Search Results for Reliability. - Narrowed by: Wiley E-Book Collection SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AWILEY$002509Wiley$002bE-Book$002bCollection$0026ic$003dtrue$0026ps$003d300? 2026-02-17T21:53:42Z Reliability engineering ent://SD_ILS/0/SD_ILS:596162 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Elsayed, Elsayed A., author.<br/>Preferred Shelf Number&#160;TA169 .E52 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665946">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665946</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Photovoltaic module reliability ent://SD_ILS/0/SD_ILS:595739 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Wohlgemuth, J. (John), 1946- author.<br/>Preferred Shelf Number&#160;TK8322<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability prediction for microelectronics ent://SD_ILS/0/SD_ILS:598968 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Bernstein, Joseph B., author.&#160;Bensoussan, Alain A., author.&#160;Bender, Emmanuel (Carl), author.<br/>Preferred Shelf Number&#160;TK7874<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability engineering and services ent://SD_ILS/0/SD_ILS:594657 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Jin, Tongdan, author.<br/>Preferred Shelf Number&#160;TS173 .J56 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Biomechanics : optimization, uncertainties and reliability ent://SD_ILS/0/SD_ILS:593282 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Kharmanda, Ghias, author.&#160;El Hami, Abdelkhalak, author.<br/>Preferred Shelf Number&#160;QH513<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119379126">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119379126</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability-based modeling of system performance ent://SD_ILS/0/SD_ILS:598598 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;El Hami, Abdelkhalak, author.&#160;Eid, Mohamed, author.<br/>Preferred Shelf Number&#160;TA169 .H36 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394236695">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394236695</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design of experiments for reliability achievement ent://SD_ILS/0/SD_ILS:597561 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Rigdon, Steven E., 1955- author.&#160;Pan, Rong (Professor of reliability engineering), author.&#160;Montgomery, Douglas C., author.&#160;Freeman, Laura June, author.<br/>Preferred Shelf Number&#160;TS173 .R54 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural reliability in civil engineering ent://SD_ILS/0/SD_ILS:599747 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Jin, Wei-Liang, author.&#160;Ye, Qian, author.&#160;Bai, Yong, author.<br/>Preferred Shelf Number&#160;TA633 .J56 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119419044">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119419044</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis of modern power systems ent://SD_ILS/0/SD_ILS:599018 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Saket, R. K., editor.&#160;Sanjeevikumar, Padmanaban, 1978-<br/>Preferred Shelf Number&#160;TA169 .S234 2024<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computational intelligence in sustainable reliability engineering ent://SD_ILS/0/SD_ILS:598272 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Malik, S. C., editor.<br/>Preferred Shelf Number&#160;TA169 .C65 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis using MINITAB and Python ent://SD_ILS/0/SD_ILS:597824 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Hwang, Jaejin, author.<br/>Preferred Shelf Number&#160;TA169 .H93 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Interconnection network reliability evaluation : multistage layouts ent://SD_ILS/0/SD_ILS:596284 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Goyal, Neeraj Kumar, author.&#160;Rajkumar, S., author.<br/>Preferred Shelf Number&#160;TK5105.5 .G69 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620600">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620600</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical applications of Bayesian reliability ent://SD_ILS/0/SD_ILS:595173 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Liu, Yan, author.&#160;Abeyratne, Athula I., author.<br/>Preferred Shelf Number&#160;QA279.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability prediction and testing textbook ent://SD_ILS/0/SD_ILS:594209 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Klyatis, Lev M., author.&#160;Anderson, Edward, 1945- author.<br/>Preferred Shelf Number&#160;TA169.3 .K5964 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119411949">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119411949</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural reliability analysis and prediction ent://SD_ILS/0/SD_ILS:593807 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Melchers, R. E. (Robert E.), 1945- author.&#160;Beck, Andr&eacute; T., author.<br/>Preferred Shelf Number&#160;TA656.5 .M45 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lead-free soldering process development and reliability ent://SD_ILS/0/SD_ILS:595935 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Bath, Jasbir, editor.<br/>Preferred Shelf Number&#160;TK7870.15 .L434 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119482093">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119482093</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software reliability techniques for real-world applications ent://SD_ILS/0/SD_ILS:598123 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Youree, Roger K., author.<br/>Preferred Shelf Number&#160;QA76.76 .R44<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119931850">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119931850</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Improving product reliability and software quality : strategies, tools, process and implementation ent://SD_ILS/0/SD_ILS:595034 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Levin, Mark, 1959- author.&#160;Kalal, Ted T., author.&#160;Rodin, Jonathan, 1957- author.<br/>Preferred Shelf Number&#160;TS173 .L48 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Physics-Of-Healthy in Mechatronics. ent://SD_ILS/0/SD_ILS:598146 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;El Hami, Abdelkhalak.&#160;Delaux, David.&#160;Grzeskowiak, Henri.<br/>Preferred Shelf Number&#160;TA169 .E515 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design, modeling and reliability in rotating machinery ent://SD_ILS/0/SD_ILS:597382 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Perez, Robert X., editor.<br/>Preferred Shelf Number&#160;TJ177<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119631699">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119631699</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Repairable systems reliability analysis : a comprehensive framework ent://SD_ILS/0/SD_ILS:596328 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Rai, Rajiv Nandan, author.&#160;Chaturvedi, Sanjay K., author.&#160;Bolia, Nomesh, author.<br/>Preferred Shelf Number&#160;QA402 .R35 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Methods for reliability improvement and risk reduction ent://SD_ILS/0/SD_ILS:594697 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Todinov, M. T., author.<br/>Preferred Shelf Number&#160;TA169 .T649 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Artificial neural network for software reliability prediction ent://SD_ILS/0/SD_ILS:593854 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Bisi, Manjubala, author.&#160;Goyal, Neeraj Kumar, author.<br/>Preferred Shelf Number&#160;QA76.87<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119223931">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119223931</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability for industry. 1, Predictive reliability for the automobile, aeronautics, defense, medical, marine and space industries ent://SD_ILS/0/SD_ILS:598306 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;El Hami, Abdelkhalak, editor.&#160;Delaux, David, editor.&#160;Grzeskowiak, Henri, editor.<br/>Preferred Shelf Number&#160;TA169 .A67 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability culture : how leaders build organizations that create reliable products ent://SD_ILS/0/SD_ILS:596268 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Bahret, Adam P., 1973- author.<br/>Preferred Shelf Number&#160;TS156 .B335 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119612483">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119612483</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability for industry. 2, Experimental reliability for the automobile, aeronautics, defense, medical, marine and space industries ent://SD_ILS/0/SD_ILS:598326 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;El Hami, Abdelkhalak, editor.&#160;Delaux, David, editor.&#160;Grzeskowiak, Henri, editor.<br/>Preferred Shelf Number&#160;TA169 .A67 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability for industry. 3, Operational relability for the automobile, aeronautics, defense, medical, marine and space industries ent://SD_ILS/0/SD_ILS:598345 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;El Hami, Abdelkhalak, editor.&#160;Delaux, David, editor.&#160;Grzeskowiak, Henri, editor.<br/>Preferred Shelf Number&#160;TA169 .A67 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209781">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209781</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis, safety assessment and optimization : methods and applications in energy systems and other applications ent://SD_ILS/0/SD_ILS:597447 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Zio, Enrico, author.&#160;Li, Yan-Fu, author.<br/>Preferred Shelf Number&#160;TA169 .Z57 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of nuclear power plants : methods, data and applications ent://SD_ILS/0/SD_ILS:597759 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Lannoy, Andr&eacute;, editor.<br/>Preferred Shelf Number&#160;TK9153 .R45 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394165483">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394165483</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of maintained systems subjected to wear failure mechanisms : theory and applications ent://SD_ILS/0/SD_ILS:595240 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Bayle, Franck, author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Condition monitoring, troubleshooting and reliability in rotating machinery. Volume 3 ent://SD_ILS/0/SD_ILS:598336 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Perez, Robert X., editor.<br/>Preferred Shelf Number&#160;TJ153 .C66 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119631620">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119631620</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advanced techniques for maintenance modeling and reliability analysis of repairable systems ent://SD_ILS/0/SD_ILS:598651 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Sharma, Garima, author.&#160;Rai, Rajiv Nandan, author.<br/>Preferred Shelf Number&#160;TA169 .S53 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fault diagnosis, prognosis, and reliability for electrical drives : fault diagnosis, failure prognosis and their effects on the reliability of electrical machines, drives and power electronics ent://SD_ILS/0/SD_ILS:597036 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Strangas, Elias, author.&#160;Clerc, Guy, author.&#160;Razik, Hubert, author.&#160;Soualhi, Abdenour, author.<br/>Preferred Shelf Number&#160;TK4058 .S77 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119722823">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119722823</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintenance, reliability and troubleshooting in rotating machinery. Volume 2 ent://SD_ILS/0/SD_ILS:597525 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Perez, Robert X., editor<br/>Preferred Shelf Number&#160;TJ174 .M35 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119631668">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119631668</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cyber-physical distributed systems : modeling, reliability analysis and applications ent://SD_ILS/0/SD_ILS:596868 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Mo, Huadong, author.&#160;Sansavini, Giovanni, author.&#160;Xie, Min, author.<br/>Preferred Shelf Number&#160;TK5105.8857 .M59 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119682707">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119682707</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural reliability : approaches from perspectives of statistical moments ent://SD_ILS/0/SD_ILS:596358 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Zhao, Yan-Gang, author.&#160;Lu, Zhao-Hui, author.