Search Results for Reliability. - Narrowed by: System failures (Engineering) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dSUBJECT$002509Subject$002509System$002bfailures$002b$002528Engineering$002529$002509System$002bfailures$002b$002528Engineering$002529$0026te$003dILS$0026ps$003d300? 2026-01-30T22:30:23Z Methods for reliability improvement and risk reduction ent://SD_ILS/0/SD_ILS:594697 2026-01-30T22:30:23Z 2026-01-30T22:30:23Z Author&#160;Todinov, M. T., author.<br/>Preferred Shelf Number&#160;TA169 .T649 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of maintained systems subjected to wear failure mechanisms : theory and applications ent://SD_ILS/0/SD_ILS:595240 2026-01-30T22:30:23Z 2026-01-30T22:30:23Z Author&#160;Bayle, Franck, author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and failure of electronic materials and devices ent://SD_ILS/0/SD_ILS:355485 2026-01-30T22:30:23Z 2026-01-30T22:30:23Z Author&#160;Ohring, Milton, 1936-&#160;Kasprzak, Lucian.<br/>Preferred Shelf Number&#160;ONLINE(355485.1)<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Spacecraft reliability and multi-state failures a statistical approach ent://SD_ILS/0/SD_ILS:305721 2026-01-30T22:30:23Z 2026-01-30T22:30:23Z Author&#160;Saleh, Joseph H., 1971-&#160;Castet, Jean-Fran&ccedil;ois.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697462">Click here to view book</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41710">http://www.books24x7.com/marc.asp?bookid=41710</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Risk-based reliability analysis and generic principles for risk reduction ent://SD_ILS/0/SD_ILS:148956 2026-01-30T22:30:23Z 2026-01-30T22:30:23Z Author&#160;Todinov, M. T.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical plant failure analysis : a guide to understanding machinery deterioration and improving equipment reliability ent://SD_ILS/0/SD_ILS:540978 2026-01-30T22:30:23Z 2026-01-30T22:30:23Z Author&#160;Sachs, Neville W., author.<br/>Preferred Shelf Number&#160;TJ153 .S164 2007<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420020007">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability and failure of electronic materials and devices ent://SD_ILS/0/SD_ILS:256309 2026-01-30T22:30:23Z 2026-01-30T22:30:23Z Author&#160;Ohring, Milton, 1936-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fault analysis and its impact on grid-connected photovoltaic systems performance ent://SD_ILS/0/SD_ILS:598021 2026-01-30T22:30:23Z 2026-01-30T22:30:23Z Author&#160;Haque, Ahteshamul, editor.&#160;Mekhilef, Saad, editor.<br/>Preferred Shelf Number&#160;TA169.5 .F38 2023 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119873785">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119873785</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electrical systems. 1 : From diagnosis to prognosis ent://SD_ILS/0/SD_ILS:595955 2026-01-30T22:30:23Z 2026-01-30T22:30:23Z Author&#160;Soualhi, Abdenour.&#160;Razik, Hubert.<br/>Preferred Shelf Number&#160;TA169.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720317">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720317</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electrical systems. 2 : from diagnosis to prognosis ent://SD_ILS/0/SD_ILS:595957 2026-01-30T22:30:23Z 2026-01-30T22:30:23Z Author&#160;Soualhi, Abdenour.&#160;Razik, Hubert.<br/>Preferred Shelf Number&#160;TA169.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720584">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720584</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Forensic systems engineering : evaluating operations by discovery ent://SD_ILS/0/SD_ILS:593932 2026-01-30T22:30:23Z 2026-01-30T22:30:23Z Author&#160;Stimson, William A., author.<br/>Preferred Shelf Number&#160;TA169.5 .S755 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422808">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422808</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> PEM fuel cell failure mode analysis ent://SD_ILS/0/SD_ILS:542776 2026-01-30T22:30:23Z 2026-01-30T22:30:23Z Author&#160;Wang, Haijiang Henry.&#160;Li, Hui, 1964-&#160;Yuan, Xiao-Zi.<br/>Preferred Shelf Number&#160;TK2933 .P76 P465 2012<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439839188">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Practical engineering failure analysis ent://SD_ILS/0/SD_ILS:545309 2026-01-30T22:30:23Z 2026-01-30T22:30:23Z Author&#160;Tawancy, Hani M., author.&#160;Abbas, Nureddin Mohamed.&#160;Ul-Hamid, Anwar.<br/>Preferred Shelf Number&#160;TA169.5 .T39 2004<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135523695">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/>