Search Results for Reliability.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026ps$003d300$0026isd$003dtrue?dt=list
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Reliability
ent://SD_ILS/0/SD_ILS:233427
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Author Meyer, J. Patrick.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Structural reliability
ent://SD_ILS/0/SD_ILS:297978
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Author Lemaire, Maurice. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering
ent://SD_ILS/0/SD_ILS:601914
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Author Sun, Youchao. author. Li, Longbiao. author. (orcid)0000-0002-7689-2098 Tiniakov, Dmytro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-5978-5">https://doi.org/10.1007/978-981-99-5978-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability engineering
ent://SD_ILS/0/SD_ILS:596162
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Author Elsayed, Elsayed A., author.<br/>Preferred Shelf Number TA169 .E52 2021<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665946">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665946</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability engineering
ent://SD_ILS/0/SD_ILS:341870
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Author Kapur, Kailash C., 1941- author. Pecht, Michael, author.<br/>Preferred Shelf Number ONLINE(341870.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a>
MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a>
Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied reliability
ent://SD_ILS/0/SD_ILS:364907
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Author Tobias, Paul A. Trindade, David C.<br/>Preferred Shelf Number TA169 T63 2012<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
MEMS Reliability
ent://SD_ILS/0/SD_ILS:172486
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Author Hartzell, Allyson L. author. da Silva, Mark G. author. Shea, Herbert R. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Bayesian Reliability
ent://SD_ILS/0/SD_ILS:167542
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Author Hamada, Michael S. author. Wilson, Alyson G. author. Reese, C. Shane. author. Martz, Harry F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability fundamentals
ent://SD_ILS/0/SD_ILS:255215
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Author Cătuneanu, Vasile M. Mihalache, Adrian.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Ensuring software reliability
ent://SD_ILS/0/SD_ILS:542468
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Author Neufelder, Ann Marie, 1960- author.<br/>Preferred Shelf Number QA76.76 .R44 N48 1992<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439832752">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
System Software Reliability
ent://SD_ILS/0/SD_ILS:175367
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Author Pham, Hoang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design for reliability
ent://SD_ILS/0/SD_ILS:249382
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Author Raheja, Dev. Gullo, Louis J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Practical system reliability
ent://SD_ILS/0/SD_ILS:153146
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Author Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of MEMS
ent://SD_ILS/0/SD_ILS:303632
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Author Tsuchiya, Toshiyuki. Tabata, Osamu, 1956- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design for reliability
ent://SD_ILS/0/SD_ILS:543493
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Author Crow, Dana. Feinberg, Alec.<br/>Preferred Shelf Number TK7836 .D473 2001<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315220192">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Practical reliability engineering
ent://SD_ILS/0/SD_ILS:305563
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Author O'Connor, Patrick P. Kleyner, Andre. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Improving machinery reliability
ent://SD_ILS/0/SD_ILS:153828
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Author Bloch, Heinz P., 1933-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Photovoltaic module reliability
ent://SD_ILS/0/SD_ILS:595739
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Author Wohlgemuth, J. (John), 1946- author.<br/>Preferred Shelf Number TK8322<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability in pragmatics
ent://SD_ILS/0/SD_ILS:357581
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Author McCready, Eric (Eric S.), author.<br/>Preferred Shelf Number P99.4.P72 M445 2015<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Probabilistic reliability models
ent://SD_ILS/0/SD_ILS:299523
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Author Ushakov, I. A. (Igorʹ Alekseevich)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a>
Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Statistical reliability engineering
ent://SD_ILS/0/SD_ILS:295099
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Author Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Pavlov, I. V. Ushakov, I. A. (Igorʹ Alekseevich) Chakravarty, Sumantra. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probabilistic reliability engineering
ent://SD_ILS/0/SD_ILS:295101
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Author Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Ushakov, I. A. (Igorʹ Alekseevich) Falk, James. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer systems reliability.
ent://SD_ILS/0/SD_ILS:58893
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Preferred Shelf Number TK 7885 C65 1974 V.20<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Importance-Informed Reliability Engineering
ent://SD_ILS/0/SD_ILS:602938
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Author Dui, Hongyan. author. Wu, Shaomin. author. (orcid)0000-0001-9786-3213 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-52455-4">https://doi.org/10.1007/978-3-031-52455-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Optimal Maintenance
ent://SD_ILS/0/SD_ILS:175380
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Author Wang, Hongzhou. author. Pham, Hoang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Maintenance Theory of Reliability
ent://SD_ILS/0/SD_ILS:175323
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Author Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability prediction for microelectronics
ent://SD_ILS/0/SD_ILS:598968
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Author Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.<br/>Preferred Shelf Number TK7874<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Safety Engineering
ent://SD_ILS/0/SD_ILS:611385
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Author Verma, Ajit Kumar. author. Ajit, Srividya. author. Karanki, Durga Rao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4471-6269-8">https://doi.org/10.1007/978-1-4471-6269-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Safety Engineering
ent://SD_ILS/0/SD_ILS:176193
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Author Verma, Ajit Kumar. author. Srividya, Ajit. author. Karanki, Durga Rao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
IEEE Transactions on reliability.
ent://SD_ILS/0/SD_ILS:226884
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Preferred Shelf Number ALFABETİK V.12 1963<br/>Format: Continuing Resources Other<br/>Availability Beytepe Library~30 ~0<br/>
Engineering design reliability handbook
ent://SD_ILS/0/SD_ILS:544208
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Author Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren.<br/>Preferred Shelf Number TA174 .E544 2005<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135513825">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Reliability of large systems
ent://SD_ILS/0/SD_ILS:254513
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Author Kołowrocki, Krzysztof.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power-system reliability calculations
ent://SD_ILS/0/SD_ILS:220175
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Author Billinton, Roy. Ringlee, Robert J., joint author. Wood, Allen J., joint author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability theory and practice
ent://SD_ILS/0/SD_ILS:47596
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Author Bazovsky, Igor.<br/>Preferred Shelf Number TA 168 B33 1961<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Reliability engineering and services
ent://SD_ILS/0/SD_ILS:594657
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Author Jin, Tongdan, author.<br/>Preferred Shelf Number TS173 .J56 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Circuit Design for Reliability
ent://SD_ILS/0/SD_ILS:529164
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Author Reis, Ricardo. editor. Cao, Yu. editor. Wirth, Gilson. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-4078-9">https://doi.org/10.1007/978-1-4614-4078-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic Models in Reliability
ent://SD_ILS/0/SD_ILS:332363
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Author Aven, Terje. author. Jensen, Uwe. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332363.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Network Reliability and Resilience
ent://SD_ILS/0/SD_ILS:195005
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Author Gertsbakh, Ilya. author. Shpungin, Yoseph. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Life cycle reliability engineering
ent://SD_ILS/0/SD_ILS:296926
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Author Yang, Guangbin, 1964- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and validity assessment
ent://SD_ILS/0/SD_ILS:7092
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Author Carmines, Edward G.<br/>Preferred Shelf Number H 61 C26 1979<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Mathematical theory of reliability
ent://SD_ILS/0/SD_ILS:35404
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Author Barlow, Richard E. Proschan Frank. , ort. yaz.<br/>Preferred Shelf Number QA 273 B3 1965<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Applied reliability for engineers
ent://SD_ILS/0/SD_ILS:565385
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Author Dhillon, B. S. (Balbir S.), 1947- author.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003132103">https://www.taylorfrancis.com/books/9781003132103</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reinforced concrete structural reliability
ent://SD_ILS/0/SD_ILS:543776
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Author El-Reedy, Mohamed Abdallah., author.<br/>Preferred Shelf Number TA683 .E47 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439874172">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Quantile-Based Reliability Analysis
ent://SD_ILS/0/SD_ILS:330556
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Author Nair, N. Unnikrishnan. author. Sankaran, P.G. author. Balakrishnan, N. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(330556.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electronic thin-film reliability
ent://SD_ILS/0/SD_ILS:278156
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Author Tu, K. N. (King-Ning), 1937-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electric power distribution reliability
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Author Brown, Richard E., 1969, author.<br/>Preferred Shelf Number TK3091 .B76 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315222332">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Reliability-based Structural Design
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2026-03-20T12:49:26Z
