Search Results for Reliability. - Narrowed by: 2017 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092017$0025092017$0026te$003dILS$0026ps$003d300? 2026-03-01T06:18:08Z Biomechanics : optimization, uncertainties and reliability ent://SD_ILS/0/SD_ILS:593282 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Kharmanda, Ghias, author.&#160;El Hami, Abdelkhalak, author.<br/>Preferred Shelf Number&#160;QH513<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119379126">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119379126</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality and Reliability in Analytical Chemistry. ent://SD_ILS/0/SD_ILS:540933 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Baiulescu, George E., author.<br/>Preferred Shelf Number&#160;QD75.4 .Q34<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781420038576">https://www.taylorfrancis.com/books/e/9781420038576</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9780429127441">https://www.taylorfrancis.com/books/e/9780429127441</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429127441">https://www.taylorfrancis.com/books/9780429127441</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Artificial neural network for software reliability prediction ent://SD_ILS/0/SD_ILS:593854 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Bisi, Manjubala, author.&#160;Goyal, Neeraj Kumar, author.<br/>Preferred Shelf Number&#160;QA76.87<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119223931">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119223931</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Konstr&uuml;ksiyon elemanlar&#305;nda g&uuml;venirlik (reliability) ve &ouml;m&uuml;r hesaplar&#305; ; teorik a&ccedil;&#305;klamalar ve uygulamalar ent://SD_ILS/0/SD_ILS:389257 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Tahral&#305;, Necati&#160;Atik, Enver, author&#160;&Ccedil;ivi, Cem, author<br/>Preferred Shelf Number&#160;TJ230 T34 2017<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Pattern recognition for reliability assessment of water distribution networks ent://SD_ILS/0/SD_ILS:546715 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Trifunovi&#263;, Nemanja.&#160;CRC Press LLC.<br/>Preferred Shelf Number&#160;TD481<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429097645">https://www.taylorfrancis.com/books/9780429097645</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment ent://SD_ILS/0/SD_ILS:593728 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Modarres, M. (Mohammad), author.&#160;Amiri, Mehdi, author.&#160;Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number&#160;TA169.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> RAIL HUMAN FACTORS : supporting reliability, safety and cost reduction. ent://SD_ILS/0/SD_ILS:546279 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Preferred Shelf Number&#160;TF610<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429212598">https://www.taylorfrancis.com/books/9780429212598</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> From prognostics and health systems management to predictive maintenance 2 : knowledge, traceability and decision ent://SD_ILS/0/SD_ILS:593831 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Chebel-Morello, Brigitte, author.&#160;Nicod, Jean-Marc, author.&#160;Varnier, Christophe, author.<br/>Preferred Shelf Number&#160;TK5105.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119436805">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119436805</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> First hitting time regression models : lifetime data analysis based on underlying stochastic processes ent://SD_ILS/0/SD_ILS:593826 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Caroni, Chrysseis, author.<br/>Preferred Shelf Number&#160;QA278.2<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119437260">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119437260</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic risk analysis and management ent://SD_ILS/0/SD_ILS:593398 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Harlamov, Boris, author.<br/>Preferred Shelf Number&#160;HD61<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388883">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388883</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fluid-structure interactions and uncertainties : Ansys and fluent tools ent://SD_ILS/0/SD_ILS:593400 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;El Hami, Abdelkhalak, author.&#160;Radi, Boucha&iuml;b, author.<br/>Preferred Shelf Number&#160;TA357.5 .F58 E44 2017 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388937">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388937</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Chi-squared goodness-of-fit tests for censored data ent://SD_ILS/0/SD_ILS:593787 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Nikulin, M. S. (Mikhail Stepanovich), author.&#160;Chimitova, Ekaterina V., author.<br/>Preferred Shelf Number&#160;QA277.3<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119427605">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119427605</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> FUNDAMENTALS OF SOLID-STATE LIGHTING : leds, oleds, and their applications in illumination and ... displays. ent://SD_ILS/0/SD_ILS:542743 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;KHANNA, VINOD KUMAR.<br/>Preferred Shelf Number&#160;TK7871.89 .L53<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9780429099861">https://www.taylorfrancis.com/books/e/9780429099861</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429099861">https://www.taylorfrancis.com/books/9780429099861</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Human Factors Challenges in Emergency Management : Enhancing Individual and Team Performance in Fire and Emergency Services ent://SD_ILS/0/SD_ILS:547518 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Owen, Christine, author.<br/>Preferred Shelf Number&#160;HV551.5 .A8 O946 2017<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781315587349">Click here to view.</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> ELECTRICAL SAFETY : systems, sustainability, and stewardship. ent://SD_ILS/0/SD_ILS:539139 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Preferred Shelf Number&#160;TK152<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9780429170324">https://www.taylorfrancis.com/books/e/9780429170324</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429170324">https://www.taylorfrancis.com/books/9780429170324</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronic Packaging Materials and Their Properties ent://SD_ILS/0/SD_ILS:541454 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Pecht, Michael, author.&#160;Agarwal, Rakish, author.&#160;Dishongh, Terrance J., author.&#160;Javadpour, Sirus, author.&#160;Mahajan, Rahul, author.<br/>Preferred Shelf Number&#160;TK7870.15 P434 2017<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781315214153">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Integrating project delivery ent://SD_ILS/0/SD_ILS:593447 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Fischer, Martin, 1960 July 11- author.&#160;Khanzode, Atul, 1971- author.&#160;Reed, Dean P., author.&#160;Ashcraft, Howard W., Jr., author.