Search Results for Reliability.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?2024-11-15T16:36:06ZReliabilityent://SD_ILS/0/SD_ILS:2334272024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Meyer, J. Patrick.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Structural reliabilityent://SD_ILS/0/SD_ILS:2979782024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Lemaire, Maurice. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:3418702024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Kapur, Kailash C., 1941- author. Pecht, Michael, author.<br/>Preferred Shelf Number ONLINE(341870.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a>
MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a>
Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Applied reliabilityent://SD_ILS/0/SD_ILS:3649072024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Tobias, Paul A. Trindade, David C.<br/>Preferred Shelf Number TA169 T63 2012<br/>Format: Books<br/>Availability Beytepe Library~1<br/>MEMS Reliabilityent://SD_ILS/0/SD_ILS:1724862024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Hartzell, Allyson L. author. da Silva, Mark G. author. Shea, Herbert R. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Bayesian Reliabilityent://SD_ILS/0/SD_ILS:1675422024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Hamada, Michael S. author. Wilson, Alyson G. author. Reese, C. Shane. author. Martz, Harry F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability fundamentalsent://SD_ILS/0/SD_ILS:2552152024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Cătuneanu, Vasile M. Mihalache, Adrian.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Ensuring software reliabilityent://SD_ILS/0/SD_ILS:2897932024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Neufelder, Ann Marie, 1960-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439832752">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>System Software Reliabilityent://SD_ILS/0/SD_ILS:1753672024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Pham, Hoang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:2493822024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Raheja, Dev. Gullo, Louis J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical system reliabilityent://SD_ILS/0/SD_ILS:1531462024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of MEMSent://SD_ILS/0/SD_ILS:3036322024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Tsuchiya, Toshiyuki. Tabata, Osamu, 1956- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:2858862024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Crow, Dana. Feinberg, Alec.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420040845">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical reliability engineeringent://SD_ILS/0/SD_ILS:3055632024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor O'Connor, Patrick P. Kleyner, Andre. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Improving machinery reliabilityent://SD_ILS/0/SD_ILS:1538282024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bloch, Heinz P., 1933-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability in pragmaticsent://SD_ILS/0/SD_ILS:3575812024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor McCready, Eric (Eric S.), author.<br/>Preferred Shelf Number P99.4.P72 M445 2015<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Probabilistic reliability modelsent://SD_ILS/0/SD_ILS:2995232024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Ushakov, I. A. (Igorʹ Alekseevich)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a>
Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical reliability engineeringent://SD_ILS/0/SD_ILS:2950992024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Pavlov, I. V. Ushakov, I. A. (Igorʹ Alekseevich) Chakravarty, Sumantra. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probabilistic reliability engineeringent://SD_ILS/0/SD_ILS:2951012024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Ushakov, I. A. (Igorʹ Alekseevich) Falk, James. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer systems reliability.ent://SD_ILS/0/SD_ILS:588932024-11-15T16:36:06Z2024-11-15T16:36:06ZPreferred Shelf Number TK 7885 C65 1974 V.20<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Reliability and Optimal Maintenanceent://SD_ILS/0/SD_ILS:1753802024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Wang, Hongzhou. author. Pham, Hoang. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Maintenance Theory of Reliabilityent://SD_ILS/0/SD_ILS:1753232024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Safety Engineeringent://SD_ILS/0/SD_ILS:1761932024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Verma, Ajit Kumar. author. Srividya, Ajit. author. Karanki, Durga Rao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>IEEE Transactions on reliability.ent://SD_ILS/0/SD_ILS:2268842024-11-15T16:36:06Z2024-11-15T16:36:06ZPreferred Shelf Number ALFABETİK V.12 1963<br/>Format: Continuing Resources Other<br/>Availability Beytepe Library~30 ~0<br/>Engineering design reliability handbookent://SD_ILS/0/SD_ILS:2873132024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of large systemsent://SD_ILS/0/SD_ILS:2545132024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Kołowrocki, Krzysztof.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Power-system reliability calculationsent://SD_ILS/0/SD_ILS:2201752024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Billinton, Roy. Ringlee, Robert J., joint author. Wood, Allen J., joint author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability theory and practiceent://SD_ILS/0/SD_ILS:475962024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bazovsky, Igor.<br/>Preferred Shelf Number TA 168 B33 1961<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Stochastic Models in Reliabilityent://SD_ILS/0/SD_ILS:3323632024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Aven, Terje. author. Jensen, Uwe. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332363.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Network Reliability and Resilienceent://SD_ILS/0/SD_ILS:1950052024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Gertsbakh, Ilya. author. Shpungin, Yoseph. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Life cycle reliability engineeringent://SD_ILS/0/SD_ILS:2969262024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Yang, Guangbin, 1964- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and validity assessmentent://SD_ILS/0/SD_ILS:70922024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Carmines, Edward G.<br/>Preferred Shelf Number H 61 C26 1979<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Mathematical theory of reliabilityent://SD_ILS/0/SD_ILS:354042024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Barlow, Richard E. Proschan Frank. , ort. yaz.<br/>Preferred Shelf Number QA 273 B3 1965<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Reinforced concrete structural reliabilityent://SD_ILS/0/SD_ILS:2916602024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor El-Reedy, Mohamed Abdallah.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439874172">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quantile-Based Reliability Analysisent://SD_ILS/0/SD_ILS:3305562024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Nair, N. Unnikrishnan. author. Sankaran, P.G. author. Balakrishnan, N. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(330556.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electronic thin-film reliabilityent://SD_ILS/0/SD_ILS:2781562024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Tu, K. N. (King-Ning), 1937-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electric power distribution reliabilityent://SD_ILS/0/SD_ILS:2856642024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Brown, Richard E., 1969-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780849375682">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability-based Structural Designent://SD_ILS/0/SD_ILS:1754212024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Choi, Seung-Kyum. author. Canfield, Robert A. author. Grandhi, Ramana V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Six Sigmaent://SD_ILS/0/SD_ILS:1657092024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Kumar, U Dinesh. author. Crocker, John. author. Chitra, T. author. Saranga, Haritha. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electric power distribution reliabilityent://SD_ILS/0/SD_ILS:2874452024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Brown, Richard E., 1969-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780824744281">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:2563332024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Neale, M. J. (Michael John)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fatigue design and reliabilityent://SD_ILS/0/SD_ILS:2544662024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland) Marquis, G. (Gary) Solin, J. European Structural Integrity Society.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of reliability engineeringent://SD_ILS/0/SD_ILS:2951002024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Ushakov, I. A. (Igorʹ Alekseevich) Harrison, Robert A. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Introduction to reliability engineeringent://SD_ILS/0/SD_ILS:476112024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Lewis, Elmer Eugene, 1938-<br/>Preferred Shelf Number TA 169 L47 1987<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Innovations in Power Systems Reliabilityent://SD_ILS/0/SD_ILS:1684172024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Anders, George. editor. Vaccaro, Alfredo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Applied Nonparametric Statistics in Reliabilityent://SD_ILS/0/SD_ILS:1684262024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Gámiz, M. Luz. author. Kulasekera, K. B. author. Limnios, Nikolaos. author. Lindqvist, Bo Henry. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Software Reliability Assessment with OR Applicationsent://SD_ILS/0/SD_ILS:1684542024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Kapur, P.K. author. Pham, Hoang. author. Gupta, A. author. Jha, P.C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-204-9">http://dx.doi.org/10.1007/978-0-85729-204-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fatigue and Fracture Reliability Engineeringent://SD_ILS/0/SD_ILS:1684582024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Xiong, J.J. author. Shenoi, R.A. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-218-6">http://dx.doi.org/10.1007/978-0-85729-218-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mining Equipment Reliability, Maintainability, and Safetyent://SD_ILS/0/SD_ILS:1443462024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dhillon, Balbir S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Product Reliability Specification and Performanceent://SD_ILS/0/SD_ILS:1757902024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Murthy, Dodderi Narshima Prabhakar. author. Rausand, Marvin. author. Østerås, Trond. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-271-5">http://dx.doi.org/10.1007/978-1-84800-271-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advanced Reliability Models and Maintenance Policiesent://SD_ILS/0/SD_ILS:1758002024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-294-4">http://dx.doi.org/10.1007/978-1-84800-294-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Improving product reliability strategies and implementationent://SD_ILS/0/SD_ILS:2956952024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Levin, Mark, 1959- Kalal, Ted T.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://ezproxy.lib.monash.edu.au/login?url=http://catdir.loc.gov/catdir/description/wiley039/2003045083.html">Full text available from Wiley InterScience</a>