<br/>Preferred Shelf Number&#160;TA650 .Z53 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620754">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620754</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Root cause failure analysis : a guide to improve plant reliability ent://SD_ILS/0/SD_ILS:596464 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Sahoo, Trinath, author.<br/>Preferred Shelf Number&#160;TA169.55 .R66 S25 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119615606">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119615606</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical topics and stochastic models for dependent data with applications : applications in reliability, survival analysis and related fields ent://SD_ILS/0/SD_ILS:596386 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Barbu, Vlad Stefan.&#160;Vergne, Nicolas.<br/>Preferred Shelf Number&#160;QA276<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119779421">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119779421</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Prognostics and health management : a practical approach to improving system reliability using conditioned-based data ent://SD_ILS/0/SD_ILS:595035 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Goodman, Douglas (Industrial engineer), author.&#160;Hofmeister, James P., author.&#160;Szidarovszky, Ferenc, author.<br/>Preferred Shelf Number&#160;TJ174<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119356677">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119356677</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dynamic system reliability : modelling and analysis of dynamic and dependent behaviors ent://SD_ILS/0/SD_ILS:595289 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Xing, Liudong, author.&#160;Levitin, Gregory, author.&#160;Wang, Chaonan, 1986- author.<br/>Preferred Shelf Number&#160;TA169 .X56 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis for asset management of electric power grids ent://SD_ILS/0/SD_ILS:594672 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Ross, Robert D., author.<br/>Preferred Shelf Number&#160;TK3001 .R67 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119125204">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119125204</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power grid reliability evaluation : models and methods ent://SD_ILS/0/SD_ILS:594919 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Singh, Chanan, author.&#160;Jirutitijaroen, Panida, author.&#160;Mitra, Joydeep, author.<br/>Preferred Shelf Number&#160;TK3001<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119536772">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119536772</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Production availability and reliability : use in the oil and gas industry ent://SD_ILS/0/SD_ILS:594494 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Leroy, Alain, author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119522454">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119522454</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment ent://SD_ILS/0/SD_ILS:593728 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Modarres, M. (Mohammad), author.&#160;Amiri, Mehdi, author.&#160;Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number&#160;TA169.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cindynics, the science of danger : a wake-up call ent://SD_ILS/0/SD_ILS:597265 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Planchette, Guy.<br/>Preferred Shelf Number&#160;HD61<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119887751">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119887751</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Automotive system safety : critical considerations for engineering and effective management ent://SD_ILS/0/SD_ILS:595672 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Miller, Joseph (Joseph D.), author.<br/>Preferred Shelf Number&#160;TL242 .M55 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119579663">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119579663</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for safety ent://SD_ILS/0/SD_ILS:594109 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Gullo, Louis J., editor.&#160;Dixon, Jack, 1948- editor.<br/>Preferred Shelf Number&#160;TA169.7<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118974339">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118974339</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> From prognostics and health systems management to predictive maintenance 2 : knowledge, traceability and decision ent://SD_ILS/0/SD_ILS:593831 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Chebel-Morello, Brigitte, author.&#160;Nicod, Jean-Marc, author.&#160;Varnier, Christophe, author.<br/>Preferred Shelf Number&#160;TK5105.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119436805">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119436805</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Product maturity. 2, Principles and illustrations ent://SD_ILS/0/SD_ILS:597611 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Bayle, Franck, author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> First hitting time regression models : lifetime data analysis based on underlying stochastic processes ent://SD_ILS/0/SD_ILS:593826 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Caroni, Chrysseis, author.<br/>Preferred Shelf Number&#160;QA278.2<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119437260">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119437260</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Product maturity. 1, Theoretical principals and industrial applications ent://SD_ILS/0/SD_ILS:597455 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Bayle, Franck, author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multi-physics optimization : mechanics, fluid interaction structure, shaping, stochastic finite elements, random vibrations, fatigue ent://SD_ILS/0/SD_ILS:600124 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;El Hami, Abdelkhalak, author.&#160;Radi, Boucha&iuml;b, author.<br/>Preferred Shelf Number&#160;TA347 .F5 E43 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394401727">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394401727</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Diagnosis and fault-tolerant control. 1, Data-driven and model-based fault diagnosis techniques ent://SD_ILS/0/SD_ILS:597222 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Puig, Vicen&ccedil;, editor.&#160;Simani, Silvio, 1971- editor.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119882329">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119882329</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties ent://SD_ILS/0/SD_ILS:596531 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Dahoo, Pierre Richard.&#160;Pougnet, Philippe.&#160;El Hami, Abdelkhalak.<br/>Preferred Shelf Number&#160;QC88<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for excellence in electronics manufacturing ent://SD_ILS/0/SD_ILS:596229 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Tulkoff, Cheryl, author.&#160;Caswell, Greg, author.<br/>Preferred Shelf Number&#160;TK7870 .T845 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119109402">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119109402</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method ent://SD_ILS/0/SD_ILS:596749 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Dahoo, Pierre Richard, author.&#160;Pougnet, Philippe, author.&#160;El Hami, Abdelkhalak, author.<br/>Preferred Shelf Number&#160;QC88<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Diagnosis and fault-tolerant control. 2, From fault diagnosis to fault-tolerant control ent://SD_ILS/0/SD_ILS:597228 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Puig, Vicen&ccedil;, editor.&#160;Simani, Silvio, 1971- editor.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119882350">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119882350</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic risk analysis and management ent://SD_ILS/0/SD_ILS:593398 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Harlamov, Boris, author.<br/>Preferred Shelf Number&#160;HD61<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388883">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388883</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fluid-structure interactions and uncertainties : Ansys and fluent tools ent://SD_ILS/0/SD_ILS:593400 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;El Hami, Abdelkhalak, author.&#160;Radi, Boucha&iuml;b, author.<br/>Preferred Shelf Number&#160;TA357.5 .F58 E44 2017 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388937">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388937</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Chi-squared goodness-of-fit tests for censored data ent://SD_ILS/0/SD_ILS:593787 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Nikulin, M. S. (Mikhail Stepanovich), author.&#160;Chimitova, Ekaterina V., author.<br/>Preferred Shelf Number&#160;QA277.3<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119427605">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119427605</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The science of resilience : complexity, risk modeling, and systems ent://SD_ILS/0/SD_ILS:600298 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Lewis, Ted G., author<br/>Preferred Shelf Number&#160;TA169 .L49 2026<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394354955">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394354955</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safeguarding satellite communications : issues, challenges, and solutions ent://SD_ILS/0/SD_ILS:600245 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;An, Jianpin, author.<br/>Preferred Shelf Number&#160;TK5104 .A53 2026<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394304325">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394304325</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power system resource adequacy for clean energy ent://SD_ILS/0/SD_ILS:600249 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Dai, Renchang, author.<br/>Preferred Shelf Number&#160;TK1010 .D35 2026<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394318223">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394318223</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Neuropsychology in the Age of Digital Health Exploration, Application, and Practical Implementation. ent://SD_ILS/0/SD_ILS:600321 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Singh, Shifali.&#160;Weisenbach, Sara L.<br/>Preferred Shelf Number&#160;XX(600321.1)<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394295432">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394295432</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Hyper-Intelligent Networks Exploring the Future of Connectivity for Society 5. 0. ent://SD_ILS/0/SD_ILS:600400 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Gantayat, Pradosh Kumar.&#160;Panda, Sandeep Kumar.&#160;Balamurugan, S.&#160;Peng, Sheng-Lung.<br/>Preferred Shelf Number&#160;XX(600400.1)<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394315635">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394315635</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Prognostics and health management in energy and power systems : integrating situation awareness into large-scale foundation models ent://SD_ILS/0/SD_ILS:600368 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Zemouri, Ryad M., author.&#160;Raymond, Jean, author.&#160;Komljenovic, Dragan, author.<br/>Preferred Shelf Number&#160;TK1005 .Z46 2026<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394367023">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394367023</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamentals of robust machine learning : handling outliers and anomalies in data science ent://SD_ILS/0/SD_ILS:599870 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Saleh, Resve A., 1957- author.&#160;Majzoub, Sohaib, author.&#160;Saleh, A. K. Md. Ehsanes, author.<br/>Preferred Shelf Number&#160;Q325.5 .S25 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394294404">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394294404</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Communication networks in smart power grids ent://SD_ILS/0/SD_ILS:599871 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Zhou, Boyang, author.<br/>Preferred Shelf Number&#160;TK3105 .Z46 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394285129">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394285129</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> IoT for smart grid : revolutionizing electrical engineering ent://SD_ILS/0/SD_ILS:599706 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Zahira, Rahiman, editor.&#160;Sivaraman, Palanisamy, editor.&#160;Sharmeela, Chenniappan, editor.&#160;Sanjeevikumar, Padmanaban, 1978- editor<br/>Preferred Shelf Number&#160;TK3105 .I68 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394279401">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394279401</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic modeling and optimization methods for critical infrastructure protection. 