Search Results for Reliability. - Narrowed by: 2023 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092023$0025092023$0026ps$003d300? 2026-02-20T03:53:36Z Applications in Reliability and Statistical Computing ent://SD_ILS/0/SD_ILS:527152 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Pham, Hoang. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-21232-1">https://doi.org/10.1007/978-3-031-21232-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Predictive Analytics in System Reliability ent://SD_ILS/0/SD_ILS:526781 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Kumar, Vijay. editor.&#160;Pham, Hoang. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-05347-4">https://doi.org/10.1007/978-3-031-05347-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability-based modeling of system performance ent://SD_ILS/0/SD_ILS:598598 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;El Hami, Abdelkhalak, author.&#160;Eid, Mohamed, author.<br/>Preferred Shelf Number&#160;TA169 .H36 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394236695">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394236695</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis using MINITAB and Python ent://SD_ILS/0/SD_ILS:597824 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Hwang, Jaejin, author.<br/>Preferred Shelf Number&#160;TA169 .H93 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computational intelligence in sustainable reliability engineering ent://SD_ILS/0/SD_ILS:598272 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Malik, S. C., editor.<br/>Preferred Shelf Number&#160;TA169 .C65 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Interconnect Reliability in Advanced Memory Device Packaging ent://SD_ILS/0/SD_ILS:526838 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Gan, Chong Leong,. author.&#160;Huang, Chen-Yu,. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-26708-6">https://doi.org/10.1007/978-3-031-26708-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software reliability techniques for real-world applications ent://SD_ILS/0/SD_ILS:598123 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Youree, Roger K., author.<br/>Preferred Shelf Number&#160;QA76.76 .R44<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119931850">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119931850</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System Reliability and Security Techniques and Methodologies. ent://SD_ILS/0/SD_ILS:576623 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Iqbal, Javaid.&#160;Masoodi, Faheem Syeed.&#160;Ahmad Malik, Ishfaq.&#160;Khurshid, Shozab.&#160;Saraf, Iqra.<br/>Preferred Shelf Number&#160;QA76.9 .A25<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032624983">https://www.taylorfrancis.com/books/9781032624983</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lifetime Reliability-aware Design of Integrated Circuits ent://SD_ILS/0/SD_ILS:527089 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Raji, Mohsen. author.&#160;Ghavami, Behnam. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-15345-7">https://doi.org/10.1007/978-3-031-15345-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability, usability, and quality for engineers ent://SD_ILS/0/SD_ILS:579176 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Dhillon, B. S. (Balbir S.), 1947- author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003298571">https://www.taylorfrancis.com/books/9781003298571</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in Reliability and Maintainability Methods and Engineering Applications Essays in Honor of Professor Hong-Zhong Huang on his 60th Birthday ent://SD_ILS/0/SD_ILS:527804 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Liu, Yu. editor.&#160;Wang, Dong. editor.&#160;Mi, Jinhua. editor.&#160;Li, He. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a 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href="https://doi.org/10.1007/978-3-031-27316-2">https://doi.org/10.1007/978-3-031-27316-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability for industry. 1, Predictive reliability for the automobile, aeronautics, defense, medical, marine and space industries ent://SD_ILS/0/SD_ILS:598306 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;El Hami, Abdelkhalak, editor.&#160;Delaux, David, editor.&#160;Grzeskowiak, Henri, editor.<br/>Preferred Shelf Number&#160;TA169 .A67 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Industrial reliability and safety engineering : applications and practices ent://SD_ILS/0/SD_ILS:578979 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Panchal, Dilbagh, editor.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003140092">https://www.taylorfrancis.com/books/9781003140092</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and maintenance modeling with optimization : advances and applications ent://SD_ILS/0/SD_ILS:562446 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Kimura, Mitsutaka, editor.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003095231">https://www.taylorfrancis.com/books/9781003095231</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability for industry. 