Search Results for Reliability. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026ps$003d300$0026isd$003dtrue?dt=list 2024-11-23T17:11:06Z Reliability ent://SD_ILS/0/SD_ILS:233427 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Meyer, J. Patrick.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural reliability ent://SD_ILS/0/SD_ILS:297978 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Lemaire, Maurice.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability engineering ent://SD_ILS/0/SD_ILS:341870 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Kapur, Kailash C., 1941- author.&#160;Pecht, Michael, author.<br/>Preferred Shelf Number&#160;ONLINE(341870.1)<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a> MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability ent://SD_ILS/0/SD_ILS:364907 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Tobias, Paul A.&#160;Trindade, David C.<br/>Preferred Shelf Number&#160;TA169 T63 2012<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> MEMS Reliability ent://SD_ILS/0/SD_ILS:172486 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Hartzell, Allyson L. author.&#160;da Silva, Mark G. author.&#160;Shea, Herbert R. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bayesian Reliability ent://SD_ILS/0/SD_ILS:167542 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Hamada, Michael S. author.&#160;Wilson, Alyson G. author.&#160;Reese, C. Shane. author.&#160;Martz, Harry F. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability fundamentals ent://SD_ILS/0/SD_ILS:255215 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;C&#259;tuneanu, Vasile M.&#160;Mihalache, Adrian.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ensuring software reliability ent://SD_ILS/0/SD_ILS:289793 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Neufelder, Ann Marie, 1960-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439832752">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System Software Reliability ent://SD_ILS/0/SD_ILS:175367 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:249382 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Raheja, Dev.&#160;Gullo, Louis J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical system reliability ent://SD_ILS/0/SD_ILS:153146 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Bauer, Eric.&#160;Zhang, Xuemei.&#160;Kimber, Douglas A.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of MEMS ent://SD_ILS/0/SD_ILS:303632 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Tsuchiya, Toshiyuki.&#160;Tabata, Osamu, 1956-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:285886 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Crow, Dana.&#160;Feinberg, Alec.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420040845">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical reliability engineering ent://SD_ILS/0/SD_ILS:305563 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;O'Connor, Patrick P.&#160;Kleyner, Andre.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Improving machinery reliability ent://SD_ILS/0/SD_ILS:153828 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Bloch, Heinz P., 1933-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability in pragmatics ent://SD_ILS/0/SD_ILS:357581 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;McCready, Eric (Eric S.), author.<br/>Preferred Shelf Number&#160;P99.4.P72 M445 2015<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Probabilistic reliability models ent://SD_ILS/0/SD_ILS:299523 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Ushakov, I. A. (Igor&#697; Alekseevich)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical reliability engineering ent://SD_ILS/0/SD_ILS:295099 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Pavlov, I. V.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Chakravarty, Sumantra.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic reliability engineering ent://SD_ILS/0/SD_ILS:295101 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Falk, James.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer systems reliability. ent://SD_ILS/0/SD_ILS:58893 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Preferred Shelf Number&#160;TK 7885 C65 1974 V.20<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Reliability and Optimal Maintenance ent://SD_ILS/0/SD_ILS:175380 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Wang, Hongzhou. author.&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintenance Theory of Reliability ent://SD_ILS/0/SD_ILS:175323 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Safety Engineering ent://SD_ILS/0/SD_ILS:176193 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Verma, Ajit Kumar. author.&#160;Srividya, Ajit. author.&#160;Karanki, Durga Rao. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> IEEE Transactions on reliability. ent://SD_ILS/0/SD_ILS:226884 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Preferred Shelf Number&#160;ALFABET&#304;K V.12 1963<br/>Format:&#160;Continuing Resources&#160;Other<br/>Availability&#160;Beytepe Library~30&#160;~0<br/> Engineering design reliability handbook ent://SD_ILS/0/SD_ILS:287313 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of large systems ent://SD_ILS/0/SD_ILS:254513 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Ko&#322;owrocki, Krzysztof.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power-system reliability calculations ent://SD_ILS/0/SD_ILS:220175 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Billinton, Roy.&#160;Ringlee, Robert J., joint author.&#160;Wood, Allen J., joint author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability theory and practice ent://SD_ILS/0/SD_ILS:47596 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Bazovsky, Igor.<br/>Preferred Shelf Number&#160;TA 168 B33 1961<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Stochastic Models in Reliability ent://SD_ILS/0/SD_ILS:332363 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Aven, Terje. author.&#160;Jensen, Uwe. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332363.