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Author Choi, Seung-Kyum. author. Canfield, Robert A. author. Grandhi, Ramana V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Six Sigma
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Author Kumar, U Dinesh. author. Crocker, John. author. Chitra, T. author. Saranga, Haritha. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electric power distribution reliability
ent://SD_ILS/0/SD_ILS:539124
2026-03-20T12:49:26Z
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Author Brown, Richard E., 1969- author.<br/>Preferred Shelf Number TK3091 .B76 2002 EB<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429164682">https://www.taylorfrancis.com/books/9780429164682</a>
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Lubrication and reliability handbook
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Fatigue design and reliability
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Author International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland) Marquis, G. (Gary) Solin, J. European Structural Integrity Society.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of reliability engineering
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Introduction to reliability engineering
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Author Lewis, Elmer Eugene, 1938-<br/>Preferred Shelf Number TA 169 L47 1987<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Applications in Reliability and Statistical Computing
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Introduction to Quality and Reliability Engineering
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Innovations in Power Systems Reliability
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Applied Nonparametric Statistics in Reliability
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Author Gámiz, M. Luz. author. Kulasekera, K. B. author. Limnios, Nikolaos. author. Lindqvist, Bo Henry. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Software Reliability Assessment with OR Applications
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Fatigue and Fracture Reliability Engineering
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Product Reliability Specification and Performance
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Advanced Reliability Models and Maintenance Policies
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Mining Equipment Reliability, Maintainability, and Safety
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Predictive Analytics in System Reliability
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Biomechanics : optimization, uncertainties and reliability
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Author Kharmanda, Ghias, author. El Hami, Abdelkhalak, author.<br/>Preferred Shelf Number QH513<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119379126">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119379126</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
OSS Reliability Measurement and Assessment
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2026-03-20T12:49:26Z
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Author Yamada, Shigeru. author. Tamura, Yoshinobu. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-31818-9">https://doi.org/10.1007/978-3-319-31818-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Diagnostics and Reliability of Pipeline Systems
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Author Timashev, Sviatoslav. author. Bushinskaya, Anna. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-25307-7">https://doi.org/10.1007/978-3-319-25307-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Improving product reliability strategies and implementation
ent://SD_ILS/0/SD_ILS:295695
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Author Levin, Mark, 1959- Kalal, Ted T.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://ezproxy.lib.monash.edu.au/login?url=http://catdir.loc.gov/catdir/description/wiley039/2003045083.html">Full text available from Wiley InterScience</a>
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Reliability-based modeling of system performance
ent://SD_ILS/0/SD_ILS:598598
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author El Hami, Abdelkhalak, author. Eid, Mohamed, author.<br/>Preferred Shelf Number TA169 .H36 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394236695">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394236695</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic models in reliability engineering
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2026-03-20T12:49:26Z
Author Cui, Lirong, 1960- editor. Frenkel, Ilia, 1950- editor. Lisnianski, Anatoly, editor.<br/>Preferred Shelf Number TA169 .S759 2020 EB<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429331527">https://www.taylorfrancis.com/books/9780429331527</a>
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Design of experiments for reliability achievement
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2026-03-20T12:49:26Z
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Author Rigdon, Steven E., 1955- author. Pan, Rong (Professor of reliability engineering), author. Montgomery, Douglas C., author. Freeman, Laura June, author.<br/>Preferred Shelf Number TS173 .R54 2022<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Structural reliability in civil engineering
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Structural Reliability Analysis Analytical Methods
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2026-03-20T12:49:26Z
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Reliability of CMOS Analog ICs
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Author Kuntman, Hakan. author. Özenli, Deniz. author. (orcid)0000-0002-6381-3629 Kaçar, Fırat. author. (orcid)0000-0002-0967-914X Özçelep, Yasin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-85455-2">https://doi.org/10.1007/978-3-031-85455-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability analysis of modern power systems
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Author Saket, R. K., editor. Sanjeevikumar, Padmanaban, 1978-<br/>Preferred Shelf Number TA169 .S234 2024<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
KRIGING IN SLOPE RELIABILITY ANALYSIS
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Liu, Lei-Lei. Li, Jing-Ze. Huang, Lei.<br/>Preferred Shelf Number TN272.7<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003475156">https://www.taylorfrancis.com/books/9781003475156</a>
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Model-Based Reliability Systems Engineering
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2026-03-20T12:49:26Z
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Reliability Engineering of BeiDou Navigation Satellite
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
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Computational intelligence in sustainable reliability engineering
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2026-03-20T12:49:26Z
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Reliability analysis using MINITAB and Python
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2026-03-20T12:49:26Z
Author Hwang, Jaejin, author.<br/>Preferred Shelf Number TA169 .H93 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Philosophies of structural safety and reliability
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2026-03-20T12:49:26Z
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Author Raĭzer, V. D. (Vladimir Davidovich), author. Elishakoff, Isaac, author.<br/>Preferred Shelf Number TA656<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003265993">https://www.taylorfrancis.com/books/9781003265993</a>
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RELIABILITY ENGINEERING a life cycle approach.
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Author Bradley, Edgar.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003326489">https://www.taylorfrancis.com/books/9781003326489</a>
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Reliability modelling with information measures
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Nair, N. Unnikrishnan, 1945- author. Sunoj, S. M., 1972- author. Rajesh, G., 1971- author.<br/>Preferred Shelf Number TA169 .N3526 2022 EB<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003309635">https://www.taylorfrancis.com/books/9781003309635</a>
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Cloud reliability engineering : technologies and tools
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Raj, Pethuru, editor. Achary, Rathnakar, editor.<br/>Preferred Shelf Number QA76.585 .C568 2021<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003030973">https://www.taylorfrancis.com/books/9781003030973</a>
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The reliability of generating data
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Krippendorff, Klaus, author.<br/>Preferred Shelf Number QA76.9 .Q36<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003112020">https://www.taylorfrancis.com/books/9781003112020</a>
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Interconnection network reliability evaluation : multistage layouts
ent://SD_ILS/0/SD_ILS:596284
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Goyal, Neeraj Kumar, author. Rajkumar, S., author.<br/>Preferred Shelf Number TK5105.5 .G69 2020<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620600">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620600</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, maintainability, and safety for engineers
ent://SD_ILS/0/SD_ILS:590317
2026-03-20T12:49:26Z
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Author Dhillon, B. S., author.<br/>Preferred Shelf Number TS173<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429340574">https://www.taylorfrancis.com/books/9780429340574</a>
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Practical applications of Bayesian reliability
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Liu, Yan, author. Abeyratne, Athula I., author.<br/>Preferred Shelf Number QA279.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Aspect of Cloud Computing Environment
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Kumar, Vikas. author. Vidhyalakshmi, R. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-3023-0">https://doi.org/10.1007/978-981-13-3023-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor Power Devices Physics, Characteristics, Reliability
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-70917-8">https://doi.org/10.1007/978-3-319-70917-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
In-Service Fatigue Reliability of Structures
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Petinov, Sergei V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-89318-1">https://doi.org/10.1007/978-3-319-89318-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Structural reliability analysis and prediction
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2026-03-20T12:49:26Z
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Author Melchers, R. E. (Robert E.), 1945- author. Beck, André T., author.<br/>Preferred Shelf Number TA656.5 .M45 2018<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability prediction and testing textbook
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2026-03-20T12:49:26Z
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Author Klyatis, Lev M., author. Anderson, Edward, 1945- author.<br/>Preferred Shelf Number TA169.3 .K5964 2018<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119411949">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119411949</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality and Reliability in Analytical Chemistry.