<a href="http://ezproxy.lib.monash.edu.au/login?url=http://dx.doi.org/10.1002/0470014024">Authentication may be required</a>
John Wiley <a href="http://dx.doi.org/10.1002/0470014024">http://dx.doi.org/10.1002/0470014024</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932">http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor Power Devices Physics, Characteristics, Reliabilityent://SD_ILS/0/SD_ILS:4019062024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-70917-8">https://doi.org/10.1007/978-3-319-70917-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Aspect of Cloud Computing Environmentent://SD_ILS/0/SD_ILS:3991442024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Kumar, Vikas. author. Vidhyalakshmi, R. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-3023-0">https://doi.org/10.1007/978-981-13-3023-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>In-Service Fatigue Reliability of Structuresent://SD_ILS/0/SD_ILS:4010412024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Petinov, Sergei V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-89318-1">https://doi.org/10.1007/978-3-319-89318-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:4894102024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Ternary Networks Reliability and Monte Carloent://SD_ILS/0/SD_ILS:4855082024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Gertsbakh, Ilya. author. Shpungin, Yoseph. author. Vaisman, Radislav. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06440-6">https://doi.org/10.1007/978-3-319-06440-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of large and complex systemsent://SD_ILS/0/SD_ILS:3558862024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Kołowrocki, Krzysztof, author.<br/>Preferred Shelf Number ONLINE(355886.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080999494">http://www.sciencedirect.com/science/book/9780080999494</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electricity infrastructure reliability and vulnerabilitiesent://SD_ILS/0/SD_ILS:2810732024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Guerritore, Walter B.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer system reliability safety and usabilityent://SD_ILS/0/SD_ILS:2853902024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dhillon, B. S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781466573130">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability models for engineers and scientistsent://SD_ILS/0/SD_ILS:2900302024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Kaminskiy, Mark, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781466565937">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Analog IC Reliability in Nanometer CMOSent://SD_ILS/0/SD_ILS:3319612024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331961.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-6163-0">http://dx.doi.org/10.1007/978-1-4614-6163-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and availability of cloud computingent://SD_ILS/0/SD_ILS:2493832024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lead Free Solder Mechanics and Reliabilityent://SD_ILS/0/SD_ILS:1736922024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Pang, John Hock Lye. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0463-7">http://dx.doi.org/10.1007/978-1-4614-0463-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and maintenance networks and systemsent://SD_ILS/0/SD_ILS:2861482024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Beichelt, Frank, 1942- Tittmann, Peter.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439826362">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor packaging materials interaction and reliabilityent://SD_ILS/0/SD_ILS:2889702024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Chen, Andrea. Lo, Randy.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439862070">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor process reliability in practiceent://SD_ILS/0/SD_ILS:2934792024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Accelerated reliability and durability testing technologyent://SD_ILS/0/SD_ILS:2978272024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Klyatis, Lev M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor Power Devices Physics, Characteristics, Reliabilityent://SD_ILS/0/SD_ILS:1915862024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Functional Analysis Methods for Reliability Modelsent://SD_ILS/0/SD_ILS:1767272024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Gupur, Geni. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-0348-0101-0">http://dx.doi.org/10.1007/978-3-0348-0101-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transportation systems reliability and safetyent://SD_ILS/0/SD_ILS:2851872024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439846414">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Measures of interobserver agreement and reliabilityent://SD_ILS/0/SD_ILS:2915392024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Shoukri, M. M. (Mohamed M.) Shoukri, M. M. (Mohamed M.). Measures of interobserver agreement.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439810811">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Multistate systems reliability theory with applicationsent://SD_ILS/0/SD_ILS:2987812024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Natvig, Bent, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10469650">http://site.ebrary.com/lib/alltitles/Doc?id=10469650</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:1928242024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human reliability assessment theory and practiceent://SD_ILS/0/SD_ILS:2878182024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Spurgin, Anthony J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420068528">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety and reliability of bridge structuresent://SD_ILS/0/SD_ILS:2855522024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Mahmoud, Khaled M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203861585">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Silver Metallization Stability and Reliabilityent://SD_ILS/0/SD_ILS:1756772024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Adams, Daniel. author. Alford, Terry L. author. Mayer, James W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mathematical models for systems reliabilityent://SD_ILS/0/SD_ILS:2877842024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Epstein, Benjamin, 1918- Weissman, Ishay, 1940-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420080834">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:1852032024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Birolini, Alessandro. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Wire Ropes Tension, Endurance, Reliabilityent://SD_ILS/0/SD_ILS:1838482024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Feyrer, K. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-33831-4">http://dx.doi.org/10.1007/978-3-540-33831-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Critical Infrastructure Reliability and Vulnerabilityent://SD_ILS/0/SD_ILS:1853362024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Murray, Alan T. editor. Grubesic, Tony H. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-68056-7">http://dx.doi.org/10.1007/978-3-540-68056-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Stochastic Ageing and Dependence for Reliabilityent://SD_ILS/0/SD_ILS:1660172024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Lai, Chin-Diew. author. Xie, Min. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-34232-X">http://dx.doi.org/10.1007/0-387-34232-X</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Distribution reliability and power qualityent://SD_ILS/0/SD_ILS:2849332024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Short, T. A. (Tom A.), 1966-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420036480">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Accelerated quality and reliability solutionsent://SD_ILS/0/SD_ILS:2544152024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Klyatis, Lev M. Klyatis, Eugene L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and risk a Bayesian perspectiveent://SD_ILS/0/SD_ILS:2968192024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Singpurwalla, Nozer D. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>System reliability : concepts and applicationsent://SD_ILS/0/SD_ILS:3928252024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Klaassen, Klaas B., 1941- Peppen, Jack C. L. van.<br/>Preferred Shelf Number QA76.5 K53 2006<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Maintainability, maintenance, and reliability for engineersent://SD_ILS/0/SD_ILS:2857112024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420006780">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, quality, and safety for engineersent://SD_ILS/0/SD_ILS:1195532024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dhillon, B. S.<br/>Preferred Shelf Number TS173 .D45 2005<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Reliability, quality, and safety for engineersent://SD_ILS/0/SD_ILS:2872852024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203006139">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Case studies in reliability and maintenanceent://SD_ILS/0/SD_ILS:3002262024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Blischke, W. R., 1934- Murthy, D. N. P. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality and reliability in analytical chemistryent://SD_ILS/0/SD_ILS:2859382024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Aboul-Enein, Hassan Y. Stefan, Raluca-Ioana. Baiulescu, George.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420038576">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability modeling, prediction, and optimizationent://SD_ILS/0/SD_ILS:3003372024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Ceramics processing, reliability, tribology and wear.ent://SD_ILS/0/SD_ILS:3005922024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Müller, G. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/3527607293">http://dx.doi.org/10.1002/3527607293</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Medical device reliability and associated areasent://SD_ILS/0/SD_ILS:2859592024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420042238">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design reliability fundamentals and applicationsent://SD_ILS/0/SD_ILS:2849922024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420050141">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability modelling : A statistical approachent://SD_ILS/0/SD_ILS:781392024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Wolstenholme, Linda C.