://dx.doi.org/10.1007/978-3-642-04468-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Corrosion, wear, fatigue, and reliability of ceramics a collection of papers presented at the 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008, Daytona Beach, Florida
ent://SD_ILS/0/SD_ILS:297457
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.) Salem, J. A. (Jonathan A.), 1960- Fuller, Edwin R. Ohji, T. (Tatsuki) Wereszczak, Andrew.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470456347">http://dx.doi.org/10.1002/9780470456347</a>
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Robust design methodology for reliability exploring the effects of variation and uncertainty
ent://SD_ILS/0/SD_ILS:298396
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Bergman, Bo, 1943- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a>
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Computer Safety, Reliability, and Security 27th International Conference, SAFECOMP 2008 Newcastle upon Tyne, UK, September 22-25, 2008 Proceedings
ent://SD_ILS/0/SD_ILS:188894
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Harrison, Michael D. editor. Sujan, Mark-Alexander. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-87698-4">http://dx.doi.org/10.1007/978-3-540-87698-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliability
ent://SD_ILS/0/SD_ILS:183993
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Bertsche, Bernd. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-34282-3">http://dx.doi.org/10.1007/978-3-540-34282-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Developments in Telecommunications With a Focus on SS7 Network Reliability
ent://SD_ILS/0/SD_ILS:187329
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Rufa, Gerhard. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74986-8">http://dx.doi.org/10.1007/978-3-540-74986-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Engineering design reliability applications for the aerospace, automotive, and ship industries
ent://SD_ILS/0/SD_ILS:153040
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren. CRC Press.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysis
ent://SD_ILS/0/SD_ILS:167030
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Limnios, Nikolaos. author. Barbu, Vlad Stefan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-73173-5">http://dx.doi.org/10.1007/978-0-387-73173-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Next Generation Wireless LANs Throughput, Robustness, and Reliability in 802.11n
ent://SD_ILS/0/SD_ILS:236024
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
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Tutorial on hardware and software reliability, maintainability, and availability
ent://SD_ILS/0/SD_ILS:249814
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Schneidewind, Norman.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540</a>
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Mathematical methods in survival analysis, reliability and quality of life
ent://SD_ILS/0/SD_ILS:297543
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Huber, Catherine.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625</a>
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Computational Intelligence in Reliability Engineering Evolutionary Techniques in Reliability Analysis and Optimization
ent://SD_ILS/0/SD_ILS:184534
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Levitin, Gregory. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37368-1">http://dx.doi.org/10.1007/978-3-540-37368-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computational Intelligence in Reliability Engineering New Metaheuristics, Neural and Fuzzy Techniques in Reliability
ent://SD_ILS/0/SD_ILS:184535
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Levitin, Gregory. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37372-8">http://dx.doi.org/10.1007/978-3-540-37372-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 26th International Conference, SAFECOMP 2007, Nuremberg, Germany, September 18-21, 2007. Proceedings
ent://SD_ILS/0/SD_ILS:187335
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Saglietti, Francesca. editor. Oster, Norbert. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-75101-4">http://dx.doi.org/10.1007/978-3-540-75101-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
A Guide to Lead-free Solders Physical Metallurgy and Reliability
ent://SD_ILS/0/SD_ILS:175373
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Evans, John W. author. Engelmaier, Werner. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
ent://SD_ILS/0/SD_ILS:165900
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, Life Testing and the Prediction of Service Lives For Engineers and Scientists
ent://SD_ILS/0/SD_ILS:166411
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Saunders, Sam C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-48538-6">http://dx.doi.org/10.1007/978-0-387-48538-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semi-Markov Risk Models for Finance, Insurance and Reliability
ent://SD_ILS/0/SD_ILS:166761
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Jacques, Janssen. author. Raimondo, Manca. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-70730-1">http://dx.doi.org/10.1007/0-387-70730-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
System Signatures and their Applications in Engineering Reliability
ent://SD_ILS/0/SD_ILS:166881
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Samaniego, Francisco J. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-71797-5">http://dx.doi.org/10.1007/978-0-387-71797-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Risk-based reliability analysis and generic principles for risk reduction
ent://SD_ILS/0/SD_ILS:148956
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Todinov, M. T.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Margins of error a study of reliability in survey measurement
ent://SD_ILS/0/SD_ILS:296996
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Alwin, Duane F. (Duane Francis), 1944- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html">http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470146316">http://dx.doi.org/10.1002/9780470146316</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 25th International Conference, SAFECOMP 2006, Gdansk, Poland, September 27-29, 2006. Proceedings
