Search Results for Reliability. - Narrowed by: 2021 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092021$0025092021$0026ps$003d300? 2026-02-20T05:52:17Z Reliability engineering ent://SD_ILS/0/SD_ILS:596162 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Elsayed, Elsayed A., author.<br/>Preferred Shelf Number&#160;TA169 .E52 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665946">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665946</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability for engineers ent://SD_ILS/0/SD_ILS:565385 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Dhillon, B. S. (Balbir S.), 1947- author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003132103">https://www.taylorfrancis.com/books/9781003132103</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic models in reliability engineering ent://SD_ILS/0/SD_ILS:554549 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Cui, Lirong, 1960- editor.&#160;Frenkel, Ilia, 1950- editor.&#160;Lisnianski, Anatoly, editor.<br/>Preferred Shelf Number&#160;TA169 .S759 2020 EB<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429331527">https://www.taylorfrancis.com/books/9780429331527</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The reliability of generating data ent://SD_ILS/0/SD_ILS:552847 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Krippendorff, Klaus, author.<br/>Preferred Shelf Number&#160;QA76.9 .Q36<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003112020">https://www.taylorfrancis.com/books/9781003112020</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cloud reliability engineering : technologies and tools ent://SD_ILS/0/SD_ILS:571108 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Raj, Pethuru, editor.&#160;Achary, Rathnakar, editor.<br/>Preferred Shelf Number&#160;QA76.585 .C568 2021<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003030973">https://www.taylorfrancis.com/books/9781003030973</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and safety of cable-supported bridges ent://SD_ILS/0/SD_ILS:585766 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Lu, Naiwei, editor.&#160;Liu, Yang (Of Haerbin gong ye da xue), editor.&#160;Noori, Mohammad, editor.<br/>Preferred Shelf Number&#160;TG405<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003170594">https://www.taylorfrancis.com/books/9781003170594</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability culture : how leaders build organizations that create reliable products ent://SD_ILS/0/SD_ILS:596268 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Bahret, Adam P., 1973- author.<br/>Preferred Shelf Number&#160;TS156 .B335 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119612483">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119612483</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design of mechanical systems based on statistics : a guide to improving product reliability ent://SD_ILS/0/SD_ILS:585409 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Woo, Seong-woo, author.<br/>Preferred Shelf Number&#160;TJ245.5<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429022050">https://www.taylorfrancis.com/books/9780429022050</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modern diagnostic X-ray sources : technology, manufacturing, reliability ent://SD_ILS/0/SD_ILS:560465 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Behling, Rolf, author.<br/>Preferred Shelf Number&#160;RC78<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003095408">https://www.taylorfrancis.com/books/9781003095408</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A comprehensive critique of student evaluation of teaching : critical perspectives on validity, reliability, and impartiality ent://SD_ILS/0/SD_ILS:573999 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Clayson, Dennis E., author.<br/>Preferred Shelf Number&#160;LB2333 .C57 2021<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003091462">https://www.taylorfrancis.com/books/9781003091462</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability-based analysis and design of structures and infrastructure ent://SD_ILS/0/SD_ILS:585816 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Farsangi, Ehsan Noroozinejad, editor.<br/>Preferred Shelf Number&#160;TA658<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003194613">https://www.taylorfrancis.com/books/9781003194613</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Thermal and reliability criteria for nuclear fuel safety ent://SD_ILS/0/SD_ILS:554086 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Maksymov, Maksym.&#160;Alyokhina, Svitlana.&#160;Brunetkin, Oleksandr.<br/>Preferred Shelf Number&#160;TK9360<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003339816">https://www.taylorfrancis.com/books/9781003339816</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety, security, and reliability of robotic systems algorithms, applications, and technologies ent://SD_ILS/0/SD_ILS:556594 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Gupta, Brij, 1982- editor.&#160;Nedjah, Nadia, editor.<br/>Preferred Shelf Number&#160;TJ211.49<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003031352">https://www.taylorfrancis.com/books/9781003031352</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Root cause failure analysis : a guide to improve plant reliability ent://SD_ILS/0/SD_ILS:596464 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Sahoo, Trinath, author.<br/>Preferred Shelf Number&#160;TA169.55 .R66 S25 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119615606">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119615606</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Achieving Product Reliability : A Key to Business Success. ent://SD_ILS/0/SD_ILS:563478 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Doganaksoy, Necip, 1960- author.