<br/>Preferred Shelf Number TA 169 W65 1999<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Statistical methods for reliability dataent://SD_ILS/0/SD_ILS:850802024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Meeker, William Q. Escobar, Luis A., ort. yaz.<br/>Preferred Shelf Number TS 173 M44 1998<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Semiconductor memories technology, testing, and reliabilityent://SD_ILS/0/SD_ILS:2497392024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Sharma, Ashok K. IEEE Solid-State Circuits Council.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>An elementary guide to reliabilityent://SD_ILS/0/SD_ILS:2543252024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dummer, G. W. A. (Geoffrey William Arnold) Tooley, Michael H. Winton, R. C.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probability, statistics, reliability for engineersent://SD_ILS/0/SD_ILS:751892024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Ayyub, Bilal M. McCuen, Richard H., 1941-<br/>Preferred Shelf Number TA 330 A99 1997<br/>Format: Books<br/>Availability Beytepe Library~1<br/>New trends in system reliability evaluationent://SD_ILS/0/SD_ILS:2552432024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Misra, Krishna B., 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>An elementary guide to reliabilityent://SD_ILS/0/SD_ILS:482442024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dummer, Geoffrey William Arnold. Winton, R. C., ort. yaz.<br/>Preferred Shelf Number TS 173 D85 1990<br/>Format: Books<br/>Availability Beytepe Library~1<br/>A Primer of reliability theoryent://SD_ILS/0/SD_ILS:476102024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Grosh, Doris Lloyd.<br/>Preferred Shelf Number TA 169 G76 1989<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Software engineering : design, reliability and managementent://SD_ILS/0/SD_ILS:325612024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Shooman, Martin L.<br/>Preferred Shelf Number QA 76.9.S88 S56 1983<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Reliability in the acquisitions processent://SD_ILS/0/SD_ILS:476122024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor DePriest, D. J., ed. by Launer, R. L., ed. by<br/>Preferred Shelf Number TA 169 R44 1983<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Life testing and reliability estimationent://SD_ILS/0/SD_ILS:354812024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Sinha, S. K. Kale, B. K., ort. yaz.<br/>Preferred Shelf Number QA 273 S64 1980<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Durability and reliability in engineering desingent://SD_ILS/0/SD_ILS:482452024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Kivenson, Gilbert.<br/>Preferred Shelf Number TS 173 K57 1971<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Mathematical methods of reliability theoryent://SD_ILS/0/SD_ILS:476452024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Gnedenko, Boris Vladimirovich, 1912- Belyayev, Yu. K., ort. yaz. Solovyev, A. D., ort. yaz.<br/>Preferred Shelf Number TA 340 G5513 1969<br/>Format: Books<br/>Availability Beytepe Library~2<br/>Stochastic Processes with Applications to Reliability Theoryent://SD_ILS/0/SD_ILS:1684752024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Failure Rate Modelling for Reliability and Riskent://SD_ILS/0/SD_ILS:1758682024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human reliability and error in transportation systemsent://SD_ILS/0/SD_ILS:2713342024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dhillon, B. S.<br/>Preferred Shelf Number TA1145 D45 2007<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Shock and Damage Models in Reliability Theoryent://SD_ILS/0/SD_ILS:1754202024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human Reliability and Error in Transportation Systemsent://SD_ILS/0/SD_ILS:1755782024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dhillon, B. S. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>IEEE Transactions on device and materials reliability.ent://SD_ILS/0/SD_ILS:2268372024-11-15T16:36:06Z2024-11-15T16:36:06ZPreferred Shelf Number ALFABETİK V.3 2003<br/>Format: Continuing Resources Other<br/>Availability Beytepe Library~1 ~0<br/>Advances in safety, reliability and risk managementent://SD_ILS/0/SD_ILS:3427902024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor European Safety and Reliability Conference (2011 : Troyes, France) Berenguer, Christophe. Grall, Antoine. Soares, C. Guedes.<br/>Preferred Shelf Number ONLINE(342790.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203135105">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety, reliability and risks associated with water, oil and gas pipelines : [proceedings of the NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines, Alexandria, Egypt, 4-8 February 2007]ent://SD_ILS/0/SD_ILS:1136172024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines (2007 : Alexandria, Egypt) Elwany, Mohamed Hamdy. Pluvinage, Guy.<br/>Preferred Shelf Number TJ930 .N386 2008<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Safety-Critical Electrical Drives Topologies, Reliability, Performanceent://SD_ILS/0/SD_ILS:4011122024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bolvashenkov, Igor. author. Herzog, Hans-Georg. author. Frenkel, Ilia. author. Khvatskin, Lev. author. Lisnianski, Anatoly. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-89969-5">https://doi.org/10.1007/978-3-319-89969-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Solid State Lighting Reliability Components to Systemsent://SD_ILS/0/SD_ILS:3313142024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor van Driel, W.D. editor. Fan, X.J. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331314.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Compressors how to achieve high reliability & availabilityent://SD_ILS/0/SD_ILS:2935792024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bloch, Heinz P., 1933- Geitner, Fred K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/compressors-how-to-achieve-high-reliability-availability">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Process plant equipment operation, control, and reliabilityent://SD_ILS/0/SD_ILS:2990852024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Holloway, Michael D., 1963- Nwaoha, Chikezie, 1984- Onyewuenyi, Oliver A., 1952-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118162569">http://onlinelibrary.wiley.com/book/10.1002/9781118162569</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118162569">http://dx.doi.org/10.1002/9781118162569</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Offshore Wind Turbines Reliability, availability and maintenanceent://SD_ILS/0/SD_ILS:2479562024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Tavner, Peter<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBRN013E">http://dx.doi.org/10.1049/PBRN013E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Telecommunications system reliability engineering, theory, and practiceent://SD_ILS/0/SD_ILS:2493972024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Ayers, Mark L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lead-free solders materials reliability for electronicsent://SD_ILS/0/SD_ILS:3055912024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Subramaniam, K. N., Ph. D. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119966203">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of Microtechnology Interconnects, Devices and Systemsent://SD_ILS/0/SD_ILS:1724202024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Liu, Johan. author. Salmela, Olli. author. Sarkka, Jussi. author. Morris, James E. author. Tegehall, Per-Erik. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability centered maintenance (RCM) implementation made simpleent://SD_ILS/0/SD_ILS:2935712024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bloom, Neil.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/reliability-centered-maintenance-rcm">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Hydrosystems engineering reliability assessment and risk analysisent://SD_ILS/0/SD_ILS:2932152024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Tung, Yeou-Koung. Yen, Ben Chie, 1935- Melching, Charles S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolutionent://SD_ILS/0/SD_ILS:1917692024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Levi, Paul. author. Kernbach, Serge. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-11692-6">http://dx.doi.org/10.1007/978-3-642-11692-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Solder Joint Reliability Prediction for Multiple Environmentsent://SD_ILS/0/SD_ILS:1676732024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Perkins, Andrew E. author. Sitaraman, Suresh K. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability wearout mechanisms in advanced CMOS technologiesent://SD_ILS/0/SD_ILS:2495742024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VoIP handbook applications, technologies, reliability, and securityent://SD_ILS/0/SD_ILS:2896752024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Ahson, Syed. Ilyas, Mohammad, 1953-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420070217">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality and Reliability of Large-Eddy Simulationsent://SD_ILS/0/SD_ILS:1702302024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Meyers, Johan. editor. Geurts, Bernard J. editor. Sagaut, Pierre. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8578-9">http://dx.doi.org/10.1007/978-1-4020-8578-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Emerging Nanotechnologies Test, Defect Tolerance, and Reliabilityent://SD_ILS/0/SD_ILS:1672042024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>New Computational Methods in Power System Reliabilityent://SD_ILS/0/SD_ILS:1879832024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Elmakias, David. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-77812-7">http://dx.doi.org/10.1007/978-3-540-77812-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Rules of thumb for maintenance and reliability engineersent://SD_ILS/0/SD_ILS:3065172024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Smith, Ricky. Mobley, R. Keith, 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Rules of thumb for maintenance and reliability engineersent://SD_ILS/0/SD_ILS:1491512024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Smith, Ricky. Mobley, R. Keith, 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Solder Joint Technology Materials, Properties, and Reliabilityent://SD_ILS/0/SD_ILS:1662522024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Tu, King-Ning. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and risk models : setting reliability requirementsent://SD_ILS/0/SD_ILS:1194812024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Todinov, M. T.