1, stochastic modeling ent://SD_ILS/0/SD_ILS:599923 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Gaivoronski, Alexei A., editor.&#160;Knopov, Pavel S.&#160;Norkin, Vladimir I.&#160;Zaslavskyi, Volodymyr A.<br/>Preferred Shelf Number&#160;HC79 .C3 S76 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394372508">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394372508</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Digitization and manufacturing performance : an 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for efficient power conversion ent://SD_ILS/0/SD_ILS:599373 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Lidow, Alex, author.<br/>Preferred Shelf Number&#160;TK7871.95 .L53 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286980">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286980</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Onshore and offshore wind energy : evolution, grid integration, and impact ent://SD_ILS/0/SD_ILS:599337 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Fthenakis, Vasilis M., 1951- author.&#160;Bhattacharya, Subhamoy, author.&#160;Lynn, Paul A., author.<br/>Preferred Shelf Number&#160;TJ820 .L95 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119854500">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119854500</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Architecting resilient systems ent://SD_ILS/0/SD_ILS:599418 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Jackson, Scott, author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394258239">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394258239</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart food packaging systems : innovations and technology applications ent://SD_ILS/0/SD_ILS:599429 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Mukherjee, Avik, editor.&#160;Kumar, Santosh, 1980- editor.&#160;Misra, Manjusri, editor.&#160;Mohanty, Amar K., editor.&#160;John Wiley &amp; Sons, publisher.<br/>Preferred Shelf Number&#160;TP374 .S63 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394189595">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394189595</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multiple 3-phase fault tolerant permanent magnet machine drives : design and control ent://SD_ILS/0/SD_ILS:599595 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Wang, Bo, author.&#160;Wang, Jiabin, author.<br/>Preferred Shelf Number&#160;TK2537 .W36 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394252046">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394252046</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Artificial Intelligence for Future Networks. ent://SD_ILS/0/SD_ILS:599611 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Matin, Mohammad A.&#160;Goudos, Sotirios K.&#160;Karagiannidis, George K.<br/>Preferred Shelf Number&#160;TK5103.25<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394227952">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394227952</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart cyber-physical power systems : fundamental concepts, challenges, and solutions. 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href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394150373">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394150373</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Defect assessment for integrity management of pipelines ent://SD_ILS/0/SD_ILS:598892 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Cheng, Y. 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href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527835539">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527835539</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Integrating metaheuristics in computer vision for real-world optimization problems ent://SD_ILS/0/SD_ILS:599305 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Preferred Shelf Number&#160;TA1637 .I58 2024<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394230952">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394230952</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Artificial intelligence for risk mitigation in the financial industry ent://SD_ILS/0/SD_ILS:599190 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Preferred Shelf Number&#160;HG173 .A78 2024<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394175574">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394175574</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Securing delay-tolerant networks with BPSec ent://SD_ILS/0/SD_ILS:598174 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Birrane, Edward J., author.&#160;Heiner, Sarah, author.&#160;McKeever, Ken, author.<br/>Preferred Shelf Number&#160;TK5105.59 .B48 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119823513">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119823513</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Agile Software Development : trends, challenges and applications ent://SD_ILS/0/SD_ILS:598189 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Hooda, Susheela, editor.&#160;Sood, Vandana Mohindru, editor.&#160;Singh, Yashwant, editor.&#160;Dalal, Sandeep, editor.&#160;Sood, Manu, editor.<br/>Preferred Shelf Number&#160;QA76.76 .D47 A55 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119896838">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119896838</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Control over communication networks : modeling, analysis, and design of networked control systems and multi-agent systems over imperfect communication channels ent://SD_ILS/0/SD_ILS:598198 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Zheng, Jianying (Electrical engineer), author.&#160;Xu, Liang (Electrical engineer), author.&#160;Hu, Qinglei, author.&#160;Xie, Lihua, author.<br/>Preferred Shelf Number&#160;TJ222 .Z46 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119885825">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119885825</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Functional safety of machinery : how to apply ISO 13849-1 and IEC 62061 ent://SD_ILS/0/SD_ILS:598269 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Tacchini, Marco, author.<br/>Preferred Shelf Number&#160;TJ211.5 .T33 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119789123">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119789123</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optimization techniques in engineering : advances and applications ent://SD_ILS/0/SD_ILS:598312 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Khosla, Anita.<br/>Preferred Shelf Number&#160;TA342 .O68 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119906391">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119906391</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> 75th anniversary of the transistor ent://SD_ILS/0/SD_ILS:598494 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Nathan, Arokia, 1957- editor.&#160;Saha, Samar K., editor.&#160;Todi, Ravi M., editor.<br/>Preferred Shelf Number&#160;TK7871.9<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamental Generation Systems : Computer Science and Artificial Consciousness, the Informational Field of Generation of the Universe, the Sixth Sense of Living Beings ent://SD_ILS/0/SD_ILS:598454 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Cardon, Alain, 1946- author.&#160;El Hami, Abdelkhalak, author.<br/>Preferred Shelf Number&#160;Q325 .C37 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394225811">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394225811</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart grids and green energy systems ent://SD_ILS/0/SD_ILS:597940 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Chitra, A., editor&#160;Indragandhi, . 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Razia, editor.<br/>Preferred Shelf Number&#160;TK3105 .S64 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872061">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872061</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Sustainability in biofuel production technology ent://SD_ILS/0/SD_ILS:597698 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Agrawal, Pratibha (Pratibha S.), author.&#160;Belkhode, Pramod, author.&#160;Rokhum, Samuel Lalthazuala, author.<br/>Preferred Shelf Number&#160;TP339 .A42 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119888864">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119888864</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cybersecurity in intelligent networking systems ent://SD_ILS/0/SD_ILS:597809 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Xu, Shengjie (Professor), author.&#160;Qian, Yi, 1962- author.&#160;Hu, Rose Qingyang, author.<br/>Preferred Shelf Number&#160;TK5105.59 .X8 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119784135">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119784135</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A practical approach to quantitative validation of patient-reported outcomes : a simulation-based guide using SAS ent://SD_ILS/0/SD_ILS:597659 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Bushmakin, Andrew G., author.&#160;Cappelleri, Joseph C., author.<br/>Preferred Shelf Number&#160;R853 .Q34 B87 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119376354">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119376354</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> IoT product design and development : best practices for 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Resources<br/>Availability&#160;Online Library~1<br/> Spacecraft lithium-ion battery power systems ent://SD_ILS/0/SD_ILS:597995 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Barrera, Thomas P., editor.<br/>Preferred Shelf Number&#160;TL1102 .B3 S63 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772170">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772170</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart energy for transportation and health in a smart city ent://SD_ILS/0/SD_ILS:598013 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Lai, Chun Sing, author.&#160;Lai, Loi Lei, author.&#160;Lai, Qi Hong, author.<br/>Preferred Shelf Number&#160;TK1005 .L35 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119790402">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119790402</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fault analysis and its impact on grid-connected photovoltaic systems performance ent://SD_ILS/0/SD_ILS:598021 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Haque, Ahteshamul, editor.&#160;Mekhilef, Saad, editor.<br/>Preferred Shelf Number&#160;TA169.5 .F38 2023 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119873785">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119873785</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power grid resilience against natural disasters : preparedness, response, and recovery ent://SD_ILS/0/SD_ILS:598098 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Lei, Shunbo, 1991- author.<br/>Preferred Shelf Number&#160;TK1010<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119801504">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119801504</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> 5G backhaul and fronthaul ent://SD_ILS/0/SD_ILS:598130 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Mets&auml;l&auml;, Esa, editor.&#160;Salmelin, Juha, editor.<br/>Preferred Shelf Number&#160;TK5103.25 .A115 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119275671">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119275671</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ultra-reliable and low-latency communications (URLLC) theory and practice : advances in 5G and beyond ent://SD_ILS/0/SD_ILS:598242 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Duong, Trung Q., editor.&#160;Khosravirad, Saeed R., editor.&#160;She, Changyang, editor.&#160;Popovski, Petar, editor.&#160;Bennis, Mehdi, editor.<br/>Preferred Shelf Number&#160;TK5103.25 .U48 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818366">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818366</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Industrial valves : calculations for design, manufacturing, operation, and safety decisions ent://SD_ILS/0/SD_ILS:598243 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Sotoodeh, Karan, author.<br/>Preferred Shelf Number&#160;TS277 .S68 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394185047">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394185047</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Interval methods for uncertain power system analysis ent://SD_ILS/0/SD_ILS:598367 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Vaccaro, Alfredo, author.<br/>Preferred Shelf Number&#160;TK1005 .V25 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119855071">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119855071</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modern forensic tools and devices : trends in criminal investigation ent://SD_ILS/0/SD_ILS:598390 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Rawtani, Deepak, editor.