Search Results for Reliability. - Narrowed by: Optical materials.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dSUBJECT$002509Subject$002509Optical$002bmaterials.$002509Optical$002bmaterials.$0026ic$003dtrue$0026ps$003d300?
2025-12-27T17:55:19Z
Lead Free Solder Mechanics and Reliability
ent://SD_ILS/0/SD_ILS:173692
2025-12-27T17:55:19Z
2025-12-27T17:55:19Z
Author Pang, John Hock Lye. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solid State Lighting Reliability Components to Systems
ent://SD_ILS/0/SD_ILS:331314
2025-12-27T17:55:19Z
2025-12-27T17:55:19Z
Author van Driel, W.D. editor. Fan, X.J. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331314.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of Microtechnology Interconnects, Devices and Systems
ent://SD_ILS/0/SD_ILS:172420
2025-12-27T17:55:19Z
2025-12-27T17:55:19Z
Author Liu, Johan. author. Salmela, Olli. author. Sarkka, Jussi. author. Morris, James E. author. Tegehall, Per-Erik. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solder Joint Reliability Prediction for Multiple Environments
ent://SD_ILS/0/SD_ILS:167673
2025-12-27T17:55:19Z
2025-12-27T17:55:19Z
Author Perkins, Andrew E. author. Sitaraman, Suresh K. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solder Joint Technology Materials, Properties, and Reliability
ent://SD_ILS/0/SD_ILS:166252
2025-12-27T17:55:19Z
2025-12-27T17:55:19Z
Author Tu, King-Ning. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
ent://SD_ILS/0/SD_ILS:168486
2025-12-27T17:55:19Z
2025-12-27T17:55:19Z
Author Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solid State Lighting Reliability Part 2 Components to Systems
ent://SD_ILS/0/SD_ILS:401528
2025-12-27T17:55:19Z
2025-12-27T17:55:19Z
Author van Driel, Willem Dirk. editor. Fan, Xuejun. editor. Zhang, Guo Qi. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamentals of Lead-Free Solder Interconnect Technology From Microstructures to Reliability
ent://SD_ILS/0/SD_ILS:530321
2025-12-27T17:55:19Z
2025-12-27T17:55:19Z
Author Lee, Tae-Kyu. author. Bieler, Thomas R. author. Kim, Choong-Un. author. Ma, Hongtao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-9266-5">https://doi.org/10.1007/978-1-4614-9266-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Silicon Analog Components Device Design, Process Integration, Characterization, and Reliability
ent://SD_ILS/0/SD_ILS:529569
2025-12-27T17:55:19Z
2025-12-27T17:55:19Z
Author El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-2751-7">https://doi.org/10.1007/978-1-4939-2751-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
ent://SD_ILS/0/SD_ILS:489246
2025-12-27T17:55:19Z
2025-12-27T17:55:19Z
Author Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-007-7663-0">https://doi.org/10.1007/978-94-007-7663-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
ent://SD_ILS/0/SD_ILS:331478
2025-12-27T17:55:19Z
2025-12-27T17:55:19Z
Author Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331478.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-4337-7">http://dx.doi.org/10.1007/978-1-4614-4337-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
A Guide to Lead-free Solders Physical Metallurgy and Reliability
ent://SD_ILS/0/SD_ILS:175373
2025-12-27T17:55:19Z
2025-12-27T17:55:19Z
Author Evans, John W. author. Engelmaier, Werner. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
ent://SD_ILS/0/SD_ILS:165900
2025-12-27T17:55:19Z
2025-12-27T17:55:19Z
Author Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliable Design of Electronic Equipment An Engineering Guide
ent://SD_ILS/0/SD_ILS:529320
2025-12-27T17:55:19Z
2025-12-27T17:55:19Z
Author Natarajan, Dhanasekharan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-09111-2">https://doi.org/10.1007/978-3-319-09111-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>