ent://SD_ILS/0/SD_ILS:184859
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Górski, Janusz. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11875567">http://dx.doi.org/10.1007/11875567</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
IUTAM Symposium on Mechanics and Reliability of Actuating Materials Proceedings of the IUTAM Symposium held in Beijing, China, 1–3 September, 2004
ent://SD_ILS/0/SD_ILS:169088
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Yang, W. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-4131-4">http://dx.doi.org/10.1007/1-4020-4131-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 24th International Conference, SAFECOMP 2005, Fredrikstad, Norway, September 28-30, 2005. Proceedings
ent://SD_ILS/0/SD_ILS:183068
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Winther, Rune. editor. Gran, Bjørn Axel. editor. Dahll, Gustav. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11563228">http://dx.doi.org/10.1007/11563228</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Ranking and Selection, Multiple Comparisons, and Reliability Methodology and Applications
ent://SD_ILS/0/SD_ILS:168118
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Balakrishnan, N. editor. Nagaraja, H. N. editor. Kannan, N. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138793">http://dx.doi.org/10.1007/b138793</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, maintainability and risk practical methods for engineers
ent://SD_ILS/0/SD_ILS:254854
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Smith, David John, 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Adhesives technology for electronic applications materials, processes, reliability
ent://SD_ILS/0/SD_ILS:256461
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Licari, James J., 1930- Swanson, Dale W.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815515135">http://www.sciencedirect.com/science/book/9780815515135</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Robust communications software extreme availability, reliability and scalability for carrier-grade systems
ent://SD_ILS/0/SD_ILS:295648
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Utas, Greg. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470011793">http://dx.doi.org/10.1002/0470011793</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Axiomatic quality integrating axiomatic design with six-sigma, reliability, and quality engineering
ent://SD_ILS/0/SD_ILS:301672
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author El-Haik, Basem.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access OverDrive (PDF) <a href="http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50">http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50</a>
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Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpAQIADSS2">http://app.knovel.com/web/toc.v/cid:kpAQIADSS2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Coating materials for electronic applications polymers, processes, reliability, testing
ent://SD_ILS/0/SD_ILS:254844
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Licari, James J., 1930-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815514923">http://www.sciencedirect.com/science/book/9780815514923</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, survivability and quality of large scale telecommunications systems
ent://SD_ILS/0/SD_ILS:301093
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Stavroulakis, Peter. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470860812">http://dx.doi.org/10.1002/0470860812</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Risk, Reliability, Uncertainty, and Robustness of Water Resource Systems
ent://SD_ILS/0/SD_ILS:236637
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Bogardi, Janos J.. Kundzewicz, Zbigniew W..<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511546006">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of computer systems and networks fault tolerance, analysis and design
ent://SD_ILS/0/SD_ILS:301466
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Shooman, Martin L. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/047122460X">http://dx.doi.org/10.1002/047122460X</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html">http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fault detectability in DWDM toward higher signal quality & system reliability
ent://SD_ILS/0/SD_ILS:249713
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Kartalopoulos, Stamatios V.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Engineering maintainability how to design for reliability and easy maintenance
ent://SD_ILS/0/SD_ILS:254337
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152576">http://www.sciencedirect.com/science/book/9780884152576</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and failure of electronic materials and devices
ent://SD_ILS/0/SD_ILS:256309
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Ohring, Milton, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems
ent://SD_ILS/0/SD_ILS:249594
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Pukite, Jan, 1928- Pukite, Paul.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Guardians of science fairness and reliability of peer review
ent://SD_ILS/0/SD_ILS:300518
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Daniel, Hans-Dieter, 1955- Russey, William E. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/29859865.html">http://catalog.hathitrust.org/api/volumes/oclc/29859865.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/3527602208">http://dx.doi.org/10.1002/3527602208</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability analysis and prediction a methodology oriented treatment
ent://SD_ILS/0/SD_ILS:255244
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Misra, Krishna B., 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444896063">http://www.sciencedirect.com/science/book/9780444896063</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Guidelines for process equipment reliability data with data tables