&#160;Hussain, Chaudhery Mustansar, editor.<br/>Preferred Shelf Number&#160;HV8073 .M63 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119763406">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119763406</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart grids for smart cities. 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Gnana, editor.&#160;Karthikeyan, K., editor.&#160;Sanjeevikumar, Padmanaban, 1978- editor.<br/>Preferred Shelf Number&#160;TK3105 .S63 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872108">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872108</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Security and privacy vision in 6G : a comprehensive guide ent://SD_ILS/0/SD_ILS:598347 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Porambage, Pawani, author.&#160;Liyanage, Madhusanka, author.<br/>Preferred Shelf Number&#160;TK5103.252 .P67 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119875437">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119875437</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Factories of the future : technological advancements in the manufacturing industry ent://SD_ILS/0/SD_ILS:598348 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Singh, Chandan Deep, editor.&#160;Kaur, Harleen, author.<br/>Preferred Shelf Number&#160;HD9720.5 .F33 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865216">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865216</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> LED packaging technologies : design, manufacture, and applications ent://SD_ILS/0/SD_ILS:598468 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Annaniah, Luruthudass, author&#160;Saheed, Mohamed Salleh M., author.&#160;Jose, Rajan, author.<br/>Preferred Shelf Number&#160;TK7871.89 .L53 A56 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527831678">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527831678</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Defects in organic semiconductors and devices ent://SD_ILS/0/SD_ILS:598531 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Nguyen, Thien-Phap, author.<br/>Preferred Shelf Number&#160;TK7871.99 .O74 N48 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Metal oxide nanocomposite thin films for optoelectronic device applications ent://SD_ILS/0/SD_ILS:598580 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Zargar, Rayees Ahmad, editor.<br/>Preferred Shelf Number&#160;TA418.9 .T45 M48 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865636">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865636</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Resource management in advanced wireless networks ent://SD_ILS/0/SD_ILS:598682 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Suresh, A. editor&#160;Ramkumar, J. editor&#160;Baskar, M. editor&#160;Bashir, Ali Kashif, editor<br/>Preferred Shelf Number&#160;TK5103.4873 .R47 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119827603">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119827603</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Wireless communication in cyber security ent://SD_ILS/0/SD_ILS:598705 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Sountharrajan, S. editor&#160;Maheswar, R. editor&#160;Rathee, Geetanjali, editor&#160;Akila, M. editor<br/>Preferred Shelf Number&#160;QA76.9 .A25 W57 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119910619">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119910619</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online 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href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394256389">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394256389</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanotechnology in electronics : materials, properties, devices ent://SD_ILS/0/SD_ILS:597956 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;P. M., Visakh, editor.&#160;Semkin, Artem, editor.&#160;B., Raneesh, 1986- editor.&#160;Lazovi&#263;, Sa&scaron;a, editor.<br/>Preferred Shelf Number&#160;TK7874.84<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527824229">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527824229</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bearing dynamic coefficients in rotordynamics ent://SD_ILS/0/SD_ILS:596500 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Bre&#324;kacz, &#321;ukasz, author.<br/>Preferred Shelf Number&#160;TJ1058<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119759287">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119759287</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bow-tie industrial risk management across sectors : a barrier based approach ent://SD_ILS/0/SD_ILS:596577 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Fiorentini, Luca, 1976- author.<br/>Preferred Shelf Number&#160;HD61 .F56 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119523857">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119523857</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Pump wisdom : essential centrifugal pump knowledge for operators and specialists ent://SD_ILS/0/SD_ILS:597066 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Perez, Robert X., author.&#160;Bloch, Heinz P., 1933- author.<br/>Preferred Shelf Number&#160;TJ900 .P47 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119748243">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119748243</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied biostatistics for the health sciences ent://SD_ILS/0/SD_ILS:597001 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Rossi, Richard J., 1956- author.<br/>Preferred Shelf Number&#160;R853 .S7 R67 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119722717">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119722717</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronic packaging science and technology ent://SD_ILS/0/SD_ILS:597053 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Tu, K. N. (King-Ning), 1937- author.&#160;Chen, Chih, 1970- author.&#160;Chen, Hung-Ming, author.<br/>Preferred Shelf Number&#160;TK7870.15 .T85 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119418344">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119418344</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fault location on transmission and distribution lines : principles and applications ent://SD_ILS/0/SD_ILS:597205 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Das, Swagata, author.&#160;Santoso, Surya, author.&#160;Ananthan, Sundaravaradan Navalpakkam, author.<br/>Preferred Shelf Number&#160;TK3226<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119121480">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119121480</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Artificial intelligence and quantum computing for advanced wireless networks ent://SD_ILS/0/SD_ILS:597216 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Glisic, Savo G., author.&#160;Lorenzo, Beatriz, author.<br/>Preferred Shelf Number&#160;Q335 .G55 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119790327">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119790327</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> VCSEL industry : communication and sensing ent://SD_ILS/0/SD_ILS:597229 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Padullaparthi, Babu Dayal, author.&#160;Tatum, Jim A., author.&#160;Iga, Ken&#700;ichi, 1940- author.<br/>Preferred Shelf Number&#160;TA1700<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119782223">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119782223</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical ESD protection design ent://SD_ILS/0/SD_ILS:597233 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Wang, Albert Z. H., 1962- author.<br/>Preferred Shelf Number&#160;TK7874<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Amorphous oxide semiconductors : IGZO and related materials for display and memory ent://SD_ILS/0/SD_ILS:597269 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Hosono, Hideo, editor.&#160;Kumomi, Hideya, editor.<br/>Preferred Shelf Number&#160;TK7871.96 .T45 A46 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119715641">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119715641</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power system protection ent://SD_ILS/0/SD_ILS:597296 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Anderson, Paul M., author.&#160;Henville, Charles, author.&#160;Rifaat, Rasheek, author.&#160;Johnson, Brian, author.&#160;Meliopoulos, Sakis, author.<br/>Preferred Shelf Number&#160;TK1010<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513100">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513100</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Evolving software processes : trends and future directions ent://SD_ILS/0/SD_ILS:597323 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Khan, Arif Ali, editor.&#160;Le, Dac-Nhuong, 1983- editor.<br/>Preferred Shelf Number&#160;QA76.76 .D47<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119821779">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119821779</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Resilient power electronic systems ent://SD_ILS/0/SD_ILS:597338 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Kaboli, Shahriyar, 1975- author.&#160;Peyghami, Saeed, author.&#160;Blaabjerg, Frede, author.<br/>Preferred Shelf Number&#160;TK7881.15 .K335 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772217">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772217</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Financial statement analysis : a practitioner's guide ent://SD_ILS/0/SD_ILS:597515 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Fridson, Martin S., author.&#160;Alvarez, Fernando, 1964- author.<br/>Preferred Shelf Number&#160;HF5681 .B2 F772 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119457176">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119457176</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart grids and microgrids : technology evolution ent://SD_ILS/0/SD_ILS:597523 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Prajof, Prabhakaran, editor.&#160;Subramaniam, Umashankar, editor.&#160;Krishna, S. Mohan, editor.&#160;Febin Daya, J.L., 1980- editor.&#160;Brijesh, P. V., editor.<br/>Preferred Shelf Number&#160;TK3105 .S83 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119760597">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119760597</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cloud computing solutions : architecture, data storage, implementation and security ent://SD_ILS/0/SD_ILS:597544 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Pal, Souvik, author.&#160;Le, Dac-Nhuong, author.&#160;Pattnai, Prasant Kumar, author.<br/>Preferred Shelf Number&#160;QA76.585 .P35 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119682318">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119682318</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> DC microgrids : advances, challenges, and applications ent://SD_ILS/0/SD_ILS:597558 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Gupta, Nikita, editor.&#160;Bhaskar, Mahajan Sagar, editor.&#160;Padmanaban, Sanjeevikumar, editor.&#160;Almakhles, Dhafer, editor.<br/>Preferred Shelf Number&#160;TK3106 .D3 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119777618">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119777618</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software-defined networking : extending SDN control to large-scale networks ent://SD_ILS/0/SD_ILS:598167 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Bannour, Fetia, author.&#160;Souihi, Sami, author.&#160;Mellouk, Abdelhamid, author.<br/>Preferred Shelf Number&#160;TK5105.5833 .B36 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186181">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186181</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fluid-Structure Interaction : Numerical Simulation Techniques for Naval Applications ent://SD_ILS/0/SD_ILS:598147 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Sigrist, Jean-Fran&ccedil;ois, author.&#160;Leblond, C&eacute;dric, author.<br/>Preferred Shelf Number&#160;TA357.5 .F58<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394188222">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394188222</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power and energy distribution systems : models, methods, and applications ent://SD_ILS/0/SD_ILS:598422 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Pahwa, Anil, author.&#160;Venkata, Subrahmanyam S., author.<br/>Preferred Shelf Number&#160;TK3001<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329694">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329694</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart solar PV inverters with advanced grid support functionalities ent://SD_ILS/0/SD_ILS:596912 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Varma, Rajiv K., author.