Search Results for Reliability. - Narrowed by: Signal processing.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dSUBJECT$002509Subject$002509Signal$002bprocessing.$002509Signal$002bprocessing.$0026ps$003d300?2026-02-17T23:42:50ZReliability and Availability of Quality Control Based on Wavelet Computer Visionent://SD_ILS/0/SD_ILS:5300612026-02-17T23:42:50Z2026-02-17T23:42:50ZAuthor Kuzmanić, Ivica. author. Vujović, Igor. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-13317-1">https://doi.org/10.1007/978-3-319-13317-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Innovations in Signal Processing and Embedded Systems Proceedings of ICISPES 2021ent://SD_ILS/0/SD_ILS:5282832026-02-17T23:42:50Z2026-02-17T23:42:50ZAuthor Mandal, Jyotsna Kumar. editor. Hinchey, Mike. editor. Rao, K. Sreenivas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-19-1669-4">https://doi.org/10.1007/978-981-19-1669-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Application of signal processing tools and artificial neural network in diagnosis of power system faultsent://SD_ILS/0/SD_ILS:5496252026-02-17T23:42:50Z2026-02-17T23:42:50ZAuthor Roy, Nabamita Banerjee, author. Bhattacharya, Kesab, author.<br/>Preferred Shelf Number TK1010<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367431143">https://www.taylorfrancis.com/books/9780367431143</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Proceedings of the Second International Conference on Mechatronics and Automatic Controlent://SD_ILS/0/SD_ILS:5298292026-02-17T23:42:50Z2026-02-17T23:42:50ZAuthor Wang, Wego. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-13707-0">https://doi.org/10.1007/978-3-319-13707-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Innovations and Advances in Computing, Informatics, Systems Sciences, Networking and Engineeringent://SD_ILS/0/SD_ILS:5306152026-02-17T23:42:50Z2026-02-17T23:42:50ZAuthor Sobh, Tarek. editor. Elleithy, Khaled. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06773-5">https://doi.org/10.1007/978-3-319-06773-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrologyent://SD_ILS/0/SD_ILS:4878402026-02-17T23:42:50Z2026-02-17T23:42:50ZAuthor Osten, Wolfgang. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-642-36359-7">https://doi.org/10.1007/978-3-642-36359-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fiabilite, maintenance predictive et vibration des machinesent://SD_ILS/0/SD_ILS:2391972026-02-17T23:42:50Z2026-02-17T23:42:50ZAuthor Thomas, Marc. Universite du Quebec. E¿¿cole de technologie superieure. Project Muse.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://muse.jhu.edu/books/9782760533585/">Full text available: </a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>