Search Results for Reliability. - Narrowed by: 2020 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092020$0025092020$0026ps$003d300? 2026-01-22T07:41:18Z Photovoltaic module reliability ent://SD_ILS/0/SD_ILS:595739 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Wohlgemuth, J. (John), 1946- author.<br/>Preferred Shelf Number&#160;TK8322<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, maintainability, and safety for engineers ent://SD_ILS/0/SD_ILS:590317 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Dhillon, B. S., author.<br/>Preferred Shelf Number&#160;TS173<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429340574">https://www.taylorfrancis.com/books/9780429340574</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Interconnection network reliability evaluation : multistage layouts ent://SD_ILS/0/SD_ILS:596284 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Goyal, Neeraj Kumar, author.&#160;Rajkumar, S., author.<br/>Preferred Shelf Number&#160;TK5105.5 .G69 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620600">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620600</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lead-free soldering process development and reliability ent://SD_ILS/0/SD_ILS:595935 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Bath, Jasbir, editor.<br/>Preferred Shelf Number&#160;TK7870.15 .L434 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119482093">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119482093</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Repairable systems reliability analysis : a comprehensive framework ent://SD_ILS/0/SD_ILS:596328 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Rai, Rajiv Nandan, author.&#160;Chaturvedi, Sanjay K., author.&#160;Bolia, Nomesh, author.<br/>Preferred Shelf Number&#160;QA402 .R35 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability management and engineering : challenges and future trends ent://SD_ILS/0/SD_ILS:583504 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Garg, Harish, editor.&#160;Ram, Mangey, editor.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429268922">https://www.taylorfrancis.com/books/9780429268922</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power systems control and reliability : electric power design and enhancement ent://SD_ILS/0/SD_ILS:562263 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Qamber, Isa S., author.<br/>Preferred Shelf Number&#160;TK1001 .Q36 2020<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429287015">https://www.taylorfrancis.com/books/9780429287015</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Synesis : the unification of productivity, quality, safety and reliability ent://SD_ILS/0/SD_ILS:570100 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Hollnagel, Erik, 1941- author.<br/>Preferred Shelf Number&#160;HD58.9<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003038245">https://www.taylorfrancis.com/books/9781003038245</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Organizational reliability : human resources, information technology and management ent://SD_ILS/0/SD_ILS:558536 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Bie&#324;kowska, Agnieszka, author.&#160;Tworek, Katarzyna, author.&#160;Zab&#322;ocka-Kluczka, Anna, author.<br/>Preferred Shelf Number&#160;HF5549 .B4594 2020<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003047995">https://www.taylorfrancis.com/books/9781003047995</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical topics and stochastic models for dependent data with applications : applications in reliability, survival analysis and related fields ent://SD_ILS/0/SD_ILS:596386 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Barbu, Vlad Stefan.&#160;Vergne, Nicolas.<br/>Preferred Shelf Number&#160;QA276<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119779421">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119779421</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Automotive system safety : critical considerations for engineering and effective management ent://SD_ILS/0/SD_ILS:595672 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Miller, Joseph (Joseph D.), author.<br/>Preferred Shelf Number&#160;TL242 .M55 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119579663">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119579663</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Cambridge handbook of personality disorders ent://SD_ILS/0/SD_ILS:506263 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Lejuez, Carl W., editor.&#160;Gratz, Kim L., editor.<br/>Preferred Shelf Number&#160;RC554 .C33 2020<br/>Electronic Access&#160;<a href="https://www.cambridge.org/core/product/identifier/9781108333931/type/BOOK">https://www.cambridge.org/core/product/identifier/9781108333931/type/BOOK</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Pump user's handbook : life extension ent://SD_ILS/0/SD_ILS:539438 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Bloch, Heinz P., 1933- author.&#160;Budris, Allan R., author.<br/>Preferred Shelf Number&#160;TJ900<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003151807">https://www.taylorfrancis.com/books/9781003151807</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Condition monitoring with vibration signals : compressive sampling and learning algorithms for rotating machines ent://SD_ILS/0/SD_ILS:595346 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Ahmed, Hosameldin, 1976- author.&#160;Nandi, Asoke Kumar, author.<br/>Preferred Shelf Number&#160;TJ177 .A36 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119544678">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119544678</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Systems engineering in the fourth industrial revolution : big data, novel technologies, and modern systems engineering ent://SD_ILS/0/SD_ILS:595527 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Kenett, Ron, editor.