ent://SD_ILS/0/SD_ILS:300061
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470938355">http://dx.doi.org/10.1002/9780470938355</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability theory and models stochastic failure models, optimal maintenance policies, life testing, and structures
ent://SD_ILS/0/SD_ILS:256119
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Abdel-Hameed, Mohamed S. Çınlar, E. (Erhan), 1941- Quinn, Joseph.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120414208">http://www.sciencedirect.com/science/book/9780120414208</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Mathematical models for the study of the reliability of systems
ent://SD_ILS/0/SD_ILS:256673
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Kaufmann, A. (Arnold), 1911- Grouchko, Daniel. Cruon, R.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124023703">http://www.sciencedirect.com/science/book/9780124023703</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Graph theory in modern engineering computer aided design, control, optimization, reliability analysis
ent://SD_ILS/0/SD_ILS:256727
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Henley, Ernest J. Williams, R. A. (Richard A.)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123408501">http://www.sciencedirect.com/science/book/9780123408501</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Implosion : lessons from national security, high reliability spacecraft, electronics, and the forces which changed them
ent://SD_ILS/0/SD_ILS:249341
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Temple, L. Parker.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6480472">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6480472</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Risk-Conscious Operations Management An Integrated Paradigm for Complex Engineering System
ent://SD_ILS/0/SD_ILS:526722
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Varde, Prabhakar V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-19-9334-3">https://doi.org/10.1007/978-981-19-9334-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Maintainability of Building Envelope Elements Optimizing Predictive Condition-Based Maintenance Decisions
ent://SD_ILS/0/SD_ILS:527007
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Ferreira, Cláudia. author. Silva, Ana. author. de Brito, Jorge. author. Flores-Colen, Inês. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-14767-8">https://doi.org/10.1007/978-3-031-14767-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optimal Inspection Models with Their Applications
ent://SD_ILS/0/SD_ILS:527328
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Ito, Kodo. author. Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-22021-0">https://doi.org/10.1007/978-3-031-22021-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Selective Maintenance Modelling and Optimization Basic Methods and Some Recent Advances
ent://SD_ILS/0/SD_ILS:527294
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Liu, Yu. author. Huang, Hong-Zhong. author. Jiang, Tao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-17323-3">https://doi.org/10.1007/978-3-031-17323-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Artificial Intelligence for Smart Manufacturing Methods, Applications, and Challenges
ent://SD_ILS/0/SD_ILS:527797
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Tran, Kim Phuc. editor. (orcid)0000-0002-6005-1497 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-30510-8">https://doi.org/10.1007/978-3-031-30510-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
System Dependability and Analytics Approaching System Dependability from Data, System and Analytics Perspectives
ent://SD_ILS/0/SD_ILS:528574
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Wang, Long. editor. Pattabiraman, Karthik. editor. Di Martino, Catello. editor. Athreya, Arjun. editor. Bagchi, Saurabh. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-02063-6">https://doi.org/10.1007/978-3-031-02063-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Technical System Maintenance Delay-Time-Based Modelling
ent://SD_ILS/0/SD_ILS:483411
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Werbińska-Wojciechowska, Sylwia. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-10788-8">https://doi.org/10.1007/978-3-030-10788-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Engineering Design under Uncertainty and Health Prognostics
ent://SD_ILS/0/SD_ILS:487389
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Hu, Chao. author. Youn, Byeng D. author. Wang, Pingfeng. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-92574-5">https://doi.org/10.1007/978-3-319-92574-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advanced Maintenance Policies for Shock and Damage Models
ent://SD_ILS/0/SD_ILS:399178
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-70456-2">https://doi.org/10.1007/978-3-319-70456-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Risk-Based Engineering An Integrated Approach to Complex Systems—Special Reference to Nuclear Plants
ent://SD_ILS/0/SD_ILS:400726
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Varde, Prabhakar V. author. Pecht, Michael G. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-0090-5">https://doi.org/10.1007/978-981-13-0090-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Risk Management of Non-Renewable Energy Systems
ent://SD_ILS/0/SD_ILS:529649
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Verma, Ajit Kumar. author. Ajit, Srividya. author. Muruva, Hari Prasad. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-16062-7">https://doi.org/10.1007/978-3-319-16062-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Game Theoretic Analysis of Congestion, Safety and Security Traffic and Transportation Theory
ent://SD_ILS/0/SD_ILS:529429
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Hausken, Kjell. editor. Zhuang, Jun. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-11674-7">https://doi.org/10.1007/978-3-319-11674-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Game Theoretic Analysis of Congestion, Safety and Security Networks, Air Traffic and Emergency Departments
