Search Results for Reliability. - Narrowed by: Electronic Library SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue? 2024-11-09T00:20:20Z Reliability ent://SD_ILS/0/SD_ILS:233427 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Meyer, J. Patrick.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural reliability ent://SD_ILS/0/SD_ILS:297978 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Lemaire, Maurice.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability engineering ent://SD_ILS/0/SD_ILS:341870 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Kapur, Kailash C., 1941- author.&#160;Pecht, Michael, author.<br/>Preferred Shelf Number&#160;ONLINE(341870.1)<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a> MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> MEMS Reliability ent://SD_ILS/0/SD_ILS:172486 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Hartzell, Allyson L. author.&#160;da Silva, Mark G. author.&#160;Shea, Herbert R. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bayesian Reliability ent://SD_ILS/0/SD_ILS:167542 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Hamada, Michael S. author.&#160;Wilson, Alyson G. author.&#160;Reese, C. Shane. author.&#160;Martz, Harry F. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability fundamentals ent://SD_ILS/0/SD_ILS:255215 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;C&#259;tuneanu, Vasile M.&#160;Mihalache, Adrian.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ensuring software reliability ent://SD_ILS/0/SD_ILS:289793 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Neufelder, Ann Marie, 1960-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439832752">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System Software Reliability ent://SD_ILS/0/SD_ILS:175367 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:249382 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Raheja, Dev.&#160;Gullo, Louis J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical system reliability ent://SD_ILS/0/SD_ILS:153146 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Bauer, Eric.&#160;Zhang, Xuemei.&#160;Kimber, Douglas A.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of MEMS ent://SD_ILS/0/SD_ILS:303632 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Tsuchiya, Toshiyuki.&#160;Tabata, Osamu, 1956-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:285886 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Crow, Dana.&#160;Feinberg, Alec.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420040845">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical reliability engineering ent://SD_ILS/0/SD_ILS:305563 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;O'Connor, Patrick P.&#160;Kleyner, Andre.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Improving machinery reliability ent://SD_ILS/0/SD_ILS:153828 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Bloch, Heinz P., 1933-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic reliability models ent://SD_ILS/0/SD_ILS:299523 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Ushakov, I. A. (Igor&#697; Alekseevich)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical reliability engineering ent://SD_ILS/0/SD_ILS:295099 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Pavlov, I. V.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Chakravarty, Sumantra.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic reliability engineering ent://SD_ILS/0/SD_ILS:295101 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Falk, James.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Optimal Maintenance ent://SD_ILS/0/SD_ILS:175380 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Wang, Hongzhou. author.&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintenance Theory of Reliability ent://SD_ILS/0/SD_ILS:175323 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Safety Engineering ent://SD_ILS/0/SD_ILS:176193 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Verma, Ajit Kumar. author.&#160;Srividya, Ajit. author.&#160;Karanki, Durga Rao. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Engineering design reliability handbook ent://SD_ILS/0/SD_ILS:287313 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of large systems ent://SD_ILS/0/SD_ILS:254513 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Ko&#322;owrocki, Krzysztof.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power-system reliability calculations ent://SD_ILS/0/SD_ILS:220175 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Billinton, Roy.&#160;Ringlee, Robert J., joint author.&#160;Wood, Allen J., joint author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic Models in Reliability ent://SD_ILS/0/SD_ILS:332363 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Aven, Terje. author.&#160;Jensen, Uwe. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332363.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Network Reliability and Resilience ent://SD_ILS/0/SD_ILS:195005 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Gertsbakh, Ilya. author.&#160;Shpungin, Yoseph. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Life cycle reliability engineering ent://SD_ILS/0/SD_ILS:296926 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Yang, Guangbin, 1964-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reinforced concrete structural reliability ent://SD_ILS/0/SD_ILS:291660 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;El-Reedy, Mohamed Abdallah.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439874172">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quantile-Based Reliability Analysis ent://SD_ILS/0/SD_ILS:330556 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Nair, N. Unnikrishnan. author.&#160;Sankaran, P.G. author.&#160;Balakrishnan, N. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(330556.