Search Results for Reliability. - Narrowed by: 2022 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092022$0025092022$0026ps$003d300? 2026-02-28T17:20:53Z Design of experiments for reliability achievement ent://SD_ILS/0/SD_ILS:597561 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Rigdon, Steven E., 1955- author.&#160;Pan, Rong (Professor of reliability engineering), author.&#160;Montgomery, Douglas C., author.&#160;Freeman, Laura June, author.<br/>Preferred Shelf Number&#160;TS173 .R54 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability modelling with information measures ent://SD_ILS/0/SD_ILS:562731 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Nair, N. Unnikrishnan, 1945- author.&#160;Sunoj, S. M., 1972- author.&#160;Rajesh, G., 1971- author.<br/>Preferred Shelf Number&#160;TA169 .N3526 2022 EB<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003309635">https://www.taylorfrancis.com/books/9781003309635</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> RELIABILITY ENGINEERING a life cycle approach. ent://SD_ILS/0/SD_ILS:575297 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Bradley, Edgar.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003326489">https://www.taylorfrancis.com/books/9781003326489</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Philosophies of structural safety and reliability ent://SD_ILS/0/SD_ILS:582933 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Ra&#301;zer, V. D. (Vladimir Davidovich), author.&#160;Elishakoff, Isaac, author.<br/>Preferred Shelf Number&#160;TA656<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003265993">https://www.taylorfrancis.com/books/9781003265993</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Physics-Of-Healthy in Mechatronics. ent://SD_ILS/0/SD_ILS:598146 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;El Hami, Abdelkhalak.&#160;Delaux, David.&#160;Grzeskowiak, Henri.<br/>Preferred Shelf Number&#160;TA169 .E515 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design, modeling and reliability in rotating machinery ent://SD_ILS/0/SD_ILS:597382 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Perez, Robert X., editor.<br/>Preferred Shelf Number&#160;TJ177<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119631699">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119631699</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical modeling of reliability structures and industrial processes ent://SD_ILS/0/SD_ILS:564431 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Triantafyllou, Ioannis S., editor.&#160;Ram, Mangey, editor.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003203124">https://www.taylorfrancis.com/books/9781003203124</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis, safety assessment and optimization : methods and applications in energy systems and other applications ent://SD_ILS/0/SD_ILS:597447 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Zio, Enrico, author.&#160;Li, Yan-Fu, author.<br/>Preferred Shelf Number&#160;TA169 .Z57 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of nuclear power plants : methods, data and applications ent://SD_ILS/0/SD_ILS:597759 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Lannoy, Andr&eacute;, editor.<br/>Preferred Shelf Number&#160;TK9153 .R45 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394165483">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394165483</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optimal reliability-based design of structures against several natural hazards ent://SD_ILS/0/SD_ILS:558659 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Ang, Alfredo Hua-Sing, 1930- author.&#160;De Leon, David (De Leon Escobido), author.&#160;Fan, Wenliang, author.<br/>Preferred Shelf Number&#160;TA658 .A56 2022<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003177289">https://www.taylorfrancis.com/books/9781003177289</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Validity and reliability in built environment research : a selection of case studies ent://SD_ILS/0/SD_ILS:569018 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Ahmed, Vian, editor.&#160;Opoku, Alex, editor.&#160;Olanipekun, Ayokunle, editor.&#160;Sutrisna, Monty, editor.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429243226">https://www.taylorfrancis.com/books/9780429243226</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Total manufacturing assurance : controlling product quality, reliability, and safety ent://SD_ILS/0/SD_ILS:575150 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Brauer, Douglas, author.&#160;Cesarone, John, author.<br/>Preferred Shelf Number&#160;TS156.6<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003208051">https://www.taylorfrancis.com/books/9781003208051</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> DISCRETE STOCHASTIC MODELS AND APPLICATIONS FOR RELIABILITY ENGINEERING AND STATISTICAL QUALITY CONTROL ent://SD_ILS/0/SD_ILS:589623 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Eryilmaz, Serkan.<br/>Preferred Shelf Number&#160;QA274.2<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003160632">https://www.taylorfrancis.com/books/9781003160632</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintenance, reliability and troubleshooting in rotating machinery. Volume 2 ent://SD_ILS/0/SD_ILS:597525 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Perez, Robert X., editor<br/>Preferred Shelf Number&#160;TJ174 .M35 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119631668">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119631668</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dynamic Management and Leadership in Education : High Reliability Techniques for Schools and Universities ent://SD_ILS/0/SD_ILS:567409 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Kelly, Anthony, 1957- author.<br/>Preferred Shelf Number&#160;LB2806 .K45 2022<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003217220">https://www.taylorfrancis.com/books/9781003217220</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability-based design in soil and rock engineering ent://SD_ILS/0/SD_ILS:551889 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Low, Bak Kong, author.<br/>Preferred Shelf Number&#160;TA705<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003112297">https://www.taylorfrancis.com/books/9781003112297</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fault diagnosis, prognosis, and reliability for electrical drives : fault diagnosis, failure prognosis and their effects on the reliability of electrical machines, drives and power electronics ent://SD_ILS/0/SD_ILS:597036 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Strangas, Elias, author.&#160;Clerc, Guy, author.&#160;Razik, Hubert, author.&#160;Soualhi, Abdenour, author.