<br/>Preferred Shelf Number&#160;TK1087 .V37 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214236">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214236</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart nanotextiles : wearable and technical applications ent://SD_ILS/0/SD_ILS:597666 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Yilmaz, Nazire Deniz.<br/>Preferred Shelf Number&#160;TS1767<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119654872">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119654872</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Iot-enabled smart healthcare systems, services and applications ent://SD_ILS/0/SD_ILS:596992 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Rani, Shalli, editor.<br/>Preferred Shelf Number&#160;R118 .I58 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119816829">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119816829</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computational structural concrete ent://SD_ILS/0/SD_ILS:597893 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;H&auml;ussler-Combe, Ulrich, author.<br/>Preferred Shelf Number&#160;TA439<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783433610268">https://onlinelibrary.wiley.com/doi/book/10.1002/9783433610268</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Collinear holography ent://SD_ILS/0/SD_ILS:598006 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Tan, Xiaodi, 1962- author.&#160;Horimai, Hideyoshi, author.&#160;Shimura, Tsutomu, 1959- author.&#160;Lin, Xiao, author.<br/>Preferred Shelf Number&#160;TA1632<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527810482">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527810482</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Engineering and technology for healthcare ent://SD_ILS/0/SD_ILS:596096 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Imran, Muhammad Ali, editor.&#160;Ghannam, Rami, editor.&#160;Abbasi, Qammer H., editor.<br/>Preferred Shelf Number&#160;R855.3 .E54 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119644316">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119644316</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Distributed energy management of electrical power systems ent://SD_ILS/0/SD_ILS:596122 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Xu, Yinliang, author.&#160;Zhang, Wei (Engineer), author.&#160;Liu, Wenxin, 1978- author.&#160;Yu, Wen, 1977- author.<br/>Preferred Shelf Number&#160;TK1006 .X83 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119534938">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119534938</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of water harvesting and conservation : basic concepts and fundamentals ent://SD_ILS/0/SD_ILS:596138 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Eslamian, Saeid, editor.&#160;Eslamian, Faezeh A., editor.<br/>Preferred Shelf Number&#160;TD418 .H36 2021 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119478911">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119478911</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Building an effective security program for distributed energy resources and systems : understanding security for smart grid and distributed energy resources &amp; systems ent://SD_ILS/0/SD_ILS:596367 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Hentea, Mariana, author.<br/>Preferred Shelf Number&#160;TK3105 .H46 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119070740">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119070740</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated life testing of one-shot devices : data collection and analysis ent://SD_ILS/0/SD_ILS:596340 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Balakrishnan, N., 1956- author.&#160;Ling, Man Ho, author.&#160;So, Hon Yiu, author.<br/>Preferred Shelf Number&#160;TA169.3 .B35 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Active electrical distribution network : a smart approach ent://SD_ILS/0/SD_ILS:596506 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Khan, Baseem, 1987- editor.<br/>Preferred Shelf Number&#160;TK3105 .A35 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119599593">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119599593</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dictionary of industrial terminology ent://SD_ILS/0/SD_ILS:596516 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Holloway, Michael D., 1963- author.&#160;Holloway, Emma, author.<br/>Preferred Shelf Number&#160;HD301.15<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119364078">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119364078</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Green energy : solar energy, photovoltaics, and smart cities ent://SD_ILS/0/SD_ILS:596517 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Tripathi, Suman Lata, editor.&#160;Sanjeevikumar, Padmanaban, 1978- editor.<br/>Preferred Shelf Number&#160;TK1087 .G735 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119760801">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119760801</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> From LED to solid state lighting : principles, materials, packaging, characterization, and applications ent://SD_ILS/0/SD_ILS:596576 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Lee, Shi-Wei Ricky, author.&#160;Lo, Jeffery C. C., author.&#160;Tao, Mian, author.&#160;Ye, Huaiyu, author.<br/>Preferred Shelf Number&#160;TK7871.89 .L53 L4365 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118881620">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118881620</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic power system expansion planning with renewable energy resources and energy storage systems ent://SD_ILS/0/SD_ILS:597024 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Choi, Jaeseok, author.&#160;Lee, Kwang Y., author.<br/>Preferred Shelf Number&#160;TK3001 .C46 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119819042">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119819042</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Enabling healthcare 4.0 for pandemics : a roadmap using AI, machine learning, IoT and cognitive technologies ent://SD_ILS/0/SD_ILS:597148 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Juneja, Abhinav, editor.<br/>Preferred Shelf Number&#160;R859.7 .A78<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119769088">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119769088</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electrical connectors : design, manufacture, test, and selection ent://SD_ILS/0/SD_ILS:596172 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Pecht, Michael, editor.&#160;Kyeong, San, editor.<br/>Preferred Shelf Number&#160;TK3521<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Random motions in Markov and semi-Markov random environments. 1, Homogeneous random motions and their applications ent://SD_ILS/0/SD_ILS:596563 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Pogorui, Anatoliy, author.&#160;Svishchuk, A. V. (Anatoli&#301; Vital&#697;evich), author.&#160;Rodr&iacute;guez Dagnino, Ram&oacute;n Mart&iacute;n, author.<br/>Preferred Shelf Number&#160;QA274.7<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808213">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808213</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Machine vision inspection systems. Volume 2, Machine -learning-based approaches ent://SD_ILS/0/SD_ILS:596564 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Malarvel, Muthukumaran, editor.&#160;Nayak, Soumya Ranjan, 1984- editor.&#160;Pattnaik, Prasant Kumar, 1969- editor.&#160;Panda, Sury Narayan, editor.<br/>Preferred Shelf Number&#160;TA1634 .M3354 2020 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119786122">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119786122</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart grid and enabling technologies ent://SD_ILS/0/SD_ILS:596797 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Refaat, Shady S., author.&#160;Ellabban, Omar, author.&#160;Bayhan, Sertac, author.&#160;Abu-Rub, Haithem, author.&#160;Blaabjerg, Frede, author.<br/>Preferred Shelf Number&#160;TK3105<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422464">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422464</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modern trends in structural and solid mechanics 3 : non-deterministic mechanics ent://SD_ILS/0/SD_ILS:596833 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Challamel, No&euml;l, editor.&#160;Kaplunov, J. D., editor.&#160;Takewaki, Izuru, editor.<br/>Preferred Shelf Number&#160;TA645 .M63 2021 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119831839">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119831839</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> High temperature mechanical behavior of ceramic-matrix composites ent://SD_ILS/0/SD_ILS:596884 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Li, Longbiao, author.<br/>Preferred Shelf Number&#160;TA418.9 .C6<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527831791">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527831791</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> From traditional fault tolerance to blockchain ent://SD_ILS/0/SD_ILS:596885 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Zhao, Wenbing, Ph.D., author.<br/>Preferred Shelf Number&#160;QA76.9 .D5 Z473 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119682127">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119682127</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cellular V2X for connected automated driving ent://SD_ILS/0/SD_ILS:596075 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Fallgren, Mikael, editor.&#160;Dillinger, Markus, editor.&#160;Mahmoodi, Toktam, editor.&#160;Svensson, Tommy (Highway engineer), editor.<br/>Preferred Shelf Number&#160;TE228.37 .C45 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119692676">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119692676</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintaining mission critical systems in a 24/7 environment ent://SD_ILS/0/SD_ILS:596287 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Curtis, Peter M., author.<br/>Preferred Shelf Number&#160;TA169 .C87 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506133">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506133</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Digitalization and analytics for smart plant performance : theory and applications ent://SD_ILS/0/SD_ILS:596319 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Zhu, Frank, 1957- author.<br/>Preferred Shelf Number&#160;TP155.6<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119634140">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119634140</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for maintainability ent://SD_ILS/0/SD_ILS:596355 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Gullo, Louis J., editor.&#160;Dixon, Jack, 1948- editor.<br/>Preferred Shelf Number&#160;TS174 .D47 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119578536">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119578536</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> 5G second phase explained : the 3GPP release 16 enhancements ent://SD_ILS/0/SD_ILS:596416 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Penttinen, Jyrki T. J., author.<br/>Preferred Shelf Number&#160;TK5103.25 .P46 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119645566">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119645566</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optical sensing in power transformers ent://SD_ILS/0/SD_ILS:596469 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Jiang, Jun, 1988- author.&#160;Ma, Guoming, 1984- author.<br/>Preferred Shelf Number&#160;TK2551<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119765325">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119765325</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modern industrial statistics : with applications in R, MINITAB and JMP ent://SD_ILS/0/SD_ILS:596471 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Kenett, Ron, author.&#160;Zacks, Shelemyahu, 1932- author.&#160;Amberti, Daniele, author.<br/>Preferred Shelf Number&#160;TS156 .K46 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mechanical engineering under uncertainties : from classical approaches to some recent developments ent://SD_ILS/0/SD_ILS:596632 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Gogu, Christian, editor.<br/>Preferred Shelf Number&#160;TJ145 .M43 2021 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119817635">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119817635</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Spectrum sharing in cognitive radio networks : towards highly connected environments ent://SD_ILS/0/SD_ILS:596691 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Thakur, Prabhat, author.