<br/>Preferred Shelf Number TA169 .T65 2005<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Reliability and risk models setting reliability requirementsent://SD_ILS/0/SD_ILS:2959002024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Todinov, M. T. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Managing risk and reliability of process plantsent://SD_ILS/0/SD_ILS:2547212024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Tweeddale, Mark.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677349">http://www.sciencedirect.com/science/book/9780750677349</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical reliability of electronic equipment and productsent://SD_ILS/0/SD_ILS:2883622024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Hnatek, Eugene R.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203909089">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>High reliability magnetic devices design and fabricationent://SD_ILS/0/SD_ILS:2845752024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor McLyman, Colonel William T., 1932-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203910689">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Cognitive reliability and error analysis method CREAMent://SD_ILS/0/SD_ILS:2544332024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Hollnagel, Erik, 1941-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>System reliability theory models and statistical methodsent://SD_ILS/0/SD_ILS:2952702024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Høyland, Arnljot, 1924- Rausand, Marvin.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316900">http://dx.doi.org/10.1002/9780470316900</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html">http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/30072858.html">http://catalog.hathitrust.org/api/volumes/oclc/30072858.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electronics reliability and measurement technology nondestructive evaluationent://SD_ILS/0/SD_ILS:2541512024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Heyman, Joseph S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Recent Advances in Multi-state Systems Reliability Theory and Applicationsent://SD_ILS/0/SD_ILS:4010982024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. Karagrigoriou, Alex. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-63423-4">https://doi.org/10.1007/978-3-319-63423-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practiceent://SD_ILS/0/SD_ILS:4018452024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor De Felice, Fabio. editor. Petrillo, Antonella. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-62319-1">https://doi.org/10.1007/978-3-319-62319-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Point Processes for Reliability Analysis Shocks and Repairable Systemsent://SD_ILS/0/SD_ILS:4023922024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Cha, Ji Hwan. author. Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-73540-5">https://doi.org/10.1007/978-3-319-73540-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human Reliability, Error, and Human Factors in Power Generationent://SD_ILS/0/SD_ILS:4876432024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dhillon, B. S. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-04019-6">https://doi.org/10.1007/978-3-319-04019-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Monte Carlo Simulation Method for System Reliability and Risk Analysisent://SD_ILS/0/SD_ILS:3310172024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Zio, Enrico. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331017.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4588-2">http://dx.doi.org/10.1007/978-1-4471-4588-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Principles of Loads and Failure Mechanisms Applications in Maintenance, Reliability and Designent://SD_ILS/0/SD_ILS:3310972024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Tinga, T. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331097.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4917-0">http://dx.doi.org/10.1007/978-1-4471-4917-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Stochastic Reliability and Maintenance Modeling Essays in Honor of Professor Shunji Osaki on his 70th Birthdayent://SD_ILS/0/SD_ILS:3311092024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dohi, Tadashi. editor. Nakagawa, Toshio. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331109.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4971-2">http://dx.doi.org/10.1007/978-1-4471-4971-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Stochastic Modeling for Reliability Shocks, Burn-in and Heterogeneous populationsent://SD_ILS/0/SD_ILS:3311212024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Finkelstein, Maxim. author. Cha, Ji Hwan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331121.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-5028-2">http://dx.doi.org/10.1007/978-1-4471-5028-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Recent Advances in System Reliability Signatures, Multi-state Systems and Statistical Inferenceent://SD_ILS/0/SD_ILS:1733902024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2207-4">http://dx.doi.org/10.1007/978-1-4471-2207-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Applications of Finite Element Methods for Reliability Studies on ULSI Interconnectionsent://SD_ILS/0/SD_ILS:1684862024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Safety of Complex Technical Systems and Processes Modeling – Identification – Prediction - Optimizationent://SD_ILS/0/SD_ILS:1685712024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Kołowrocki, Krzysztof. author. Soszyńska-Budny, Joanna. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-694-8">http://dx.doi.org/10.1007/978-0-85729-694-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability technology principles and practice of failure prevention in electronic systemsent://SD_ILS/0/SD_ILS:2988172024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Pascoe, Norman.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://proquest.safaribooksonline.com/?fpi=9781119991366">Available by subscription from Safari Books Online</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470980101">http://dx.doi.org/10.1002/9780470980101</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470980101">http://onlinelibrary.wiley.com/book/10.1002/9780470980101</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41740">http://www.books24x7.com/marc.asp?bookid=41740</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Simulation Methods for Reliability and Availability of Complex Systemsent://SD_ILS/0/SD_ILS:1759232024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Faulin, Javier. editor. Juan, Angel A. editor. Martorell, Sebastián. editor. Ramírez-Márquez, José-Emmanuel. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84882-213-9">http://dx.doi.org/10.1007/978-1-84882-213-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Complex System Reliability Multichannel Systems with Imperfect Fault Coverageent://SD_ILS/0/SD_ILS:1762442024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Myers, Albert. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-414-2">http://dx.doi.org/10.1007/978-1-84996-414-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Recent Advances in Reliability and Quality in Designent://SD_ILS/0/SD_ILS:1757162024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Pham, Hoang. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-113-8">http://dx.doi.org/10.1007/978-1-84800-113-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Applied Reliability and Quality Fundamentals, Methods and Proceduresent://SD_ILS/0/SD_ILS:1754432024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dhillon, B. S. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-498-4">http://dx.doi.org/10.1007/978-1-84628-498-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Universal Generating Function in Reliability Analysis and Optimizationent://SD_ILS/0/SD_ILS:1753372024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Levitin, Gregory. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-245-4">http://dx.doi.org/10.1007/1-84628-245-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fracture mechanics. 1, Analysis of reliability and quality controlent://SD_ILS/0/SD_ILS:3054242024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Grous, Ammar, author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a>
Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Security and Reliability of Damaged Structures and Defective Materialsent://SD_ILS/0/SD_ILS:2048892024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Pluvinage, Guy. editor. Sedmak, Aleksandar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-2792-4">http://dx.doi.org/10.1007/978-90-481-2792-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systemsent://SD_ILS/0/SD_ILS:1758392024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Seong, Poong Hyun. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-384-2">http://dx.doi.org/10.1007/978-1-84800-384-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelinesent://SD_ILS/0/SD_ILS:1698422024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Pluvinage, Guy. editor. Elwany, Mohamed Hamdy. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-6526-2">http://dx.doi.org/10.1007/978-1-4020-6526-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Guidelines for improving plant reliability through data collection and analysisent://SD_ILS/0/SD_ILS:3000222024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety and reliability : methodology and applications : proceedings of the European Safety and Reliability Conference, Esrel 2014, Wroc¿̐ưaw, Poland, 14-18 September 2014ent://SD_ILS/0/SD_ILS:3569842024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor European Safety and Reliability Conference (2014 : Wroc¿̐ưaw, Poland) Nowakowski, Tomasz, editor.<br/>Preferred Shelf Number ONLINE(356984.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781315736976">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety, reliability, risk and life-cycle performance of structures and infrastructures : proceedings of the 11th International Conference on Structural Safety and Reliability, New York, USA, 16-20 June 2013ent://SD_ILS/0/SD_ILS:3569192024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor International Conference on Structural Safety and Reliability (11th : 2013 : New York). Sponsor. Deodatis, G. (George), editor. Ellingwood, Bruce R., editor. Frangopol, Dan M., editor.<br/>Preferred Shelf Number ONLINE(356919.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781315884882">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in product development and reliability III selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, Chinaent://SD_ILS/0/SD_ILS:2796202024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China) Gao, L., editor of compilation. Li, W. D., editor of compilation. Zhao, Y. X., editor of compilation. Li, X. Y., editor of compilation.