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Network Reliability and Resilience ent://SD_ILS/0/SD_ILS:195005 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Gertsbakh, Ilya. author.&#160;Shpungin, Yoseph. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Life cycle reliability engineering ent://SD_ILS/0/SD_ILS:296926 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Yang, Guangbin, 1964-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and validity assessment ent://SD_ILS/0/SD_ILS:7092 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Carmines, Edward G.<br/>Preferred Shelf Number&#160;H 61 C26 1979<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Mathematical theory of reliability ent://SD_ILS/0/SD_ILS:35404 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Barlow, Richard E.&#160;Proschan Frank. , ort. yaz.<br/>Preferred Shelf Number&#160;QA 273 B3 1965<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Quantile-Based Reliability Analysis ent://SD_ILS/0/SD_ILS:330556 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Nair, N. Unnikrishnan. author.&#160;Sankaran, P.G. author.&#160;Balakrishnan, N. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(330556.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reinforced concrete structural reliability ent://SD_ILS/0/SD_ILS:291660 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;El-Reedy, Mohamed Abdallah.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439874172">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronic thin-film reliability ent://SD_ILS/0/SD_ILS:278156 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Tu, K. N. (King-Ning), 1937-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:285664 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Brown, Richard E., 1969-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780849375682">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability-based Structural Design ent://SD_ILS/0/SD_ILS:175421 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Choi, Seung-Kyum. author.&#160;Canfield, Robert A. author.&#160;Grandhi, Ramana V. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Six Sigma ent://SD_ILS/0/SD_ILS:165709 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Kumar, U Dinesh. author.&#160;Crocker, John. author.&#160;Chitra, T. author.&#160;Saranga, Haritha. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:287445 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Brown, Richard E., 1969-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780824744281">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lubrication and reliability handbook ent://SD_ILS/0/SD_ILS:256333 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Neale, M. J. (Michael John)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fatigue design and reliability ent://SD_ILS/0/SD_ILS:254466 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)&#160;Marquis, G. (Gary)&#160;Solin, J.&#160;European Structural Integrity Society.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of reliability engineering ent://SD_ILS/0/SD_ILS:295100 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Ushakov, I. A. 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A. (Tom A.), 1966-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420036480">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintainability, maintenance, and reliability for engineers ent://SD_ILS/0/SD_ILS:285711 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420006780">Distributed by publisher. 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(Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203006139">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Case studies in reliability and maintenance ent://SD_ILS/0/SD_ILS:300226 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. 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S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420042238">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability modelling : A statistical approach ent://SD_ILS/0/SD_ILS:78139 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Wolstenholme, Linda C.<br/>Preferred Shelf Number&#160;TA 169 W65 1999<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Design reliability fundamentals and applications ent://SD_ILS/0/SD_ILS:284992 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420050141">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical methods for reliability data ent://SD_ILS/0/SD_ILS:85080 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Meeker, William Q.&#160;Escobar, Luis A., ort. yaz.<br/>Preferred Shelf Number&#160;TS 173 M44 1998<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Probability, statistics, reliability for engineers ent://SD_ILS/0/SD_ILS:75189 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Ayyub, Bilal M.&#160;McCuen, Richard H., 1941-<br/>Preferred Shelf Number&#160;TA 330 A99 1997<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Semiconductor memories technology, testing, and reliability ent://SD_ILS/0/SD_ILS:249739 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Sharma, Ashok K.&#160;IEEE Solid-State Circuits Council.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> An elementary guide to reliability ent://SD_ILS/0/SD_ILS:254325 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Dummer, G. W. A. (Geoffrey William Arnold)&#160;Tooley, Michael H.&#160;Winton, R. C.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> New trends in system reliability evaluation ent://SD_ILS/0/SD_ILS:255243 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Misra, Krishna B., 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> An elementary guide to reliability ent://SD_ILS/0/SD_ILS:48244 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Dummer, Geoffrey William Arnold.&#160;Winton, R. C., ort. yaz.<br/>Preferred Shelf Number&#160;TS 173 D85 1990<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> A Primer of reliability theory ent://SD_ILS/0/SD_ILS:47610 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Grosh, Doris Lloyd.