&#160;Singh, Ghanshyam, author.<br/>Preferred Shelf Number&#160;TK5103.4873 .T43 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665458">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665458</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of human factors and ergonomics ent://SD_ILS/0/SD_ILS:596970 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Salvendy, Gavriel, 1938-&#160;Karwowski, Waldemar, 1953-<br/>Preferred Shelf Number&#160;TA166 .H36 2021 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119636113">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119636113</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Condition monitoring with vibration signals : compressive sampling and learning algorithms for rotating machines ent://SD_ILS/0/SD_ILS:595346 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Ahmed, Hosameldin, 1976- author.&#160;Nandi, Asoke Kumar, author.<br/>Preferred Shelf Number&#160;TJ177 .A36 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119544678">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119544678</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> 5G verticals : customizing applications, technologies and deployment techniques ent://SD_ILS/0/SD_ILS:595563 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Vannithamby, Rath, editor.&#160;Soong, Anthony C. K., editor.<br/>Preferred Shelf Number&#160;TK5103.25 .A175 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119514848">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119514848</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Official Google Professional Cloud Architect : study guide ent://SD_ILS/0/SD_ILS:595579 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Sullivan, Dan, author.<br/>Preferred Shelf Number&#160;QA76.585<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119602477">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119602477</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistics and probability with applications for engineers and scientists using Minitab, R and JMP ent://SD_ILS/0/SD_ILS:595650 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Gupta, Bhisham C., 1942- author.&#160;Guttman, Irwin, author.&#160;Jayalath, Kalanka, author.<br/>Preferred Shelf Number&#160;QA273 .G87 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119516651">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119516651</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fog computing : theory and practice ent://SD_ILS/0/SD_ILS:595723 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Zomaya, Albert Y., editor.&#160;Abbas, Assad, editor.&#160;Khan, Samee Ullah, editor.<br/>Preferred Shelf Number&#160;QA76.585 .F648 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119551713">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119551713</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fog and fogonomics : challenges and practices of fog computing, communication, networking, strategy, and economics ent://SD_ILS/0/SD_ILS:595782 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Yang, Yang (Professor at ShanghaiTech), editor.<br/>Preferred Shelf Number&#160;QA76.585 .F64 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119501121">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119501121</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Thermal Safety of Chemical Processes : Risk Assessment and Process Design ent://SD_ILS/0/SD_ILS:595851 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Stoessel, Francis.<br/>Preferred Shelf Number&#160;TP150 .S24<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527696918">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527696918</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Thermodynamic processes. 1, Systems without physical state change ent://SD_ILS/0/SD_ILS:595855 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Belaadi, Salah, author.<br/>Preferred Shelf Number&#160;TJ265 .B45 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119706830">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119706830</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power electronics-enabled autonomous power systems : next generation smart grids ent://SD_ILS/0/SD_ILS:595874 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Zhong, Qing-Chang, author.<br/>Preferred Shelf Number&#160;TK2699 .Z46 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118803516">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118803516</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Profit maximization techniques for operating chemical plants ent://SD_ILS/0/SD_ILS:595940 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Lahiri, Sandip Kumar, 1970- author.<br/>Preferred Shelf Number&#160;TP155.2 .C67 L34 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119532231">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119532231</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electrical systems. 1 : From diagnosis to prognosis ent://SD_ILS/0/SD_ILS:595955 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Soualhi, Abdenour.&#160;Razik, Hubert.<br/>Preferred Shelf Number&#160;TA169.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720317">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720317</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electrical systems. 2 : from diagnosis to prognosis ent://SD_ILS/0/SD_ILS:595957 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Soualhi, Abdenour.&#160;Razik, Hubert.<br/>Preferred Shelf Number&#160;TA169.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720584">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720584</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smarter data science : succeeding with enterprise-grade data and AI projects ent://SD_ILS/0/SD_ILS:595959 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Fishman, Neal.&#160;Stryker, Cole.<br/>Preferred Shelf Number&#160;T58.6<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119697985">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119697985</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Official Google Cloud Certified Professional Data Engineer study guide ent://SD_ILS/0/SD_ILS:596021 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Sullivan, Dan, 1962-<br/>Preferred Shelf Number&#160;QA76.3<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119618461">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119618461</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Machine learning and cognitive computing for mobile communications and wireless networks ent://SD_ILS/0/SD_ILS:596240 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Singh, Krishna Kant (Telecommunications professor), editor.<br/>Preferred Shelf Number&#160;QA76.59 .M334 2020 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119640554">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119640554</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nitride semiconductor technology : power electronics and optoelectronic devices ent://SD_ILS/0/SD_ILS:596257 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Roccaforte, Fabrizio, editor.&#160;Leszczynsk, Mike, editor.<br/>Preferred Shelf Number&#160;TK7871.85<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527825264">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527825264</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Systems engineering in the fourth industrial revolution : big data, novel technologies, and modern systems engineering ent://SD_ILS/0/SD_ILS:595527 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Kenett, Ron, editor.&#160;Swarz, Robert S., editor.&#160;Zonnenshain, Avigdor, editor.<br/>Preferred Shelf Number&#160;TA168 .S8727 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Public safety networks from LTE to 5G ent://SD_ILS/0/SD_ILS:595528 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Yarali, Abdulrahman, author.<br/>Preferred Shelf Number&#160;TK6570 .P8 Y37 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119580157">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119580157</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power system dynamics with computer-based modeling and analysis ent://SD_ILS/0/SD_ILS:595175 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Hase, Yoshihide, 1937- author.&#160;Khandelwal, Tanuj, 1977- author.&#160;Kameda, Kazuyuki, 1947- author.<br/>Preferred Shelf Number&#160;TK3001 .H37 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119487470">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119487470</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Methods and Interdisciplinarity ent://SD_ILS/0/SD_ILS:595680 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Waldeck, Roger.<br/>Preferred Shelf Number&#160;Q180.55 .I48<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119681519">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119681519</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Innovation trends in the space industry ent://SD_ILS/0/SD_ILS:595747 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Paulino, Victor dos Santos.<br/>Preferred Shelf Number&#160;TL797<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119694847">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119694847</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Antenna-in-package technology and applications ent://SD_ILS/0/SD_ILS:595805 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Liu, Duixian, editor.&#160;Zhang, Yueping, editor.<br/>Preferred Shelf Number&#160;TK7871.67 .M5 A58 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119556671">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119556671</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Network traffic engineering : stochastic models and applications ent://SD_ILS/0/SD_ILS:595984 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Baiocchi, Andrea, 1962- author.<br/>Preferred Shelf Number&#160;TK5105.5 .B326 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119632498">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119632498</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Potassium-ion batteries : materials and applications ent://SD_ILS/0/SD_ILS:596079 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Inamuddin, 1980- editor.&#160;Boddula, Rajender, editor.&#160;Asiri, Abdullah M., editor.<br/>Preferred Shelf Number&#160;TK2945 .P68 P68 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119663287">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119663287</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Role of edge analytics in sustainable smart city development : challenges and solutions ent://SD_ILS/0/SD_ILS:596185 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Kanagachidambaresan, G. R., 1988- editor.<br/>Preferred Shelf Number&#160;TD159.4 .R65 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119681328">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119681328</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Toward 6G : a new era of convergence ent://SD_ILS/0/SD_ILS:596251 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Ebrahimzadeh, Amin, author.&#160;Maier, Martin, 1969- author.<br/>Preferred Shelf Number&#160;TK5103.2 .E27 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119658054">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119658054</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Queueing theory. 2, Advanced trends ent://SD_ILS/0/SD_ILS:596633 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Anisimov, V. I. (Vladimir Il&#697;ich)&#160;Limnios, N. (Nikolaos)<br/>Preferred Shelf Number&#160;QA274.8<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119755234">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119755234</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dependable computing : design and assessment ent://SD_ILS/0/SD_ILS:599167 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Iyer, Ravishankar K., author.&#160;Kalbarczyk, Zbigniew T., author.&#160;Nakka, Nithin M., author.<br/>Preferred Shelf Number&#160;QA76.9 .F38 I9 2020 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119743453">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119743453</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical pharmaceutical engineering ent://SD_ILS/0/SD_ILS:594289 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Prager, Gary, 1943- author.<br/>Preferred Shelf Number&#160;RS192 .P73 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119418764">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119418764</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ultra-dense networks for 5G and beyond : modelling, analysis, and applications ent://SD_ILS/0/SD_ILS:594857 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Duong, Trung Q., editor.&#160;Chu, Xiaoli, editor.&#160;Suraweera, Himal A., editor.<br/>Preferred Shelf Number&#160;TK5103.2 .U48 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119473756">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119473756</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> AWS certified solutions architect : study guide : Associate (SAA-C01) exam ent://SD_ILS/0/SD_ILS:595132 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Piper, Ben (IT consultant), author.