Search Results for Reliability. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dReliability.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?dt=list 2026-01-11T23:29:10Z Reliability ent://SD_ILS/0/SD_ILS:233427 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Meyer, J. Patrick.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural reliability ent://SD_ILS/0/SD_ILS:297978 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Lemaire, Maurice.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability engineering ent://SD_ILS/0/SD_ILS:341870 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Kapur, Kailash C., 1941- author.&#160;Pecht, Michael, author.<br/>Preferred Shelf Number&#160;ONLINE(341870.1)<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a> MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability ent://SD_ILS/0/SD_ILS:364907 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Tobias, Paul A.&#160;Trindade, David C.<br/>Preferred Shelf Number&#160;TA169 T63 2012<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> MEMS Reliability ent://SD_ILS/0/SD_ILS:172486 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Hartzell, Allyson L. author.&#160;da Silva, Mark G. author.&#160;Shea, Herbert R. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bayesian Reliability ent://SD_ILS/0/SD_ILS:167542 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Hamada, Michael S. author.&#160;Wilson, Alyson G. author.&#160;Reese, C. Shane. author.&#160;Martz, Harry F. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability fundamentals ent://SD_ILS/0/SD_ILS:255215 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;C&#259;tuneanu, Vasile M.&#160;Mihalache, Adrian.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ensuring software reliability ent://SD_ILS/0/SD_ILS:542468 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Neufelder, Ann Marie, 1960- author.<br/>Preferred Shelf Number&#160;QA76.76 .R44 N48 1992<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439832752">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> System Software Reliability ent://SD_ILS/0/SD_ILS:175367 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:249382 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Raheja, Dev.&#160;Gullo, Louis J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical system reliability ent://SD_ILS/0/SD_ILS:153146 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Bauer, Eric.&#160;Zhang, Xuemei.&#160;Kimber, Douglas A.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of MEMS ent://SD_ILS/0/SD_ILS:303632 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Tsuchiya, Toshiyuki.&#160;Tabata, Osamu, 1956-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:543493 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Crow, Dana.&#160;Feinberg, Alec.<br/>Preferred Shelf Number&#160;TK7836 .D473 2001<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781315220192">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Practical reliability engineering ent://SD_ILS/0/SD_ILS:305563 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;O'Connor, Patrick P.&#160;Kleyner, Andre.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Improving machinery reliability ent://SD_ILS/0/SD_ILS:153828 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Bloch, Heinz P., 1933-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability in pragmatics ent://SD_ILS/0/SD_ILS:357581 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;McCready, Eric (Eric S.), author.<br/>Preferred Shelf Number&#160;P99.4.P72 M445 2015<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Probabilistic reliability models ent://SD_ILS/0/SD_ILS:299523 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Ushakov, I. A. (Igor&#697; Alekseevich)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical reliability engineering ent://SD_ILS/0/SD_ILS:295099 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Pavlov, I. V.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Chakravarty, Sumantra.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic reliability engineering ent://SD_ILS/0/SD_ILS:295101 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Falk, James.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer systems reliability. ent://SD_ILS/0/SD_ILS:58893 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Preferred Shelf Number&#160;TK 7885 C65 1974 V.20<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Reliability and Optimal Maintenance ent://SD_ILS/0/SD_ILS:175380 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Wang, Hongzhou. author.&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintenance Theory of Reliability ent://SD_ILS/0/SD_ILS:175323 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Safety Engineering ent://SD_ILS/0/SD_ILS:176193 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Verma, Ajit Kumar. author.&#160;Srividya, Ajit. author.&#160;Karanki, Durga Rao. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> IEEE Transactions on reliability. ent://SD_ILS/0/SD_ILS:226884 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Preferred Shelf Number&#160;ALFABET&#304;K V.12 1963<br/>Format:&#160;Continuing Resources&#160;Other<br/>Availability&#160;Beytepe Library~30&#160;~0<br/> Engineering design reliability handbook ent://SD_ILS/0/SD_ILS:544208 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Preferred Shelf Number&#160;TA174 .E544 2005<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135513825">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability of large systems ent://SD_ILS/0/SD_ILS:254513 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Ko&#322;owrocki, Krzysztof.