Search Results for Reliability. - Narrowed by: 2008 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092008$0025092008$0026ps$003d300? 2026-01-22T14:33:39Z Bayesian Reliability ent://SD_ILS/0/SD_ILS:167542 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Hamada, Michael S. author.&#160;Wilson, Alyson G. author.&#160;Reese, C. Shane. author.&#160;Martz, Harry F. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of MEMS ent://SD_ILS/0/SD_ILS:303632 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Tsuchiya, Toshiyuki.&#160;Tabata, Osamu, 1956-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advanced Reliability Models and Maintenance Policies ent://SD_ILS/0/SD_ILS:175800 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-294-4">http://dx.doi.org/10.1007/978-1-84800-294-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Product Reliability Specification and Performance ent://SD_ILS/0/SD_ILS:175790 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Murthy, Dodderi Narshima Prabhakar. author.&#160;Rausand, Marvin. author.&#160;&Oslash;ster&aring;s, Trond. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-271-5">http://dx.doi.org/10.1007/978-1-84800-271-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mining Equipment Reliability, Maintainability, and Safety ent://SD_ILS/0/SD_ILS:144346 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Dhillon, Balbir S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Silver Metallization Stability and Reliability ent://SD_ILS/0/SD_ILS:175677 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Adams, Daniel. author.&#160;Alford, Terry L. author.&#160;Mayer, James W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mathematical models for systems reliability ent://SD_ILS/0/SD_ILS:538905 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Epstein, Benjamin, 1918, author.&#160;Weissman, Ishay, 1940-<br/>Preferred Shelf Number&#160;TA169 .E67 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420080834">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Failure Rate Modelling for Reliability and Risk ent://SD_ILS/0/SD_ILS:175868 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Finkelstein, Maxim. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety, reliability and risks associated with water, oil and gas pipelines : [proceedings of the NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines, Alexandria, Egypt, 4-8 February 2007] ent://SD_ILS/0/SD_ILS:113617 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines (2007 : Alexandria, Egypt)&#160;Elwany, Mohamed Hamdy.&#160;Pluvinage, Guy.<br/>Preferred Shelf Number&#160;TJ930 .N386 2008<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Quality and Reliability of Large-Eddy Simulations ent://SD_ILS/0/SD_ILS:170230 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Meyers, Johan. editor.&#160;Geurts, Bernard J. editor.&#160;Sagaut, Pierre. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-8578-9">http://dx.doi.org/10.1007/978-1-4020-8578-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> New Computational Methods in Power System Reliability ent://SD_ILS/0/SD_ILS:187983 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Elmakias, David. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-77812-7">http://dx.doi.org/10.1007/978-3-540-77812-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Rules of thumb for maintenance and reliability engineers ent://SD_ILS/0/SD_ILS:306517 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Smith, Ricky.&#160;Mobley, R. Keith, 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Rules of thumb for maintenance and reliability engineers ent://SD_ILS/0/SD_ILS:149151 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Smith, Ricky.&#160;Mobley, R. Keith, 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Emerging Nanotechnologies Test, Defect Tolerance, and Reliability ent://SD_ILS/0/SD_ILS:167204 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Tehranipoor, Mohammad. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Recent Advances in Reliability and Quality in Design ent://SD_ILS/0/SD_ILS:175716 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Pham, Hoang. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-113-8">http://dx.doi.org/10.1007/978-1-84800-113-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines ent://SD_ILS/0/SD_ILS:169842 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Pluvinage, Guy. editor.&#160;Elwany, Mohamed Hamdy. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-6526-2">http://dx.doi.org/10.1007/978-1-4020-6526-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliability ent://SD_ILS/0/SD_ILS:183993 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Bertsche, Bernd. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-34282-3">http://dx.doi.org/10.1007/978-3-540-34282-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 27th International Conference, SAFECOMP 2008 Newcastle upon Tyne, UK, September 22-25, 2008 Proceedings ent://SD_ILS/0/SD_ILS:188894 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Harrison, Michael D. editor.&#160;Sujan, Mark-Alexander. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-87698-4">http://dx.doi.org/10.1007/978-3-540-87698-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mathematical methods in survival analysis, reliability and quality of life ent://SD_ILS/0/SD_ILS:297543 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Huber, Catherine.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470610985">http://dx.doi.org/10.1002/9780470610985</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Tutorial on hardware and software reliability, maintainability, and availability ent://SD_ILS/0/SD_ILS:249814 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Schneidewind, Norman.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540</a> IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysis ent://SD_ILS/0/SD_ILS:167030 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Limnios, Nikolaos. author.&#160;Barbu, Vlad Stefan. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-73173-5">http://dx.doi.org/10.1007/978-0-387-73173-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Engineering design reliability applications for the aerospace, automotive, and ship industries ent://SD_ILS/0/SD_ILS:153040 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.&#160;CRC Press.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Engineering design reliability applications : for the aerospace, automotive, and ship industries ent://SD_ILS/0/SD_ILS:539978 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Preferred Shelf Number&#160;TA174 .E54 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420051339">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Lubrication and maintenance of industrial machinery : best practices and reliability ent://SD_ILS/0/SD_ILS:541017 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Gresham, Robert M.&#160;Totten, George E.<br/>Preferred Shelf Number&#160;TJ153 .L845 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420089363">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability technology, human error, and quality in health care ent://SD_ILS/0/SD_ILS:542996 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Dhillon, B. 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(Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;RA399 .A1 D487 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420065596">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Developments in Telecommunications With a Focus on SS7 Network Reliability ent://SD_ILS/0/SD_ILS:187329 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Rufa, Gerhard. