Search Results for Reliability. - Narrowed by: Electronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026ps$003d300$0026isd$003dtrue?
2026-01-20T10:39:05Z
MEMS Reliability
ent://SD_ILS/0/SD_ILS:172486
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Author Hartzell, Allyson L. author. da Silva, Mark G. author. Shea, Herbert R. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability prediction for microelectronics
ent://SD_ILS/0/SD_ILS:598968
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Author Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.<br/>Preferred Shelf Number TK7874<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor Power Devices Physics, Characteristics, Reliability
ent://SD_ILS/0/SD_ILS:401906
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Author Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-70917-8">https://doi.org/10.1007/978-3-319-70917-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:489410
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Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Analog IC Reliability in Nanometer CMOS
ent://SD_ILS/0/SD_ILS:331961
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Author Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331961.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-6163-0">http://dx.doi.org/10.1007/978-1-4614-6163-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Lead Free Solder Mechanics and Reliability
ent://SD_ILS/0/SD_ILS:173692
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Author Pang, John Hock Lye. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor Power Devices Physics, Characteristics, Reliability
ent://SD_ILS/0/SD_ILS:191586
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Author Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:192824
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Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:185203
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Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Repairable systems reliability analysis : a comprehensive framework
ent://SD_ILS/0/SD_ILS:596328
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Author Rai, Rajiv Nandan, author. Chaturvedi, Sanjay K., author. Bolia, Nomesh, author.<br/>Preferred Shelf Number QA402 .R35 2020<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solid State Lighting Reliability Components to Systems
ent://SD_ILS/0/SD_ILS:331314
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Author van Driel, W.D. editor. Fan, X.J. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331314.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of Microtechnology Interconnects, Devices and Systems
ent://SD_ILS/0/SD_ILS:172420
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Author Liu, Johan. author. Salmela, Olli. author. Sarkka, Jussi. author. Morris, James E. author. Tegehall, Per-Erik. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solder Joint Reliability Prediction for Multiple Environments
ent://SD_ILS/0/SD_ILS:167673
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Author Perkins, Andrew E. author. Sitaraman, Suresh K. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
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Author Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solder Joint Technology Materials, Properties, and Reliability
ent://SD_ILS/0/SD_ILS:166252
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Author Tu, King-Ning. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
ent://SD_ILS/0/SD_ILS:168486
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Author Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advanced techniques for maintenance modeling and reliability analysis of repairable systems
ent://SD_ILS/0/SD_ILS:598651
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Author Sharma, Garima, author. Rai, Rajiv Nandan, author.<br/>Preferred Shelf Number TA169 .S53 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solid State Lighting Reliability Part 2 Components to Systems
ent://SD_ILS/0/SD_ILS:401528
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Author van Driel, Willem Dirk. editor. Fan, Xuejun. editor. Zhang, Guo Qi. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
ent://SD_ILS/0/SD_ILS:593728
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Author Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number TA169.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamentals of Lead-Free Solder Interconnect Technology From Microstructures to Reliability
ent://SD_ILS/0/SD_ILS:530321
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Author Lee, Tae-Kyu. author. Bieler, Thomas R. author. Kim, Choong-Un. author. Ma, Hongtao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-9266-5">https://doi.org/10.1007/978-1-4614-9266-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
ent://SD_ILS/0/SD_ILS:331478
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Author Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331478.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-4337-7">http://dx.doi.org/10.1007/978-1-4614-4337-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:332682
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Author McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332682.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power Electronic Packaging Design, Assembly Process, Reliability and Modeling
ent://SD_ILS/0/SD_ILS:173841
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Author Liu, Yong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:172571
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Author McPherson, J.W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
A Guide to Lead-free Solders Physical Metallurgy and Reliability
ent://SD_ILS/0/SD_ILS:175373
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Author Evans, John W. author. Engelmaier, Werner. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
ent://SD_ILS/0/SD_ILS:165900
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Author Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Measurement Uncertainty An Approach via the Mathematical Theory of Evidence
ent://SD_ILS/0/SD_ILS:166341
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Author Salicone, Simona. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-46328-5">http://dx.doi.org/10.1007/978-0-387-46328-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
More-than-Moore Devices and Integration for Semiconductors
ent://SD_ILS/0/SD_ILS:526736
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Author Iacopi, Francesca. editor. Balestra, Francis. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-21610-7">https://doi.org/10.1007/978-3-031-21610-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Software Defined Chips Volume II
ent://SD_ILS/0/SD_ILS:527085