<br/>Preferred Shelf Number&#160;TK4058 .S77 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119722823">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119722823</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Humidity and electronics : corrosion reliability issues and preventive measures ent://SD_ILS/0/SD_ILS:600917 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Ambat, Rajan, author.&#160;Piotrowska, Kamila, author.<br/>Preferred Shelf Number&#160;ONL&#304;NE<br/>Electronic Access&#160;ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780323908535">https://www.sciencedirect.com/science/book/9780323908535</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Product maturity. 2, Principles and illustrations ent://SD_ILS/0/SD_ILS:597611 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Bayle, Franck, author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Product maturity. 1, Theoretical principals and industrial applications ent://SD_ILS/0/SD_ILS:597455 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Bayle, Franck, author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Operations research : methods, techniques, and advancements ent://SD_ILS/0/SD_ILS:564351 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Kumar, Amit, editor.&#160;Ram, Mangey, editor.<br/>Preferred Shelf Number&#160;T57.6<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003156291">https://www.taylorfrancis.com/books/9781003156291</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Application of signal processing tools and artificial neural network in diagnosis of power system faults ent://SD_ILS/0/SD_ILS:549625 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Roy, Nabamita Banerjee, author.&#160;Bhattacharya, Kesab, author.<br/>Preferred Shelf Number&#160;TK1010<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367431143">https://www.taylorfrancis.com/books/9780367431143</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> REVISITING TRUSTWORTHINESS IN SOCIAL INTERACTION ent://SD_ILS/0/SD_ILS:586841 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Fem&oslash; Nielsen, Mie, author.&#160;Nielsen, Ann Merrit Rikke, author.<br/>Preferred Shelf Number&#160;HM1111<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003280903">https://www.taylorfrancis.com/books/9781003280903</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust engineering designs of partial differential systems and their applications ent://SD_ILS/0/SD_ILS:567445 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Chen, Bor-Sen, author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003229230">https://www.taylorfrancis.com/books/9781003229230</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bearing dynamic coefficients in rotordynamics ent://SD_ILS/0/SD_ILS:596500 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Bre&#324;kacz, &#321;ukasz, author.<br/>Preferred Shelf Number&#160;TJ1058<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119759287">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119759287</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bow-tie industrial risk management across sectors : a barrier based approach ent://SD_ILS/0/SD_ILS:596577 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Fiorentini, Luca, 1976- author.<br/>Preferred Shelf Number&#160;HD61 .F56 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119523857">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119523857</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Iot-enabled smart healthcare systems, services and applications ent://SD_ILS/0/SD_ILS:596992 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Rani, Shalli, editor.<br/>Preferred Shelf Number&#160;R118 .I58 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119816829">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119816829</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied biostatistics for the health sciences ent://SD_ILS/0/SD_ILS:597001 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Rossi, Richard J., 1956- author.<br/>Preferred Shelf Number&#160;R853 .S7 R67 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119722717">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119722717</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Amorphous oxide semiconductors : IGZO and related materials for display and memory ent://SD_ILS/0/SD_ILS:597269 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Hosono, Hideo, editor.&#160;Kumomi, Hideya, editor.<br/>Preferred Shelf Number&#160;TK7871.96 .T45 A46 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119715641">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119715641</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power system protection ent://SD_ILS/0/SD_ILS:597296 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Anderson, Paul M., author.&#160;Henville, Charles, author.&#160;Rifaat, Rasheek, author.&#160;Johnson, Brian, author.&#160;Meliopoulos, Sakis, author.<br/>Preferred Shelf Number&#160;TK1010<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513100">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513100</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Evolving software processes : trends and future directions ent://SD_ILS/0/SD_ILS:597323 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Khan, Arif Ali, editor.&#160;Le, Dac-Nhuong, 1983- editor.<br/>Preferred Shelf Number&#160;QA76.76 .D47<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119821779">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119821779</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Financial statement analysis : a practitioner's guide ent://SD_ILS/0/SD_ILS:597515 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Fridson, Martin S., author.&#160;Alvarez, Fernando, 1964- author.<br/>Preferred Shelf Number&#160;HF5681 .B2 F772 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119457176">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119457176</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart grids and microgrids : technology evolution ent://SD_ILS/0/SD_ILS:597523 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Prajof, Prabhakaran, editor.&#160;Subramaniam, Umashankar, editor.&#160;Krishna, S. Mohan, editor.&#160;Febin Daya, J.L., 1980- editor.&#160;Brijesh, P. V., editor.<br/>Preferred Shelf Number&#160;TK3105 .S83 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119760597">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119760597</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cloud computing solutions : architecture, data storage, implementation and security ent://SD_ILS/0/SD_ILS:597544 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Pal, Souvik, author.&#160;Le, Dac-Nhuong, author.&#160;Pattnai, Prasant Kumar, author.