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74986-8">http://dx.doi.org/10.1007/978-3-540-74986-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Next Generation Wireless LANs Throughput, Robustness, and Reliability in 802.11n ent://SD_ILS/0/SD_ILS:236024 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Perahia, Eldad.&#160;Stacey, Robert.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1017/CBO9780511541032">Access by subscription</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Complex System Maintenance Handbook ent://SD_ILS/0/SD_ILS:175670 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Kobbacy, Khairy A. H. author.&#160;Murthy, D. N. Prabhakar. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-011-7">http://dx.doi.org/10.1007/978-1-84800-011-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Justifying the Dependability of Computer-based Systems With Applications in Nuclear Engineering ent://SD_ILS/0/SD_ILS:175833 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Courtois, Pierre-Jacques. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-372-9">http://dx.doi.org/10.1007/978-1-84800-372-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Risks in Modern Society ent://SD_ILS/0/SD_ILS:170104 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Bischoff, Hans-J&uuml;rgen. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-8289-4">http://dx.doi.org/10.1007/978-1-4020-8289-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Oil and Security A World Beyond Petroleum ent://SD_ILS/0/SD_ILS:169783 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Frankel, Ernst Gabriel. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-6382-4">http://dx.doi.org/10.1007/978-1-4020-6382-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dependability benchmarking for computer systems ent://SD_ILS/0/SD_ILS:249772 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Kanoun, Karama.&#160;Spainhower, Lisa.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Using aspect-oriented programming for trustworthy software development ent://SD_ILS/0/SD_ILS:297624 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Safonov, V. O. (Vladimir Olegovich)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=26061">http://www.books24x7.com/marc.asp?bookid=26061</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470283110">http://dx.doi.org/10.1002/9780470283110</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=138149&ref=toc">http://www.myilibrary.com?id=138149&ref=toc</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0829/2007041615-b.html">http://catdir.loc.gov/catdir/enhancements/fy0829/2007041615-b.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of power quality ent://SD_ILS/0/SD_ILS:302723 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Baggini, Angelo B.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470754245">http://dx.doi.org/10.1002/9780470754245</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Information assurance dependability and security in networked systems ent://SD_ILS/0/SD_ILS:145553 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Qian, Yi, 1962-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123735669">http://www.sciencedirect.com/science/book/9780123735669</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Silicon heterostructure devices ent://SD_ILS/0/SD_ILS:540480 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Cressler, John D.<br/>Preferred Shelf Number&#160;TK7871.96 .B55 S54 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420066913">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Handbook of semiconductor manufacturing technology ent://SD_ILS/0/SD_ILS:542441 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Doering, Robert, 1946-&#160;Nishi, Yoshio, 1940-<br/>Preferred Shelf Number&#160;TK7871.85 .H3335 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781315213934">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Handbook of capillary and microchip electrophoresis and associated microtechniques ent://SD_ILS/0/SD_ILS:547665 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Landers, James P.<br/>Preferred Shelf Number&#160;QP519.9 .C36 H35 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420004953">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Foot and ankle motion analysis : clinical treatment and technology ent://SD_ILS/0/SD_ILS:537402 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Harris, Gerald F.&#160;Smith, Peter A., 1959-&#160;Marks, Richard M.<br/>Preferred Shelf Number&#160;RD781 .F585 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420005745">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Statistical test theory for the behavioral sciences ent://SD_ILS/0/SD_ILS:544031 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Gruijter, Dato N. de., author.&#160;Kamp, Leo J. Th. van der.<br/>Preferred Shelf Number&#160;H61.25 .G78 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781584889595">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Smart materials ent://SD_ILS/0/SD_ILS:538993 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Schwartz, Mel M.<br/>Preferred Shelf Number&#160;TA418.9 .S62 S48 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420043730">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> RF and microwave applications and systems ent://SD_ILS/0/SD_ILS:542504 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Golio, John Michael, 1954-<br/>Preferred Shelf Number&#160;TK7876 .R486 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420006711">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Structural design optimization considering uncertainties ent://SD_ILS/0/SD_ILS:544359 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Tsompanakis, Yiannis, 1969-&#160;Lagaros, Nikos D., 1970-&#160;Papadrakakis, Manolis.<br/>Preferred Shelf Number&#160;TA658.8 .S77 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781134055067">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Electrically conductive adhesives ent://SD_ILS/0/SD_ILS:544684 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Gomatam, R. 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L., 1945-<br/>Preferred Shelf Number&#160;TP968 .E42 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9789004187825">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> The Weibull distribution : a handbook ent://SD_ILS/0/SD_ILS:545027 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Rinne, Horst., author.<br/>Preferred Shelf Number&#160;QA273.6 .R56 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420087444">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Bridge maintenance, safety management, health monitoring and informatics : proceedings of the Fourth International Conference on Bridge Maintenance, Safety and Management, Seoul, Korea, July 13-17 2008 ent://SD_ILS/0/SD_ILS:545756 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;International Conference on Bridge Maintenance, Safety and Management (4th : 2008 : Seoul, Korea)&#160;Koh, Hyun-Moo.&#160;Frangopol, Dan M.<br/>Preferred Shelf Number&#160;TG315 .I58 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439828434">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Foot and ankle motion analysis : clinical treatment and technology ent://SD_ILS/0/SD_ILS:546903 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Harris, Gerald F.&#160;Smith, Peter A., 1959-&#160;Marks, Richard M.<br/>Preferred Shelf Number&#160;RD781 .F585 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420005745">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Fundamentals of quality control and improvement ent://SD_ILS/0/SD_ILS:596773 2026-01-22T14:33:39Z 2026-01-22T14:33:39Z Author&#160;Mitra, Amitava.<br/>Preferred Shelf Number&#160;TS156<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119692379">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119692379</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>