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Power-system reliability calculations ent://SD_ILS/0/SD_ILS:220175 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Billinton, Roy.&#160;Ringlee, Robert J., joint author.&#160;Wood, Allen J., joint author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability theory and practice ent://SD_ILS/0/SD_ILS:47596 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Bazovsky, Igor.<br/>Preferred Shelf Number&#160;TA 168 B33 1961<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Circuit Design for Reliability ent://SD_ILS/0/SD_ILS:529164 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Reis, Ricardo. editor.&#160;Cao, Yu. editor.&#160;Wirth, Gilson. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-1-4614-4078-9">https://doi.org/10.1007/978-1-4614-4078-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic Models in Reliability ent://SD_ILS/0/SD_ILS:332363 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Aven, Terje. author.&#160;Jensen, Uwe. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332363.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Network Reliability and Resilience ent://SD_ILS/0/SD_ILS:195005 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Gertsbakh, Ilya. author.&#160;Shpungin, Yoseph. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Life cycle reliability engineering ent://SD_ILS/0/SD_ILS:296926 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Yang, Guangbin, 1964-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and validity assessment ent://SD_ILS/0/SD_ILS:7092 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Carmines, Edward G.<br/>Preferred Shelf Number&#160;H 61 C26 1979<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Mathematical theory of reliability ent://SD_ILS/0/SD_ILS:35404 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Barlow, Richard E.&#160;Proschan Frank. , ort. yaz.<br/>Preferred Shelf Number&#160;QA 273 B3 1965<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Applied reliability for engineers ent://SD_ILS/0/SD_ILS:565385 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Dhillon, B. S. (Balbir S.), 1947- author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003132103">https://www.taylorfrancis.com/books/9781003132103</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quantile-Based Reliability Analysis ent://SD_ILS/0/SD_ILS:330556 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Nair, N. Unnikrishnan. author.&#160;Sankaran, P.G. author.&#160;Balakrishnan, N. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(330556.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reinforced concrete structural reliability ent://SD_ILS/0/SD_ILS:543776 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;El-Reedy, Mohamed Abdallah., author.<br/>Preferred Shelf Number&#160;TA683 .E47 2013<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439874172">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Electronic thin-film reliability ent://SD_ILS/0/SD_ILS:278156 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Tu, K. N. (King-Ning), 1937-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:543516 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Brown, Richard E., 1969, author.<br/>Preferred Shelf Number&#160;TK3091 .B76 2009<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781315222332">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability-based Structural Design ent://SD_ILS/0/SD_ILS:175421 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Choi, Seung-Kyum. author.&#160;Canfield, Robert A. author.&#160;Grandhi, Ramana V. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Six Sigma ent://SD_ILS/0/SD_ILS:165709 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Kumar, U Dinesh. author.&#160;Crocker, John. author.&#160;Chitra, T. author.&#160;Saranga, Haritha. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:539124 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Brown, Richard E., 1969- author.<br/>Preferred Shelf Number&#160;TK3091 .B76 2002 EB<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429164682">https://www.taylorfrancis.com/books/9780429164682</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lubrication and reliability handbook ent://SD_ILS/0/SD_ILS:256333 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Neale, M. J. (Michael John)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fatigue design and reliability ent://SD_ILS/0/SD_ILS:254466 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland)&#160;Marquis, G. (Gary)&#160;Solin, J.&#160;European Structural Integrity Society.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of reliability engineering ent://SD_ILS/0/SD_ILS:295100 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Harrison, Robert A.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Introduction to reliability engineering ent://SD_ILS/0/SD_ILS:47611 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Lewis, Elmer Eugene, 1938-<br/>Preferred Shelf Number&#160;TA 169 L47 1987<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Applications in Reliability and Statistical Computing ent://SD_ILS/0/SD_ILS:527152 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Pham, Hoang. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-21232-1">https://doi.org/10.1007/978-3-031-21232-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Introduction to Quality and Reliability Engineering ent://SD_ILS/0/SD_ILS:529803 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Jiang, Renyan. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-662-47215-6">https://doi.org/10.1007/978-3-662-47215-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Innovations in Power Systems Reliability ent://SD_ILS/0/SD_ILS:168417 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Anders, George. editor.&#160;Vaccaro, Alfredo. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Nonparametric Statistics in Reliability ent://SD_ILS/0/SD_ILS:168426 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;G&aacute;miz, M. Luz. author.&#160;Kulasekera, K. B. author.&#160;Limnios, Nikolaos. author.&#160;Lindqvist, Bo Henry. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software Reliability Assessment with OR Applications ent://SD_ILS/0/SD_ILS:168454 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Kapur, P.K. author.&#160;Pham, Hoang. author.&#160;Gupta, A. author.&#160;Jha, P.C. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-204-9">http://dx.doi.org/10.1007/978-0-85729-204-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fatigue and Fracture Reliability Engineering ent://SD_ILS/0/SD_ILS:168458 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z 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(Vladimir Davidovich), author.&#160;Elishakoff, Isaac, author.<br/>Preferred Shelf Number&#160;TA656<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003265993">https://www.taylorfrancis.com/books/9781003265993</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The reliability of generating data ent://SD_ILS/0/SD_ILS:552847 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Krippendorff, Klaus, author.<br/>Preferred Shelf Number&#160;QA76.9 .Q36<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003112020">https://www.taylorfrancis.com/books/9781003112020</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cloud reliability engineering : technologies and tools ent://SD_ILS/0/SD_ILS:571108 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Raj, Pethuru, editor.&#160;Achary, Rathnakar, editor.<br/>Preferred Shelf Number&#160;QA76.585 .C568 2021<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003030973">https://www.taylorfrancis.com/books/9781003030973</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, maintainability, and safety for engineers ent://SD_ILS/0/SD_ILS:590317 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Dhillon, B. 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(Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;TA1145 .D453 2011<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439846414">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Functional Analysis Methods for Reliability Models ent://SD_ILS/0/SD_ILS:176727 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Gupur, Geni. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-0348-0101-0">http://dx.doi.org/10.1007/978-3-0348-0101-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor Power Devices Physics, Characteristics, Reliability ent://SD_ILS/0/SD_ILS:191586 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Lutz, Josef. author.&#160;Schlangenotto, Heinrich. author.&#160;Scheuermann, Uwe. author.&#160;De Doncker, Rik. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Measures of interobserver agreement and reliability ent://SD_ILS/0/SD_ILS:539074 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Shoukri, M. M. (Mohamed M.), author.&#160;Shoukri, M. M. (Mohamed M.). Measures of interobserver agreement.<br/>Preferred Shelf Number&#160;RC71.3 .S478 2011<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439810811">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Human reliability assessment : theory and practice ent://SD_ILS/0/SD_ILS:540046 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Spurgin, Anthony J., author.<br/>Preferred Shelf Number&#160;TA166 .S685 2010<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420068528">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:192824 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety and reliability of bridge structures ent://SD_ILS/0/SD_ILS:545232 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Mahmoud, Khaled M.<br/>Preferred Shelf Number&#160;TG300 .M34 2009<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135172435">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Silver Metallization Stability and Reliability ent://SD_ILS/0/SD_ILS:175677 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Adams, Daniel. author.&#160;Alford, Terry L. author.&#160;Mayer, James W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mathematical models for systems reliability ent://SD_ILS/0/SD_ILS:538905 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Epstein, Benjamin, 1918, author.&#160;Weissman, Ishay, 1940-<br/>Preferred Shelf Number&#160;TA169 .E67 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420080834">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:185203 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Wire Ropes Tension, Endurance, Reliability ent://SD_ILS/0/SD_ILS:183848 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Feyrer, K. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-33831-4">http://dx.doi.org/10.1007/978-3-540-33831-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Critical Infrastructure Reliability and Vulnerability ent://SD_ILS/0/SD_ILS:185336 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Murray, Alan T. editor.&#160;Grubesic, Tony H. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-68056-7">http://dx.doi.org/10.1007/978-3-540-68056-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated quality and reliability solutions ent://SD_ILS/0/SD_ILS:254415 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Klyatis, Lev M.&#160;Klyatis, Eugene L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System reliability : concepts and applications ent://SD_ILS/0/SD_ILS:392825 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Klaassen, Klaas B., 1941-&#160;Peppen, Jack C. L. van.<br/>Preferred Shelf Number&#160;QA76.5 K53 2006<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Reliability and risk a Bayesian perspective ent://SD_ILS/0/SD_ILS:296819 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Singpurwalla, Nozer D.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470060346">http://dx.doi.org/10.1002/9780470060346</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic Ageing and Dependence for Reliability ent://SD_ILS/0/SD_ILS:166017 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Lai, Chin-Diew. author.&#160;Xie, Min. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-34232-X">http://dx.doi.org/10.1007/0-387-34232-X</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Maintainability, maintenance, and reliability for engineers ent://SD_ILS/0/SD_ILS:545920 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;TA168 .D53 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420006780">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Distribution reliability and power quality ent://SD_ILS/0/SD_ILS:543499 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Short, T. A. (Tom A.), 1966- author.<br/>Preferred Shelf Number&#160;TK3091 .S465 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420036480">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:547810 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;TS173 .D495 2005<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135484071">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:119553 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Dhillon, B. S.<br/>Preferred Shelf Number&#160;TS173 .D45 2005<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Case studies in reliability and maintenance ent://SD_ILS/0/SD_ILS:300226 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability modeling, prediction, and optimization ent://SD_ILS/0/SD_ILS:300337 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. 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S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;R855.3 .D47 2000<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability modelling : A statistical approach ent://SD_ILS/0/SD_ILS:78139 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Wolstenholme, Linda C.<br/>Preferred Shelf Number&#160;TA 169 W65 1999<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Design reliability : fundamentals and applications ent://SD_ILS/0/SD_ILS:540572 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;TA174 .D4929 1999<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical methods for reliability data ent://SD_ILS/0/SD_ILS:85080 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Meeker, William Q.&#160;Escobar, Luis A., ort. yaz.<br/>Preferred Shelf Number&#160;TS 173 M44 1998<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> An elementary guide to reliability ent://SD_ILS/0/SD_ILS:254325 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Dummer, G. W. A. (Geoffrey William Arnold)&#160;Tooley, Michael H.&#160;Winton, R. C.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor memories technology, testing, and reliability ent://SD_ILS/0/SD_ILS:249739 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Sharma, Ashok K.&#160;IEEE Solid-State Circuits Council.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probability, statistics, reliability for engineers ent://SD_ILS/0/SD_ILS:75189 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Ayyub, Bilal M.&#160;McCuen, Richard H., 1941-<br/>Preferred Shelf Number&#160;TA 330 A99 1997<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> New trends in system reliability evaluation ent://SD_ILS/0/SD_ILS:255243 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Misra, Krishna B., 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> An elementary guide to reliability ent://SD_ILS/0/SD_ILS:48244 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Dummer, Geoffrey William Arnold.&#160;Winton, R. C., ort. yaz.<br/>Preferred Shelf Number&#160;TS 173 D85 1990<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> A Primer of reliability theory ent://SD_ILS/0/SD_ILS:47610 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Grosh, Doris Lloyd.<br/>Preferred Shelf Number&#160;TA 169 G76 1989<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Software engineering : design, reliability and management ent://SD_ILS/0/SD_ILS:32561 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Shooman, Martin L.<br/>Preferred Shelf Number&#160;QA 76.9.S88 S56 1983<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Reliability in the acquisitions process ent://SD_ILS/0/SD_ILS:47612 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;DePriest, D. J., ed. by&#160;Launer, R. L., ed. by<br/>Preferred Shelf Number&#160;TA 169 R44 1983<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Life testing and reliability estimation ent://SD_ILS/0/SD_ILS:35481 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Sinha, S. K.