&#160;Clinton, David, author.<br/>Preferred Shelf Number&#160;TK5105.88813<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119560395">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119560395</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Harsh environment electronics : interconnect materials and performance assessment ent://SD_ILS/0/SD_ILS:595195 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Sharif, Ahmed, editor.<br/>Preferred Shelf Number&#160;TK7871<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527813964">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527813964</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of 3D integration. Volume 4, Design, test, and thermal management ent://SD_ILS/0/SD_ILS:595051 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Franzon, Paul D., editor.&#160;Marinissen, Eric Jan, editor.&#160;Bakir, Muhannad S., editor.<br/>Preferred Shelf Number&#160;TK7874.893 .H36 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Local energy autonomy : spaces, scales, politics ent://SD_ILS/0/SD_ILS:595277 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Lopez, Fanny, editor.&#160;Pellegrino, Margot, editor.&#160;Coutard, Olivier, 1965- editor.<br/>Preferred Shelf Number&#160;HD2763<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119616290">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119616290</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Guidelines for investigating process safety incidents ent://SD_ILS/0/SD_ILS:595294 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;American Institute of Chemical Engineers. Center for Chemical Process Safety, author.<br/>Preferred Shelf Number&#160;TP150 .A23<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119529132">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119529132</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Indoor positioning : technologies and performance ent://SD_ILS/0/SD_ILS:595250 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Samama, Nel, 1963- author.<br/>Preferred Shelf Number&#160;TK5103.48323<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119421887">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119421887</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Enabling 5G communication systems to support vertical industries ent://SD_ILS/0/SD_ILS:595353 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Imran, Muhammad Ali, editor.&#160;Sambo, Yusuf Abdulrahman, 1988- editor.&#160;Abbasi, Qammer H., editor.<br/>Preferred Shelf Number&#160;TK5103.2<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119515579">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119515579</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power electronics in renewable energy systems and smart grid : technology and applications ent://SD_ILS/0/SD_ILS:595359 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Bose, Bimal K., editor.<br/>Preferred Shelf Number&#160;TK7881.15 .P67333 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119515661">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119515661</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Risk assessment : tools, techniques, and their applications ent://SD_ILS/0/SD_ILS:595379 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Ostrom, Lee T., author.&#160;Wilhelmsen, Cheryl A., 1953- author.<br/>Preferred Shelf Number&#160;TA169.55 .R57 O88 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119483342">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119483342</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> 5G for the connected world ent://SD_ILS/0/SD_ILS:594939 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Chandramouli, Devaki, editor.&#160;Liebhart, Rainer, editor.&#160;Pirskanen, Juho, editor.<br/>Preferred Shelf Number&#160;TK5103.2 .A147 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119247111">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119247111</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Microgrid planning and design : a concise guide ent://SD_ILS/0/SD_ILS:595155 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Farhangi, Hassan, author.&#160;Jo&oacute;s, G&eacute;za, author.<br/>Preferred Shelf Number&#160;TK3105<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119453550">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119453550</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Environmental considerations associated with hydraulic fracturing operations : adjusting to the shale revolution in a green world ent://SD_ILS/0/SD_ILS:595212 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Jacobs, James A. (James Alan), 1956- author.&#160;Testa, Stephen M., author.<br/>Preferred Shelf Number&#160;TN871.255<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119336129">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119336129</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Operator's guide to process compressors ent://SD_ILS/0/SD_ILS:595220 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Perez, Robert X., author.<br/>Preferred Shelf Number&#160;TP159 .C57 P47 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119581383">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119581383</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design technology of synthetic aperture radar ent://SD_ILS/0/SD_ILS:595259 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Lu, Jiaguo, 1964- author.<br/>Preferred Shelf Number&#160;TK6592 .S95 L83 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119564621">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119564621</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Management of extreme situations : from Polar expeditions to exploration-oriented organizations ent://SD_ILS/0/SD_ILS:595499 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Li&egrave;vre, Pascal (Writer on management science), editor.&#160;Aubry, Monique, editor.&#160;Garel, Gilles, editor.<br/>Preferred Shelf Number&#160;HD31.2<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119663041">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119663041</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Progress in solar energy technologies and applications ent://SD_ILS/0/SD_ILS:595529 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Sahoo, Umakanta, editor.<br/>Preferred Shelf Number&#160;TJ810 .P87 2019 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119555650">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119555650</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Introduction to stochastic processes and simulation ent://SD_ILS/0/SD_ILS:595544 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Cochard, G&eacute;rard-Michel, author.<br/>Preferred Shelf Number&#160;QA274<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119670827">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119670827</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The fracture of brittle materials : testing and analysis ent://SD_ILS/0/SD_ILS:594691 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Freiman, S. W., author.&#160;Mecholsky, John J., Jr., author.<br/>Preferred Shelf Number&#160;TA409<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118769560">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118769560</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in embedded and fan-out wafer level packaging technologies ent://SD_ILS/0/SD_ILS:594706 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Keser, Beth, 1971- editor.&#160;Kroehnert, Steffen, 1970- editor.<br/>Preferred Shelf Number&#160;TK7870.17 .A38 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119313991">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119313991</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dynamics and control of electric transmission and microgrids ent://SD_ILS/0/SD_ILS:594707 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Padiyar, K. R., author.&#160;Kulkarni, Anil M., author.<br/>Preferred Shelf Number&#160;TK1007 .P33 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119173410">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119173410</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust statistics : theory and methods (with R) ent://SD_ILS/0/SD_ILS:594721 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Maronna, Ricardo A., author.&#160;Martin, R. Douglas, author.&#160;Yohai, V&iacute;ctor J., author.<br/>Preferred Shelf Number&#160;QA276 .M336 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214656">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214656</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric distribution systems ent://SD_ILS/0/SD_ILS:594882 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Sallam, A. A. (Abdelhay A.), author.&#160;Malik, Om P., author.<br/>Preferred Shelf Number&#160;TK3001<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119509332">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119509332</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Hybrid electric vehicles : principles and applications with practical perspectives ent://SD_ILS/0/SD_ILS:593667 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Mi, Chris, author.&#160;Masrur, Abul, author.<br/>Preferred Shelf Number&#160;TL221.15 .M545 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118970553">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118970553</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mechanics of microsystems ent://SD_ILS/0/SD_ILS:594077 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Corigliano, Alberto, author.<br/>Preferred Shelf Number&#160;TK7875<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119053828">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119053828</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural health monitoring of large civil engineering structures ent://SD_ILS/0/SD_ILS:594137 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Chen, Hua-Peng, author.&#160;Ni, Yi-Qing, contributor.<br/>Preferred Shelf Number&#160;TA656.6 .C44 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119166641">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119166641</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> 3D IC and RF SiPs : advanced stacking and planar solutions for 5G mobility ent://SD_ILS/0/SD_ILS:594223 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Hwang, Lih-Tyng, author.&#160;Horng, Tzyy-sheng Jason, author.<br/>Preferred Shelf Number&#160;TK5103.2<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119289654">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119289654</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Wiley handbook of psychometric testing : a multidisciplinary reference on survey, scale and test development ent://SD_ILS/0/SD_ILS:594229 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Irwing, Paul, editor.<br/>Preferred Shelf Number&#160;BF39 .W55 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118489772">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118489772</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical data cleaning with applications in R ent://SD_ILS/0/SD_ILS:594236 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Loo, Mark van der, 1976- author.&#160;Jonge, Edwin de, 1972- author.<br/>Preferred Shelf Number&#160;QA276.45 .R3 J66 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118897126">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118897126</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Data uncertainty and important measures ent://SD_ILS/0/SD_ILS:594255 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Simon, Christophe, author.&#160;Weber, Philippe (Co-author of Data uncertainty and important measures), author.&#160;Sallak, Mohamed, author.<br/>Preferred Shelf Number&#160;Q375 .S56 2018 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119489375">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119489375</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Aerospace actuators. 3, European commercial aircraft and tiltrotor aircraft ent://SD_ILS/0/SD_ILS:594256 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Mar&eacute;, Jean-Charles, author.<br/>Preferred Shelf Number&#160;TJ223 .A25 M37 2018 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119505433">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119505433</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Integration of large scale wind energy with electrical power system in China ent://SD_ILS/0/SD_ILS:594279 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Lu, Zongxiang, 1974- author.&#160;Zhou, Shuangxi, 1941- author.<br/>Preferred Shelf Number&#160;TK1541<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118910054">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118910054</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart grid communication infrastructures : big data, cloud computing, and security ent://SD_ILS/0/SD_ILS:594395 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Ye, Feng, 1989- author.