Search Results for Reliability. - Narrowed by: Surfaces (Physics). SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue? 2024-11-14T02:54:25Z Silver Metallization Stability and Reliability ent://SD_ILS/0/SD_ILS:175677 2024-11-14T02:54:25Z 2024-11-14T02:54:25Z Author&#160;Adams, Daniel. author.&#160;Alford, Terry L. author.&#160;Mayer, James W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ent://SD_ILS/0/SD_ILS:331478 2024-11-14T02:54:25Z 2024-11-14T02:54:25Z Author&#160;Ueda, Osamu. editor.&#160;Pearton, Stephen J. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331478.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-4337-7">http://dx.doi.org/10.1007/978-1-4614-4337-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging ent://SD_ILS/0/SD_ILS:165900 2024-11-14T02:54:25Z 2024-11-14T02:54:25Z Author&#160;Suhir, E. editor.&#160;Lee, Y. C. editor.&#160;Wong, C. P. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computational Electromagnetics and Model-Based Inversion A Modern Paradigm for Eddy-Current Nondestructive Evaluation ent://SD_ILS/0/SD_ILS:330843 2024-11-14T02:54:25Z 2024-11-14T02:54:25Z Author&#160;Sabbagh, Harold A. author.&#160;Murphy, R. Kim. author.&#160;Sabbagh, Elias H. author.&#160;Aldrin, John C. author.&#160;Knopp, Jeremy S. author.<br/>Preferred Shelf Number&#160;ONLINE(330843.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-8429-6">http://dx.doi.org/10.1007/978-1-4419-8429-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Evaluating Measurement Accuracy A Practical Approach ent://SD_ILS/0/SD_ILS:332097 2024-11-14T02:54:25Z 2024-11-14T02:54:25Z Author&#160;Rabinovich, Semyon G. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332097.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-6717-5">http://dx.doi.org/10.1007/978-1-4614-6717-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of Technical Diagnostics Fundamentals and Application to Structures and Systems ent://SD_ILS/0/SD_ILS:333141 2024-11-14T02:54:25Z 2024-11-14T02:54:25Z Author&#160;Czichos, Horst. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333141.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-25850-3">http://dx.doi.org/10.1007/978-3-642-25850-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>