&#160;Meeker, William Q., author.&#160;Hahn, Gerald J., author.<br/>Preferred Shelf Number&#160;TS156<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003181361">https://www.taylorfrancis.com/books/9781003181361</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural reliability : approaches from perspectives of statistical moments ent://SD_ILS/0/SD_ILS:596358 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Zhao, Yan-Gang, author.&#160;Lu, Zhao-Hui, author.<br/>Preferred Shelf Number&#160;TA650 .Z53 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620754">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620754</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cyber-physical distributed systems : modeling, reliability analysis and applications ent://SD_ILS/0/SD_ILS:596868 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Mo, Huadong, author.&#160;Sansavini, Giovanni, author.&#160;Xie, Min, author.<br/>Preferred Shelf Number&#160;TK5105.8857 .M59 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119682707">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119682707</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cindynics, the science of danger : a wake-up call ent://SD_ILS/0/SD_ILS:597265 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Planchette, Guy.<br/>Preferred Shelf Number&#160;HD61<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119887751">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119887751</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Predictive analytics : modeling and optimization ent://SD_ILS/0/SD_ILS:562435 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Kumar, Vijay, editor.&#160;Ram, Mangey, editor.<br/>Preferred Shelf Number&#160;TA340<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003083177">https://www.taylorfrancis.com/books/9781003083177</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for excellence in electronics manufacturing ent://SD_ILS/0/SD_ILS:596229 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Tulkoff, Cheryl, author.&#160;Caswell, Greg, author.<br/>Preferred Shelf Number&#160;TK7870 .T845 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119109402">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119109402</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties ent://SD_ILS/0/SD_ILS:596531 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Dahoo, Pierre Richard.&#160;Pougnet, Philippe.&#160;El Hami, Abdelkhalak.<br/>Preferred Shelf Number&#160;QC88<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Diagnosis and fault-tolerant control. 1, Data-driven and model-based fault diagnosis techniques ent://SD_ILS/0/SD_ILS:597222 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Puig, Vicen&ccedil;, editor.&#160;Simani, Silvio, 1971- editor.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119882329">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119882329</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Diagnosis and fault-tolerant control. 2, From fault diagnosis to fault-tolerant control ent://SD_ILS/0/SD_ILS:597228 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Puig, Vicen&ccedil;, editor.&#160;Simani, Silvio, 1971- editor.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119882350">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119882350</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lubrication degradation : getting into the root causes ent://SD_ILS/0/SD_ILS:564528 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Mathura, Sanya, author.&#160;Latino, Robert J., author.<br/>Preferred Shelf Number&#160;TJ1077<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003252030">https://www.taylorfrancis.com/books/9781003252030</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied systems analysis : science and art of solving real-life problems ent://SD_ILS/0/SD_ILS:574968 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Tarasenko, F. P. (Feliks Petrovich), author.<br/>Preferred Shelf Number&#160;T57.6<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003054290">https://www.taylorfrancis.com/books/9781003054290</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method ent://SD_ILS/0/SD_ILS:596749 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Dahoo, Pierre Richard, author.&#160;Pougnet, Philippe, author.&#160;El Hami, Abdelkhalak, author.<br/>Preferred Shelf Number&#160;QC88<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Building an effective security program for distributed energy resources and systems : understanding security for smart grid and distributed energy resources &amp; systems ent://SD_ILS/0/SD_ILS:596367 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Hentea, Mariana, author.<br/>Preferred Shelf Number&#160;TK3105 .H46 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119070740">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119070740</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> 5G second phase explained : the 3GPP release 16 enhancements ent://SD_ILS/0/SD_ILS:596416 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Penttinen, Jyrki T. J., author.<br/>Preferred Shelf Number&#160;TK5103.25 .P46 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119645566">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119645566</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optical sensing in power transformers ent://SD_ILS/0/SD_ILS:596469 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Jiang, Jun, 1988- author.&#160;Ma, Guoming, 1984- author.