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2026-03-20T12:49:26Z
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Author Baiulescu, George E., author.<br/>Preferred Shelf Number QD75.4 .Q34<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781420038576">https://www.taylorfrancis.com/books/e/9781420038576</a>
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Advances in Reliability and System Engineering
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2026-03-20T12:49:26Z
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Author Ram, Mangey. editor. Davim, J. Paulo. editor. (orcid)0000-0002-5659-3111 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-48875-2">https://doi.org/10.1007/978-3-319-48875-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:614253
2026-03-20T12:49:26Z
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Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-662-54209-5">https://doi.org/10.1007/978-3-662-54209-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Wire Ropes Tension, Endurance, Reliability
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Feyrer, Klaus. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-642-54996-0">https://doi.org/10.1007/978-3-642-54996-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Risk and reliability in geotechnical engineering
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2026-03-20T12:49:26Z
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Author Ching, Jianye, editor. Phoon, Kok-Kwang, editor.<br/>Preferred Shelf Number TA706 .R48 2015<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781482227222">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Ternary Networks Reliability and Monte Carlo
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Gertsbakh, Ilya. author. Shpungin, Yoseph. author. Vaisman, Radislav. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06440-6">https://doi.org/10.1007/978-3-319-06440-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:489410
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of large and complex systems
ent://SD_ILS/0/SD_ILS:355886
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Author Kołowrocki, Krzysztof, author.<br/>Preferred Shelf Number ONLINE(355886.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080999494">http://www.sciencedirect.com/science/book/9780080999494</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability models for engineers and scientists
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Author Kaminskiy, Mark, 1946, author.<br/>Preferred Shelf Number TA169 .K36 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781466565937">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Analog IC Reliability in Nanometer CMOS
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2026-03-20T12:49:26Z
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Author Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331961.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-6163-0">http://dx.doi.org/10.1007/978-1-4614-6163-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electricity infrastructure reliability and vulnerabilities
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Author Guerritore, Walter B.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer system reliability : safety and usability
ent://SD_ILS/0/SD_ILS:547174
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Dhillon, B. S., author.<br/>Preferred Shelf Number QA76.76 .R44 D495 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781466573130">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Reliability and maintenance : networks and systems
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Beichelt, Frank, 1942, author. Tittmann, Peter.<br/>Preferred Shelf Number TA169 .B45 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439826362">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Semiconductor packaging : materials interaction and reliability
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Chen, Andrea., author. Lo, Randy.<br/>Preferred Shelf Number TK7870.15 .C54 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439862070">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Lead Free Solder Mechanics and Reliability
ent://SD_ILS/0/SD_ILS:173692
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Pang, John Hock Lye. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor process reliability in practice
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
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Accelerated reliability and durability testing technology
ent://SD_ILS/0/SD_ILS:297827
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Klyatis, Lev M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
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Reliability and availability of cloud computing
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Measures of interobserver agreement and reliability
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Shoukri, M. M. (Mohamed M.), author. Shoukri, M. M. (Mohamed M.). Measures of interobserver agreement.<br/>Preferred Shelf Number RC71.3 .S478 2011<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439810811">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Transportation systems reliability and safety
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number TA1145 .D453 2011<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439846414">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Semiconductor Power Devices Physics, Characteristics, Reliability
ent://SD_ILS/0/SD_ILS:191586
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Functional Analysis Methods for Reliability Models
ent://SD_ILS/0/SD_ILS:176727
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Gupur, Geni. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-0348-0101-0">http://dx.doi.org/10.1007/978-3-0348-0101-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Multistate systems reliability theory with applications
ent://SD_ILS/0/SD_ILS:298781
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Natvig, Bent, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a>
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Human reliability assessment : theory and practice
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2026-03-20T12:49:26Z
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Author Spurgin, Anthony J., author.<br/>Preferred Shelf Number TA166 .S685 2010<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420068528">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Reliability Engineering Theory and Practice
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Safety and reliability of bridge structures
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Mahmoud, Khaled M.<br/>Preferred Shelf Number TG300 .M34 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135172435">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Mathematical models for systems reliability
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2026-03-20T12:49:26Z
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Author Epstein, Benjamin, 1918, author. Weissman, Ishay, 1940-<br/>Preferred Shelf Number TA169 .E67 2008<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420080834">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Silver Metallization Stability and Reliability
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Adams, Daniel. author. Alford, Terry L. author. Mayer, James W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Wire Ropes Tension, Endurance, Reliability
ent://SD_ILS/0/SD_ILS:183848
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Feyrer, K. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-33831-4">http://dx.doi.org/10.1007/978-3-540-33831-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:185203
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Critical Infrastructure Reliability and Vulnerability
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Murray, Alan T. editor. Grubesic, Tony H. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-68056-7">http://dx.doi.org/10.1007/978-3-540-68056-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
System reliability : concepts and applications
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Klaassen, Klaas B., 1941- Peppen, Jack C. L. van.<br/>Preferred Shelf Number QA76.5 K53 2006<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Distribution reliability and power quality
ent://SD_ILS/0/SD_ILS:543499
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Short, T. A. (Tom A.), 1966- author.<br/>Preferred Shelf Number TK3091 .S465 2006<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420036480">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Maintainability, maintenance, and reliability for engineers
ent://SD_ILS/0/SD_ILS:545920
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number TA168 .D53 2006<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420006780">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Stochastic Ageing and Dependence for Reliability
ent://SD_ILS/0/SD_ILS:166017
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Lai, Chin-Diew. author. Xie, Min. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-34232-X">http://dx.doi.org/10.1007/0-387-34232-X</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and risk a Bayesian perspective
ent://SD_ILS/0/SD_ILS:296819
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Singpurwalla, Nozer D. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Accelerated quality and reliability solutions
ent://SD_ILS/0/SD_ILS:254415
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Klyatis, Lev M. Klyatis, Eugene L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, quality, and safety for engineers
ent://SD_ILS/0/SD_ILS:547810
2026-03-20T12:49:26Z
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Author Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number TS173 .D495 2005<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135484071">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Reliability, quality, and safety for engineers
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Dhillon, B. S.<br/>Preferred Shelf Number TS173 .D45 2005<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Case studies in reliability and maintenance
ent://SD_ILS/0/SD_ILS:300226
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Blischke, W. R., 1934- Murthy, D. N. P. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a>
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Medical device reliability and associated areas
ent://SD_ILS/0/SD_ILS:540912
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number R855.3 .D47 2000<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Reliability modeling, prediction, and optimization
ent://SD_ILS/0/SD_ILS:300337
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a>
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Ceramics processing, reliability, tribology and wear.
