Search Results for Reliability. - Narrowed by: Semiconductors.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dSUBJECT$002509Subject$002509Semiconductors.$002509Semiconductors.$0026ps$003d300?dt=list
2026-03-31T05:15:24Z
Power GaN Devices Materials, Applications and Reliability
ent://SD_ILS/0/SD_ILS:611788
2026-03-31T05:15:24Z
2026-03-31T05:15:24Z
Author Meneghini, Matteo. editor. Meneghesso, Gaudenzio. editor. Zanoni, Enrico. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-43199-4">https://doi.org/10.1007/978-3-319-43199-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
ent://SD_ILS/0/SD_ILS:488848
2026-03-31T05:15:24Z
2026-03-31T05:15:24Z
Author Richter, Detlev. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-007-6082-0">https://doi.org/10.1007/978-94-007-6082-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
ent://SD_ILS/0/SD_ILS:489246
2026-03-31T05:15:24Z
2026-03-31T05:15:24Z
Author Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-007-7663-0">https://doi.org/10.1007/978-94-007-7663-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Device circuit co-design issues in FETs
ent://SD_ILS/0/SD_ILS:557974
2026-03-31T05:15:24Z
2026-03-31T05:15:24Z
Author Tayal, Shubham, editor. Smaani, Billel, editor. Rahi, Shiromani Balmukund, editor. Labiod, Samir, 1981- editor. Ramezani, Zeinab, editor.<br/>Preferred Shelf Number TK7871.95 .D48 2024<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003359234">https://www.taylorfrancis.com/books/9781003359234</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Hybrid Bonding, Advanced Substrates, Failure Mechanisms, and Thermal Management for Chiplets and Heterogeneous Integration
ent://SD_ILS/0/SD_ILS:608515
2026-03-31T05:15:24Z
2026-03-31T05:15:24Z
Author Lau, John. author. Fan, Xuejun. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-96-4166-6">https://doi.org/10.1007/978-981-96-4166-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advanced ultra low-power semiconductor devices : design and applications
ent://SD_ILS/0/SD_ILS:598708
2026-03-31T05:15:24Z
2026-03-31T05:15:24Z
Author Tayal, Shubham, editor Upadhyay, Abhishek Kumar, editor Rahi, Shiromani Balmukund, editor. Song, Young Suh, editor<br/>Preferred Shelf Number TK7871.85 .A38 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394167647">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394167647</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
75th anniversary of the transistor
ent://SD_ILS/0/SD_ILS:598494
2026-03-31T05:15:24Z
2026-03-31T05:15:24Z
Author Nathan, Arokia, 1957- editor. Saha, Samar K., editor. Todi, Ravi M., editor.<br/>Preferred Shelf Number TK7871.9<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Defects in organic semiconductors and devices
ent://SD_ILS/0/SD_ILS:598531
2026-03-31T05:15:24Z
2026-03-31T05:15:24Z
Author Nguyen, Thien-Phap, author.<br/>Preferred Shelf Number TK7871.99 .O74 N48 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nitride semiconductor technology : power electronics and optoelectronic devices
ent://SD_ILS/0/SD_ILS:596257
2026-03-31T05:15:24Z
2026-03-31T05:15:24Z
Author Roccaforte, Fabrizio, editor. Leszczynsk, Mike, editor.<br/>Preferred Shelf Number TK7871.85<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527825264">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527825264</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
CMOS Test and Evaluation A Physical Perspective
ent://SD_ILS/0/SD_ILS:530329
2026-03-31T05:15:24Z
2026-03-31T05:15:24Z
Author Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-1349-7">https://doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Bias Temperature Instability for Devices and Circuits
ent://SD_ILS/0/SD_ILS:484755
2026-03-31T05:15:24Z
2026-03-31T05:15:24Z
Author Grasser, Tibor. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-7909-3">https://doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>