2, Experimental reliability for the automobile, aeronautics, defense, medical, marine and space industries ent://SD_ILS/0/SD_ILS:598326 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;El Hami, Abdelkhalak, editor.&#160;Delaux, David, editor.&#160;Grzeskowiak, Henri, editor.<br/>Preferred Shelf Number&#160;TA169 .A67 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability for industry. 3, Operational relability for the automobile, aeronautics, defense, medical, marine and space industries ent://SD_ILS/0/SD_ILS:598345 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;El Hami, Abdelkhalak, editor.&#160;Delaux, David, editor.&#160;Grzeskowiak, Henri, editor.<br/>Preferred Shelf Number&#160;TA169 .A67 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209781">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209781</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. 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Modelling, Analysis, Verification, and Certification 5th International Conference, RSSRail 2023, Berlin, Germany, October 10-12, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521180 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Milius, Birgit. editor.&#160;Collart-Dutilleul, Simon. editor.&#160;Lecomte, Thierry. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-43366-5">https://doi.org/10.1007/978-3-031-43366-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Intelligent Reliability and Maintainability of Energy Infrastructure Assets ent://SD_ILS/0/SD_ILS:526952 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Li, He. author.&#160;Peng, Weiwen. author.&#160;Adumene, Sidum. author.&#160;Yazdi, Mohammad. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-29962-9">https://doi.org/10.1007/978-3-031-29962-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Statistics in Transportation and Communication Selected Papers from the 22nd International Multidisciplinary Conference on Reliability and Statistics in Transportation and Communication: Artificial Intelligence in Transportation, RelStat-2022, October 20-21, 2022, Riga, Latvia ent://SD_ILS/0/SD_ILS:527300 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Kabashkin, Igor. editor.&#160;Yatskiv, Irina. editor.&#160;Prentkovskis, Olegas. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-26655-3">https://doi.org/10.1007/978-3-031-26655-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Engineering and Computational Intelligence for Complex Systems Design, Analysis and Evaluation ent://SD_ILS/0/SD_ILS:528444 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;van Gulijk, Coen. editor. (orcid)0000-0003-4541-2693&#160;Zaitseva, Elena. editor.&#160;Kvassay, Miroslav. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-40997-4">https://doi.org/10.1007/978-3-031-40997-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> ICPER 2020 Proceedings of the 7th International Conference on Production, Energy and Reliability ent://SD_ILS/0/SD_ILS:527387 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Ahmad, Faiz. editor.&#160;Al-Kayiem, Hussain H. editor.&#160;King Soon, William Pao. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-19-1939-8">https://doi.org/10.1007/978-981-19-1939-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022) ent://SD_ILS/0/SD_ILS:528353 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Senthil Kumar, C. editor.&#160;Sujatha, R. editor.&#160;Muthukumar, R. editor.&#160;Rao, K. 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SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521137 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Guiochet, J&eacute;r&eacute;mie. editor.&#160;Tonetta, Stefano. editor.&#160;Schoitsch, Erwin. editor.&#160;Roy, Matthieu. editor.&#160;Bitsch, Friedemann. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-40953-0">https://doi.org/10.1007/978-3-031-40953-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521134 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Guiochet, J&eacute;r&eacute;mie. editor.&#160;Tonetta, Stefano. editor.&#160;Bitsch, Friedemann. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Performance, reliability, and availability evaluation of computational systems. Volume 1, Performance and background ent://SD_ILS/0/SD_ILS:585932 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Maciel, Paulo Romero Martins, author.<br/>Preferred Shelf Number&#160;QA76<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003306016">https://www.taylorfrancis.com/books/9781003306016</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Performance, reliability, and availability evaluation of computational systems. Volume 2, Reliability, availability modeling, measuring, and data analysis ent://SD_ILS/0/SD_ILS:585933 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Maciel, Paulo Romero Martins, author.<br/>Preferred Shelf Number&#160;QA76<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003306030">https://www.taylorfrancis.com/books/9781003306030</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> ORGANIC AND INORGANIC LIGHT EMITTING DIODES reliability issues and. ent://SD_ILS/0/SD_ILS:553105 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Subash, T. D., editor.&#160;Ajayan, J., editor.&#160;Grabinski, W&#322;adys&#322;aw, editor.