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Müller, G. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/3527607293">http://dx.doi.org/10.1002/3527607293</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design reliability : fundamentals and applications
ent://SD_ILS/0/SD_ILS:540572
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number TA174 .D4929 1999<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a>
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Reliability modelling : A statistical approach
ent://SD_ILS/0/SD_ILS:78139
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Wolstenholme, Linda C.<br/>Preferred Shelf Number TA 169 W65 1999<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Statistical methods for reliability data
ent://SD_ILS/0/SD_ILS:85080
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Meeker, William Q. Escobar, Luis A., ort. yaz.<br/>Preferred Shelf Number TS 173 M44 1998<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Probability, statistics, reliability for engineers
ent://SD_ILS/0/SD_ILS:75189
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Ayyub, Bilal M. McCuen, Richard H., 1941-<br/>Preferred Shelf Number TA 330 A99 1997<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
An elementary guide to reliability
ent://SD_ILS/0/SD_ILS:254325
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Dummer, G. W. A. (Geoffrey William Arnold) Tooley, Michael H. Winton, R. C.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor memories technology, testing, and reliability
ent://SD_ILS/0/SD_ILS:249739
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Sharma, Ashok K. IEEE Solid-State Circuits Council.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
New trends in system reliability evaluation
ent://SD_ILS/0/SD_ILS:255243
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Misra, Krishna B., 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
An elementary guide to reliability
ent://SD_ILS/0/SD_ILS:48244
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Dummer, Geoffrey William Arnold. Winton, R. C., ort. yaz.<br/>Preferred Shelf Number TS 173 D85 1990<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
A Primer of reliability theory
ent://SD_ILS/0/SD_ILS:47610
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Grosh, Doris Lloyd.<br/>Preferred Shelf Number TA 169 G76 1989<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Reliability in the acquisitions process
ent://SD_ILS/0/SD_ILS:47612
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author DePriest, D. J., ed. by Launer, R. L., ed. by<br/>Preferred Shelf Number TA 169 R44 1983<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Software engineering : design, reliability and management
ent://SD_ILS/0/SD_ILS:32561
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Shooman, Martin L.<br/>Preferred Shelf Number QA 76.9.S88 S56 1983<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Life testing and reliability estimation
ent://SD_ILS/0/SD_ILS:35481
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Sinha, S. K. Kale, B. K., ort. yaz.<br/>Preferred Shelf Number QA 273 S64 1980<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Durability and reliability in engineering desing
ent://SD_ILS/0/SD_ILS:48245
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Kivenson, Gilbert.<br/>Preferred Shelf Number TS 173 K57 1971<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Mathematical methods of reliability theory
ent://SD_ILS/0/SD_ILS:47645
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Gnedenko, Boris Vladimirovich, 1912- Belyayev, Yu. K., ort. yaz. Solovyev, A. D., ort. yaz.<br/>Preferred Shelf Number TA 340 G5513 1969<br/>Format: Books<br/>Availability Beytepe Library~2<br/>
Safety and Reliability Methodology and Applications.
ent://SD_ILS/0/SD_ILS:545362
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Preferred Shelf Number TA169.7<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429226823">https://www.taylorfrancis.com/books/9780429226823</a>
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Interconnect Reliability in Advanced Memory Device Packaging
ent://SD_ILS/0/SD_ILS:526838
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-26708-6">https://doi.org/10.1007/978-3-031-26708-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Lead-free soldering process development and reliability
ent://SD_ILS/0/SD_ILS:595935
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Bath, Jasbir, editor.<br/>Preferred Shelf Number TK7870.15 .L434 2020<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119482093">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119482093</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality and Reliability Management and Its Applications
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Pham, Hoang. editor. (orcid)0000-0002-8019-7522 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4471-6778-5">https://doi.org/10.1007/978-1-4471-6778-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic Processes with Applications to Reliability Theory
ent://SD_ILS/0/SD_ILS:168475
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Failure Rate Modelling for Reliability and Risk
ent://SD_ILS/0/SD_ILS:175868
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Shock and Damage Models in Reliability Theory
ent://SD_ILS/0/SD_ILS:175420
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Human Reliability and Error in Transportation Systems
ent://SD_ILS/0/SD_ILS:175578
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Dhillon, B. S. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Human reliability and error in transportation systems
ent://SD_ILS/0/SD_ILS:271334
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Dhillon, B. S.<br/>Preferred Shelf Number TA1145 D45 2007<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Software reliability techniques for real-world applications
ent://SD_ILS/0/SD_ILS:598123
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Youree, Roger K., author.<br/>Preferred Shelf Number QA76.76 .R44<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119931850">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119931850</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
IEEE Transactions on device and materials reliability.
ent://SD_ILS/0/SD_ILS:226837
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Preferred Shelf Number ALFABETİK V.3 2003<br/>Format: Continuing Resources Other<br/>Availability Beytepe Library~1 ~0<br/>
Improving product reliability and software quality : strategies, tools, process and implementation
ent://SD_ILS/0/SD_ILS:595034
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Levin, Mark, 1959- author. Kalal, Ted T., author. Rodin, Jonathan, 1957- author.<br/>Preferred Shelf Number TS173 .L48 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
CMOS RF Circuit Design for Reliability and Variability
ent://SD_ILS/0/SD_ILS:617325
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Yuan, Jiann-Shiun. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-0884-9">https://doi.org/10.1007/978-981-10-0884-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Safety, reliability and risks associated with water, oil and gas pipelines : [proceedings of the NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines, Alexandria, Egypt, 4-8 February 2007]
ent://SD_ILS/0/SD_ILS:113617
2026-03-20T12:49:26Z
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Author NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines (2007 : Alexandria, Egypt) Elwany, Mohamed Hamdy. Pluvinage, Guy.<br/>Preferred Shelf Number TJ930 .N386 2008<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Reliability Engineering Data analytics, modeling, risk prediction
ent://SD_ILS/0/SD_ILS:602307
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Bracke, Stefan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-662-67446-8">https://doi.org/10.1007/978-3-662-67446-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Lifetime Reliability-aware Design of Integrated Circuits
ent://SD_ILS/0/SD_ILS:527089
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Raji, Mohsen. author. Ghavami, Behnam. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-15345-7">https://doi.org/10.1007/978-3-031-15345-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied reliability, usability, and quality for engineers
ent://SD_ILS/0/SD_ILS:579176
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Dhillon, B. S. (Balbir S.), 1947- author.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003298571">https://www.taylorfrancis.com/books/9781003298571</a>
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System Reliability and Security Techniques and Methodologies.
ent://SD_ILS/0/SD_ILS:576623
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Iqbal, Javaid. Masoodi, Faheem Syeed. Ahmad Malik, Ishfaq. Khurshid, Shozab. Saraf, Iqra.<br/>Preferred Shelf Number QA76.9 .A25<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032624983">https://www.taylorfrancis.com/books/9781032624983</a>
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Reliability and Physics-Of-Healthy in Mechatronics.