&#160;Swarz, Robert S., editor.&#160;Zonnenshain, Avigdor, editor.<br/>Preferred Shelf Number&#160;TA168 .S8727 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Public safety networks from LTE to 5G ent://SD_ILS/0/SD_ILS:595528 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Yarali, Abdulrahman, author.<br/>Preferred Shelf Number&#160;TK6570 .P8 Y37 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119580157">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119580157</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Methods and Interdisciplinarity ent://SD_ILS/0/SD_ILS:595680 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Waldeck, Roger.<br/>Preferred Shelf Number&#160;Q180.55 .I48<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119681519">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119681519</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mitigation of gas pipeline integrity problems ent://SD_ILS/0/SD_ILS:552796 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Okyere, Mavis Sika, author.<br/>Preferred Shelf Number&#160;TN880.5<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003090021">https://www.taylorfrancis.com/books/9781003090021</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fog and fogonomics : challenges and practices of fog computing, communication, networking, strategy, and economics ent://SD_ILS/0/SD_ILS:595782 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Yang, Yang (Professor at ShanghaiTech), editor.<br/>Preferred Shelf Number&#160;QA76.585 .F64 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119501121">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119501121</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistics and probability with applications for engineers and scientists using Minitab, R and JMP ent://SD_ILS/0/SD_ILS:595650 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Gupta, Bhisham C., 1942- author.&#160;Guttman, Irwin, author.&#160;Jayalath, Kalanka, author.<br/>Preferred Shelf Number&#160;QA273 .G87 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119516651">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119516651</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power electronics-enabled autonomous power systems : next generation smart grids ent://SD_ILS/0/SD_ILS:595874 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Zhong, Qing-Chang, author.<br/>Preferred Shelf Number&#160;TK2699 .Z46 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118803516">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118803516</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electrical systems. 1 : From diagnosis to prognosis ent://SD_ILS/0/SD_ILS:595955 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Soualhi, Abdenour.&#160;Razik, Hubert.<br/>Preferred Shelf Number&#160;TA169.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720317">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720317</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Official Google Cloud Certified Professional Data Engineer study guide ent://SD_ILS/0/SD_ILS:596021 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Sullivan, Dan, 1962-<br/>Preferred Shelf Number&#160;QA76.3<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119618461">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119618461</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Role of edge analytics in sustainable smart city development : challenges and solutions ent://SD_ILS/0/SD_ILS:596185 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Kanagachidambaresan, G. R., 1988- editor.<br/>Preferred Shelf Number&#160;TD159.4 .R65 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119681328">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119681328</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Machine learning and cognitive computing for mobile communications and wireless networks ent://SD_ILS/0/SD_ILS:596240 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Singh, Krishna Kant (Telecommunications professor), editor.<br/>Preferred Shelf Number&#160;QA76.59 .M334 2020 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119640554">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119640554</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Toward 6G : a new era of convergence ent://SD_ILS/0/SD_ILS:596251 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Ebrahimzadeh, Amin, author.&#160;Maier, Martin, 1969- author.<br/>Preferred Shelf Number&#160;TK5103.2 .E27 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119658054">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119658054</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nitride semiconductor technology : power electronics and optoelectronic devices ent://SD_ILS/0/SD_ILS:596257 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Roccaforte, Fabrizio, editor.&#160;Leszczynsk, Mike, editor.<br/>Preferred Shelf Number&#160;TK7871.85<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527825264">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527825264</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fog computing : theory and practice ent://SD_ILS/0/SD_ILS:595723 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Zomaya, Albert Y., editor.&#160;Abbas, Assad, editor.&#160;Khan, Samee Ullah, editor.<br/>Preferred Shelf Number&#160;QA76.585 .F648 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119551713">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119551713</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Innovation trends in the space industry ent://SD_ILS/0/SD_ILS:595747 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Paulino, Victor dos Santos.