Search Results for Reliability. - Narrowed by: 2024 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092024$0025092024$0026ps$003d300$0026isd$003dtrue?dt=list 2026-06-02T23:53:57Z Reliability Engineering ent://SD_ILS/0/SD_ILS:601914 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Sun, Youchao. author.&#160;Li, Longbiao. author. (orcid)0000-0002-7689-2098&#160;Tiniakov, Dmytro. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-99-5978-5">https://doi.org/10.1007/978-981-99-5978-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Importance-Informed Reliability Engineering ent://SD_ILS/0/SD_ILS:602938 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Dui, Hongyan. author.&#160;Wu, Shaomin. author. (orcid)0000-0001-9786-3213&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-52455-4">https://doi.org/10.1007/978-3-031-52455-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability prediction for microelectronics ent://SD_ILS/0/SD_ILS:598968 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Bernstein, Joseph B., author.&#160;Bensoussan, Alain A., author.&#160;Bender, Emmanuel (Carl), author.<br/>Preferred Shelf Number&#160;TK7874<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> KRIGING IN SLOPE RELIABILITY ANALYSIS ent://SD_ILS/0/SD_ILS:589037 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Liu, Lei-Lei.&#160;Li, Jing-Ze.&#160;Huang, Lei.<br/>Preferred Shelf Number&#160;TN272.7<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003475156">https://www.taylorfrancis.com/books/9781003475156</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis of modern power systems ent://SD_ILS/0/SD_ILS:599018 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Saket, R. K., editor.&#160;Sanjeevikumar, Padmanaban, 1978-<br/>Preferred Shelf Number&#160;TA169 .S234 2024<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Model-Based Reliability Systems Engineering ent://SD_ILS/0/SD_ILS:602459 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Ren, Yi. author.&#160;Qian, Cheng. author.&#160;Yang, Dezhen. author.&#160;Feng, Qiang. author. (orcid)0000-0003-2454-7839&#160;Sun, Bo. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-99-0275-0">https://doi.org/10.1007/978-981-99-0275-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Engineering of BeiDou Navigation Satellite ent://SD_ILS/0/SD_ILS:603412 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Yang, Hui. author.&#160;Zhao, Haitao. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-99-9130-3">https://doi.org/10.1007/978-981-99-9130-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Engineering Data analytics, modeling, risk prediction ent://SD_ILS/0/SD_ILS:602307 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Bracke, Stefan. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-662-67446-8">https://doi.org/10.1007/978-3-662-67446-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in Computational Mathematics for Industrial System Reliability and Maintainability ent://SD_ILS/0/SD_ILS:602668 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Yazdi, Mohammad. author. (orcid)0000-0002-6714-5285&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-53514-7">https://doi.org/10.1007/978-3-031-53514-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied OSS Reliability Assessment Modeling, AI and Tools Mathematics and AI for OSS Reliability Assessment ent://SD_ILS/0/SD_ILS:605293 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Tamura, Yoshinobu. author. (orcid)0000-0001-7665-5765&#160;Yamada, Shigeru. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-64803-8">https://doi.org/10.1007/978-3-031-64803-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Engineering for Industrial Processes An Analytics Perspective ent://SD_ILS/0/SD_ILS:603298 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Kapur, P. K. editor. (orcid)0000-0001-8006-5952&#160;Pham, Hoang. editor.&#160;Singh, Gurinder. editor. (orcid)0000-0002-7827-1578&#160;Kumar, Vivek. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-55048-5">https://doi.org/10.1007/978-3-031-55048-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Artificial Intelligence for Safety and Reliability Engineering Methods, Applications, and Challenges ent://SD_ILS/0/SD_ILS:605348 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Tran, Kim Phuc. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-71495-5">https://doi.org/10.1007/978-3-031-71495-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Recent Advances in Reliability and Maintenance Modeling : Proceedings of the 11th Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling (APARM 2024, Nagoya, Japan, 26-30 August 2024) ent://SD_ILS/0/SD_ILS:561997 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling (11th : 2024 : Nagoya, Japan).&#160;Okamura, Hiroyuki, editor.&#160;Inoue, Shinji, editor.&#160;Xiao, Xiao, editor.<br/>Preferred Shelf Number&#160;TA342<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003491309">https://www.taylorfrancis.com/books/9781003491309</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The iron triangle of energy : how to improve energy cost, reliability, and emissions ent://SD_ILS/0/SD_ILS:551570 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Miller, Ronald L., author.