Search Results for Reliability. - Narrowed by: 2005SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092005$0025092005$0026ps$003d300?2025-02-17T10:33:14ZMaintenance Theory of Reliabilityent://SD_ILS/0/SD_ILS:1753232025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Engineering design reliability handbookent://SD_ILS/0/SD_ILS:2873132025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, quality, and safety for engineersent://SD_ILS/0/SD_ILS:2872852025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203006139">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, quality, and safety for engineersent://SD_ILS/0/SD_ILS:1195532025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Dhillon, B. S.<br/>Preferred Shelf Number TS173 .D45 2005<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Reliability and risk models setting reliability requirementsent://SD_ILS/0/SD_ILS:2959002025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Todinov, M. T. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and risk models : setting reliability requirementsent://SD_ILS/0/SD_ILS:1194812025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Todinov, M. T.<br/>Preferred Shelf Number TA169 .T65 2005<br/>Format: Books<br/>Availability Beytepe Library~1<br/>The Universal Generating Function in Reliability Analysis and Optimizationent://SD_ILS/0/SD_ILS:1753372025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Levitin, Gregory. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-245-4">http://dx.doi.org/10.1007/1-84628-245-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, maintainability and risk practical methods for engineersent://SD_ILS/0/SD_ILS:2548542025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Smith, David John, 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Adhesives technology for electronic applications materials, processes, reliabilityent://SD_ILS/0/SD_ILS:2564612025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Licari, James J., 1930- Swanson, Dale W.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815515135">http://www.sciencedirect.com/science/book/9780815515135</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Robust communications software extreme availability, reliability and scalability for carrier-grade systemsent://SD_ILS/0/SD_ILS:2956482025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Utas, Greg. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470011793">http://dx.doi.org/10.1002/0470011793</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Axiomatic quality integrating axiomatic design with six-sigma, reliability, and quality engineeringent://SD_ILS/0/SD_ILS:3016722025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor El-Haik, Basem.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access OverDrive (PDF) <a href="http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50">http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50</a>
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Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpAQIADSS2">http://app.knovel.com/web/toc.v/cid:kpAQIADSS2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Robust communications software : extreme availability, reliability and scalability for carrier-grade systemsent://SD_ILS/0/SD_ILS:1194832025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Utas, Greg.<br/>Preferred Shelf Number TK5105.9 U83 2005<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Advances in Ranking and Selection, Multiple Comparisons, and Reliability Methodology and Applicationsent://SD_ILS/0/SD_ILS:1681182025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Balakrishnan, N. editor. Nagaraja, H. N. editor. Kannan, N. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138793">http://dx.doi.org/10.1007/b138793</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 24th International Conference, SAFECOMP 2005, Fredrikstad, Norway, September 28-30, 2005. Proceedingsent://SD_ILS/0/SD_ILS:1830682025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Winther, Rune. editor. Gran, Bjørn Axel. editor. Dahll, Gustav. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11563228">http://dx.doi.org/10.1007/11563228</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Integrated Risk and Vulnerability Management Assisted by Decision Support Systems Relevance and Impact on Governanceent://SD_ILS/0/SD_ILS:1689852025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Gheorghe, Adrian V. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-3721-X">http://dx.doi.org/10.1007/1-4020-3721-X</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Digital communication over fading channelsent://SD_ILS/0/SD_ILS:2494082025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Simon, Marvin Kenneth, 1939- Alouini, Mohamed-Slim.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238261">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238261</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Risk assessment of power systems models, methods, and applicationsent://SD_ILS/0/SD_ILS:2494362025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Li, Wenyuan.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238312">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238312</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Trustworthy systems through quantitative software engineeringent://SD_ILS/0/SD_ILS:2494372025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Bernstein, Lawrence, 1940- Yuhas, C. M. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Plant and machinery failure preventionent://SD_ILS/0/SD_ILS:2935722025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Hattangadi, A. A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/plant-machinery-failure-prevention">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Flowgraph models for multistate time-to-event dataent://SD_ILS/0/SD_ILS:3016332025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Huzurbazar, Aparna V., 1966- John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471686565">http://dx.doi.org/10.1002/0471686565</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Sosyal ve davranışsal ölçümlerde güvenilirlik ve geçerlilikent://SD_ILS/0/SD_ILS:1082012025-02-17T10:33:14Z2025-02-17T10:33:14ZAuthor Şencan, Hüner.<br/>Preferred Shelf Number BF176 .S463 2005<br/>Format: Books<br/>Availability Beytepe Library~1<br/>