<br/>Preferred Shelf Number&#160;TL797<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119694847">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119694847</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dependable computing : design and assessment ent://SD_ILS/0/SD_ILS:599167 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Iyer, Ravishankar K., author.&#160;Kalbarczyk, Zbigniew T., author.&#160;Nakka, Nithin M., author.<br/>Preferred Shelf Number&#160;QA76.9 .F38 I9 2020 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119743453">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119743453</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power system dynamics with computer-based modeling and analysis ent://SD_ILS/0/SD_ILS:595175 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Hase, Yoshihide, 1937- author.&#160;Khandelwal, Tanuj, 1977- author.&#160;Kameda, Kazuyuki, 1947- author.<br/>Preferred Shelf Number&#160;TK3001 .H37 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119487470">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119487470</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> 5G verticals : customizing applications, technologies and deployment techniques ent://SD_ILS/0/SD_ILS:595563 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Vannithamby, Rath, editor.&#160;Soong, Anthony C. K., editor.<br/>Preferred Shelf Number&#160;TK5103.25 .A175 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119514848">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119514848</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Official Google Professional Cloud Architect : study guide ent://SD_ILS/0/SD_ILS:595579 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Sullivan, Dan, author.<br/>Preferred Shelf Number&#160;QA76.585<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119602477">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119602477</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Antenna-in-package technology and applications ent://SD_ILS/0/SD_ILS:595805 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Liu, Duixian, editor.&#160;Zhang, Yueping, editor.<br/>Preferred Shelf Number&#160;TK7871.67 .M5 A58 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119556671">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119556671</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Thermal Safety of Chemical Processes : Risk Assessment and Process Design ent://SD_ILS/0/SD_ILS:595851 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Stoessel, Francis.<br/>Preferred Shelf Number&#160;TP150 .S24<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527696918">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527696918</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Thermodynamic processes. 1, Systems without physical state change ent://SD_ILS/0/SD_ILS:595855 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Belaadi, Salah, author.<br/>Preferred Shelf Number&#160;TJ265 .B45 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119706830">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119706830</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Profit maximization techniques for operating chemical plants ent://SD_ILS/0/SD_ILS:595940 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Lahiri, Sandip Kumar, 1970- author.<br/>Preferred Shelf Number&#160;TP155.2 .C67 L34 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119532231">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119532231</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Network traffic engineering : stochastic models and applications ent://SD_ILS/0/SD_ILS:595984 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Baiocchi, Andrea, 1962- author.<br/>Preferred Shelf Number&#160;TK5105.5 .B326 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119632498">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119632498</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electrical systems. 2 : from diagnosis to prognosis ent://SD_ILS/0/SD_ILS:595957 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Soualhi, Abdenour.&#160;Razik, Hubert.<br/>Preferred Shelf Number&#160;TA169.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720584">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720584</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smarter data science : succeeding with enterprise-grade data and AI projects ent://SD_ILS/0/SD_ILS:595959 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Fishman, Neal.&#160;Stryker, Cole.<br/>Preferred Shelf Number&#160;T58.6<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119697985">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119697985</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Potassium-ion batteries : materials and applications ent://SD_ILS/0/SD_ILS:596079 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Inamuddin, 1980- editor.&#160;Boddula, Rajender, editor.&#160;Asiri, Abdullah M., editor.<br/>Preferred Shelf Number&#160;TK2945 .P68 P68 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119663287">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119663287</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Queueing theory. 2, Advanced trends ent://SD_ILS/0/SD_ILS:596633 2026-01-22T07:41:18Z 2026-01-22T07:41:18Z Author&#160;Anisimov, V. I. (Vladimir Il&#697;ich)&#160;Limnios, N. (Nikolaos)<br/>Preferred Shelf Number&#160;QA274.8<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119755234">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119755234</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>