<br/>Preferred Shelf Number&#160;TK7871.89 .L53<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003340577">https://www.taylorfrancis.com/books/9781003340577</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> What every engineer should know about reliability and risk analysis ent://SD_ILS/0/SD_ILS:565637 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Modarres, M. (Mohammad), author.&#160;Groth, Katrina, author.<br/>Preferred Shelf Number&#160;TA169 .M63 2023<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003307495">https://www.taylorfrancis.com/books/9781003307495</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> LEADERSHIP STYLES AND JOB PERFORMANCE the impact of fake leadership on organizational reliability. ent://SD_ILS/0/SD_ILS:565979 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Bie&#324;kowska, Agnieszka, author.&#160;Tworek, Katarzyna, author.<br/>Preferred Shelf Number&#160;HD57.7<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032664194">https://www.taylorfrancis.com/books/9781032664194</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Information technology in contemporary organizations : redefining IT management for organizational reliability ent://SD_ILS/0/SD_ILS:590844 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Tworek, Katarzyna, author.<br/>Preferred Shelf Number&#160;HD30.213<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003365044">https://www.taylorfrancis.com/books/9781003365044</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multi-criteria decision models in software reliability : methods and applications ent://SD_ILS/0/SD_ILS:571883 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Mishra, Ashish (Ashish Kumar), editor.&#160;Dieu Linh, Nguyen Thi, editor.&#160;Bhardwaj, Manish (Professor of computer science and engineering), editor.&#160;Pinto, Carla M. 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ent://SD_ILS/0/SD_ILS:597698 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Agrawal, Pratibha (Pratibha S.), author.&#160;Belkhode, Pramod, author.&#160;Rokhum, Samuel Lalthazuala, author.<br/>Preferred Shelf Number&#160;TP339 .A42 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119888864">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119888864</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electromechanical coupling theory, methodology and applications for high-performance microwave equipment ent://SD_ILS/0/SD_ILS:597980 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Duan, Baoyan, author.&#160;Zhang, Shuxin (Professor of electromechanical engineering), author.<br/>Preferred Shelf Number&#160;TK7876 .D83 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power grid resilience against natural disasters : preparedness, response, and recovery ent://SD_ILS/0/SD_ILS:598098 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Lei, Shunbo, 1991- author.<br/>Preferred Shelf Number&#160;TK1010<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119801504">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119801504</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart energy for transportation and health in a smart city ent://SD_ILS/0/SD_ILS:598013 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Lai, Chun Sing, author.&#160;Lai, Loi Lei, author.&#160;Lai, Qi Hong, author.<br/>Preferred Shelf Number&#160;TK1005 .L35 2023<br/>Electronic 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href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119855071">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119855071</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modern forensic tools and devices : trends in criminal investigation ent://SD_ILS/0/SD_ILS:598390 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Rawtani, Deepak, editor.&#160;Hussain, Chaudhery Mustansar, editor.<br/>Preferred Shelf Number&#160;HV8073 .M63 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119763406">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119763406</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart grids for smart cities. 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Gnana, editor.&#160;Karthikeyan, K., editor.&#160;Sanjeevikumar, Padmanaban, 1978- editor.<br/>Preferred Shelf Number&#160;TK3105 .S63 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872108">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872108</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamental Generation Systems : Computer Science and Artificial Consciousness, the Informational Field of Generation of the Universe, the Sixth Sense of Living Beings ent://SD_ILS/0/SD_ILS:598454 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Cardon, Alain, 1946- author.&#160;El Hami, Abdelkhalak, author.<br/>Preferred Shelf Number&#160;Q325 .C37 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394225811">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394225811</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Resource management in advanced wireless networks ent://SD_ILS/0/SD_ILS:598682 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Suresh, A. editor&#160;Ramkumar, J. editor&#160;Baskar, M. editor&#160;Bashir, Ali Kashif, editor<br/>Preferred Shelf Number&#160;TK5103.4873 .R47 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119827603">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119827603</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Thermoelectric micro/nano generators. 