ent://SD_ILS/0/SD_ILS:529568
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Hausken, Kjell. editor. Zhuang, Jun. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-13009-5">https://doi.org/10.1007/978-3-319-13009-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Offshore Risk Assessment vol 2. Principles, Modelling and Applications of QRA Studies
ent://SD_ILS/0/SD_ILS:484312
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Vinnem, Jan-Erik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4471-5213-2">https://doi.org/10.1007/978-1-4471-5213-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Offshore Risk Assessment vol 1. Principles, Modelling and Applications of QRA Studies
ent://SD_ILS/0/SD_ILS:484335
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Vinnem, Jan-Erik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4471-5207-1">https://doi.org/10.1007/978-1-4471-5207-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Extended Warranties, Maintenance Service and Lease Contracts Modeling and Analysis for Decision-Making
ent://SD_ILS/0/SD_ILS:484374
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Murthy, D.N.Prabhakar. author. Jack, Nat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4471-6440-1">https://doi.org/10.1007/978-1-4471-6440-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Random Maintenance Policies
ent://SD_ILS/0/SD_ILS:487923
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4471-6575-0">https://doi.org/10.1007/978-1-4471-6575-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality Control Applications
ent://SD_ILS/0/SD_ILS:330894
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Chorafas, Dimitris N. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(330894.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2966-0">http://dx.doi.org/10.1007/978-1-4471-2966-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Improving the Earthquake Resilience of Buildings The worst case approach
ent://SD_ILS/0/SD_ILS:330916
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Takewaki, Izuru. author. Moustafa, Abbas. author. Fujita, Kohei. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(330916.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4144-0">http://dx.doi.org/10.1007/978-1-4471-4144-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Using Game Theory to Improve Safety within Chemical Industrial Parks
ent://SD_ILS/0/SD_ILS:331129
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Reniers, Genserik. author. Pavlova, Yulia. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331129.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-5052-7">http://dx.doi.org/10.1007/978-1-4471-5052-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic Analysis of Offshore Steel Structures An Analytical Appraisal
ent://SD_ILS/0/SD_ILS:332580
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Karadeniz, Halil. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332580.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-190-5">http://dx.doi.org/10.1007/978-1-84996-190-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Atomic Information Technology Safety and Economy of Nuclear Power Plants
ent://SD_ILS/0/SD_ILS:173523
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Woo, Taeho. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4030-6">http://dx.doi.org/10.1007/978-1-4471-4030-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Risk and Interdependencies in Critical Infrastructures A Guideline for Analysis
ent://SD_ILS/0/SD_ILS:173560
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Hokstad, Per. editor. Utne, Ingrid B. editor. Vatn, Jørn. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4661-2">http://dx.doi.org/10.1007/978-1-4471-4661-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Thermal Power Plant Performance Analysis
ent://SD_ILS/0/SD_ILS:173416
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author de Souza, Gilberto Francisco Martha. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2309-5">http://dx.doi.org/10.1007/978-1-4471-2309-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic Systems Uncertainty Quantification and Propagation
ent://SD_ILS/0/SD_ILS:173422
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Grigoriu, Mircea. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2327-9">http://dx.doi.org/10.1007/978-1-4471-2327-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Maintenance Management in Network Utilities Framework and Practical Implementation
ent://SD_ILS/0/SD_ILS:173475
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Gómez Fernández, Juan F. author. Crespo Márquez, Adolfo. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2757-4">http://dx.doi.org/10.1007/978-1-4471-2757-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Effective FMEAs achieving safe, reliable, and economical products and processes using failure mode and effects analysis
ent://SD_ILS/0/SD_ILS:299377
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Carlson, Carl (Carl Seymour)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118312575">http://dx.doi.org/10.1002/9781118312575</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=46749">http://www.books24x7.com/marc.asp?bookid=46749</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10558143">http://site.ebrary.com/lib/alltitles/Doc?id=10558143</a>
ebrary <a href="http://site.ebrary.com/id/10558143">http://site.ebrary.com/id/10558143</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Bayesian Inference for Probabilistic Risk Assessment A Practitioner's Guidebook
ent://SD_ILS/0/SD_ILS:176181
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Kelly, Dana. author. Smith, Curtis. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-187-5">http://dx.doi.org/10.1007/978-1-84996-187-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Replacement Models with Minimal Repair
ent://SD_ILS/0/SD_ILS:168457
2026-02-17T18:26:00Z
2026-02-17T18:26:00Z
Author Tadj, Lotfi. editor. Ouali, M.-Salah. editor. Yacout, Soumaya. editor. Ait-Kadi, Daoud. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-215-5">http://dx.doi.org/10.1007/978-0-85729-215-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>