Search Results for Reliability. - Narrowed by: 2009SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092009$0025092009$0026ps$003d300$0026isd$003dtrue?2024-10-24T09:21:51ZStructural reliabilityent://SD_ILS/0/SD_ILS:2979782024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Lemaire, Maurice. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical system reliabilityent://SD_ILS/0/SD_ILS:1531462024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electric power distribution reliabilityent://SD_ILS/0/SD_ILS:2856642024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Brown, Richard E., 1969-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780849375682">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety and reliability of bridge structuresent://SD_ILS/0/SD_ILS:2855522024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Mahmoud, Khaled M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203861585">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability wearout mechanisms in advanced CMOS technologiesent://SD_ILS/0/SD_ILS:2495742024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VoIP handbook applications, technologies, reliability, and securityent://SD_ILS/0/SD_ILS:2896752024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Ahson, Syed. Ilyas, Mohammad, 1953-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420070217">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Solder Joint Reliability Prediction for Multiple Environmentsent://SD_ILS/0/SD_ILS:1676732024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Perkins, Andrew E. author. Sitaraman, Suresh K. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systemsent://SD_ILS/0/SD_ILS:1758392024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Seong, Poong Hyun. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-384-2">http://dx.doi.org/10.1007/978-1-84800-384-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Security and Reliability of Damaged Structures and Defective Materialsent://SD_ILS/0/SD_ILS:2048892024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Pluvinage, Guy. editor. Sedmak, Aleksandar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-2792-4">http://dx.doi.org/10.1007/978-90-481-2792-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety, reliability and risk of structures, infrastructures and engineering systems proceedings of the Tenth International Conference on Structural Safety and Reliability (ICOSSAR2009), Osaka, Japan, 13-17 September 2009ent://SD_ILS/0/SD_ILS:2888582024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor International Conference on Structural Safety and Reliability (10th : 2009 : Osaka, Japan) Furuta, Hitoshi. Frangopol, Dan M. Shinozuka, Masanobu. Hirokane, Michiyuki.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439847657">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 28th International Conference, SAFECOMP 2009, Hamburg, Germany, September 15-18, 2009. Proceedingsent://SD_ILS/0/SD_ILS:1909602024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Buth, Bettina. editor. Rabe, Gerd. editor. Seyfarth, Till. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-04468-7">http://dx.doi.org/10.1007/978-3-642-04468-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality of Service in Heterogeneous Networks 6th International ICST Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2009 and 3rd International Workshop on Advanced Architectures and Algorithms for Internet Delivery and Applications, AAA-IDEA 2009, Las Palmas, Gran Canaria, November 23-25, 2009 Proceedingsent://SD_ILS/0/SD_ILS:1914262024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Bartolini, Novella. editor. Nikoletseas, Sotiris. editor. Sinha, Prasun. editor. Cardellini, Valeria. editor. Mahanti, Anirban. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-10625-5">http://dx.doi.org/10.1007/978-3-642-10625-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Corrosion, wear, fatigue, and reliability of ceramics a collection of papers presented at the 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008, Daytona Beach, Floridaent://SD_ILS/0/SD_ILS:2974572024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.) Salem, J. A. (Jonathan A.), 1960- Fuller, Edwin R. Ohji, T. (Tatsuki) Wereszczak, Andrew.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470456347">http://dx.doi.org/10.1002/9780470456347</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297839">http://site.ebrary.com/lib/alltitles/Doc?id=10297839</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Machine Learning in Cyber Trust Security, Privacy, and Reliabilityent://SD_ILS/0/SD_ILS:1679002024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Yu, Philip S. editor. Tsai, Jeffrey J. P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-88735-7">http://dx.doi.org/10.1007/978-0-387-88735-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of Reliability, Availability, Maintainability and Safety in Engineering Designent://SD_ILS/0/SD_ILS:1757452024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Stapelberg, Rudolph Frederick. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-175-6">http://dx.doi.org/10.1007/978-1-84800-175-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Robust design methodology for reliability exploring the effects of variation and uncertaintyent://SD_ILS/0/SD_ILS:2983962024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Bergman, Bo, 1943- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Power distribution system reliability practical methods and applicationsent://SD_ILS/0/SD_ILS:2495632024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Chowdhury, Ali A. Koval, D. O. (Don Orest)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>İki parametreli üstel dağılımda rekor değerler ile ortak değişim katsayısı ve güvenirlik tahmin edicileri = Common coefficient of variation and reliability estimators using record values in two parameter exponential distributionent://SD_ILS/0/SD_ILS:1246412024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Bıyıklı, Nurten.<br/>Preferred Shelf Number TEZ/9030 .B59 2009<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Reliability analysis and prediction with warranty data issues, strategies, and methodsent://SD_ILS/0/SD_ILS:2860482024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Rai, Bharatendra K. Singh, Nanua.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439803264">Distributed by publisher. 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D. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84882-602-1">http://dx.doi.org/10.1007/978-1-84882-602-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Complexity of Proceduralized Tasksent://SD_ILS/0/SD_ILS:1760682024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Park, Jinkyun. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84882-791-2">http://dx.doi.org/10.1007/978-1-84882-791-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality Decision Management - The Heart of Effective Futures-Oriented Management A Primer for Effective Decision-Based Managementent://SD_ILS/0/SD_ILS:1704042024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Frankel, Ernst G. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8996-1">http://dx.doi.org/10.1007/978-1-4020-8996-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transient-induced latchup in CMOS integrated circuitsent://SD_ILS/0/SD_ILS:2497852024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Ker, Ming-Dou. Hsu, Sheng-Fu.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Cross-cultural research methodsent://SD_ILS/0/SD_ILS:2685482024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Ember, Carol R. Ember, Melvin.<br/>Preferred Shelf Number GN345.7 E53 2009<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Smart materialsent://SD_ILS/0/SD_ILS:2860092024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Schwartz, Mel M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420043730">Distributed by publisher. 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John Wiley <a href="http://dx.doi.org/10.1002/9780470464076">http://dx.doi.org/10.1002/9780470464076</a>
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IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>ESD failure mechanisms and modelsent://SD_ILS/0/SD_ILS:2983752024-10-24T09:21:51Z2024-10-24T09:21:51ZAuthor Voldman, Steven H. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a>
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