Search Results for Reliability. - Narrowed by: 2009SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092009$0025092009$0026ps$003d300$0026isd$003dtrue?2024-11-12T19:51:53ZStructural reliabilityent://SD_ILS/0/SD_ILS:2979782024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Lemaire, Maurice. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical system reliabilityent://SD_ILS/0/SD_ILS:1531462024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electric power distribution reliabilityent://SD_ILS/0/SD_ILS:2856642024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Brown, Richard E., 1969-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780849375682">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety and reliability of bridge structuresent://SD_ILS/0/SD_ILS:2855522024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Mahmoud, Khaled M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203861585">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VoIP handbook applications, technologies, reliability, and securityent://SD_ILS/0/SD_ILS:2896752024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Ahson, Syed. Ilyas, Mohammad, 1953-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420070217">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability wearout mechanisms in advanced CMOS technologiesent://SD_ILS/0/SD_ILS:2495742024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Solder Joint Reliability Prediction for Multiple Environmentsent://SD_ILS/0/SD_ILS:1676732024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Perkins, Andrew E. author. Sitaraman, Suresh K. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Security and Reliability of Damaged Structures and Defective Materialsent://SD_ILS/0/SD_ILS:2048892024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Pluvinage, Guy. editor. Sedmak, Aleksandar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-2792-4">http://dx.doi.org/10.1007/978-90-481-2792-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systemsent://SD_ILS/0/SD_ILS:1758392024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Seong, Poong Hyun. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-384-2">http://dx.doi.org/10.1007/978-1-84800-384-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety, reliability and risk of structures, infrastructures and engineering systems proceedings of the Tenth International Conference on Structural Safety and Reliability (ICOSSAR2009), Osaka, Japan, 13-17 September 2009ent://SD_ILS/0/SD_ILS:2888582024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor International Conference on Structural Safety and Reliability (10th : 2009 : Osaka, Japan) Furuta, Hitoshi. Frangopol, Dan M. Shinozuka, Masanobu. Hirokane, Michiyuki.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439847657">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Corrosion, wear, fatigue, and reliability of ceramics a collection of papers presented at the 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008, Daytona Beach, Floridaent://SD_ILS/0/SD_ILS:2974572024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.) Salem, J. A. (Jonathan A.), 1960- Fuller, Edwin R. Ohji, T. (Tatsuki) Wereszczak, Andrew.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470456347">http://dx.doi.org/10.1002/9780470456347</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297839">http://site.ebrary.com/lib/alltitles/Doc?id=10297839</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability analysis and prediction with warranty data issues, strategies, and methodsent://SD_ILS/0/SD_ILS:2860482024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Rai, Bharatendra K. Singh, Nanua.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439803264">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Power distribution system reliability practical methods and applicationsent://SD_ILS/0/SD_ILS:2495632024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Chowdhury, Ali A. Koval, D. O. (Don Orest)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Robust design methodology for reliability exploring the effects of variation and uncertaintyent://SD_ILS/0/SD_ILS:2983962024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Bergman, Bo, 1943- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a>
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Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of Reliability, Availability, Maintainability and Safety in Engineering Designent://SD_ILS/0/SD_ILS:1757452024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Stapelberg, Rudolph Frederick. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-175-6">http://dx.doi.org/10.1007/978-1-84800-175-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>İki parametreli üstel dağılımda rekor değerler ile ortak değişim katsayısı ve güvenirlik tahmin edicileri = Common coefficient of variation and reliability estimators using record values in two parameter exponential distributionent://SD_ILS/0/SD_ILS:1246412024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Bıyıklı, Nurten.<br/>Preferred Shelf Number TEZ/9030 .B59 2009<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Computer Safety, Reliability, and Security 28th International Conference, SAFECOMP 2009, Hamburg, Germany, September 15-18, 2009. Proceedingsent://SD_ILS/0/SD_ILS:1909602024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Buth, Bettina. editor. Rabe, Gerd. editor. Seyfarth, Till. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-04468-7">http://dx.doi.org/10.1007/978-3-642-04468-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality of Service in Heterogeneous Networks 6th International ICST Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2009 and 3rd International Workshop on Advanced Architectures and Algorithms for Internet Delivery and Applications, AAA-IDEA 2009, Las Palmas, Gran Canaria, November 23-25, 2009 Proceedingsent://SD_ILS/0/SD_ILS:1914262024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Bartolini, Novella. editor. Nikoletseas, Sotiris. editor. Sinha, Prasun. editor. Cardellini, Valeria. editor. Mahanti, Anirban. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-10625-5">http://dx.doi.org/10.1007/978-3-642-10625-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Machine Learning in Cyber Trust Security, Privacy, and Reliabilityent://SD_ILS/0/SD_ILS:1679002024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Yu, Philip S. editor. Tsai, Jeffrey J. P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-88735-7">http://dx.doi.org/10.1007/978-0-387-88735-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Engineering Decisions for Life Quality How Safe is Safe Enough?ent://SD_ILS/0/SD_ILS:1760192024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Nathwani, J. S. author. Lind, N. C. author. Pandey, M. D. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84882-602-1">http://dx.doi.org/10.1007/978-1-84882-602-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Complexity of Proceduralized Tasksent://SD_ILS/0/SD_ILS:1760682024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Park, Jinkyun. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84882-791-2">http://dx.doi.org/10.1007/978-1-84882-791-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality Decision Management - The Heart of Effective Futures-Oriented Management A Primer for Effective Decision-Based Managementent://SD_ILS/0/SD_ILS:1704042024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Frankel, Ernst G. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8996-1">http://dx.doi.org/10.1007/978-1-4020-8996-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Shovel-truck systems modelling, analysis, and calculationent://SD_ILS/0/SD_ILS:2883132024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Czaplicki, Jacek M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203881248">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Smart materialsent://SD_ILS/0/SD_ILS:2860092024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Schwartz, Mel M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420043730">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Analysis and design of marine structures Proceedings of Marstruct 2009, the 2nd International Conference on Marine Structures, Lisbon, Portugal, 16-18 March 2009ent://SD_ILS/0/SD_ILS:2884412024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Soares, C. Guedes. Das, P. K. International Conference on Marine Structures.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203874981">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transient-induced latchup in CMOS integrated circuitsent://SD_ILS/0/SD_ILS:2497852024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Ker, Ming-Dou. Hsu, Sheng-Fu.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Systems and software engineering with applicationsent://SD_ILS/0/SD_ILS:2498132024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Schneidewind, Norman.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539</a>
IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Software error detection through testing and analysisent://SD_ILS/0/SD_ILS:2977252024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Huang, J. C., 1935-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470464076">http://dx.doi.org/10.1002/9780470464076</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=227967&ref=toc">http://www.myilibrary.com?id=227967&ref=toc</a>
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<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=456102">http://swb.eblib.com/patron/FullRecord.aspx?p=456102</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>ESD failure mechanisms and modelsent://SD_ILS/0/SD_ILS:2983752024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Voldman, Steven H. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Cross-cultural research methodsent://SD_ILS/0/SD_ILS:2685482024-11-12T19:51:53Z2024-11-12T19:51:53ZAuthor Ember, Carol R. Ember, Melvin.<br/>Preferred Shelf Number GN345.7 E53 2009<br/>Format: Books<br/>Availability Beytepe Library~1<br/>