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Author Liu, Leibo. author. Wei, Shaojun. author. Zhu, Jianfeng. author. Deng, Chenchen. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-19-7636-0">https://doi.org/10.1007/978-981-19-7636-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Proceeding of 2022 International Conference on Wireless Communications, Networking and Applications (WCNA 2022)
ent://SD_ILS/0/SD_ILS:528059
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Author Qian, Zhihong. editor. Jabbar, M.A. editor. Cheung, Simon K. S. editor. Li, Xiaolong. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-3951-0">https://doi.org/10.1007/978-981-99-3951-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electromechanical coupling theory, methodology and applications for high-performance microwave equipment
ent://SD_ILS/0/SD_ILS:597980
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Author Duan, Baoyan, author. Zhang, Shuxin (Professor of electromechanical engineering), author.<br/>Preferred Shelf Number TK7876 .D83 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
75th anniversary of the transistor
ent://SD_ILS/0/SD_ILS:598494
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Author Nathan, Arokia, 1957- editor. Saha, Samar K., editor. Todi, Ravi M., editor.<br/>Preferred Shelf Number TK7871.9<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Defects in organic semiconductors and devices
ent://SD_ILS/0/SD_ILS:598531
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Author Nguyen, Thien-Phap, author.<br/>Preferred Shelf Number TK7871.99 .O74 N48 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Resilient power electronic systems
ent://SD_ILS/0/SD_ILS:597338
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Author Kaboli, Shahriyar, 1975- author. Peyghami, Saeed, author. Blaabjerg, Frede, author.<br/>Preferred Shelf Number TK7881.15 .K335 2022<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772217">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772217</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Cellular V2X for connected automated driving
ent://SD_ILS/0/SD_ILS:596075
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Author Fallgren, Mikael, editor. Dillinger, Markus, editor. Mahmoodi, Toktam, editor. Svensson, Tommy (Highway engineer), editor.<br/>Preferred Shelf Number TE228.37 .C45 2021<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119692676">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119692676</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electrical connectors : design, manufacture, test, and selection
ent://SD_ILS/0/SD_ILS:596172
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Author Pecht, Michael, editor. Kyeong, San, editor.<br/>Preferred Shelf Number TK3521<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Systems engineering in the fourth industrial revolution : big data, novel technologies, and modern systems engineering
ent://SD_ILS/0/SD_ILS:595527
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Author Kenett, Ron, editor. Swarz, Robert S., editor. Zonnenshain, Avigdor, editor.<br/>Preferred Shelf Number TA168 .S8727 2020<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of 3D integration. Volume 4, Design, test, and thermal management
ent://SD_ILS/0/SD_ILS:595051
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Author Franzon, Paul D., editor. Marinissen, Eric Jan, editor. Bakir, Muhannad S., editor.<br/>Preferred Shelf Number TK7874.893 .H36 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in embedded and fan-out wafer level packaging technologies
ent://SD_ILS/0/SD_ILS:594706
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Author Keser, Beth, 1971- editor. Kroehnert, Steffen, 1970- editor.<br/>Preferred Shelf Number TK7870.17 .A38 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119313991">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119313991</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanoelectronics : materials, devices, applications
ent://SD_ILS/0/SD_ILS:593621
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Author Puers, R., editor.<br/>Preferred Shelf Number TK7874.84<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Real-time embedded systems
ent://SD_ILS/0/SD_ILS:593770
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Author Wang, Jiacun, 1963- author.<br/>Preferred Shelf Number TK7895 .E42<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Physics and Technology of Crystalline Oxide Semiconductor CAAC-IGZO : Application to Displays
ent://SD_ILS/0/SD_ILS:593178
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Author Yamazaki, Shunpei, editor. Tsutsui, Tetsuo, editor.<br/>Preferred Shelf Number TK7871.85<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119247395">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119247395</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Wafer-Level Chip-Scale Packaging Analog and Power Semiconductor Applications
ent://SD_ILS/0/SD_ILS:530077
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Author Qu, Shichun. author. Liu, Yong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-1556-9">https://doi.org/10.1007/978-1-4939-1556-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
CMOS Test and Evaluation A Physical Perspective
ent://SD_ILS/0/SD_ILS:530329
2026-01-20T10:39:05Z
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Author Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-1349-7">https://doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Innovations and Advances in Computing, Informatics, Systems Sciences, Networking and Engineering
ent://SD_ILS/0/SD_ILS:530615
2026-01-20T10:39:05Z
2026-01-20T10:39:05Z
Author Sobh, Tarek. editor. Elleithy, Khaled. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06773-5">https://doi.org/10.1007/978-3-319-06773-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliable Design of Electronic Equipment An Engineering Guide
ent://SD_ILS/0/SD_ILS:529320
2026-01-20T10:39:05Z
2026-01-20T10:39:05Z
Author Natarajan, Dhanasekharan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-09111-2">https://doi.org/10.1007/978-3-319-09111-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
ent://SD_ILS/0/SD_ILS:488642
2026-01-20T10:39:05Z
2026-01-20T10:39:05Z
Author Balasinski, Artur. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-1761-3">https://doi.org/10.1007/978-1-4614-1761-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Bias Temperature Instability for Devices and Circuits
ent://SD_ILS/0/SD_ILS:484755
2026-01-20T10:39:05Z
2026-01-20T10:39:05Z
Author Grasser, Tibor. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-7909-3">https://doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fault-Tolerant Design
ent://SD_ILS/0/SD_ILS:331297
2026-01-20T10:39:05Z
2026-01-20T10:39:05Z
Author Dubrova, Elena. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331297.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-2113-9">http://dx.doi.org/10.1007/978-1-4614-2113-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>