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, risk, and safety theory and applications : proceedings of the European Safety and Reliability Conference, ESREL 2009 : Prague, Czech Republic, 7-19 September 2009ent://SD_ILS/0/SD_ILS:2883172024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor European Safety and Reliability Conference (2009 : Prague, Czech Republic) Bri?, Radim. Soares, C. Guedes. Martorell, Sebastiǹ.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203859759">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and optimization of structural systems proceedings of Reliability and Optimization of Structural Systems, Tum, M¿nchen, Germany, 7-10 April 2010ent://SD_ILS/0/SD_ILS:2892422024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Reliability and Optimization of Structural Systems (2010 : Tum, M¿nchen, Germany) Straub, D.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203841419">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety, reliability and risk of structures, infrastructures and engineering systems proceedings of the Tenth International Conference on Structural Safety and Reliability (ICOSSAR2009), Osaka, Japan, 13-17 September 2009ent://SD_ILS/0/SD_ILS:2888582024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor International Conference on Structural Safety and Reliability (10th : 2009 : Osaka, Japan) Furuta, Hitoshi. Frangopol, Dan M. Shinozuka, Masanobu. Hirokane, Michiyuki.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439847657">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211342024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Bitsch, Friedemann. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(521134.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211372024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Roy, Matthieu. editor. Bitsch, Friedemann. editor.<br/>Preferred Shelf Number XX(521137.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-40953-0">https://doi.org/10.1007/978-3-031-40953-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification 5th International Conference, RSSRail 2023, Berlin, Germany, October 10-12, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211802024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Milius, Birgit. editor. Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(521180.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-43366-5">https://doi.org/10.1007/978-3-031-43366-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Physics and Engineering Time-To-Failure Modelingent://SD_ILS/0/SD_ILS:4829352024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security SAFECOMP 2019 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Turku, Finland, September 10, 2019, Proceedingsent://SD_ILS/0/SD_ILS:4848672024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 Troubitsyna, Elena. editor. Gashi, Ilir. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-26250-1">https://doi.org/10.1007/978-3-030-26250-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality, Reliability, Security and Robustness in Heterogeneous Systems 14th EAI International Conference, Qshine 2018, Ho Chi Minh City, Vietnam, December 3–4, 2018, Proceedingsent://SD_ILS/0/SD_ILS:4869002024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Duong, Trung Q. editor. Vo, Nguyen-Son. editor. Phan, Van Ca. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-14413-5">https://doi.org/10.1007/978-3-030-14413-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of Selective Laser Melted AlSi12 Alloy for Quasistatic and Fatigue Applicationsent://SD_ILS/0/SD_ILS:4870452024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Siddique, Shafaqat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-658-23425-6">https://doi.org/10.1007/978-3-658-23425-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 38th International Conference, SAFECOMP 2019, Turku, Finland, September 11–13, 2019, Proceedingsent://SD_ILS/0/SD_ILS:4837362024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 Troubitsyna, Elena. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-26601-1">https://doi.org/10.1007/978-3-030-26601-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineeringent://SD_ILS/0/SD_ILS:4852132024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Ali, Syed Riffat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2018 International Conference on Human Error, Reliability, Resilience, and Performance, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USAent://SD_ILS/0/SD_ILS:4859212024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Boring, Ronald L. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-94391-6">https://doi.org/10.1007/978-3-319-94391-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Stochastic Models in Reliability, Network Security and System Safety Essays Dedicated to Professor Jinhua Cao on the Occasion of His 80th Birthdayent://SD_ILS/0/SD_ILS:4860292024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Li, Quan-Lin. editor. Wang, Jinting. editor. Yu, Hai-Bo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-15-0864-6">https://doi.org/10.1007/978-981-15-0864-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification Third International Conference, RSSRail 2019, Lille, France, June 4–6, 2019, Proceedingsent://SD_ILS/0/SD_ILS:4862742024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-18744-6">https://doi.org/10.1007/978-3-030-18744-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Statistics in Transportation and Communication Selected Papers from the 18th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’18, 17-20 October 2018, Riga, Latviaent://SD_ILS/0/SD_ILS:4869962024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Kabashkin, Igor. editor. Yatskiv (Jackiva), Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-12450-2">https://doi.org/10.1007/978-3-030-12450-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security SAFECOMP 2018 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Västerås, Sweden, September 18, 2018, Proceedingsent://SD_ILS/0/SD_ILS:3997832024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-99229-7">https://doi.org/10.1007/978-3-319-99229-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliabilityent://SD_ILS/0/SD_ILS:4002902024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Jahanshahi, Mohsen. author. Bistouni, Fathollah. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-78473-1">https://doi.org/10.1007/978-3-319-78473-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, Västerås, Sweden, September 19-21, 2018, Proceedingsent://SD_ILS/0/SD_ILS:4003442024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-99130-6">https://doi.org/10.1007/978-3-319-99130-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Solid State Lighting Reliability Part 2 Components to Systemsent://SD_ILS/0/SD_ILS:4015282024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor van Driel, Willem Dirk. editor. Fan, Xuejun. editor. Zhang, Guo Qi. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chipent://SD_ILS/0/SD_ILS:4013482024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Wang, Zheng. author. Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-1073-6">https://doi.org/10.1007/978-981-10-1073-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USAent://SD_ILS/0/SD_ILS:4018302024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Boring, Ronald Laurids. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-60645-3">https://doi.org/10.1007/978-3-319-60645-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliabilityent://SD_ILS/0/SD_ILS:4601172024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Suganuma, Katsuaki, editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780081020944">https://www.sciencedirect.com/science/book/9780081020944</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality, Reliability, Security and Robustness in Heterogeneous Systems 13th International Conference, QShine 2017, Dalian, China, December 16 -17, 2017, Proceedingsent://SD_ILS/0/SD_ILS:4008732024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Wang, Lei. editor. Qiu, Tie. editor. Zhao, Wenbing. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-78078-8">https://doi.org/10.1007/978-3-319-78078-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’17, 18-21 October, 2017, Riga, Latviaent://SD_ILS/0/SD_ILS:4023952024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-74454-4">https://doi.org/10.1007/978-3-319-74454-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Konstrüksiyon elemanlarında güvenirlik (reliability) ve ömür hesapları ; teorik açıklamalar ve uygulamalarent://SD_ILS/0/SD_ILS:3892572024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Tahralı, Necati Atik, Enver, author Çivi, Cem, author<br/>Preferred Shelf Number TJ230 T34 2017<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Semi-Markov processes : applications in system reliability and maintenanceent://SD_ILS/0/SD_ILS:3555172024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Grabski, Franciszek, author.<br/>Preferred Shelf Number ONLINE(355517.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128005187">http://www.sciencedirect.com/science/book/9780128005187</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Chemical and biochemical technology : materials, processing, and reliabilityent://SD_ILS/0/SD_ILS:3565452024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Varfolomeev, Serge¿̐ưi Dmitrievich, editor.<br/>Preferred Shelf Number ONLINE(356545.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781482257625">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security SAFECOMP 2015 Workshops, ASSURE, DECSoS. ISSE, ReSA4CI, and SASSUR, Delft, The Netherlands, September 22, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5190922024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(519092.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-24249-1">https://doi.org/10.1007/978-3-319-24249-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 34th International Conference, SAFECOMP 2015, Delft, The Netherlands, September 23-25, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5190262024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(519026.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-24255-2">https://doi.org/10.1007/978-3-319-24255-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 33rd International Conference, SAFECOM 2014, Florence, Italy, September 10-12, 2014. Proceedingsent://SD_ILS/0/SD_ILS:4828012024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bondavalli, Andrea. editor. Di Giandomenico, Felicita. editor. (orcid)0000-0002-8760-7299 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-10506-2">https://doi.org/10.1007/978-3-319-10506-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Availability, Reliability, and Security in Information Systems IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2014 and 4th InternationalWorkshop on Security and Cognitive Informatics for Homeland Defense, SeCIHD 2014, Fribourg, Switzerland, September 8-12, 2014. Proceedingsent://SD_ILS/0/SD_ILS:4890552024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Teufel, Stephanie. editor. A Min, Tjoa. editor. You, Illsun. editor. Weippl, Edgar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-10975-6">https://doi.org/10.1007/978-3-319-10975-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applicationsent://SD_ILS/0/SD_ILS:4892462024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-007-7663-0">https://doi.org/10.1007/978-94-007-7663-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:3554852024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Ohring, Milton, 1936- Kasprzak, Lucian.