ent://SD_ILS/0/SD_ILS:598146
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author El Hami, Abdelkhalak. Delaux, David. Grzeskowiak, Henri.<br/>Preferred Shelf Number TA169 .E515 2022<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design, modeling and reliability in rotating machinery
ent://SD_ILS/0/SD_ILS:597382
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Perez, Robert X., editor.<br/>Preferred Shelf Number TJ177<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119631699">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119631699</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and safety of cable-supported bridges
ent://SD_ILS/0/SD_ILS:585766
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Lu, Naiwei, editor. Liu, Yang (Of Haerbin gong ye da xue), editor. Noori, Mohammad, editor.<br/>Preferred Shelf Number TG405<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003170594">https://www.taylorfrancis.com/books/9781003170594</a>
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Repairable systems reliability analysis : a comprehensive framework
ent://SD_ILS/0/SD_ILS:596328
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Rai, Rajiv Nandan, author. Chaturvedi, Sanjay K., author. Bolia, Nomesh, author.<br/>Preferred Shelf Number QA402 .R35 2020<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Methods for reliability improvement and risk reduction
ent://SD_ILS/0/SD_ILS:594697
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Todinov, M. T., author.<br/>Preferred Shelf Number TA169 .T649 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Safety-Critical Electrical Drives Topologies, Reliability, Performance
ent://SD_ILS/0/SD_ILS:401112
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Bolvashenkov, Igor. author. Herzog, Hans-Georg. author. Frenkel, Ilia. author. Khvatskin, Lev. author. Lisnianski, Anatoly. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-89969-5">https://doi.org/10.1007/978-3-319-89969-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Artificial neural network for software reliability prediction
ent://SD_ILS/0/SD_ILS:593854
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Bisi, Manjubala, author. Goyal, Neeraj Kumar, author.<br/>Preferred Shelf Number QA76.87<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119223931">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119223931</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power GaN Devices Materials, Applications and Reliability
ent://SD_ILS/0/SD_ILS:611788
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Meneghini, Matteo. editor. Meneghesso, Gaudenzio. editor. Zanoni, Enrico. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-43199-4">https://doi.org/10.1007/978-3-319-43199-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Risk and Reliability : Coastal and Hydraulic Engineering
ent://SD_ILS/0/SD_ILS:541176
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Reeve, Dominic, author.<br/>Preferred Shelf Number TC205 .R448 2014<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781482266351">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Solid State Lighting Reliability Components to Systems
ent://SD_ILS/0/SD_ILS:331314
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author van Driel, W.D. editor. Fan, X.J. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331314.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Process plant equipment operation, control, and reliability
ent://SD_ILS/0/SD_ILS:299085
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Holloway, Michael D., 1963- Nwaoha, Chikezie, 1984- Onyewuenyi, Oliver A., 1952-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118162569">http://onlinelibrary.wiley.com/book/10.1002/9781118162569</a>
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Lead-free solders materials reliability for electronics
ent://SD_ILS/0/SD_ILS:305591
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Subramaniam, K. N., Ph. D. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119966203">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Compressors how to achieve high reliability & availability
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Telecommunications system reliability engineering, theory, and practice
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Offshore Wind Turbines Reliability, availability and maintenance
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Hydrosystems engineering reliability assessment and risk analysis
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Author Tung, Yeou-Koung. Yen, Ben Chie, 1935- Melching, Charles S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability centered maintenance (RCM) implementation made simple
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Reliability of Microtechnology Interconnects, Devices and Systems
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Author Liu, Johan. author. Salmela, Olli. author. Sarkka, Jussi. author. Morris, James E. author. Tegehall, Per-Erik. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolution
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Author Levi, Paul. author. Kernbach, Serge. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-11692-6">http://dx.doi.org/10.1007/978-3-642-11692-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VoIP handbook : applications, technologies, reliability, and security
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Author Ahson, Syed. Ilyas, Mohammad, 1953-<br/>Preferred Shelf Number TK5105.8865 .V658 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420070217">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Solder Joint Reliability Prediction for Multiple Environments
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Author Perkins, Andrew E. author. Sitaraman, Suresh K. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability wearout mechanisms in advanced CMOS technologies
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New Computational Methods in Power System Reliability
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Rules of thumb for maintenance and reliability engineers
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Author Smith, Ricky. Mobley, R. Keith, 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
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Quality and Reliability of Large-Eddy Simulations
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Rules of thumb for maintenance and reliability engineers
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Solder Joint Technology Materials, Properties, and Reliability
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Author Tu, King-Ning. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and risk models : setting reliability requirements
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Author Todinov, M. T.<br/>Preferred Shelf Number TA169 .T65 2005<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Reliability and risk models setting reliability requirements
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Practical reliability of electronic equipment and products
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Author Hnatek, Eugene R., author.<br/>Preferred Shelf Number TK7870.23 .H53 2003<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135564438">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Managing risk and reliability of process plants
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Author Tweeddale, Mark.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677349">http://www.sciencedirect.com/science/book/9780750677349</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
High reliability magnetic devices : design and fabrication
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Author McLyman, Colonel William T., 1932, author.<br/>Preferred Shelf Number TK454.4 .M3 M35 2002<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135563738">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Cognitive reliability and error analysis method CREAM
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Author Hollnagel, Erik, 1941-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
System reliability theory models and statistical methods
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Electronics reliability and measurement technology nondestructive evaluation
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Reliability Engineering for Industrial Processes An Analytics Perspective
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Author Kapur, P. K. editor. (orcid)0000-0001-8006-5952 Pham, Hoang. editor. Singh, Gurinder. editor. (orcid)0000-0002-7827-1578 Kumar, Vivek. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-55048-5">https://doi.org/10.1007/978-3-031-55048-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Artificial Intelligence for Safety and Reliability Engineering Methods, Applications, and Challenges
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Applied OSS Reliability Assessment Modeling, AI and Tools Mathematics and AI for OSS Reliability Assessment
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Author Tamura, Yoshinobu. author. (orcid)0000-0001-7665-5765 Yamada, Shigeru. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-64803-8">https://doi.org/10.1007/978-3-031-64803-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Computational Mathematics for Industrial System Reliability and Maintainability
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Advances in Reliability and Maintainability Methods and Engineering Applications Essays in Honor of Professor Hong-Zhong Huang on his 60th Birthday
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2026-03-20T12:49:26Z
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Design of Mechanical Systems Accelerated Lifecycle Testing and Reliability
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Which-Is-Better (WIB): Problems in Reliability Theory
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2026-03-20T12:49:26Z
Author Mizutani, Satoshi. author. Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-27316-2">https://doi.org/10.1007/978-3-031-27316-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied reliability for industry. 1, Predictive reliability for the automobile, aeronautics, defense, medical, marine and space industries
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author El Hami, Abdelkhalak, editor. Delaux, David, editor. Grzeskowiak, Henri, editor.<br/>Preferred Shelf Number TA169 .A67 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability culture : how leaders build organizations that create reliable products
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Author Bahret, Adam P., 1973- author.<br/>Preferred Shelf Number TS156 .B335 2021<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119612483">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119612483</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Point Processes for Reliability Analysis Shocks and Repairable Systems