<br/>Preferred Shelf Number&#160;QA76.585 .P35 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119682318">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119682318</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart nanotextiles : wearable and technical applications ent://SD_ILS/0/SD_ILS:597666 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Yilmaz, Nazire Deniz.<br/>Preferred Shelf Number&#160;TS1767<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119654872">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119654872</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Collinear holography ent://SD_ILS/0/SD_ILS:598006 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Tan, Xiaodi, 1962- author.&#160;Horimai, Hideyoshi, author.&#160;Shimura, Tsutomu, 1959- author.&#160;Lin, Xiao, author.<br/>Preferred Shelf Number&#160;TA1632<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527810482">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527810482</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Thermal and structural electronic packaging analysis for space and extreme environments ent://SD_ILS/0/SD_ILS:579090 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Cepeda-Rizo, Juan, author.&#160;Gayle, Jeremiah, author.&#160;Ravich, Joshua, author.<br/>Preferred Shelf Number&#160;TK7870.15<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003247005">https://www.taylorfrancis.com/books/9781003247005</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart solar PV inverters with advanced grid support functionalities ent://SD_ILS/0/SD_ILS:596912 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Varma, Rajiv K., author.<br/>Preferred Shelf Number&#160;TK1087 .V37 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214236">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214236</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> VCSEL industry : communication and sensing ent://SD_ILS/0/SD_ILS:597229 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Padullaparthi, Babu Dayal, author.&#160;Tatum, Jim A., author.&#160;Iga, Ken&#700;ichi, 1940- author.<br/>Preferred Shelf Number&#160;TA1700<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119782223">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119782223</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical ESD protection design ent://SD_ILS/0/SD_ILS:597233 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Wang, Albert Z. H., 1962- author.<br/>Preferred Shelf Number&#160;TK7874<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> DC microgrids : advances, challenges, and applications ent://SD_ILS/0/SD_ILS:597558 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Gupta, Nikita, editor.&#160;Bhaskar, Mahajan Sagar, editor.&#160;Padmanaban, Sanjeevikumar, editor.&#160;Almakhles, Dhafer, editor.<br/>Preferred Shelf Number&#160;TK3106 .D3 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119777618">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119777618</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computational structural concrete ent://SD_ILS/0/SD_ILS:597893 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;H&auml;ussler-Combe, Ulrich, author.<br/>Preferred Shelf Number&#160;TA439<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783433610268">https://onlinelibrary.wiley.com/doi/book/10.1002/9783433610268</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fluid-Structure Interaction : Numerical Simulation Techniques for Naval Applications ent://SD_ILS/0/SD_ILS:598147 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Sigrist, Jean-Fran&ccedil;ois, author.&#160;Leblond, C&eacute;dric, author.<br/>Preferred Shelf Number&#160;TA357.5 .F58<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394188222">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394188222</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software-defined networking : extending SDN control to large-scale networks ent://SD_ILS/0/SD_ILS:598167 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Bannour, Fetia, author.&#160;Souihi, Sami, author.&#160;Mellouk, Abdelhamid, author.<br/>Preferred Shelf Number&#160;TK5105.5833 .B36 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186181">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186181</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Pump wisdom : essential centrifugal pump knowledge for operators and specialists ent://SD_ILS/0/SD_ILS:597066 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Perez, Robert X., author.&#160;Bloch, Heinz P., 1933- author.<br/>Preferred Shelf Number&#160;TJ900 .P47 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119748243">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119748243</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fault location on transmission and distribution lines : principles and applications ent://SD_ILS/0/SD_ILS:597205 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Das, Swagata, author.&#160;Santoso, Surya, author.&#160;Ananthan, Sundaravaradan Navalpakkam, author.<br/>Preferred Shelf Number&#160;TK3226<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119121480">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119121480</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Artificial intelligence and quantum computing for advanced wireless networks ent://SD_ILS/0/SD_ILS:597216 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Glisic, Savo G., author.&#160;Lorenzo, Beatriz, author.<br/>Preferred Shelf Number&#160;Q335 .G55 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119790327">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119790327</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronic packaging science and technology ent://SD_ILS/0/SD_ILS:597053 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Tu, K. N. (King-Ning), 1937- author.&#160;Chen, Chih, 1970- author.&#160;Chen, Hung-Ming, author.<br/>Preferred Shelf Number&#160;TK7870.15 .T85 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119418344">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119418344</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Resilient power electronic systems ent://SD_ILS/0/SD_ILS:597338 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Kaboli, Shahriyar, 1975- author.&#160;Peyghami, Saeed, author.&#160;Blaabjerg, Frede, author.<br/>Preferred Shelf Number&#160;TK7881.15 .K335 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772217">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772217</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power and energy distribution systems : models, methods, and applications ent://SD_ILS/0/SD_ILS:598422 2026-02-28T17:20:53Z 2026-02-28T17:20:53Z Author&#160;Pahwa, Anil, author.&#160;Venkata, Subrahmanyam S., author.<br/>Preferred Shelf Number&#160;TK3001<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329694">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329694</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>