Search Results for Reliability. - Narrowed by: Electronics. - Engineering. - System safety.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026qf$003dSUBJECT$002509Subject$002509Engineering.$002509Engineering.$0026qf$003dSUBJECT$002509Subject$002509System$002bsafety.$002509System$002bsafety.$0026ps$003d300?
2024-10-24T03:57:10Z
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:192824
2024-10-24T03:57:10Z
2024-10-24T03:57:10Z
Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:185203
2024-10-24T03:57:10Z
2024-10-24T03:57:10Z
Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of Microtechnology Interconnects, Devices and Systems
ent://SD_ILS/0/SD_ILS:172420
2024-10-24T03:57:10Z
2024-10-24T03:57:10Z
Author Liu, Johan. author. Salmela, Olli. author. Sarkka, Jussi. author. Morris, James E. author. Tegehall, Per-Erik. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solder Joint Reliability Prediction for Multiple Environments
ent://SD_ILS/0/SD_ILS:167673
2024-10-24T03:57:10Z
2024-10-24T03:57:10Z
Author Perkins, Andrew E. author. Sitaraman, Suresh K. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
2024-10-24T03:57:10Z
2024-10-24T03:57:10Z
Author Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
ent://SD_ILS/0/SD_ILS:168486
2024-10-24T03:57:10Z
2024-10-24T03:57:10Z
Author Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:332682
2024-10-24T03:57:10Z
2024-10-24T03:57:10Z
Author McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332682.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:172571
2024-10-24T03:57:10Z
2024-10-24T03:57:10Z
Author McPherson, J.W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
ent://SD_ILS/0/SD_ILS:165900
2024-10-24T03:57:10Z
2024-10-24T03:57:10Z
Author Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
A Guide to Lead-free Solders Physical Metallurgy and Reliability
ent://SD_ILS/0/SD_ILS:175373
2024-10-24T03:57:10Z
2024-10-24T03:57:10Z
Author Evans, John W. author. Engelmaier, Werner. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>