Search Results for Reliability. - Narrowed by: 2006 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092006$0025092006$0026ps$003d300? 2026-01-22T07:41:13Z Reliability and Optimal Maintenance ent://SD_ILS/0/SD_ILS:175380 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Wang, Hongzhou. author.&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Six Sigma ent://SD_ILS/0/SD_ILS:165709 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Kumar, U Dinesh. author.&#160;Crocker, John. author.&#160;Chitra, T. author.&#160;Saranga, Haritha. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated quality and reliability solutions ent://SD_ILS/0/SD_ILS:254415 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Klyatis, Lev M.&#160;Klyatis, Eugene L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic Ageing and Dependence for Reliability ent://SD_ILS/0/SD_ILS:166017 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Lai, Chin-Diew. author.&#160;Xie, Min. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-34232-X">http://dx.doi.org/10.1007/0-387-34232-X</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and risk a Bayesian perspective ent://SD_ILS/0/SD_ILS:296819 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Singpurwalla, Nozer D.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System reliability : concepts and applications ent://SD_ILS/0/SD_ILS:392825 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Klaassen, Klaas B., 1941-&#160;Peppen, Jack C. L. van.<br/>Preferred Shelf Number&#160;QA76.5 K53 2006<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Maintainability, maintenance, and reliability for engineers ent://SD_ILS/0/SD_ILS:545920 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;TA168 .D53 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420006780">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Distribution reliability and power quality ent://SD_ILS/0/SD_ILS:543499 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Short, T. A. (Tom A.), 1966- author.<br/>Preferred Shelf Number&#160;TK3091 .S465 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420036480">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> IUTAM Symposium on Mechanics and Reliability of Actuating Materials Proceedings of the IUTAM Symposium held in Beijing, China, 1&ndash;3 September, 2004 ent://SD_ILS/0/SD_ILS:169088 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Yang, W. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-4020-4131-4">http://dx.doi.org/10.1007/1-4020-4131-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 25th International Conference, SAFECOMP 2006, Gdansk, Poland, September 27-29, 2006. Proceedings ent://SD_ILS/0/SD_ILS:184859 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;G&oacute;rski, Janusz. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11875567">http://dx.doi.org/10.1007/11875567</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Warranty Management and Product Manufacture ent://SD_ILS/0/SD_ILS:175346 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Murthy, D.N. Prabhakar. author.&#160;Blischke, Wallace R. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-258-6">http://dx.doi.org/10.1007/1-84628-258-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Critical Infrastructures at Risk Securing the European Electric Power System ent://SD_ILS/0/SD_ILS:169155 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Gheorghe, A.V. editor.&#160;Masera, M. editor.&#160;Weijnen, M. editor.&#160;Vries, De L. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-4020-4364-3">http://dx.doi.org/10.1007/1-4020-4364-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Challenging American Leadership Impact of National Quality on Risk of Losing Leadership ent://SD_ILS/0/SD_ILS:169311 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Frankel, Ernst Gabriel. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-4020-4907-2">http://dx.doi.org/10.1007/1-4020-4907-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Nuclear Imperative A Critical Look at the Approaching Energy Crisis ent://SD_ILS/0/SD_ILS:169319 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Eerkens, Jeff W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-4020-4931-5">http://dx.doi.org/10.1007/1-4020-4931-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Electrical Engineering Handbook - Six Volume Set ent://SD_ILS/0/SD_ILS:542484 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Dorf, Richard C., editor.&#160;Taylor and Francis.<br/>Preferred Shelf Number&#160;R857 .B54<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Assurance technologies principles and practices : a product, process, and system safety perspective ent://SD_ILS/0/SD_ILS:295628 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Raheja, Dev.&#160;Allocco, Michael.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=54979&ref=toc">http://www.myilibrary.com?id=54979&ref=toc</a> John Wiley <a href="http://dx.doi.org/10.1002/047000942X">http://dx.doi.org/10.1002/047000942X</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112151853">http://www3.interscience.wiley.com/cgi-bin/bookhome/112151853</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/62326785.html">http://catalog.hathitrust.org/api/volumes/oclc/62326785.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Risk analysis in engineering : techniques, tools, and trends ent://SD_ILS/0/SD_ILS:119534 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Modarres, Mohammad.