<br/>Preferred Shelf Number ONLINE(355485.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability prediction from burn-in data fit to reliability modelsent://SD_ILS/0/SD_ILS:3559212024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bernstein, Joseph.<br/>Preferred Shelf Number ONLINE(355921.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128007471">http://www.sciencedirect.com/science/book/9780128007471</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security SAFECOMP 2014 Workshops: ASCoMS, DECSoS, DEVVARTS, ISSE, ReSA4CI, SASSUR. Florence, Italy, September 8-9, 2014, Proceedingsent://SD_ILS/0/SD_ILS:4856762024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bondavalli, Andrea. editor. Ceccarelli, Andrea. editor. Ortmeier, Frank. editor. (orcid)0000-0001-6186-4142 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-10557-4">https://doi.org/10.1007/978-3-319-10557-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Flash Memories Economic Principles of Performance, Cost and Reliability Optimizationent://SD_ILS/0/SD_ILS:4888482024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Richter, Detlev. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-007-6082-0">https://doi.org/10.1007/978-94-007-6082-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of safety-critical systems : theory and applicationent://SD_ILS/0/SD_ILS:3417732024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Rausand, Marvin.<br/>Preferred Shelf Number ONLINE(341773.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653">http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118776353">http://dx.doi.org/10.1002/9781118776353</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamentals of reliability engineering : applications in multistage interconnection networksent://SD_ILS/0/SD_ILS:3420102024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Gunawan, Indra.<br/>Preferred Shelf Number ONLINE(342010.1)<br/>Electronic Access Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a>
Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079">http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079</a>
Ebook Library <a href="http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0">http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0</a>
ebrary <a href="http://site.ebrary.com/id/10843879">http://site.ebrary.com/id/10843879</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of inter-rater reliability : the definitive guide to measuring the extent of agreement among ratersent://SD_ILS/0/SD_ILS:3386332024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Gwet, Kilem Li, author<br/>Preferred Shelf Number QA278 G8 2014<br/>Format: Books<br/>Availability Beytepe Library~1 Health Sciences Library~1<br/>Gas and oil reliability engineering modeling and analysisent://SD_ILS/0/SD_ILS:1459072024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Calixto, Eduardo.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Rail human factors supporting reliability, safety and cost reductionent://SD_ILS/0/SD_ILS:2911072024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dadashi, Nastaran. Scott, Anita. Wilson, John R. Mills, Ann.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203759721">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Materials and Reliability Handbook for Semiconductor Optical and Electron Devicesent://SD_ILS/0/SD_ILS:3314782024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331478.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-4337-7">http://dx.doi.org/10.1007/978-1-4614-4337-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Stochastic Orders in Reliability and Risk In Honor of Professor Moshe Shakedent://SD_ILS/0/SD_ILS:3321492024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Li, Haijun. editor. Li, Xiaohu. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332149.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-6892-9">http://dx.doi.org/10.1007/978-1-4614-6892-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Physics and Engineering Time-To-Failure Modelingent://SD_ILS/0/SD_ILS:3326822024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332682.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.ent://SD_ILS/0/SD_ILS:3052862024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Epperlein, Peter W.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118481882">http://dx.doi.org/10.1002/9781118481882</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applicationsent://SD_ILS/0/SD_ILS:3065662024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Wu, Bin, author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examplesent://SD_ILS/0/SD_ILS:3650012024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.<br/>Preferred Shelf Number ONLINE(365001.1)<br/>Electronic Access Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality, Reliability, Security and Robustness in Heterogeneous Networks 9th International Conference, QShine 2013, Greader Noida, India, January 11-12, 2013, Revised Selected Papersent://SD_ILS/0/SD_ILS:3345052024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Singh, Karan. editor. Awasthi, Amit K. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334505.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-37949-9">http://dx.doi.org/10.1007/978-3-642-37949-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Availability, Reliability, and Security in Information Systems and HCI IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2013, Regensburg, Germany, September 2-6, 2013. Proceedingsent://SD_ILS/0/SD_ILS:3349582024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Cuzzocrea, Alfredo. editor. Kittl, Christian. editor. Simos, Dimitris E. editor. Weippl, Edgar. editor. Xu, Lida. editor.<br/>Preferred Shelf Number ONLINE(334958.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedingsent://SD_ILS/0/SD_ILS:3350052024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bitsch, Friedemann. editor. Guiochet, Jérémie. editor. Kaâniche, Mohamed. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335005.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-40793-2">http://dx.doi.org/10.1007/978-3-642-40793-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and Risk Evaluation of Wind Integrated Power Systemsent://SD_ILS/0/SD_ILS:3354842024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Billinton, Roy. editor. Karki, Rajesh. editor. Verma, Ajit Kumar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335484.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-81-322-0987-4">http://dx.doi.org/10.1007/978-81-322-0987-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Early Software Reliability Prediction A Fuzzy Logic Approachent://SD_ILS/0/SD_ILS:3355122024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Pandey, Ajeet Kumar. author. Goyal, Neeraj Kumar. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335512.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-81-322-1176-1">http://dx.doi.org/10.1007/978-81-322-1176-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Optimal Stochastic Control Schemes within a Structural Reliability Frameworkent://SD_ILS/0/SD_ILS:3328642024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Leira, Bernt J. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332864.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-01405-0">http://dx.doi.org/10.1007/978-3-319-01405-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, Availability and Serviceability of Networks-on-Chipent://SD_ILS/0/SD_ILS:1737792024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Cota, Érika. author. Morais Amory, Alexandre. author. Soares Lubaszewski, Marcelo. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0791-1">http://dx.doi.org/10.1007/978-1-4614-0791-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliabilityent://SD_ILS/0/SD_ILS:1738162024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Levinson, David M. editor. Liu, Henry X. editor. Bell, Michael. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Multidisciplinary Research and Practice for Information Systems IFIP WG 8.4, 8.9/TC 5 International Cross-Domain Conference and Workshop on Availability, Reliability, and Security, CD-ARES 2012, Prague, Czech Republic, August 20-24, 2012. Proceedingsent://SD_ILS/0/SD_ILS:1972272024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Quirchmayr, Gerald. editor. Basl, Josef. editor. You, Ilsun. editor. Xu, Lida. editor. Weippl, Edgar. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-32498-7">http://dx.doi.org/10.1007/978-3-642-32498-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papersent://SD_ILS/0/SD_ILS:1966482024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Zhang, Xi. editor. Qiao, Daji. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-29222-4">http://dx.doi.org/10.1007/978-3-642-29222-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 31st International Conference, SAFECOMP 2012, Magdeburg, Germany, September 25-28, 2012. Proceedingsent://SD_ILS/0/SD_ILS:1974202024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Ortmeier, Frank. editor. Daniel, Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33678-2">http://dx.doi.org/10.1007/978-3-642-33678-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Non-Destructive Assessment of Concrete Structures: Reliability and Limits of Single and Combined Techniques State-of-the-Art Report of the RILEM Technical Committee 207-INRent://SD_ILS/0/SD_ILS:2064442024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Breysse, Denys. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-2736-6">http://dx.doi.org/10.1007/978-94-007-2736-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security SAFECOMP 2012 Workshops: Sassur, ASCoMS, DESEC4LCCI, ERCIM/EWICS, IWDE, Magdeburg, Germany, September 25-28, 2012. Proceedingsent://SD_ILS/0/SD_ILS:1974192024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Ortmeier, Frank. editor. Daniel, Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33675-1">http://dx.doi.org/10.1007/978-3-642-33675-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Pattern recognition for reliability assessment of water distribution networksent://SD_ILS/0/SD_ILS:2853852024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Trifunovi?, Nemanja.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781466558021">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electric utility resource planning economics, reliability, and decision-makingent://SD_ILS/0/SD_ILS:2907802024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Sim, Steven.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439884096">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systemsent://SD_ILS/0/SD_ILS:2493512024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bauer, Eric. Adams, Randee. Eustace, Dan.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systemsent://SD_ILS/0/SD_ILS:3054622024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bauer, Eric. Adams, Randee. Eustace, Dan. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119941378">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Importance measures in reliability, risk, and optimization principles and applicationsent://SD_ILS/0/SD_ILS:2993862024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Kuo, Way, 1951- Zhu, Xiaoyan.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10559415">http://site.ebrary.com/lib/alltitles/Doc?id=10559415</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Power Electronic Packaging Design, Assembly Process, Reliability and Modelingent://SD_ILS/0/SD_ILS:1738412024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Liu, Yong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Using the Weibull distribution reliability, modeling, and inferenceent://SD_ILS/0/SD_ILS:2994792024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor McCool, John, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=388380">Connect to MyiLibrary resource.</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118351994">http://dx.doi.org/10.1002/9781118351994</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=51285">http://www.books24x7.com/marc.asp?bookid=51285</a>