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronic thin-film reliability ent://SD_ILS/0/SD_ILS:278156 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Tu, K. N. (King-Ning), 1937-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:285664 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Brown, Richard E., 1969-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780849375682">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability-based Structural Design ent://SD_ILS/0/SD_ILS:175421 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Choi, Seung-Kyum. author.&#160;Canfield, Robert A. author.&#160;Grandhi, Ramana V. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Six Sigma ent://SD_ILS/0/SD_ILS:165709 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Kumar, U Dinesh. author.&#160;Crocker, John. author.&#160;Chitra, T. author.&#160;Saranga, Haritha. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:287445 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Brown, Richard E., 1969-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780824744281">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lubrication and reliability handbook ent://SD_ILS/0/SD_ILS:256333 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Neale, M. J. (Michael John)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fatigue design and reliability ent://SD_ILS/0/SD_ILS:254466 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)&#160;Marquis, G. (Gary)&#160;Solin, J.&#160;European Structural Integrity Society.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of reliability engineering ent://SD_ILS/0/SD_ILS:295100 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Harrison, Robert A.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fatigue and Fracture Reliability Engineering ent://SD_ILS/0/SD_ILS:168458 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Xiong, J.J. author.&#160;Shenoi, R.A. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-218-6">http://dx.doi.org/10.1007/978-0-85729-218-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Innovations in Power Systems Reliability ent://SD_ILS/0/SD_ILS:168417 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Anders, George. editor.&#160;Vaccaro, Alfredo. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Nonparametric Statistics in Reliability ent://SD_ILS/0/SD_ILS:168426 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;G&aacute;miz, M. Luz. author.&#160;Kulasekera, K. B. author.&#160;Limnios, Nikolaos. author.&#160;Lindqvist, Bo Henry. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software Reliability Assessment with OR Applications ent://SD_ILS/0/SD_ILS:168454 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Kapur, P.K. author.&#160;Pham, Hoang. author.&#160;Gupta, A. author.&#160;Jha, P.C. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-204-9">http://dx.doi.org/10.1007/978-0-85729-204-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mining Equipment Reliability, Maintainability, and Safety ent://SD_ILS/0/SD_ILS:144346 2024-11-09T00:20:20Z 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S. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in safety, reliability and risk management ent://SD_ILS/0/SD_ILS:342790 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;European Safety and Reliability Conference (2011 : Troyes, France)&#160;Berenguer, Christophe.&#160;Grall, Antoine.&#160;Soares, C. Guedes.<br/>Preferred Shelf Number&#160;ONLINE(342790.1)<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203135105">Distributed by publisher. 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N., Ph. D.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119966203">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Telecommunications system reliability engineering, theory, and practice ent://SD_ILS/0/SD_ILS:249397 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Ayers, Mark L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Compressors how to achieve high reliability &amp; availability ent://SD_ILS/0/SD_ILS:293579 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Bloch, Heinz P., 1933-&#160;Geitner, Fred K.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/compressors-how-to-achieve-high-reliability-availability">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability centered maintenance (RCM) implementation made simple ent://SD_ILS/0/SD_ILS:293571 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Bloom, Neil.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/reliability-centered-maintenance-rcm">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of Microtechnology Interconnects, Devices and Systems ent://SD_ILS/0/SD_ILS:172420 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Liu, Johan. author.&#160;Salmela, Olli. author.&#160;Sarkka, Jussi. author.&#160;Morris, James E. author.&#160;Tegehall, Per-Erik. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Hydrosystems engineering reliability assessment and risk analysis ent://SD_ILS/0/SD_ILS:293215 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Tung, Yeou-Koung.&#160;Yen, Ben Chie, 1935-&#160;Melching, Charles S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolution ent://SD_ILS/0/SD_ILS:191769 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Levi, Paul. author.&#160;Kernbach, Serge. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-11692-6">http://dx.doi.org/10.1007/978-3-642-11692-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability wearout mechanisms in advanced CMOS technologies ent://SD_ILS/0/SD_ILS:249574 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solder Joint Reliability Prediction for Multiple Environments ent://SD_ILS/0/SD_ILS:167673 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Perkins, Andrew E. author.&#160;Sitaraman, Suresh K. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> VoIP handbook applications, technologies, reliability, and security ent://SD_ILS/0/SD_ILS:289675 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Ahson, Syed.