<br/>Preferred Shelf Number&#160;TJ163.2<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9788770046848">https://www.taylorfrancis.com/books/9788770046848</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Long-term strength of materials : reliability assessment and lifetime prediction of engineering structures ent://SD_ILS/0/SD_ILS:584038 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Chudnovsky, Alexander, author.&#160;Sehanobish, Kalyan, author.<br/>Preferred Shelf Number&#160;TA405<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003359845">https://www.taylorfrancis.com/books/9781003359845</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Healthcare Industry Assessment: Analyzing Risks, Security, and Reliability ent://SD_ILS/0/SD_ILS:604607 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Kumar, Pardeep. editor. (orcid)0000-0001-5303-7219&#160;Singh, Prabhishek. editor. (orcid)0000-0002-9338-0932&#160;Diwakar, Manoj. editor.&#160;Garg, Deepak. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-65434-3">https://doi.org/10.1007/978-3-031-65434-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Statistics in Transportation and Communication Selected Papers from the 23rd International Multidisciplinary Conference on Reliability and Statistics in Transportation and Communication: Digital Twins - From Development to Application, RelStat-2023, October 19-21, 2023, Riga, Latvia ent://SD_ILS/0/SD_ILS:602479 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Kabashkin, Igor. editor. (orcid)0000-0003-4004-6620&#160;Yatskiv, Irina. editor.&#160;Prentkovskis, Olegas. editor. (orcid)0000-0003-0910-591X&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-53598-7">https://doi.org/10.1007/978-3-031-53598-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Engineering Technology of Digital Diagnosis and Treatment Equipment ent://SD_ILS/0/SD_ILS:602871 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Li, Xiuqing. author.&#160;Gao, Jun. author.&#160;Li, Wen. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-99-5522-0">https://doi.org/10.1007/978-981-99-5522-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> THEORY AND PRACTICE OF DECISION MAKING IN REGULATION, DIAGNOSTICS AND RELIABILITY OF MACHINES ent://SD_ILS/0/SD_ILS:588241 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Lindstedt, Pawe&#322;.&#160;Gr&#261;dzki, Rafa&#322;.&#160;Golak, Karol.<br/>Preferred Shelf Number&#160;HD30.23<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032638447">https://www.taylorfrancis.com/books/9781032638447</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust Environmental Perception and Reliability Control for Intelligent Vehicles ent://SD_ILS/0/SD_ILS:602015 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Pan, Huihui. author.&#160;Wang, Jue. author.&#160;Yu, Xinghu. author.&#160;Sun, Weichao. author.&#160;Gao, Huijun. author. 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(orcid)0000-0002-2210-1756&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-57546-4">https://doi.org/10.1007/978-3-031-57546-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40 ent://SD_ILS/0/SD_ILS:604274 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;van Driel, Willem Dirk. editor.&#160;Pressel, Klaus. editor.&#160;Soyturk, Mujdat. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-59361-1">https://doi.org/10.1007/978-3-031-59361-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Systems 19th EAI International Conference, QShine 2023, Shenzhen, China, October 8 - 9, 2023, Proceedings, Part II ent://SD_ILS/0/SD_ILS:604755 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Leung, Victor C.M. editor.&#160;Li, Hezhang. editor.&#160;Hu, Xiping. editor.&#160;Ning, Zhaolong. editor. (orcid)0000-0002-7870-5524&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-65123-6">https://doi.org/10.1007/978-3-031-65123-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Systems 19th EAI International Conference, QShine 2023, Shenzhen, China, October 8 - 9, 2023, Proceedings, Part I ent://SD_ILS/0/SD_ILS:604756 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Leung, Victor C.M. editor.&#160;Li, Hezhang. editor.&#160;Hu, Xiping. editor.&#160;Ning, Zhaolong. editor. (orcid)0000-0002-7870-5524&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-65126-7">https://doi.org/10.1007/978-3-031-65126-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 43rd International Conference, SAFECOMP 2024, Florence, Italy, September 18-20, 2024, Proceedings ent://SD_ILS/0/SD_ILS:605082 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Ceccarelli, Andrea. editor. (orcid)0000-0002-2291-2428&#160;Trapp, Mario. editor.&#160;Bondavalli, Andrea. editor. (orcid)0000-0001-7366-6530&#160;Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-68606-1">https://doi.org/10.1007/978-3-031-68606-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security. SAFECOMP 2024 Workshops DECSoS, SASSUR, TOASTS, and WAISE, Florence, Italy, September 17, 2024, Proceedings ent://SD_ILS/0/SD_ILS:605083 2026-06-02T23:53:57Z 2026-06-02T23:53:57Z Author&#160;Ceccarelli, Andrea. editor. (orcid)0000-0002-2291-2428&#160;Trapp, Mario. editor.&#160;Bondavalli, Andrea. editor. (orcid)0000-0001-7366-6530&#160;Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443&#160;Gallina, Barbara. editor. 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