2 : challenges and prospects ent://SD_ILS/0/SD_ILS:598802 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Akinaga, Hiroyuki, editor.<br/>Preferred Shelf Number&#160;TK5105.8857 .T447 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394256389">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394256389</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Behaviour and design of steel and composite connections in fire ent://SD_ILS/0/SD_ILS:567289 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Jafarian, Mostafa, author.<br/>Preferred Shelf Number&#160;TH1065<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003134466">https://www.taylorfrancis.com/books/9781003134466</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> IoT product design and development : best practices for industrial, consumer, and business applications ent://SD_ILS/0/SD_ILS:597584 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Fattahi, Ahmad, author.<br/>Preferred Shelf Number&#160;TK5105.8857 .F384 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119787686">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119787686</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A practical approach to quantitative validation of patient-reported outcomes : a simulation-based guide using SAS ent://SD_ILS/0/SD_ILS:597659 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Bushmakin, Andrew G., author.&#160;Cappelleri, Joseph C., author.<br/>Preferred Shelf Number&#160;R853 .Q34 B87 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119376354">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119376354</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cybersecurity in intelligent networking systems ent://SD_ILS/0/SD_ILS:597809 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Xu, Shengjie (Professor), author.&#160;Qian, Yi, 1962- author.&#160;Hu, Rose Qingyang, author.<br/>Preferred Shelf Number&#160;TK5105.59 .X8 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119784135">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119784135</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanotechnology in electronics : materials, properties, devices ent://SD_ILS/0/SD_ILS:597956 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;P. M., Visakh, editor.&#160;Semkin, Artem, editor.&#160;B., Raneesh, 1986- editor.&#160;Lazovi&#263;, Sa&scaron;a, editor.<br/>Preferred Shelf Number&#160;TK7874.84<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527824229">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527824229</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> LED packaging technologies : design, manufacture, and applications ent://SD_ILS/0/SD_ILS:598468 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Annaniah, Luruthudass, author&#160;Saheed, Mohamed Salleh M., author.&#160;Jose, Rajan, author.<br/>Preferred Shelf Number&#160;TK7871.89 .L53 A56 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527831678">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527831678</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> 75th anniversary of the transistor ent://SD_ILS/0/SD_ILS:598494 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Nathan, Arokia, 1957- editor.&#160;Saha, Samar K., editor.&#160;Todi, Ravi M., editor.<br/>Preferred Shelf Number&#160;TK7871.9<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Defects in organic semiconductors and devices ent://SD_ILS/0/SD_ILS:598531 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Nguyen, Thien-Phap, author.<br/>Preferred Shelf Number&#160;TK7871.99 .O74 N48 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Smart grids and green energy systems ent://SD_ILS/0/SD_ILS:597940 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Chitra, A., editor&#160;Indragandhi, . 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Razia, editor.<br/>Preferred Shelf Number&#160;TK3105 .S64 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872061">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872061</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Spacecraft lithium-ion battery power systems ent://SD_ILS/0/SD_ILS:597995 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Barrera, Thomas P., editor.<br/>Preferred Shelf Number&#160;TL1102 .B3 S63 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772170">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772170</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> 5G backhaul and fronthaul ent://SD_ILS/0/SD_ILS:598130 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Mets&auml;l&auml;, Esa, editor.&#160;Salmelin, Juha, editor.<br/>Preferred Shelf Number&#160;TK5103.25 .A115 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119275671">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119275671</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Securing delay-tolerant networks with BPSec ent://SD_ILS/0/SD_ILS:598174 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Birrane, Edward J., author.&#160;Heiner, Sarah, author.&#160;McKeever, Ken, author.