<br/>Preferred Shelf Number&#160;TK2551<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119765325">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119765325</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modern industrial statistics : with applications in R, MINITAB and JMP ent://SD_ILS/0/SD_ILS:596471 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Kenett, Ron, author.&#160;Zacks, Shelemyahu, 1932- author.&#160;Amberti, Daniele, author.<br/>Preferred Shelf Number&#160;TS156 .K46 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dictionary of industrial terminology ent://SD_ILS/0/SD_ILS:596516 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Holloway, Michael D., 1963- author.&#160;Holloway, Emma, author.<br/>Preferred Shelf Number&#160;HD301.15<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119364078">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119364078</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Green energy : solar energy, photovoltaics, and smart cities ent://SD_ILS/0/SD_ILS:596517 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Tripathi, Suman Lata, editor.&#160;Sanjeevikumar, Padmanaban, 1978- editor.<br/>Preferred Shelf Number&#160;TK1087 .G735 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119760801">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119760801</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart grid and enabling technologies ent://SD_ILS/0/SD_ILS:596797 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Refaat, Shady S., author.&#160;Ellabban, Omar, author.&#160;Bayhan, Sertac, author.&#160;Abu-Rub, Haithem, author.&#160;Blaabjerg, Frede, author.<br/>Preferred Shelf Number&#160;TK3105<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422464">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422464</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of human factors and ergonomics ent://SD_ILS/0/SD_ILS:596970 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Salvendy, Gavriel, 1938-&#160;Karwowski, Waldemar, 1953-<br/>Preferred Shelf Number&#160;TA166 .H36 2021 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119636113">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119636113</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of water harvesting and conservation : basic concepts and fundamentals ent://SD_ILS/0/SD_ILS:596138 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Eslamian, Saeid, editor.&#160;Eslamian, Faezeh A., editor.<br/>Preferred Shelf Number&#160;TD418 .H36 2021 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119478911">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119478911</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Prognostics and Remaining Useful Life (RUL) Estimation : Predicting with Confidence. ent://SD_ILS/0/SD_ILS:566296 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Galar, Diego, author.&#160;Goebel, Kai, author.&#160;Sandborn, Peter A., 1959- author.&#160;Kumar, Uday, author.<br/>Preferred Shelf Number&#160;TJ174<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003097242">https://www.taylorfrancis.com/books/9781003097242</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cellular V2X for connected automated driving ent://SD_ILS/0/SD_ILS:596075 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Fallgren, Mikael, editor.&#160;Dillinger, Markus, editor.&#160;Mahmoodi, Toktam, editor.&#160;Svensson, Tommy (Highway engineer), editor.<br/>Preferred Shelf Number&#160;TE228.37 .C45 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119692676">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119692676</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Engineering and technology for healthcare ent://SD_ILS/0/SD_ILS:596096 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Imran, Muhammad Ali, editor.&#160;Ghannam, Rami, editor.&#160;Abbasi, Qammer H., editor.<br/>Preferred Shelf Number&#160;R855.3 .E54 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119644316">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119644316</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electrical connectors : design, manufacture, test, and selection ent://SD_ILS/0/SD_ILS:596172 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Pecht, Michael, editor.&#160;Kyeong, San, editor.<br/>Preferred Shelf Number&#160;TK3521<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintaining mission critical systems in a 24/7 environment ent://SD_ILS/0/SD_ILS:596287 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Curtis, Peter M., author.<br/>Preferred Shelf Number&#160;TA169 .C87 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506133">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506133</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Digitalization and analytics for smart plant performance : theory and applications ent://SD_ILS/0/SD_ILS:596319 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Zhu, Frank, 1957- author.<br/>Preferred Shelf Number&#160;TP155.6<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119634140">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119634140</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated life testing of one-shot devices : data collection and analysis ent://SD_ILS/0/SD_ILS:596340 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Balakrishnan, N., 1956- author.&#160;Ling, Man Ho, author.&#160;So, Hon Yiu, author.<br/>Preferred Shelf Number&#160;TA169.3 .B35 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for maintainability ent://SD_ILS/0/SD_ILS:596355 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Gullo, Louis J., editor.&#160;Dixon, Jack, 1948- editor.