Search Results for Reliability. - Narrowed by: Electronics Design and Verification.
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dSUBJECT$002509Subject$002509Electronics$002bDesign$002band$002bVerification.$002509Electronics$002bDesign$002band$002bVerification.$0026ps$003d300?dt=list
2026-03-20T07:57:05Z
Reliability of CMOS Analog ICs
ent://SD_ILS/0/SD_ILS:608901
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Author Kuntman, Hakan. author. Özenli, Deniz. author. (orcid)0000-0002-6381-3629 Kaçar, Fırat. author. (orcid)0000-0002-0967-914X Özçelep, Yasin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-85455-2">https://doi.org/10.1007/978-3-031-85455-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Lifetime Reliability-aware Design of Integrated Circuits
ent://SD_ILS/0/SD_ILS:527089
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2026-03-20T07:57:05Z
Author Raji, Mohsen. author. Ghavami, Behnam. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-15345-7">https://doi.org/10.1007/978-3-031-15345-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40
ent://SD_ILS/0/SD_ILS:604274
2026-03-20T07:57:05Z
2026-03-20T07:57:05Z
Author van Driel, Willem Dirk. editor. Pressel, Klaus. editor. Soyturk, Mujdat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-59361-1">https://doi.org/10.1007/978-3-031-59361-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
CMOS Plasma and Process Damage
ent://SD_ILS/0/SD_ILS:608490
2026-03-20T07:57:05Z
2026-03-20T07:57:05Z
Author Prall, Kirk. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-89029-1">https://doi.org/10.1007/978-3-031-89029-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Hybrid Bonding, Advanced Substrates, Failure Mechanisms, and Thermal Management for Chiplets and Heterogeneous Integration
ent://SD_ILS/0/SD_ILS:608515
2026-03-20T07:57:05Z
2026-03-20T07:57:05Z
Author Lau, John. author. Fan, Xuejun. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-96-4166-6">https://doi.org/10.1007/978-981-96-4166-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quantum Computing Circuits, Systems, Automation and Applications
ent://SD_ILS/0/SD_ILS:602002
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2026-03-20T07:57:05Z
Author Thapliyal, Himanshu. editor. Humble, Travis. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-37966-6">https://doi.org/10.1007/978-3-031-37966-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
GaN Technology Materials, Manufacturing, Devices and Design for Power Conversion
ent://SD_ILS/0/SD_ILS:604632
2026-03-20T07:57:05Z
2026-03-20T07:57:05Z
Author Di Paolo Emilio, Maurizio. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-63238-9">https://doi.org/10.1007/978-3-031-63238-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
SiC Technology Materials, Manufacturing, Devices and Design for Power Conversion
ent://SD_ILS/0/SD_ILS:604707
2026-03-20T07:57:05Z
2026-03-20T07:57:05Z
Author Di Paolo Emilio, Maurizio. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-63418-5">https://doi.org/10.1007/978-3-031-63418-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>