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2026-03-20T12:49:26Z
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Recent Advances in Multi-state Systems Reliability Theory and Applications
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2026-03-20T12:49:26Z
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Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practice
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
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Risk and Reliability Analysis: Theory and Applications In Honor of Prof. Armen Der Kiureghian
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2026-03-20T12:49:26Z
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Principles of Performance and Reliability Modeling and Evaluation Essays in Honor of Kishor Trivedi on his 70th Birthday
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Reliability and Life-Cycle Analysis of Deteriorating Systems
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Sánchez-Silva, Mauricio. author. (orcid)0000-0002-3626-6690 Klutke, Georgia-Ann. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-20946-3">https://doi.org/10.1007/978-3-319-20946-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Human Reliability, Error, and Human Factors in Power Generation
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2026-03-20T12:49:26Z
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Principles of Loads and Failure Mechanisms Applications in Maintenance, Reliability and Design
ent://SD_ILS/0/SD_ILS:331097
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
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The Monte Carlo Simulation Method for System Reliability and Risk Analysis
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
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Stochastic Reliability and Maintenance Modeling Essays in Honor of Professor Shunji Osaki on his 70th Birthday
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
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Stochastic Modeling for Reliability Shocks, Burn-in and Heterogeneous populations
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Finkelstein, Maxim. author. Cha, Ji Hwan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331121.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-5028-2">http://dx.doi.org/10.1007/978-1-4471-5028-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Recent Advances in System Reliability Signatures, Multi-state Systems and Statistical Inference
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2207-4">http://dx.doi.org/10.1007/978-1-4471-2207-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
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2026-03-20T12:49:26Z
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Reliability and Safety of Complex Technical Systems and Processes Modeling – Identification – Prediction - Optimization
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2026-03-20T12:49:26Z
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Reliability technology principles and practice of failure prevention in electronic systems
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Complex System Reliability Multichannel Systems with Imperfect Fault Coverage
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Simulation Methods for Reliability and Availability of Complex Systems
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Recent Advances in Reliability and Quality in Design
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Applied Reliability and Quality Fundamentals, Methods and Procedures
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The Universal Generating Function in Reliability Analysis and Optimization
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Designing faultless mechanical products based on advanced reliability analysis
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2026-03-20T12:49:26Z
Author Woo, Seongwoo, 1966- author.<br/>Preferred Shelf Number TS173<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003451471">https://www.taylorfrancis.com/books/9781003451471</a>
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System reliability analysis : transition from binary to multi-state models
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2026-03-20T12:49:26Z
Author Kumar, Akshay, editor. Ram, Mangey, editor. Gaonkar, Rajesh S. Prabhu, editor. Klochkov, Yury, editor.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003546214">https://www.taylorfrancis.com/books/9781003546214</a>
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Industrial reliability and safety engineering : applications and practices
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Applied reliability for industry. 2, Experimental reliability for the automobile, aeronautics, defense, medical, marine and space industries
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2026-03-20T12:49:26Z
Author El Hami, Abdelkhalak, editor. Delaux, David, editor. Grzeskowiak, Henri, editor.<br/>Preferred Shelf Number TA169 .A67 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied reliability for industry. 3, Operational relability for the automobile, aeronautics, defense, medical, marine and space industries
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2026-03-20T12:49:26Z
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Reliability and maintenance modeling with optimization : advances and applications
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Statistical modeling of reliability structures and industrial processes
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2026-03-20T12:49:26Z
Author Triantafyllou, Ioannis S., editor. Ram, Mangey, editor.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003203124">https://www.taylorfrancis.com/books/9781003203124</a>
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Reliability analysis, safety assessment and optimization : methods and applications in energy systems and other applications
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2026-03-20T12:49:26Z
Author Zio, Enrico, author. Li, Yan-Fu, author.<br/>Preferred Shelf Number TA169 .Z57 2022<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability of nuclear power plants : methods, data and applications
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2026-03-20T12:49:26Z
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Design of mechanical systems based on statistics : a guide to improving product reliability
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2026-03-20T12:49:26Z
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Reliability management and engineering : challenges and future trends
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2026-03-20T12:49:26Z
Author Garg, Harish, editor. Ram, Mangey, editor.<br/>Preferred Shelf Number TA169<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429268922">https://www.taylorfrancis.com/books/9780429268922</a>
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Reliability of maintained systems subjected to wear failure mechanisms : theory and applications
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Author Bayle, Franck, author.<br/>Preferred Shelf Number TA169<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fracture mechanics. 1, Analysis of reliability and quality control
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Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems
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2026-03-20T12:49:26Z
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Security and Reliability of Damaged Structures and Defective Materials
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Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines
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Author Pluvinage, Guy. editor. Elwany, Mohamed Hamdy. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-6526-2">http://dx.doi.org/10.1007/978-1-4020-6526-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Guidelines for improving plant reliability through data collection and analysis
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2026-03-20T12:49:26Z
Author American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The theory and applications of reliability with emphasis on Bayesian and nonparametric methods
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2026-03-20T12:49:26Z
Author Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Recent Advances in Reliability and Maintenance Modeling : Proceedings of the 11th Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling (APARM 2024, Nagoya, Japan, 26-30 August 2024)
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling (11th : 2024 : Nagoya, Japan). Okamura, Hiroyuki, editor. Inoue, Shinji, editor. Xiao, Xiao, editor.<br/>Preferred Shelf Number TA342<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003491309">https://www.taylorfrancis.com/books/9781003491309</a>
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Advances in product development and reliability III selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, China
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China) Gao, L., editor of compilation. Li, W. D., editor of compilation. Zhao, Y. X., editor of compilation. Li, X. Y., editor of compilation.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and optimization of structural systems : proceedings of Reliability and Optimization of Structural Systems, Tum, Munchen, Germany, 7-10 April 2010
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Reliability, risk and safety : theory and applications : proceedings of the European Safety and Reliability Conference, ESREL 2009, Prague, Czech Republic, 7-10 September 2009
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author European Safety and Reliability Conference (2009 : Prague, Czech Republic) Briš, Radim, 1957- Martorell, Sebastián. Soares, C. Guedes.<br/>Preferred Shelf Number TA169.7 .E975 2009 EB<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9780429206504">https://www.taylorfrancis.com/books/9780429206504</a>
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Safety, reliability and risk of structures, infrastructures and engineering systems proceedings of the Tenth International Conference on Structural Safety and Reliability (ICOSSAR2009), Osaka, Japan, 13-17 September 2009
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author International Conference on Structural Safety and Reliability (10th : 2009 : Osaka, Japan) CRC Press.<br/>Preferred Shelf Number TA168 .I58 2009<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781439847657">https://www.taylorfrancis.com/books/9781439847657</a>
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SYSTEM RELIABILITY, RISK, LONGEVITY, SUSTAINABILITY AND OPTIMAL DECISION MAKING ... emphasis on marine structures.