<br/>Preferred Shelf Number&#160;TH438 .F556 2017 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179009">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179009</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Flexible pipes ent://SD_ILS/0/SD_ILS:593556 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Bai, Qiang, author.&#160;Bai, Yong, author.&#160;Ruan, Weidong, 1989- author.<br/>Preferred Shelf Number&#160;TA492 .P6<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119041290">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119041290</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Continuous manufacturing of pharmaceuticals ent://SD_ILS/0/SD_ILS:593575 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Kleinebudde, Peter, 1958- editor.&#160;Khinast, Johannes, 1964- editor.&#160;Rantanen, Jukka, editor.<br/>Preferred Shelf Number&#160;RS192 .C67 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119001348">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119001348</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Content delivery networks : fundamentals, design, and evolution ent://SD_ILS/0/SD_ILS:593580 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Robinson, Dom, author.<br/>Preferred Shelf Number&#160;TK5105.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119249924">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119249924</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Wittgenstein's Whewell's Court Lectures : Cambridge, 1938-1941, from the notes by Yorick Smythies ent://SD_ILS/0/SD_ILS:593612 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Wittgenstein, Ludwig, 1889-1951, author.&#160;Smythies, Yorick, 1917-1980, writer of notes.&#160;Munz, Volker A., editor.&#160;Ritter, Bernhard, 1973- editor.<br/>Preferred Shelf Number&#160;B3376 .W564 A5 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119166399">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119166399</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanoelectronics : materials, devices, applications ent://SD_ILS/0/SD_ILS:593621 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Puers, R., editor.<br/>Preferred Shelf Number&#160;TK7874.84<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dynamics of large structures and inverse problems ent://SD_ILS/0/SD_ILS:593823 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;El Hami, Abdelkhalak, author.&#160;Radi, Boucha&iuml;b, author.<br/>Preferred Shelf Number&#160;TA654<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119332275">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119332275</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Flexible glass : enabling thin, lightweight, and flexible electronics ent://SD_ILS/0/SD_ILS:593847 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Garner, Sean M., author.<br/>Preferred Shelf Number&#160;TA418 .T45 F54 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118946404">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118946404</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Conductive atomic force microscopy : applications in nanomaterials ent://SD_ILS/0/SD_ILS:593891 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Lanza, Mario.<br/>Preferred Shelf Number&#160;QH212 .A78<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699773">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699773</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electricity markets : theories and applications ent://SD_ILS/0/SD_ILS:593935 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Lin, Jeremy.&#160;Magnago, Fernando H.<br/>Preferred Shelf Number&#160;HD9697 .A2 L56 2017 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179382">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179382</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fault-tolerance techniques for spacecraft control computers ent://SD_ILS/0/SD_ILS:593150 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Yang, Mengfei, author.&#160;Hua, Gengxin, 1965- author.&#160;Feng, Yanjun, 1969- author.&#160;Gong, Jian, 1975- author.<br/>Preferred Shelf Number&#160;TL3250<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119107392">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119107392</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Materials for solid state lighting and displays ent://SD_ILS/0/SD_ILS:593216 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Kitai, Adrian, 1957- editor.<br/>Preferred Shelf Number&#160;TK7882 .I6 M374 2017 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119140610">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119140610</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Corrosion engineering and cathodic protection handbook : with extensive question and answer section ent://SD_ILS/0/SD_ILS:593224 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Cicek, Volkan, author.<br/>Preferred Shelf Number&#160;TA418.74<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119284338">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119284338</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust control optimization with metaheuristics ent://SD_ILS/0/SD_ILS:593300 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Feyel, Philippe.<br/>Preferred Shelf Number&#160;T57.84<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119340959">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119340959</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Photovoltaic solar energy : from fundamentals to applications ent://SD_ILS/0/SD_ILS:593310 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Reinders, Ang&egrave;le, editor.&#160;Verlinden, Pierre, editor.&#160;Sark, Wilfried van, editor.&#160;Freundlich, Alexandre, editor.<br/>Preferred Shelf Number&#160;TK1087 .P466 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118927496">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118927496</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Metrology and standardization of nanotechnology : protocols and industrial innovations ent://SD_ILS/0/SD_ILS:593319 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Mansfield, Elisabeth, (Research chemist), editor.&#160;Kaiser, Debra L., editor.&#160;Fujita, Daisuke (Materials scientist), editor.&#160;Voorde, M. H. van de (Marcel H.), editor.<br/>Preferred Shelf Number&#160;T174.7<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Real-time embedded systems ent://SD_ILS/0/SD_ILS:593770 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Wang, Jiacun, 1963- author.<br/>Preferred Shelf Number&#160;TK7895 .E42<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The sourcebook of listening research : methodology and measures ent://SD_ILS/0/SD_ILS:594037 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Worthington, Debra L., editor.&#160;Bodie, Graham, editor.<br/>Preferred Shelf Number&#160;BF323 .L5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119102991">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119102991</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of structural life assessment ent://SD_ILS/0/SD_ILS:593183 2026-03-01T06:18:08Z 2026-03-01T06:18:08Z Author&#160;Ibrahim, R. A., 1940- author.<br/>Preferred Shelf Number&#160;TA645<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119135470">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119135470</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>