<br/>Preferred Shelf Number&#160;TK5105.59 .B48 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119823513">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119823513</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Agile Software Development : trends, challenges and applications ent://SD_ILS/0/SD_ILS:598189 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Hooda, Susheela, editor.&#160;Sood, Vandana Mohindru, editor.&#160;Singh, Yashwant, editor.&#160;Dalal, Sandeep, editor.&#160;Sood, Manu, editor.<br/>Preferred Shelf Number&#160;QA76.76 .D47 A55 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119896838">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119896838</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Control over communication networks : modeling, analysis, and design of networked control systems and multi-agent systems over imperfect communication channels ent://SD_ILS/0/SD_ILS:598198 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Zheng, Jianying (Electrical engineer), author.&#160;Xu, Liang (Electrical engineer), author.&#160;Hu, Qinglei, author.&#160;Xie, Lihua, author.<br/>Preferred Shelf Number&#160;TJ222 .Z46 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119885825">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119885825</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ultra-reliable and low-latency communications (URLLC) theory and practice : advances in 5G and beyond ent://SD_ILS/0/SD_ILS:598242 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Duong, Trung Q., editor.&#160;Khosravirad, Saeed R., editor.&#160;She, Changyang, editor.&#160;Popovski, Petar, editor.&#160;Bennis, Mehdi, editor.<br/>Preferred Shelf Number&#160;TK5103.25 .U48 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818366">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818366</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Industrial valves : calculations for design, manufacturing, operation, and safety decisions ent://SD_ILS/0/SD_ILS:598243 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Sotoodeh, Karan, author.<br/>Preferred Shelf Number&#160;TS277 .S68 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394185047">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394185047</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Functional safety of machinery : how to apply ISO 13849-1 and IEC 62061 ent://SD_ILS/0/SD_ILS:598269 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Tacchini, Marco, author.<br/>Preferred Shelf Number&#160;TJ211.5 .T33 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119789123">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119789123</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optimization techniques in engineering : advances and applications ent://SD_ILS/0/SD_ILS:598312 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Khosla, Anita.<br/>Preferred Shelf Number&#160;TA342 .O68 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119906391">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119906391</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Security and privacy vision in 6G : a comprehensive guide ent://SD_ILS/0/SD_ILS:598347 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Porambage, Pawani, author.&#160;Liyanage, Madhusanka, author.<br/>Preferred Shelf Number&#160;TK5103.252 .P67 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119875437">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119875437</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Factories of the future : technological advancements in the manufacturing industry ent://SD_ILS/0/SD_ILS:598348 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Singh, Chandan Deep, editor.&#160;Kaur, Harleen, author.<br/>Preferred Shelf Number&#160;HD9720.5 .F33 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865216">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865216</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Metal oxide nanocomposite thin films for optoelectronic device applications ent://SD_ILS/0/SD_ILS:598580 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Zargar, Rayees Ahmad, editor.<br/>Preferred Shelf Number&#160;TA418.9 .T45 M48 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865636">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865636</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Wireless communication in cyber security ent://SD_ILS/0/SD_ILS:598705 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Sountharrajan, S. editor&#160;Maheswar, R. editor&#160;Rathee, Geetanjali, editor&#160;Akila, M. editor<br/>Preferred Shelf Number&#160;QA76.9 .A25 W57 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119910619">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119910619</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advanced ultra low-power semiconductor devices : design and applications ent://SD_ILS/0/SD_ILS:598708 2026-02-20T03:53:36Z 2026-02-20T03:53:36Z Author&#160;Tayal, Shubham, editor&#160;Upadhyay, Abhishek Kumar, editor&#160;Rahi, Shiromani Balmukund, editor.&#160;Song, Young Suh, editor<br/>Preferred Shelf Number&#160;TK7871.85 .A38 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394167647">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394167647</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>