ebrary <a href="http://site.ebrary.com/id/10593122">http://site.ebrary.com/id/10593122</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=894399">http://swb.eblib.com/patron/FullRecord.aspx?p=894399</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Adhesives technology for electronic applications materials, processing, reliabilityent://SD_ILS/0/SD_ILS:1460142024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Licari, James J., 1930- Swanson, Dale W.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality and Reliability of Large-Eddy Simulations IIent://SD_ILS/0/SD_ILS:2057842024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Salvetti, Maria Vittoria. editor. Geurts, Bernard. editor. Meyers, Johan. editor. Sagaut, Pierre. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-0231-8">http://dx.doi.org/10.1007/978-94-007-0231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Engineering Basic Concepts and Applications in ICTent://SD_ILS/0/SD_ILS:1945502024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Lazzaroni, Massimo. author. Cristaldi, Loredana. author. Peretto, Lorenzo. author. Rinaldi, Paola. author. Catelani, Marcantonio. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-20983-3">http://dx.doi.org/10.1007/978-3-642-20983-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Availability, Reliability and Security for Business, Enterprise and Health Information Systems IFIP WG 8.4/8.9 International Cross Domain Conference and Workshop, ARES 2011, Vienna, Austria, August 22-26, 2011. Proceedingsent://SD_ILS/0/SD_ILS:1953022024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Tjoa, A Min. editor. Quirchmayr, Gerald. editor. You, Ilsun. editor. Xu, Lida. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-23300-5">http://dx.doi.org/10.1007/978-3-642-23300-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 30th International Conference,SAFECOMP 2011, Naples, Italy, September 19-22, 2011. Proceedingsent://SD_ILS/0/SD_ILS:1955862024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Flammini, Francesco. editor. Bologna, Sandro. editor. Vittorini, Valeria. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-24270-0">http://dx.doi.org/10.1007/978-3-642-24270-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability in Scientific Research Improving the Dependability of Measurements, Calculations, Equipment, and Softwareent://SD_ILS/0/SD_ILS:2373542024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Walker, I. R..<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511780608">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probability, statistics, and reliability for engineers and scientistsent://SD_ILS/0/SD_ILS:3129152024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Ayyub, Bilal M., author. McCuen, Richard H., 1941-<br/>Preferred Shelf Number ONLINE(312915.1)<br/>Electronic Access Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpPSRESE01">http://app.knovel.com/web/toc.v/cid:kpPSRESE01</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, Maintainability and Risk Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.ent://SD_ILS/0/SD_ILS:1491762024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Smith, David J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Assessment of Power System Reliability Methods and Applicationsent://SD_ILS/0/SD_ILS:1685692024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Čepin, Marko. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-688-7">http://dx.doi.org/10.1007/978-0-85729-688-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architecturesent://SD_ILS/0/SD_ILS:1725302024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6217-1">http://dx.doi.org/10.1007/978-1-4419-6217-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, maintainability, and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:4594222024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Smith, David J. (David John), 1943 June 22-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Modeling and simulation for microelectronic packaging assembly manufacture, reliability, and testingent://SD_ILS/0/SD_ILS:2986532024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Liu, S. (Sheng), 1963- Liu, Yong, 1962- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470827826">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Spacecraft reliability and multi-state failures a statistical approachent://SD_ILS/0/SD_ILS:3057212024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Saleh, Joseph H., 1971- Castet, Jean-François. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697462">Click here to view book</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41710">http://www.books24x7.com/marc.asp?bookid=41710</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Process risk and reliability management operational integrity managementent://SD_ILS/0/SD_ILS:1472192024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Sutton, Ian S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mathematical and Statistical Models and Methods in Reliability Applications to Medicine, Finance, and Quality Controlent://SD_ILS/0/SD_ILS:1683332024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Rykov, V.V. editor. Balakrishnan, N. editor. Nikulin, M.S. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4971-5">http://dx.doi.org/10.1007/978-0-8176-4971-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probability and Statistical Models Foundations for Problems in Reliability and Financial Mathematicsent://SD_ILS/0/SD_ILS:1683372024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Gupta, Arjun K. author. Zeng, Wei-Bin. author. Wu, Yanhong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4987-6">http://dx.doi.org/10.1007/978-0-8176-4987-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Calculation of Roundabouts Capacity, Waiting Phenomena and Reliabilityent://SD_ILS/0/SD_ILS:1909852024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Mauro, Raffaele. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-04551-6">http://dx.doi.org/10.1007/978-3-642-04551-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Physics and Engineering Time-To-Failure Modelingent://SD_ILS/0/SD_ILS:1725712024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor McPherson, J.W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Multi-state System Reliability Analysis and Optimization for Engineers and Industrial Managersent://SD_ILS/0/SD_ILS:1762212024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Lisnianski, Anatoly. author. Frenkel, Ilia. author. Ding, Yi. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84996-320-6">http://dx.doi.org/10.1007/978-1-84996-320-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 29th International Conference, SAFECOMP 2010, Vienna, Austria, September 14-17, 2010. Proceedingsent://SD_ILS/0/SD_ILS:1930402024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Schoitsch, Erwin. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-15651-9">http://dx.doi.org/10.1007/978-3-642-15651-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Safety and reliability of industrial products, systems and structuresent://SD_ILS/0/SD_ILS:2883272024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Guedes Soares, Carlos.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203818657">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design for reliability information and computer-based systemsent://SD_ILS/0/SD_ILS:2498792024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bauer, Eric.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Data Analysis Theory and Applications to Reliability and Inference, Data Mining, Bioinformatics, Lifetime Data, and Neural Networksent://SD_ILS/0/SD_ILS:1682922024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Skiadas, Christos H. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4799-5">http://dx.doi.org/10.1007/978-0-8176-4799-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Degradation Modeling Applications to Reliability, Survival Analysis, and Financeent://SD_ILS/0/SD_ILS:1683212024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Nikulin, M.S. editor. Limnios, Nikolaos. editor. Balakrishnan, N. editor. Kahle, Waltraud. editor. Huber-Carol, Catherine. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4924-1">http://dx.doi.org/10.1007/978-0-8176-4924-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability engineering and risk analysis : a practical guideent://SD_ILS/0/SD_ILS:3638772024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Modarres, M. (Mohammad) Kaminskiy, Mark, 1946- Krivtsov, Vasiliy, 1963-<br/>Preferred Shelf Number TA169 M627 2010<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Survival analysis : reliability theory, reliability engineering, random variable, actuarial science, expected value, renewal theory, reliability theory of aging and longevity, likelihood functionent://SD_ILS/0/SD_ILS:1335152024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Surhone, Lambert M. Timpledon, Miriam T. Marseken, Susan F.<br/>Preferred Shelf Number H61 .S87 2010<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Practical reliability engineering and analysis for system design and life-cycle sustainmentent://SD_ILS/0/SD_ILS:2860842024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Wessels, William R.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420094404">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mining equipment and systems theory and practice of exploitation and reliabilityent://SD_ILS/0/SD_ILS:2864972024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Czaplicki, Jacek M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203852804">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Machine Learning in Cyber Trust Security, Privacy, and Reliabilityent://SD_ILS/0/SD_ILS:1679002024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Yu, Philip S. editor. Tsai, Jeffrey J. P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-88735-7">http://dx.doi.org/10.1007/978-0-387-88735-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of Reliability, Availability, Maintainability and Safety in Engineering Designent://SD_ILS/0/SD_ILS:1757452024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Stapelberg, Rudolph Frederick. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-175-6">http://dx.doi.org/10.1007/978-1-84800-175-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 28th International Conference, SAFECOMP 2009, Hamburg, Germany, September 15-18, 2009. Proceedingsent://SD_ILS/0/SD_ILS:1909602024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Buth, Bettina. editor. Rabe, Gerd. editor. Seyfarth, Till. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-04468-7">http://dx.doi.org/10.1007/978-3-642-04468-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality of Service in Heterogeneous Networks 6th International ICST Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2009 and 3rd International Workshop on Advanced Architectures and Algorithms for Internet Delivery and Applications, AAA-IDEA 2009, Las Palmas, Gran Canaria, November 23-25, 2009 Proceedingsent://SD_ILS/0/SD_ILS:1914262024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bartolini, Novella. editor. Nikoletseas, Sotiris. editor. Sinha, Prasun. editor. Cardellini, Valeria. editor. Mahanti, Anirban. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-10625-5">http://dx.doi.org/10.1007/978-3-642-10625-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>İki parametreli üstel dağılımda rekor değerler ile ortak değişim katsayısı ve güvenirlik tahmin edicileri = Common coefficient of variation and reliability estimators using record values in two parameter exponential distributionent://SD_ILS/0/SD_ILS:1246412024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bıyıklı, Nurten.<br/>Preferred Shelf Number TEZ/9030 .B59 2009<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Power distribution system reliability practical methods and applicationsent://SD_ILS/0/SD_ILS:2495632024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Chowdhury, Ali A. Koval, D. O. (Don Orest)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability analysis and prediction with warranty data issues, strategies, and methodsent://SD_ILS/0/SD_ILS:2860482024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Rai, Bharatendra K. Singh, Nanua.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439803264">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Human reliability, error, and human factors in engineering maintenance with reference to aviation and power generationent://SD_ILS/0/SD_ILS:2868932024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439803844">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Corrosion, wear, fatigue, and reliability of ceramics a collection of papers presented at the 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008, Daytona Beach, Floridaent://SD_ILS/0/SD_ILS:2974572024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.) Salem, J. A. (Jonathan A.), 1960- Fuller, Edwin R. Ohji, T. (Tatsuki) Wereszczak, Andrew.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470456347">http://dx.doi.org/10.1002/9780470456347</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297839">http://site.ebrary.com/lib/alltitles/Doc?id=10297839</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Robust design methodology for reliability exploring the effects of variation and uncertaintyent://SD_ILS/0/SD_ILS:2983962024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bergman, Bo, 1943- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysisent://SD_ILS/0/SD_ILS:1670302024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Limnios, Nikolaos. author. Barbu, Vlad Stefan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-73173-5">http://dx.doi.org/10.1007/978-0-387-73173-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Engineering design reliability applications for the aerospace, automotive, and ship industriesent://SD_ILS/0/SD_ILS:1530402024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren. CRC Press.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Developments in Telecommunications With a Focus on SS7 Network Reliabilityent://SD_ILS/0/SD_ILS:1873292024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Rufa, Gerhard. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74986-8">http://dx.doi.org/10.1007/978-3-540-74986-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 27th International Conference, SAFECOMP 2008 Newcastle upon Tyne, UK, September 22-25, 2008 Proceedingsent://SD_ILS/0/SD_ILS:1888942024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Harrison, Michael D. editor. Sujan, Mark-Alexander. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-87698-4">http://dx.doi.org/10.1007/978-3-540-87698-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliabilityent://SD_ILS/0/SD_ILS:1839932024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Bertsche, Bernd. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-34282-3">http://dx.doi.org/10.1007/978-3-540-34282-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability technology, human error, and quality in health careent://SD_ILS/0/SD_ILS:2850362024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420065596">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mathematical methods in survival analysis, reliability and quality of lifeent://SD_ILS/0/SD_ILS:2975432024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Huber, Catherine.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470610985">http://dx.doi.org/10.1002/9780470610985</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Next Generation Wireless LANs Throughput, Robustness, and Reliability in 802.11nent://SD_ILS/0/SD_ILS:2360242024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Perahia, Eldad. Stacey, Robert.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511541032">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Tutorial on hardware and software reliability, maintainability, and availabilityent://SD_ILS/0/SD_ILS:2498142024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Schneidewind, Norman.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540</a>
IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Lubrication and maintenance of industrial machinery best practices and reliabilityent://SD_ILS/0/SD_ILS:2896492024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Gresham, Robert M. Totten, George E.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420089363">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Risk-based reliability analysis and generic principles for risk reductionent://SD_ILS/0/SD_ILS:1489562024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Todinov, M. T.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packagingent://SD_ILS/0/SD_ILS:1659002024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>System Signatures and their Applications in Engineering Reliabilityent://SD_ILS/0/SD_ILS:1668812024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Samaniego, Francisco J. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-71797-5">http://dx.doi.org/10.1007/978-0-387-71797-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computational Intelligence in Reliability Engineering Evolutionary Techniques in Reliability Analysis and Optimizationent://SD_ILS/0/SD_ILS:1845342024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Levitin, Gregory. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37368-1">http://dx.doi.org/10.1007/978-3-540-37368-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computational Intelligence in Reliability Engineering New Metaheuristics, Neural and Fuzzy Techniques in Reliabilityent://SD_ILS/0/SD_ILS:1845352024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Levitin, Gregory. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37372-8">http://dx.doi.org/10.1007/978-3-540-37372-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 26th International Conference, SAFECOMP 2007, Nuremberg, Germany, September 18-21, 2007. Proceedingsent://SD_ILS/0/SD_ILS:1873352024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Saglietti, Francesca. editor. Oster, Norbert. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-75101-4">http://dx.doi.org/10.1007/978-3-540-75101-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical plant failure analysis a guide to understanding machinery deterioration and improving equipment reliabilityent://SD_ILS/0/SD_ILS:2866202024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Sachs, Neville W.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420020007">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Margins of error a study of reliability in survey measurementent://SD_ILS/0/SD_ILS:2969962024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Alwin, Duane F. (Duane Francis), 1944- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html">http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470146316">http://dx.doi.org/10.1002/9780470146316</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, Life Testing and the Prediction of Service Lives For Engineers and Scientistsent://SD_ILS/0/SD_ILS:1664112024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Saunders, Sam C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-48538-6">http://dx.doi.org/10.1007/978-0-387-48538-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semi-Markov Risk Models for Finance, Insurance and Reliabilityent://SD_ILS/0/SD_ILS:1667612024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Jacques, Janssen. author. Raimondo, Manca. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-70730-1">http://dx.doi.org/10.1007/0-387-70730-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A Guide to Lead-free Solders Physical Metallurgy and Reliabilityent://SD_ILS/0/SD_ILS:1753732024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Evans, John W. author. Engelmaier, Werner. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Micro- and opto-electronic materials and structures : physics, mechanics, design, reliability, packagingent://SD_ILS/0/SD_ILS:1104482024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Suhir, Ephraim. Lee, Y. C. Wong, C. P.<br/>Preferred Shelf Number TK7874 .M438 2007 V.1<br/>Format: Books<br/>Availability Beytepe Library~2<br/>IUTAM Symposium on Mechanics and Reliability of Actuating Materials Proceedings of the IUTAM Symposium held in Beijing, China, 1–3 September, 2004ent://SD_ILS/0/SD_ILS:1690882024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Yang, W. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-4131-4">http://dx.doi.org/10.1007/1-4020-4131-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Safety, Reliability, and Security 25th International Conference, SAFECOMP 2006, Gdansk, Poland, September 27-29, 2006. Proceedingsent://SD_ILS/0/SD_ILS:1848592024-11-15T16:36:06Z2024-11-15T16:36:06ZAuthor Górski, Janusz. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11875567">http://dx.doi.org/10.1007/11875567</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>