&#160;Qian, Yi, 1962- author.&#160;Hu, Rose Qingyang, author.<br/>Preferred Shelf Number&#160;TK3105<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119240136">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119240136</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Prognostics and health management of electronics : fundamentals, machine learning, and internet of things ent://SD_ILS/0/SD_ILS:594639 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Pecht, Michael, editor.&#160;Kang, Myeongsu, 1980- editor.<br/>Preferred Shelf Number&#160;TK7870<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119515326">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119515326</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bow ties in risk management : a concept book for process safety ent://SD_ILS/0/SD_ILS:594678 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;American Institute of Chemical Engineers. Center for Chemical Process Safety, author.&#160;Energy Institute (Great Britain)<br/>Preferred Shelf Number&#160;TP150 .S24 B69 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119490357">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119490357</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Understanding least squares estimation and geomatics data analysis ent://SD_ILS/0/SD_ILS:594776 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Ogundare, John Olusegun, author.<br/>Preferred Shelf Number&#160;QA276.8<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119501459">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119501459</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Assured cloud computing ent://SD_ILS/0/SD_ILS:595003 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Campbell, Roy Harold, editor.&#160;Kamhoua, Charles A., editor.&#160;Kwiat, Kevin A., editor.<br/>Preferred Shelf Number&#160;QA76.585 .A87 2018 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119428497">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119428497</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Forensic systems engineering : evaluating operations by discovery ent://SD_ILS/0/SD_ILS:593932 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Stimson, William A., author.<br/>Preferred Shelf Number&#160;TA169.5 .S755 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422808">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422808</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Transdisciplinary engineering design process ent://SD_ILS/0/SD_ILS:594394 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Ertas, Atila, 1944- author.<br/>Preferred Shelf Number&#160;TA174 .E7824 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119474654">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119474654</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Analytic methods in systems and software testing ent://SD_ILS/0/SD_ILS:594482 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Kenett, Ron, editor.&#160;Ruggeri, Fabrizio, editor.&#160;Faltin, Frederick W., editor.<br/>Preferred Shelf Number&#160;QA76.76 .T48 A52 2018 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fatigue design of steel and composite structures : Eurocode 3 : design of steel structures, part 1-9 fatigue, Eurocode 4 : design of composite steel and concrete structures ent://SD_ILS/0/SD_ILS:594583 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Nussbaumer, Alain, 1964-&#160;Borges, Lu&iacute;s.&#160;Davaine, Laurence, 1975-<br/>Preferred Shelf Number&#160;TA684 .N87 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783433608791">https://onlinelibrary.wiley.com/doi/book/10.1002/9783433608791</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of safety principles ent://SD_ILS/0/SD_ILS:594034 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;M&ouml;ller, Niklas, editor.&#160;Hansson, Sven Ove, 1951- editor.&#160;Holmberg, Jan-Erik, editor.<br/>Preferred Shelf Number&#160;HD7261 .H36 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119443070">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119443070</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Wave and tidal energy ent://SD_ILS/0/SD_ILS:594055 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Greaves, Deborah, editor.&#160;Iglesias, Gregorio, 1969- editor.<br/>Preferred Shelf Number&#160;TC147 .W38 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119014492">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119014492</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dynamic vulnerability assessment and intelligent control for sustainable power systems ent://SD_ILS/0/SD_ILS:594059 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Rueda Torres, Jos&eacute; L., 1980- author.&#160;Gonzalez-Longatt, Francisco, 1972- author.<br/>Preferred Shelf Number&#160;TK3081<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214984">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214984</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fault-tolerance techniques for spacecraft control computers ent://SD_ILS/0/SD_ILS:593150 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Yang, Mengfei, author.&#160;Hua, Gengxin, 1965- author.&#160;Feng, Yanjun, 1969- author.&#160;Gong, Jian, 1975- author.<br/>Preferred Shelf Number&#160;TL3250<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119107392">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119107392</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of structural life assessment ent://SD_ILS/0/SD_ILS:593183 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Ibrahim, R. A., 1940- author.<br/>Preferred Shelf Number&#160;TA645<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119135470">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119135470</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Corrosion engineering and cathodic protection handbook : with extensive question and answer section ent://SD_ILS/0/SD_ILS:593224 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Cicek, Volkan, author.<br/>Preferred Shelf Number&#160;TA418.74<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119284338">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119284338</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Wittgenstein's Whewell's Court Lectures : Cambridge, 1938-1941, from the notes by Yorick Smythies ent://SD_ILS/0/SD_ILS:593612 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Wittgenstein, Ludwig, 1889-1951, author.&#160;Smythies, Yorick, 1917-1980, writer of notes.&#160;Munz, Volker A., editor.&#160;Ritter, Bernhard, 1973- editor.<br/>Preferred Shelf Number&#160;B3376 .W564 A5 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119166399">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119166399</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanoelectronics : materials, devices, applications ent://SD_ILS/0/SD_ILS:593621 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Puers, R., editor.<br/>Preferred Shelf Number&#160;TK7874.84<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Conductive atomic force microscopy : applications in nanomaterials ent://SD_ILS/0/SD_ILS:593891 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Lanza, Mario.<br/>Preferred Shelf Number&#160;QH212 .A78<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699773">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699773</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Flexible glass : enabling thin, lightweight, and flexible electronics ent://SD_ILS/0/SD_ILS:593847 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Garner, Sean M., author.<br/>Preferred Shelf Number&#160;TA418 .T45 F54 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118946404">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118946404</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust control optimization with metaheuristics ent://SD_ILS/0/SD_ILS:593300 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Feyel, Philippe.<br/>Preferred Shelf Number&#160;T57.84<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119340959">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119340959</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Photovoltaic solar energy : from fundamentals to applications ent://SD_ILS/0/SD_ILS:593310 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Reinders, Ang&egrave;le, editor.&#160;Verlinden, Pierre, editor.&#160;Sark, Wilfried van, editor.&#160;Freundlich, Alexandre, editor.<br/>Preferred Shelf Number&#160;TK1087 .P466 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118927496">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118927496</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Materials for solid state lighting and displays ent://SD_ILS/0/SD_ILS:593216 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Kitai, Adrian, 1957- editor.<br/>Preferred Shelf Number&#160;TK7882 .I6 M374 2017 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119140610">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119140610</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Metrology and standardization of nanotechnology : protocols and industrial innovations ent://SD_ILS/0/SD_ILS:593319 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Mansfield, Elisabeth, (Research chemist), editor.&#160;Kaiser, Debra L., editor.&#160;Fujita, Daisuke (Materials scientist), editor.&#160;Voorde, M. H. van de (Marcel H.), editor.<br/>Preferred Shelf Number&#160;T174.7<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Integrating project delivery ent://SD_ILS/0/SD_ILS:593447 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Fischer, Martin, 1960 July 11- author.&#160;Khanzode, Atul, 1971- author.&#160;Reed, Dean P., author.&#160;Ashcraft, Howard W., Jr., author.<br/>Preferred Shelf Number&#160;TH438 .F556 2017 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179009">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179009</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Continuous manufacturing of pharmaceuticals ent://SD_ILS/0/SD_ILS:593575 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Kleinebudde, Peter, 1958- editor.&#160;Khinast, Johannes, 1964- editor.&#160;Rantanen, Jukka, editor.<br/>Preferred Shelf Number&#160;RS192 .C67 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119001348">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119001348</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Content delivery networks : fundamentals, design, and evolution ent://SD_ILS/0/SD_ILS:593580 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Robinson, Dom, author.<br/>Preferred Shelf Number&#160;TK5105.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119249924">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119249924</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Flexible pipes ent://SD_ILS/0/SD_ILS:593556 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Bai, Qiang, author.&#160;Bai, Yong, author.&#160;Ruan, Weidong, 1989- author.<br/>Preferred Shelf Number&#160;TA492 .P6<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119041290">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119041290</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Real-time embedded systems ent://SD_ILS/0/SD_ILS:593770 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Wang, Jiacun, 1963- author.<br/>Preferred Shelf Number&#160;TK7895 .E42<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dynamics of large structures and inverse problems ent://SD_ILS/0/SD_ILS:593823 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;El Hami, Abdelkhalak, author.&#160;Radi, Boucha&iuml;b, author.<br/>Preferred Shelf Number&#160;TA654<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119332275">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119332275</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electricity markets : theories and applications ent://SD_ILS/0/SD_ILS:593935 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Lin, Jeremy.&#160;Magnago, Fernando H.<br/>Preferred Shelf Number&#160;HD9697 .A2 L56 2017 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179382">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179382</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The sourcebook of listening research : methodology and measures ent://SD_ILS/0/SD_ILS:594037 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Worthington, Debra L., editor.&#160;Bodie, Graham, editor.<br/>Preferred Shelf Number&#160;BF323 .L5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119102991">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119102991</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Physics and Technology of Crystalline Oxide Semiconductor CAAC-IGZO : Application to Displays ent://SD_ILS/0/SD_ILS:593178 2026-02-17T21:53:42Z 2026-02-17T21:53:42Z Author&#160;Yamazaki, Shunpei, editor.&#160;Tsutsui, Tetsuo, editor.<br/>Preferred Shelf Number&#160;TK7871.85<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119247395">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119247395</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>