<br/>Preferred Shelf Number&#160;TA 169 G76 1989<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Software engineering : design, reliability and management ent://SD_ILS/0/SD_ILS:32561 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Shooman, Martin L.<br/>Preferred Shelf Number&#160;QA 76.9.S88 S56 1983<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Reliability in the acquisitions process ent://SD_ILS/0/SD_ILS:47612 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;DePriest, D. J., ed. by&#160;Launer, R. L., ed. by<br/>Preferred Shelf Number&#160;TA 169 R44 1983<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Life testing and reliability estimation ent://SD_ILS/0/SD_ILS:35481 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Sinha, S. K.&#160;Kale, B. K., ort. yaz.<br/>Preferred Shelf Number&#160;QA 273 S64 1980<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Durability and reliability in engineering desing ent://SD_ILS/0/SD_ILS:48245 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Kivenson, Gilbert.<br/>Preferred Shelf Number&#160;TS 173 K57 1971<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Mathematical methods of reliability theory ent://SD_ILS/0/SD_ILS:47645 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Gnedenko, Boris Vladimirovich, 1912-&#160;Belyayev, Yu. K., ort. yaz.&#160;Solovyev, A. D., ort. yaz.<br/>Preferred Shelf Number&#160;TA 340 G5513 1969<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~2<br/> Stochastic Processes with Applications to Reliability Theory ent://SD_ILS/0/SD_ILS:168475 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Failure Rate Modelling for Reliability and Risk ent://SD_ILS/0/SD_ILS:175868 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Finkelstein, Maxim. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Shock and Damage Models in Reliability Theory ent://SD_ILS/0/SD_ILS:175420 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Human Reliability and Error in Transportation Systems ent://SD_ILS/0/SD_ILS:175578 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Dhillon, B. S. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Human reliability and error in transportation systems ent://SD_ILS/0/SD_ILS:271334 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Dhillon, B. S.<br/>Preferred Shelf Number&#160;TA1145 D45 2007<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> IEEE Transactions on device and materials reliability. ent://SD_ILS/0/SD_ILS:226837 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Preferred Shelf Number&#160;ALFABET&#304;K V.3 2003<br/>Format:&#160;Continuing Resources&#160;Other<br/>Availability&#160;Beytepe Library~1&#160;~0<br/> Advances in safety, reliability and risk management ent://SD_ILS/0/SD_ILS:342790 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;European Safety and Reliability Conference (2011 : Troyes, France)&#160;Berenguer, Christophe.&#160;Grall, Antoine.&#160;Soares, C. Guedes.<br/>Preferred Shelf Number&#160;ONLINE(342790.1)<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203135105">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety, reliability and risks associated with water, oil and gas pipelines : [proceedings of the NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines, Alexandria, Egypt, 4-8 February 2007] ent://SD_ILS/0/SD_ILS:113617 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines (2007 : Alexandria, Egypt)&#160;Elwany, Mohamed Hamdy.&#160;Pluvinage, Guy.<br/>Preferred Shelf Number&#160;TJ930 .N386 2008<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Safety-Critical Electrical Drives Topologies, Reliability, Performance ent://SD_ILS/0/SD_ILS:401112 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Bolvashenkov, Igor. author.&#160;Herzog, Hans-Georg. author.&#160;Frenkel, Ilia. author.&#160;Khvatskin, Lev. author.&#160;Lisnianski, Anatoly. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-89969-5">https://doi.org/10.1007/978-3-319-89969-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solid State Lighting Reliability Components to Systems ent://SD_ILS/0/SD_ILS:331314 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;van Driel, W.D. editor.&#160;Fan, X.J. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331314.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Offshore Wind Turbines Reliability, availability and maintenance ent://SD_ILS/0/SD_ILS:247956 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Tavner, Peter<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBRN013E">http://dx.doi.org/10.1049/PBRN013E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Telecommunications system reliability engineering, theory, and practice ent://SD_ILS/0/SD_ILS:249397 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Ayers, Mark L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lead-free solders materials reliability for electronics ent://SD_ILS/0/SD_ILS:305591 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Subramaniam, K. N., Ph. D.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119966203">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Compressors how to achieve high reliability &amp; availability ent://SD_ILS/0/SD_ILS:293579 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Bloch, Heinz P., 1933-&#160;Geitner, Fred K.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/compressors-how-to-achieve-high-reliability-availability">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Process plant equipment operation, control, and reliability ent://SD_ILS/0/SD_ILS:299085 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Holloway, Michael D., 1963-&#160;Nwaoha, Chikezie, 1984-&#160;Onyewuenyi, Oliver A., 1952-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118162569">http://onlinelibrary.wiley.com/book/10.1002/9781118162569</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118162569">http://dx.doi.org/10.1002/9781118162569</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of Microtechnology Interconnects, Devices and Systems ent://SD_ILS/0/SD_ILS:172420 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Liu, Johan. author.&#160;Salmela, Olli. author.&#160;Sarkka, Jussi. author.&#160;Morris, James E. author.&#160;Tegehall, Per-Erik. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability centered maintenance (RCM) implementation made simple ent://SD_ILS/0/SD_ILS:293571 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Bloom, Neil.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/reliability-centered-maintenance-rcm">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Hydrosystems engineering reliability assessment and risk analysis ent://SD_ILS/0/SD_ILS:293215 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Tung, Yeou-Koung.&#160;Yen, Ben Chie, 1935-&#160;Melching, Charles S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolution ent://SD_ILS/0/SD_ILS:191769 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Levi, Paul. author.&#160;Kernbach, Serge. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-11692-6">http://dx.doi.org/10.1007/978-3-642-11692-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solder Joint Reliability Prediction for Multiple Environments ent://SD_ILS/0/SD_ILS:167673 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Perkins, Andrew E. author.&#160;Sitaraman, Suresh K. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability wearout mechanisms in advanced CMOS technologies ent://SD_ILS/0/SD_ILS:249574 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> VoIP handbook applications, technologies, reliability, and security ent://SD_ILS/0/SD_ILS:289675 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Ahson, Syed.&#160;Ilyas, Mohammad, 1953-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420070217">Distributed by publisher. 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Proceedings ent://SD_ILS/0/SD_ILS:482801 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Bondavalli, Andrea. editor.&#160;Di Giandomenico, Felicita. editor. (orcid)0000-0002-8760-7299&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-10506-2">https://doi.org/10.1007/978-3-319-10506-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2014 Workshops: ASCoMS, DECSoS, DEVVARTS, ISSE, ReSA4CI, SASSUR. Florence, Italy, September 8-9, 2014, Proceedings ent://SD_ILS/0/SD_ILS:485676 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Bondavalli, Andrea. editor.&#160;Ceccarelli, Andrea. editor.&#160;Ortmeier, Frank. editor. 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Proceedings ent://SD_ILS/0/SD_ILS:334958 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Cuzzocrea, Alfredo. editor.&#160;Kittl, Christian. editor.&#160;Simos, Dimitris E. editor.&#160;Weippl, Edgar. editor.&#160;Xu, Lida. editor.<br/>Preferred Shelf Number&#160;ONLINE(334958.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples ent://SD_ILS/0/SD_ILS:365001 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Taylor, Zachary, 1959-&#160;Ranganathan, Subramanyam.&#160;IEEE Xplore (Online Service), distributor.&#160;Wiley, publisher.<br/>Preferred Shelf Number&#160;ONLINE(365001.1)<br/>Electronic Access&#160;Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic Orders in Reliability and Risk In Honor of Professor Moshe Shaked ent://SD_ILS/0/SD_ILS:332149 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Li, Haijun. editor.&#160;Li, Xiaohu. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332149.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-6892-9">http://dx.doi.org/10.1007/978-1-4614-6892-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:332682 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;McPherson, J. 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Proceedings ent://SD_ILS/0/SD_ILS:197419 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Ortmeier, Frank. editor.&#160;Daniel, Peter. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33675-1">http://dx.doi.org/10.1007/978-3-642-33675-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 31st International Conference, SAFECOMP 2012, Magdeburg, Germany, September 25-28, 2012. Proceedings ent://SD_ILS/0/SD_ILS:197420 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Ortmeier, Frank. editor.&#160;Daniel, Peter. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33678-2">http://dx.doi.org/10.1007/978-3-642-33678-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Non-Destructive Assessment of Concrete Structures: Reliability and Limits of Single and Combined Techniques State-of-the-Art Report of the RILEM Technical Committee 207-INR ent://SD_ILS/0/SD_ILS:206444 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Breysse, Denys. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-2736-6">http://dx.doi.org/10.1007/978-94-007-2736-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems ent://SD_ILS/0/SD_ILS:305462 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Bauer, Eric.&#160;Adams, Randee.&#160;Eustace, Dan.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119941378">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric utility resource planning economics, reliability, and decision-making ent://SD_ILS/0/SD_ILS:290780 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Sim, Steven.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439884096">Distributed by publisher. 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Proceedings ent://SD_ILS/0/SD_ILS:195302 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Tjoa, A Min. editor.&#160;Quirchmayr, Gerald. editor.&#160;You, Ilsun. editor.&#160;Xu, Lida. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-23300-5">http://dx.doi.org/10.1007/978-3-642-23300-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Safety, Reliability, and Security 30th International Conference,SAFECOMP 2011, Naples, Italy, September 19-22, 2011. Proceedings ent://SD_ILS/0/SD_ILS:195586 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Flammini, Francesco. editor.&#160;Bologna, Sandro. editor.&#160;Vittorini, Valeria. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-24270-0">http://dx.doi.org/10.1007/978-3-642-24270-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability in Scientific Research Improving the Dependability of Measurements, Calculations, Equipment, and Software ent://SD_ILS/0/SD_ILS:237354 2024-11-23T17:11:06Z 2024-11-23T17:11:06Z Author&#160;Walker, I. 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