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Frangopol, Dan M. Kim, Sunyong, 1976- author.<br/>Preferred Shelf Number TC1665<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003542827">https://www.taylorfrancis.com/books/9781003542827</a>
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Availability, Reliability and Security 20th International Conference, ARES 2025, Ghent, Belgium, August 11-14, 2025, Proceedings, Part I
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Dalla Preda, Mila. editor. (orcid)0000-0003-2761-4347 Schrittwieser, Sebastian. editor. (orcid)0000-0003-2115-2022 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-032-00624-0">https://doi.org/10.1007/978-3-032-00624-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Availability, Reliability and Security 20th International Conference, ARES 2025, Ghent, Belgium, August 11-14, 2025, Proceedings, Part II
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Dalla Preda, Mila. editor. (orcid)0000-0003-2761-4347 Schrittwieser, Sebastian. editor. (orcid)0000-0003-2115-2022 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-032-00627-1">https://doi.org/10.1007/978-3-032-00627-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Empowering IoT: Reliability, Network Management, Sensing, and Probabilistic Charging in Wireless Sensor Networks A Comprehensive Guide to IoT-Based WSN Network Optimization
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2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Qaisar, Muhammad Umar Farooq. author. (orcid)0000-0002-5545-3379 Yuan, Weijie. author. Bellavista, Paolo. author. Tabassum, Hina. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-96-6079-7">https://doi.org/10.1007/978-981-96-6079-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Proceedings of the Indian Geotechnical Conference (IGC 2024), Volume 11 Foundations, Uncertainties, Risk, and Reliability in Geotechnical Engineering
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2026-03-20T12:49:26Z
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Author Dixit, Manish S. editor. Jaiswal, Sumeet S. editor. Satyam, Neelima. editor. Singh, Awadhesh P. editor. Maji, Vidya Bhushan. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-96-7795-5">https://doi.org/10.1007/978-981-96-7795-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Statistics in Transportation and Communication: Human Sustainability and Resilience in the Digital Age Selected Papers from the 24th International Multidisciplinary Conference on Reliability and Statistics in Transportation and Communication, RelStat-2024, Riga, Latvia, September 25-28, 2024
ent://SD_ILS/0/SD_ILS:608036
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Kabashkin, Igor. editor. (orcid)0000-0003-4004-6620 Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. (orcid)0000-0003-0910-591X SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-87532-8">https://doi.org/10.1007/978-3-031-87532-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Materials and Strength of Gas Turbine Parts Volume 2: Corrosion, High-Temperature Coatings, Non-Classical Strength Calculations, and Methods of Ensuring the Reliability of Gas Turbine Unit
ent://SD_ILS/0/SD_ILS:609752
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Borisovich Getsov, Leonid. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-95-0640-8">https://doi.org/10.1007/978-981-95-0640-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Availability, Reliability and Security ARES 2025 International Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part I
ent://SD_ILS/0/SD_ILS:609681
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Coppens, Bart. editor. (orcid)0000-0002-7628-9264 Volckaert, Bruno. editor. (orcid)0000-0003-0575-5894 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-032-00630-1">https://doi.org/10.1007/978-3-032-00630-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Availability, Reliability and Security ARES 2025 International Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part III
ent://SD_ILS/0/SD_ILS:609682
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Coppens, Bart. editor. (orcid)0000-0002-7628-9264 Volckaert, Bruno. editor. (orcid)0000-0003-0575-5894 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-032-00635-6">https://doi.org/10.1007/978-3-032-00635-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Availability, Reliability and Security ARES 2025 International Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part IV
ent://SD_ILS/0/SD_ILS:609683
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Coppens, Bart. editor. (orcid)0000-0002-7628-9264 Volckaert, Bruno. editor. (orcid)0000-0003-0575-5894 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-032-00639-4">https://doi.org/10.1007/978-3-032-00639-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Availability, Reliability and Security ARES 2025 EU Projects Symposium Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part I
ent://SD_ILS/0/SD_ILS:609684
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Skopik, Florian. editor. (orcid)0000-0002-1922-7892 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-032-00642-4">https://doi.org/10.1007/978-3-032-00642-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Availability, Reliability and Security ARES 2025 EU Projects Symposium Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part II
ent://SD_ILS/0/SD_ILS:609671
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Skopik, Florian. editor. (orcid)0000-0002-1922-7892 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-032-00644-8">https://doi.org/10.1007/978-3-032-00644-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Availability, Reliability and Security ARES 2025 International Workshops, Ghent, Belgium, August 11-14, 2025, Proceedings, Part II
ent://SD_ILS/0/SD_ILS:610236
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Coppens, Bart. editor. (orcid)0000-0002-7628-9264 Volckaert, Bruno. editor. (orcid)0000-0003-0575-5894 Naessens, Vincent. editor. (orcid)0000-0002-9255-4902 De Sutter, Bjorn. editor. (orcid)0000-0003-0317-2089 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-032-00633-2">https://doi.org/10.1007/978-3-032-00633-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Evaluation and Its Influence on Traffic Application Based on Mobile Phone Signaling Data
ent://SD_ILS/0/SD_ILS:606087
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Yang, Fei. author. Wang, Yanchen. author. Guo, Yudong. author. Jiang, Haihang. author. Yao, Zhenxing. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-97-7950-5">https://doi.org/10.1007/978-981-97-7950-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Long-term strength of materials : reliability assessment and lifetime prediction of engineering structures
ent://SD_ILS/0/SD_ILS:584038
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Chudnovsky, Alexander, author. Sehanobish, Kalyan, author.<br/>Preferred Shelf Number TA405<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003359845">https://www.taylorfrancis.com/books/9781003359845</a>
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The iron triangle of energy : how to improve energy cost, reliability, and emissions
ent://SD_ILS/0/SD_ILS:551570
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Miller, Ronald L., author.<br/>Preferred Shelf Number TJ163.2<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9788770046848">https://www.taylorfrancis.com/books/9788770046848</a>
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THEORY AND PRACTICE OF DECISION MAKING IN REGULATION, DIAGNOSTICS AND RELIABILITY OF MACHINES
ent://SD_ILS/0/SD_ILS:588241
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Lindstedt, Paweł. Grądzki, Rafał. Golak, Karol.<br/>Preferred Shelf Number HD30.23<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032638447">https://www.taylorfrancis.com/books/9781032638447</a>
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Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40
ent://SD_ILS/0/SD_ILS:604274
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author van Driel, Willem Dirk. editor. Pressel, Klaus. editor. Soyturk, Mujdat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-59361-1">https://doi.org/10.1007/978-3-031-59361-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Statistics in Transportation and Communication Selected Papers from the 23rd International Multidisciplinary Conference on Reliability and Statistics in Transportation and Communication: Digital Twins - From Development to Application, RelStat-2023, October 19-21, 2023, Riga, Latvia
ent://SD_ILS/0/SD_ILS:602479
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Kabashkin, Igor. editor. (orcid)0000-0003-4004-6620 Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. (orcid)0000-0003-0910-591X SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-53598-7">https://doi.org/10.1007/978-3-031-53598-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Systems 19th EAI International Conference, QShine 2023, Shenzhen, China, October 8 - 9, 2023, Proceedings, Part I
ent://SD_ILS/0/SD_ILS:604756
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Leung, Victor C.M. editor. Li, Hezhang. editor. Hu, Xiping. editor. Ning, Zhaolong. editor. (orcid)0000-0002-7870-5524 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-65126-7">https://doi.org/10.1007/978-3-031-65126-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quality, Reliability, Security and Robustness in Heterogeneous Systems 19th EAI International Conference, QShine 2023, Shenzhen, China, October 8 - 9, 2023, Proceedings, Part II
ent://SD_ILS/0/SD_ILS:604755
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Leung, Victor C.M. editor. Li, Hezhang. editor. Hu, Xiping. editor. Ning, Zhaolong. editor. (orcid)0000-0002-7870-5524 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-65123-6">https://doi.org/10.1007/978-3-031-65123-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering Technology of Digital Diagnosis and Treatment Equipment
