Search Results for Reliability. - Narrowed by: 2012SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092012$0025092012$0026ic$003dtrue$0026ps$003d300?2024-09-17T07:29:23ZApplied reliabilityent://SD_ILS/0/SD_ILS:3649072024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Tobias, Paul A. Trindade, David C.<br/>Preferred Shelf Number TA169 T63 2012<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:2493822024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Raheja, Dev. Gullo, Louis J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probabilistic reliability modelsent://SD_ILS/0/SD_ILS:2995232024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Ushakov, I. A. (Igorʹ Alekseevich)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a>
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Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor packaging materials interaction and reliabilityent://SD_ILS/0/SD_ILS:2889702024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Chen, Andrea. Lo, Randy.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439862070">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor process reliability in practiceent://SD_ILS/0/SD_ILS:2934792024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and maintenance networks and systemsent://SD_ILS/0/SD_ILS:2861482024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Beichelt, Frank, 1942- Tittmann, Peter.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439826362">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Accelerated reliability and durability testing technologyent://SD_ILS/0/SD_ILS:2978272024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Klyatis, Lev M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9781118162569">http://dx.doi.org/10.1002/9781118162569</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Offshore Wind Turbines Reliability, availability and maintenanceent://SD_ILS/0/SD_ILS:2479562024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Tavner, Peter<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBRN013E">http://dx.doi.org/10.1049/PBRN013E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Telecommunications system reliability engineering, theory, and practiceent://SD_ILS/0/SD_ILS:2493972024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Ayers, Mark L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Recent Advances in System Reliability Signatures, Multi-state Systems and Statistical Inferenceent://SD_ILS/0/SD_ILS:1733902024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2207-4">http://dx.doi.org/10.1007/978-1-4471-2207-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in product development and reliability III selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, Chinaent://SD_ILS/0/SD_ILS:2796202024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China) Gao, L., editor of compilation. Li, W. D., editor of compilation. Zhao, Y. X., editor of compilation. Li, X. Y., editor of compilation.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electric utility resource planning economics, reliability, and decision-makingent://SD_ILS/0/SD_ILS:2907802024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Sim, Steven.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439884096">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Non-Destructive Assessment of Concrete Structures: Reliability and Limits of Single and Combined Techniques State-of-the-Art Report of the RILEM Technical Committee 207-INRent://SD_ILS/0/SD_ILS:2064442024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Breysse, Denys. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-2736-6">http://dx.doi.org/10.1007/978-94-007-2736-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Importance measures in reliability, risk, and optimization principles and applicationsent://SD_ILS/0/SD_ILS:2993862024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Kuo, Way, 1951- Zhu, Xiaoyan.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a>
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<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=894399">http://swb.eblib.com/patron/FullRecord.aspx?p=894399</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systemsent://SD_ILS/0/SD_ILS:3054622024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Bauer, Eric. Adams, Randee. Eustace, Dan. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119941378">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Multidisciplinary Research and Practice for Information Systems IFIP WG 8.4, 8.9/TC 5 International Cross-Domain Conference and Workshop on Availability, Reliability, and Security, CD-ARES 2012, Prague, Czech Republic, August 20-24, 2012. Proceedingsent://SD_ILS/0/SD_ILS:1972272024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Quirchmayr, Gerald. editor. Basl, Josef. editor. You, Ilsun. editor. Xu, Lida. editor. Weippl, Edgar. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-32498-7">http://dx.doi.org/10.1007/978-3-642-32498-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security SAFECOMP 2012 Workshops: Sassur, ASCoMS, DESEC4LCCI, ERCIM/EWICS, IWDE, Magdeburg, Germany, September 25-28, 2012. Proceedingsent://SD_ILS/0/SD_ILS:1974192024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Ortmeier, Frank. editor. Daniel, Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33675-1">http://dx.doi.org/10.1007/978-3-642-33675-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 31st International Conference, SAFECOMP 2012, Magdeburg, Germany, September 25-28, 2012. Proceedingsent://SD_ILS/0/SD_ILS:1974202024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Ortmeier, Frank. editor. Daniel, Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33678-2">http://dx.doi.org/10.1007/978-3-642-33678-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papersent://SD_ILS/0/SD_ILS:1966482024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Zhang, Xi. editor. Qiao, Daji. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-29222-4">http://dx.doi.org/10.1007/978-3-642-29222-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, Availability and Serviceability of Networks-on-Chipent://SD_ILS/0/SD_ILS:1737792024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Cota, Érika. author. Morais Amory, Alexandre. author. Soares Lubaszewski, Marcelo. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0791-1">http://dx.doi.org/10.1007/978-1-4614-0791-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliabilityent://SD_ILS/0/SD_ILS:1738162024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Levinson, David M. editor. Liu, Henry X. editor. Bell, Michael. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Power Electronic Packaging Design, Assembly Process, Reliability and Modelingent://SD_ILS/0/SD_ILS:1738412024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Liu, Yong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systemsent://SD_ILS/0/SD_ILS:2493512024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Bauer, Eric. Adams, Randee. Eustace, Dan.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Pattern recognition for reliability assessment of water distribution networksent://SD_ILS/0/SD_ILS:2853852024-09-17T07:29:23Z2024-09-17T07:29:23ZAuthor Trifunovi?, Nemanja.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781466558021">Distributed by publisher. 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