<br/>Preferred Shelf Number&#160;T174.5 M65 2006<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Handbook of exponential and related distributions for engineers and scientists ent://SD_ILS/0/SD_ILS:545251 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Pal, Nabendu., author.&#160;Jin, Chun.&#160;Lim, Wooi K.<br/>Preferred Shelf Number&#160;QA273.6 .P35 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135442842">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Handbook of semiconductor interconnection technology ent://SD_ILS/0/SD_ILS:545976 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Schwartz, G. 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V., 1948-<br/>Preferred Shelf Number&#160;TK7874.53 .H36 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420017656">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Geotechnical risk in rock tunnels : selected papers from a course on Geotechnical Risk in Rock Tunnels, Aveiro, Portugal, 16-17 April 2004 ent://SD_ILS/0/SD_ILS:546361 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Matos, Antonio Campos e.<br/>Preferred Shelf Number&#160;TA815 .G46 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781134147182">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Developmental and reproductive toxicology : a practical approach ent://SD_ILS/0/SD_ILS:537414 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Hood, Ronald D.<br/>Preferred Shelf Number&#160;RA1224.2 .H36 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420040548">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Uncertainty modeling and analysis in engineering and the sciences ent://SD_ILS/0/SD_ILS:544184 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Ayyub, Bilal M., author.&#160;Klir, George J., 1932-<br/>Preferred Shelf Number&#160;TA330 .A995 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420011456">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Developmental and reproductive toxicology : a practical approach ent://SD_ILS/0/SD_ILS:539903 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Hood, Ronald D.<br/>Preferred Shelf Number&#160;RA1224.2 .H36 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420040548">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Understanding electric utilities and de-regulation ent://SD_ILS/0/SD_ILS:544494 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Philipson, Lorrin, 1945, author.&#160;Willis, H. Lee, 1949-<br/>Preferred Shelf Number&#160;HD9685 .A2 P48 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420028263">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Handbook of univariate and multivariate data analysis and interpretation with SPSS ent://SD_ILS/0/SD_ILS:544057 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Ho, Robert, author.<br/>Preferred Shelf Number&#160;QA279 .H6 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420011111">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Numerical methods in geotechnical engineering : proceedings of the sixth European Conference on Numerical Methods in Geotechnical Engineering : Graz, Austria, 6-8 September 2006 ent://SD_ILS/0/SD_ILS:544708 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;European Conference on Numerical Methods in Geotechnical Engineering (6th : 2006 : Graz, Austria)&#160;Schweiger, Helmut F.<br/>Preferred Shelf Number&#160;TA703.5 .E97 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439833766">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Electrical contacts : fundamentals, applications and technology ent://SD_ILS/0/SD_ILS:545501 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Braunovic, Milenko, author.&#160;Myshkin, Nikolai Konstantinovich.&#160;Konchit&#865;s, V. V. (Valerii Vasilevich)<br/>Preferred Shelf Number&#160;TK2821 .B665 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9780849391088">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> New technological solutions in underground mining : International Mining Forum 2006 ent://SD_ILS/0/SD_ILS:546186 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;International Mining Forum (2006)&#160;Kicki, Jerzy.&#160;Sobczyk, Eugeniusz J.<br/>Preferred Shelf Number&#160;TN5 .I58 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9780415889391">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Principles of structural design ent://SD_ILS/0/SD_ILS:546816 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Chen, Wai-Fah, 1936-&#160;Lui, E. M.<br/>Preferred Shelf Number&#160;TA658 .P745 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420037135">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> MEMS and Microstructures in aerospace applications ent://SD_ILS/0/SD_ILS:547494 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Osiander, Robert., author.&#160;Darrin, M. Ann Garrison.&#160;Champion, John.<br/>Preferred Shelf Number&#160;TL589 .O85 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420027747">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> The electrical engineering handbook. Sensors, nanoscience, biomedical engineering, and instruments ent://SD_ILS/0/SD_ILS:547506 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Dorf, Richard C.<br/>Preferred Shelf Number&#160;R857 .B54 E44 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420003161">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Handbook on Neurovascular Ultrasound ent://SD_ILS/0/SD_ILS:548874 2026-01-22T07:41:13Z 2026-01-22T07:41:13Z Author&#160;Baumgartner, R.W., editor.<br/>Preferred Shelf Number&#160;XX(548874.1)<br/>Electronic Access&#160;<a href="https://karger.com/book/doi/10.1159/isbn.978-3-318-01284-2">https://karger.com/book/doi/10.1159/isbn.978-3-318-01284-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>