ent://SD_ILS/0/SD_ILS:602871
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Li, Xiuqing. author. Gao, Jun. author. Li, Wen. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-5522-0">https://doi.org/10.1007/978-981-99-5522-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Internal Medicine Learning A to Z and 1, 2, 3 A High Reliability Approach to Clinical Knowledge and Standardized Testing Success
ent://SD_ILS/0/SD_ILS:603586
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Lezama, Joe. author. (orcid)0000-0002-2210-1756 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-57546-4">https://doi.org/10.1007/978-3-031-57546-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Robust Environmental Perception and Reliability Control for Intelligent Vehicles
ent://SD_ILS/0/SD_ILS:602015
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Pan, Huihui. author. Wang, Jue. author. Yu, Xinghu. author. Sun, Weichao. author. Gao, Huijun. author. (orcid)0000-0001-5554-5452<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-7790-1">https://doi.org/10.1007/978-981-99-7790-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Healthcare Industry Assessment: Analyzing Risks, Security, and Reliability
ent://SD_ILS/0/SD_ILS:604607
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Kumar, Pardeep. editor. (orcid)0000-0001-5303-7219 Singh, Prabhishek. editor. (orcid)0000-0002-9338-0932 Diwakar, Manoj. editor. Garg, Deepak. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-65434-3">https://doi.org/10.1007/978-3-031-65434-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 43rd International Conference, SAFECOMP 2024, Florence, Italy, September 18-20, 2024, Proceedings
ent://SD_ILS/0/SD_ILS:605082
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Ceccarelli, Andrea. editor. (orcid)0000-0002-2291-2428 Trapp, Mario. editor. Bondavalli, Andrea. editor. (orcid)0000-0001-7366-6530 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-68606-1">https://doi.org/10.1007/978-3-031-68606-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security. SAFECOMP 2024 Workshops DECSoS, SASSUR, TOASTS, and WAISE, Florence, Italy, September 17, 2024, Proceedings
ent://SD_ILS/0/SD_ILS:605083
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Ceccarelli, Andrea. editor. (orcid)0000-0002-2291-2428 Trapp, Mario. editor. Bondavalli, Andrea. editor. (orcid)0000-0001-7366-6530 Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Gallina, Barbara. editor. (orcid)0000-0002-6952-1053<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-68738-9">https://doi.org/10.1007/978-3-031-68738-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521134
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Bitsch, Friedemann. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability and Statistics in Transportation and Communication Selected Papers from the 22nd International Multidisciplinary Conference on Reliability and Statistics in Transportation and Communication: Artificial Intelligence in Transportation, RelStat-2022, October 20-21, 2022, Riga, Latvia
ent://SD_ILS/0/SD_ILS:527300
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-26655-3">https://doi.org/10.1007/978-3-031-26655-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022)
ent://SD_ILS/0/SD_ILS:528353
2026-03-20T12:49:26Z
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Author Senthil Kumar, C. editor. Sujatha, R. editor. Muthukumar, R. editor. Rao, K. Balaji. editor. Prakash, Raghu V. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-5049-2">https://doi.org/10.1007/978-981-99-5049-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ICPER 2020 Proceedings of the 7th International Conference on Production, Energy and Reliability
ent://SD_ILS/0/SD_ILS:527387
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Ahmad, Faiz. editor. Al-Kayiem, Hussain H. editor. King Soon, William Pao. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-19-1939-8">https://doi.org/10.1007/978-981-19-1939-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Engineering and Computational Intelligence for Complex Systems Design, Analysis and Evaluation
ent://SD_ILS/0/SD_ILS:528444
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author van Gulijk, Coen. editor. (orcid)0000-0003-4541-2693 Zaitseva, Elena. editor. Kvassay, Miroslav. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-40997-4">https://doi.org/10.1007/978-3-031-40997-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521137
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Roy, Matthieu. editor. Bitsch, Friedemann. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-40953-0">https://doi.org/10.1007/978-3-031-40953-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification 5th International Conference, RSSRail 2023, Berlin, Germany, October 10-12, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521180
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Milius, Birgit. editor. Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-43366-5">https://doi.org/10.1007/978-3-031-43366-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Intelligent Reliability and Maintainability of Energy Infrastructure Assets
ent://SD_ILS/0/SD_ILS:526952
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Li, He. author. Peng, Weiwen. author. Adumene, Sidum. author. Yazdi, Mohammad. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-29962-9">https://doi.org/10.1007/978-3-031-29962-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Performance, reliability, and availability evaluation of computational systems. Volume 2, Reliability, availability modeling, measuring, and data analysis
ent://SD_ILS/0/SD_ILS:585933
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Maciel, Paulo Romero Martins, author.<br/>Preferred Shelf Number QA76<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003306030">https://www.taylorfrancis.com/books/9781003306030</a>
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LEADERSHIP STYLES AND JOB PERFORMANCE the impact of fake leadership on organizational reliability.
ent://SD_ILS/0/SD_ILS:565979
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Bieńkowska, Agnieszka, author. Tworek, Katarzyna, author.<br/>Preferred Shelf Number HD57.7<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032664194">https://www.taylorfrancis.com/books/9781032664194</a>
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Multi-criteria decision models in software reliability : methods and applications
ent://SD_ILS/0/SD_ILS:571883
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Mishra, Ashish (Ashish Kumar), editor. Dieu Linh, Nguyen Thi, editor. Bhardwaj, Manish (Professor of computer science and engineering), editor. Pinto, Carla M. A. (Computer scientist), editor.<br/>Preferred Shelf Number QA76.76 .R44 M85 2023<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367816414">https://www.taylorfrancis.com/books/9780367816414</a>
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ELECTRIC UTILITY RESOURCE PLANNING; ECONOMICS, RELIABILITY, AND DECISION-MAKING
ent://SD_ILS/0/SD_ILS:555995
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Sim, Steven.<br/>Preferred Shelf Number TK1001<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003301509">https://www.taylorfrancis.com/books/9781003301509</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
What every engineer should know about reliability and risk analysis
ent://SD_ILS/0/SD_ILS:565637
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Modarres, M. (Mohammad), author. Groth, Katrina, author.<br/>Preferred Shelf Number TA169 .M63 2023<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003307495">https://www.taylorfrancis.com/books/9781003307495</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Modeling remaining useful life dynamics in reliability engineering
ent://SD_ILS/0/SD_ILS:579104
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Dersin, Pierre, author.<br/>Preferred Shelf Number TS173<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003250685">https://www.taylorfrancis.com/books/9781003250685</a>
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ORGANIC AND INORGANIC LIGHT EMITTING DIODES reliability issues and.
ent://SD_ILS/0/SD_ILS:553105
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Subash, T. D., editor. Ajayan, J., editor. Grabinski, Władysław, editor.<br/>Preferred Shelf Number TK7871.89 .L53<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003340577">https://www.taylorfrancis.com/books/9781003340577</a>
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Performance, reliability, and availability evaluation of computational systems. Volume 1, Performance and background
ent://SD_ILS/0/SD_ILS:585932
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Maciel, Paulo Romero Martins, author.<br/>Preferred Shelf Number QA76<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003306016">https://www.taylorfrancis.com/books/9781003306016</a>
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Advanced techniques for maintenance modeling and reliability analysis of repairable systems
ent://SD_ILS/0/SD_ILS:598651
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Sharma, Garima, author. Rai, Rajiv Nandan, author.<br/>Preferred Shelf Number TA169 .S53 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Information technology in contemporary organizations : redefining IT management for organizational reliability
ent://SD_ILS/0/SD_ILS:590844
2026-03-20T12:49:26Z
2026-03-20T12:49:26Z
Author Tworek, Katarzyna, author.<br/>Preferred Shelf Number HD30.213<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003365044">https://www.taylorfrancis.com/books/9781003365044</a>
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