&#160;Ilyas, Mohammad, 1953-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420070217">Distributed by publisher. 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Keith, 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality and Reliability of Large-Eddy Simulations ent://SD_ILS/0/SD_ILS:170230 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Meyers, Johan. editor.&#160;Geurts, Bernard J. editor.&#160;Sagaut, Pierre. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-8578-9">http://dx.doi.org/10.1007/978-1-4020-8578-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Emerging Nanotechnologies Test, Defect Tolerance, and Reliability ent://SD_ILS/0/SD_ILS:167204 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Tehranipoor, Mohammad. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Rules of thumb for maintenance and reliability engineers ent://SD_ILS/0/SD_ILS:306517 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Smith, Ricky.&#160;Mobley, R. Keith, 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> New Computational Methods in Power System Reliability ent://SD_ILS/0/SD_ILS:187983 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Elmakias, David. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-77812-7">http://dx.doi.org/10.1007/978-3-540-77812-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solder Joint Technology Materials, Properties, and Reliability ent://SD_ILS/0/SD_ILS:166252 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Tu, King-Ning. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and risk models setting reliability requirements ent://SD_ILS/0/SD_ILS:295900 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Todinov, M. T.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Managing risk and reliability of process plants ent://SD_ILS/0/SD_ILS:254721 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Tweeddale, Mark.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677349">http://www.sciencedirect.com/science/book/9780750677349</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical reliability of electronic equipment and products ent://SD_ILS/0/SD_ILS:288362 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Hnatek, Eugene R.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203909089">Distributed by publisher. 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Proceedings ent://SD_ILS/0/SD_ILS:334958 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Cuzzocrea, Alfredo. editor.&#160;Kittl, Christian. editor.&#160;Simos, Dimitris E. editor.&#160;Weippl, Edgar. editor.&#160;Xu, Lida. editor.<br/>Preferred Shelf Number&#160;ONLINE(334958.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliability ent://SD_ILS/0/SD_ILS:173816 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Levinson, David M. editor.&#160;Liu, Henry X. editor.&#160;Bell, Michael. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power Electronic Packaging Design, Assembly Process, Reliability and Modeling ent://SD_ILS/0/SD_ILS:173841 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Liu, Yong. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multidisciplinary Research and Practice for Information Systems IFIP WG 8.4, 8.9/TC 5 International Cross-Domain Conference and Workshop on Availability, Reliability, and Security, CD-ARES 2012, Prague, Czech Republic, August 20-24, 2012. Proceedings ent://SD_ILS/0/SD_ILS:197227 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Quirchmayr, Gerald. editor.&#160;Basl, Josef. editor.&#160;You, Ilsun. editor.&#160;Xu, Lida. editor.&#160;Weippl, Edgar. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-32498-7">http://dx.doi.org/10.1007/978-3-642-32498-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papers ent://SD_ILS/0/SD_ILS:196648 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Zhang, Xi. editor.&#160;Qiao, Daji. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-29222-4">http://dx.doi.org/10.1007/978-3-642-29222-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2012 Workshops: Sassur, ASCoMS, DESEC4LCCI, ERCIM/EWICS, IWDE, Magdeburg, Germany, September 25-28, 2012. 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Proceedings ent://SD_ILS/0/SD_ILS:197420 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Ortmeier, Frank. editor.&#160;Daniel, Peter. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33678-2">http://dx.doi.org/10.1007/978-3-642-33678-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Non-Destructive Assessment of Concrete Structures: Reliability and Limits of Single and Combined Techniques State-of-the-Art Report of the RILEM Technical Committee 207-INR ent://SD_ILS/0/SD_ILS:206444 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Breysse, Denys. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-2736-6">http://dx.doi.org/10.1007/978-94-007-2736-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems ent://SD_ILS/0/SD_ILS:249351 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Bauer, Eric.&#160;Adams, Randee.&#160;Eustace, Dan.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric utility resource planning economics, reliability, and decision-making ent://SD_ILS/0/SD_ILS:290780 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Sim, Steven.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439884096">Distributed by publisher. 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Proceedings ent://SD_ILS/0/SD_ILS:195586 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Flammini, Francesco. editor.&#160;Bologna, Sandro. editor.&#160;Vittorini, Valeria. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-24270-0">http://dx.doi.org/10.1007/978-3-642-24270-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Assessment of Power System Reliability Methods and Applications ent://SD_ILS/0/SD_ILS:168569 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;&#268;epin, Marko. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-688-7">http://dx.doi.org/10.1007/978-0-85729-688-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Availability, Reliability and Security for Business, Enterprise and Health Information Systems IFIP WG 8.4/8.9 International Cross Domain Conference and Workshop, ARES 2011, Vienna, Austria, August 22-26, 2011. Proceedings ent://SD_ILS/0/SD_ILS:195302 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Tjoa, A Min. editor.&#160;Quirchmayr, Gerald. editor.&#160;You, Ilsun. editor.&#160;Xu, Lida. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-23300-5">http://dx.doi.org/10.1007/978-3-642-23300-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality and Reliability of Large-Eddy Simulations II ent://SD_ILS/0/SD_ILS:205784 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Salvetti, Maria Vittoria. editor.&#160;Geurts, Bernard. editor.&#160;Meyers, Johan. editor.&#160;Sagaut, Pierre. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-0231-8">http://dx.doi.org/10.1007/978-94-007-0231-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modeling and simulation for microelectronic packaging assembly manufacture, reliability, and testing ent://SD_ILS/0/SD_ILS:298653 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Liu, S. 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Proceedings ent://SD_ILS/0/SD_ILS:184859 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;G&oacute;rski, Janusz. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11875567">http://dx.doi.org/10.1007/11875567</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 24th International Conference, SAFECOMP 2005, Fredrikstad, Norway, September 28-30, 2005. Proceedings ent://SD_ILS/0/SD_ILS:183068 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Winther, Rune. editor.&#160;Gran, Bj&oslash;rn Axel. editor.&#160;Dahll, Gustav. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11563228">http://dx.doi.org/10.1007/11563228</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, maintainability and risk practical methods for engineers ent://SD_ILS/0/SD_ILS:254854 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Smith, David John, 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Adhesives technology for electronic applications materials, processes, reliability ent://SD_ILS/0/SD_ILS:256461 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Licari, James J., 1930-&#160;Swanson, Dale W.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815515135">http://www.sciencedirect.com/science/book/9780815515135</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust communications software extreme availability, reliability and scalability for carrier-grade systems ent://SD_ILS/0/SD_ILS:295648 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Utas, Greg.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470011793">http://dx.doi.org/10.1002/0470011793</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in Ranking and Selection, Multiple Comparisons, and Reliability Methodology and Applications ent://SD_ILS/0/SD_ILS:168118 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Balakrishnan, N. editor.&#160;Nagaraja, H. 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(Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884152576">http://www.sciencedirect.com/science/book/9780884152576</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems ent://SD_ILS/0/SD_ILS:249594 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Pukite, Jan, 1928-&#160;Pukite, Paul.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and failure of electronic materials and devices ent://SD_ILS/0/SD_ILS:256309 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Ohring, Milton, 1936-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Guardians of science fairness and reliability of peer review ent://SD_ILS/0/SD_ILS:300518 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Daniel, Hans-Dieter, 1955-&#160;Russey, William E.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/29859865.html">http://catalog.hathitrust.org/api/volumes/oclc/29859865.html</a> John Wiley <a href="http://dx.doi.org/10.1002/3527602208">http://dx.doi.org/10.1002/3527602208</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis and prediction a methodology oriented treatment ent://SD_ILS/0/SD_ILS:255244 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Misra, Krishna B., 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444896063">http://www.sciencedirect.com/science/book/9780444896063</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Guidelines for process equipment reliability data with data tables ent://SD_ILS/0/SD_ILS:300061 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;American Institute of Chemical Engineers. Center for Chemical Process Safety.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470938355">http://dx.doi.org/10.1002/9780470938355</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability theory and models stochastic failure models, optimal maintenance policies, life testing, and structures ent://SD_ILS/0/SD_ILS:256119 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Abdel-Hameed, Mohamed S.&#160;&Ccedil;&#305;nlar, E. (Erhan), 1941-&#160;Quinn, Joseph.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120414208">http://www.sciencedirect.com/science/book/9780120414208</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mathematical models for the study of the reliability of systems ent://SD_ILS/0/SD_ILS:256673 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Kaufmann, A. (Arnold), 1911-&#160;Grouchko, Daniel.&#160;Cruon, R.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124023703">http://www.sciencedirect.com/science/book/9780124023703</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Graph theory in modern engineering computer aided design, control, optimization, reliability analysis ent://SD_ILS/0/SD_ILS:256727 2024-11-09T00:20:20Z 2024-11-09T00:20:20Z Author&#160;Henley, Ernest J.&#160;Williams, R. A. 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