Search Results for Reliability. - Narrowed by: Systems engineering.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026qf$003dSUBJECT$002509Subject$002509Systems$002bengineering.$002509Systems$002bengineering.$0026ic$003dtrue$0026ps$003d300?dt=list
2024-10-02T12:28:06Z
Semiconductor Power Devices Physics, Characteristics, Reliability
ent://SD_ILS/0/SD_ILS:401906
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Author Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-70917-8">https://doi.org/10.1007/978-3-319-70917-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Analog IC Reliability in Nanometer CMOS
ent://SD_ILS/0/SD_ILS:331961
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Author Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331961.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-6163-0">http://dx.doi.org/10.1007/978-1-4614-6163-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Lead Free Solder Mechanics and Reliability
ent://SD_ILS/0/SD_ILS:173692
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Author Pang, John Hock Lye. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solid State Lighting Reliability Components to Systems
ent://SD_ILS/0/SD_ILS:331314
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Author van Driel, W.D. editor. Fan, X.J. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331314.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
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Author Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solid State Lighting Reliability Part 2 Components to Systems
ent://SD_ILS/0/SD_ILS:401528
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Author van Driel, Willem Dirk. editor. Fan, Xuejun. editor. Zhang, Guo Qi. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
ent://SD_ILS/0/SD_ILS:401348
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2024-10-02T12:28:06Z
Author Wang, Zheng. author. Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-1073-6">https://doi.org/10.1007/978-981-10-1073-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, Availability and Serviceability of Networks-on-Chip
ent://SD_ILS/0/SD_ILS:173779
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Author Cota, Érika. author. Morais Amory, Alexandre. author. Soares Lubaszewski, Marcelo. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0791-1">http://dx.doi.org/10.1007/978-1-4614-0791-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power Electronic Packaging Design, Assembly Process, Reliability and Modeling
ent://SD_ILS/0/SD_ILS:173841
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Author Liu, Yong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
ent://SD_ILS/0/SD_ILS:172530
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Author Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6217-1">http://dx.doi.org/10.1007/978-1-4419-6217-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Securing Electricity Supply in the Cyber Age Exploring the Risks of Information and Communication Technology in Tomorrow's Electricity Infrastructure
ent://SD_ILS/0/SD_ILS:205126
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Author Lukszo, Zofia. editor. Deconinck, Geert. editor. Weijnen, Margot P. C. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-3594-3">http://dx.doi.org/10.1007/978-90-481-3594-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advanced risk analysis in engineering enterprise systems
ent://SD_ILS/0/SD_ILS:287163
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2024-10-02T12:28:06Z
Author Pinto, Cesar Ariel. Garvey, Paul R., 1956-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439826157">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Systems engineering and safety building the bridge
ent://SD_ILS/0/SD_ILS:289077
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Author Glismann, Peter J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781466552135">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fault-Tolerant Design
ent://SD_ILS/0/SD_ILS:331297
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Author Dubrova, Elena. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331297.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-2113-9">http://dx.doi.org/10.1007/978-1-4614-2113-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design, Analysis and Test of Logic Circuits Under Uncertainty
ent://SD_ILS/0/SD_ILS:335669
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Author Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335669.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Systems engineering tools and methods
ent://SD_ILS/0/SD_ILS:287974
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2024-10-02T12:28:06Z
Author Kamrani, Ali K. Azimi, Maryam.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439809273">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Supportability engineering handbook implementation, measurement, and management
ent://SD_ILS/0/SD_ILS:293555
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Author Jones, James V.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/supportability-engineering-handbook">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quantitative measurements for logistics
ent://SD_ILS/0/SD_ILS:293604
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Author Frohne, Philip T. SOLE--The International Society of Logistics.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/quantitative-measurements-for-logistics">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Architecting resilient systems accident avoidance and survival and recovery from disruptions
ent://SD_ILS/0/SD_ILS:297830
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Author Jackson, Scott.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470544013">http://dx.doi.org/10.1002/9780470544013</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10355233">http://site.ebrary.com/lib/alltitles/Doc?id=10355233</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Systems and software engineering with applications
ent://SD_ILS/0/SD_ILS:249813
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Author Schneidewind, Norman.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539</a>
IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>