Search Results for Reliability. - Narrowed by: 2002SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092002$0025092002$0026ps$003d300?2026-02-20T22:02:00ZElectric power distribution reliabilityent://SD_ILS/0/SD_ILS:5391242026-02-20T22:02:00Z2026-02-20T22:02:00ZAuthor Brown, Richard E., 1969- author.<br/>Preferred Shelf Number TK3091 .B76 2002 EB<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429164682">https://www.taylorfrancis.com/books/9780429164682</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>High reliability magnetic devices : design and fabricationent://SD_ILS/0/SD_ILS:5478292026-02-20T22:02:00Z2026-02-20T22:02:00ZAuthor McLyman, Colonel William T., 1932, author.<br/>Preferred Shelf Number TK454.4 .M3 M35 2002<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135563738">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152026-02-20T22:02:00Z2026-02-20T22:02:00ZAuthor Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Risk, Reliability, Uncertainty, and Robustness of Water Resource Systemsent://SD_ILS/0/SD_ILS:2366372026-02-20T22:02:00Z2026-02-20T22:02:00ZAuthor Bogardi, Janos J.. Kundzewicz, Zbigniew W..<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511546006">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of computer systems and networks fault tolerance, analysis and designent://SD_ILS/0/SD_ILS:3014662026-02-20T22:02:00Z2026-02-20T22:02:00ZAuthor Shooman, Martin L. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/047122460X">http://dx.doi.org/10.1002/047122460X</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html">http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Root cause analysis : improving performance for bottom-line resultsent://SD_ILS/0/SD_ILS:5418832026-02-20T22:02:00Z2026-02-20T22:02:00ZAuthor Latino, Robert J., author. Latino, Kenneth C.<br/>Preferred Shelf Number TS156 .L368 2002<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420040418">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Spatial electric load forecastingent://SD_ILS/0/SD_ILS:5433452026-02-20T22:02:00Z2026-02-20T22:02:00ZAuthor Willis, H. Lee, 1949, author.<br/>Preferred Shelf Number TK1005 .W55 2002<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135564643">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Evaluating the measurement uncertainty : fundamentals and practical guidanceent://SD_ILS/0/SD_ILS:5385562026-02-20T22:02:00Z2026-02-20T22:02:00ZAuthor Lira, Ignacio, 1951- author.<br/>Preferred Shelf Number T50<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367801564">https://www.taylorfrancis.com/books/9780367801564</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electronic systems maintenance handbookent://SD_ILS/0/SD_ILS:5434982026-02-20T22:02:00Z2026-02-20T22:02:00ZAuthor Whitaker, Jerry C.<br/>Preferred Shelf Number TK7870 .E212 2002<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315220680">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Instrument engineers' handbook. Process software and digital networksent://SD_ILS/0/SD_ILS:5437672026-02-20T22:02:00Z2026-02-20T22:02:00ZAuthor Liptak, Bela G. Liptak, Bela G. Instrument engineers' handbook. Process measurement and analysis. Liptak, Bela G. Instrument engineers' handbook. Process control.<br/>Preferred Shelf Number TS156.8 .I56 2002<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439863442">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Handbook of nutrition and foodent://SD_ILS/0/SD_ILS:5476422026-02-20T22:02:00Z2026-02-20T22:02:00ZAuthor Berdanier, Carolyn D.<br/>Preferred Shelf Number QP141 .H345 2002<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420038392">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Power transformers : principles and applicationsent://SD_ILS/0/SD_ILS:5403352026-02-20T22:02:00Z2026-02-20T22:02:00ZAuthor Winders, John J., 1947, author.<br/>Preferred Shelf Number TK2551 .W495 2002<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135559113">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>