<br/>Preferred Shelf Number&#160;TS174 .D47 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119578536">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119578536</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Random motions in Markov and semi-Markov random environments. 1, Homogeneous random motions and their applications ent://SD_ILS/0/SD_ILS:596563 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Pogorui, Anatoliy, author.&#160;Svishchuk, A. V. (Anatoli&#301; Vital&#697;evich), author.&#160;Rodr&iacute;guez Dagnino, Ram&oacute;n Mart&iacute;n, author.<br/>Preferred Shelf Number&#160;QA274.7<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808213">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808213</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Machine vision inspection systems. Volume 2, Machine -learning-based approaches ent://SD_ILS/0/SD_ILS:596564 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Malarvel, Muthukumaran, editor.&#160;Nayak, Soumya Ranjan, 1984- editor.&#160;Pattnaik, Prasant Kumar, 1969- editor.&#160;Panda, Sury Narayan, editor.<br/>Preferred Shelf Number&#160;TA1634 .M3354 2020 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119786122">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119786122</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> From LED to solid state lighting : principles, materials, packaging, characterization, and applications ent://SD_ILS/0/SD_ILS:596576 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Lee, Shi-Wei Ricky, author.&#160;Lo, Jeffery C. C., author.&#160;Tao, Mian, author.&#160;Ye, Huaiyu, author.<br/>Preferred Shelf Number&#160;TK7871.89 .L53 L4365 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118881620">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118881620</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Active electrical distribution network : a smart approach ent://SD_ILS/0/SD_ILS:596506 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Khan, Baseem, 1987- editor.<br/>Preferred Shelf Number&#160;TK3105 .A35 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119599593">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119599593</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mechanical engineering under uncertainties : from classical approaches to some recent developments ent://SD_ILS/0/SD_ILS:596632 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Gogu, Christian, editor.<br/>Preferred Shelf Number&#160;TJ145 .M43 2021 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119817635">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119817635</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Spectrum sharing in cognitive radio networks : towards highly connected environments ent://SD_ILS/0/SD_ILS:596691 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Thakur, Prabhat, author.&#160;Singh, Ghanshyam, author.<br/>Preferred Shelf Number&#160;TK5103.4873 .T43 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665458">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665458</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modern trends in structural and solid mechanics 3 : non-deterministic mechanics ent://SD_ILS/0/SD_ILS:596833 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Challamel, No&euml;l, editor.&#160;Kaplunov, J. D., editor.&#160;Takewaki, Izuru, editor.<br/>Preferred Shelf Number&#160;TA645 .M63 2021 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119831839">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119831839</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> High temperature mechanical behavior of ceramic-matrix composites ent://SD_ILS/0/SD_ILS:596884 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Li, Longbiao, author.<br/>Preferred Shelf Number&#160;TA418.9 .C6<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527831791">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527831791</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> From traditional fault tolerance to blockchain ent://SD_ILS/0/SD_ILS:596885 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Zhao, Wenbing, Ph.D., author.<br/>Preferred Shelf Number&#160;QA76.9 .D5 Z473 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119682127">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119682127</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic power system expansion planning with renewable energy resources and energy storage systems ent://SD_ILS/0/SD_ILS:597024 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Choi, Jaeseok, author.&#160;Lee, Kwang Y., author.<br/>Preferred Shelf Number&#160;TK3001 .C46 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119819042">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119819042</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Enabling healthcare 4.0 for pandemics : a roadmap using AI, machine learning, IoT and cognitive technologies ent://SD_ILS/0/SD_ILS:597148 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Juneja, Abhinav, editor.<br/>Preferred Shelf Number&#160;R859.7 .A78<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119769088">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119769088</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Distributed energy management of electrical power systems ent://SD_ILS/0/SD_ILS:596122 2026-02-20T05:52:17Z 2026-02-20T05:52:17Z Author&#160;Xu, Yinliang, author.&#160;Zhang, Wei (Engineer), author.&#160;Liu, Wenxin, 1978- author.&#160;Yu, Wen, 1977- author.<br/>Preferred Shelf Number&#160;TK1006 .X83 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119534938">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119534938</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>