&#160;Kale, B. K., ort. yaz.<br/>Preferred Shelf Number&#160;QA 273 S64 1980<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Durability and reliability in engineering desing ent://SD_ILS/0/SD_ILS:48245 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Kivenson, Gilbert.<br/>Preferred Shelf Number&#160;TS 173 K57 1971<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Mathematical methods of reliability theory ent://SD_ILS/0/SD_ILS:47645 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Gnedenko, Boris Vladimirovich, 1912-&#160;Belyayev, Yu. K., ort. yaz.&#160;Solovyev, A. D., ort. yaz.<br/>Preferred Shelf Number&#160;TA 340 G5513 1969<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~2<br/> Safety and Reliability Methodology and Applications. ent://SD_ILS/0/SD_ILS:545362 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Preferred Shelf Number&#160;TA169.7<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429226823">https://www.taylorfrancis.com/books/9780429226823</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Interconnect Reliability in Advanced Memory Device Packaging ent://SD_ILS/0/SD_ILS:526838 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Gan, Chong Leong,. author.&#160;Huang, Chen-Yu,. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-26708-6">https://doi.org/10.1007/978-3-031-26708-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Stochastic Processes with Applications to Reliability Theory ent://SD_ILS/0/SD_ILS:168475 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Failure Rate Modelling for Reliability and Risk ent://SD_ILS/0/SD_ILS:175868 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Finkelstein, Maxim. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Human reliability and error in transportation systems ent://SD_ILS/0/SD_ILS:271334 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Dhillon, B. S.<br/>Preferred Shelf Number&#160;TA1145 D45 2007<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Shock and Damage Models in Reliability Theory ent://SD_ILS/0/SD_ILS:175420 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Human Reliability and Error in Transportation Systems ent://SD_ILS/0/SD_ILS:175578 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Dhillon, B. S. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> IEEE Transactions on device and materials reliability. ent://SD_ILS/0/SD_ILS:226837 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Preferred Shelf Number&#160;ALFABET&#304;K V.3 2003<br/>Format:&#160;Continuing Resources&#160;Other<br/>Availability&#160;Beytepe Library~1&#160;~0<br/> Safety, reliability and risks associated with water, oil and gas pipelines : [proceedings of the NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines, Alexandria, Egypt, 4-8 February 2007] ent://SD_ILS/0/SD_ILS:113617 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines (2007 : Alexandria, Egypt)&#160;Elwany, Mohamed Hamdy.&#160;Pluvinage, Guy.<br/>Preferred Shelf Number&#160;TJ930 .N386 2008<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Lifetime Reliability-aware Design of Integrated Circuits ent://SD_ILS/0/SD_ILS:527089 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Raji, Mohsen. author.&#160;Ghavami, Behnam. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-15345-7">https://doi.org/10.1007/978-3-031-15345-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System Reliability and Security Techniques and Methodologies. ent://SD_ILS/0/SD_ILS:576623 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Iqbal, Javaid.&#160;Masoodi, Faheem Syeed.&#160;Ahmad Malik, Ishfaq.&#160;Khurshid, Shozab.&#160;Saraf, Iqra.<br/>Preferred Shelf Number&#160;QA76.9 .A25<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032624983">https://www.taylorfrancis.com/books/9781032624983</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability, usability, and quality for engineers ent://SD_ILS/0/SD_ILS:579176 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Dhillon, B. S. (Balbir S.), 1947- author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003298571">https://www.taylorfrancis.com/books/9781003298571</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and safety of cable-supported bridges ent://SD_ILS/0/SD_ILS:585766 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Lu, Naiwei, editor.&#160;Liu, Yang (Of Haerbin gong ye da xue), editor.&#160;Noori, Mohammad, editor.<br/>Preferred Shelf Number&#160;TG405<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003170594">https://www.taylorfrancis.com/books/9781003170594</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safety-Critical Electrical Drives Topologies, Reliability, Performance ent://SD_ILS/0/SD_ILS:401112 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Bolvashenkov, Igor. author.&#160;Herzog, Hans-Georg. author.&#160;Frenkel, Ilia. author.&#160;Khvatskin, Lev. author.&#160;Lisnianski, Anatoly. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-89969-5">https://doi.org/10.1007/978-3-319-89969-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Risk and Reliability : Coastal and Hydraulic Engineering ent://SD_ILS/0/SD_ILS:541176 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Reeve, Dominic, author.<br/>Preferred Shelf Number&#160;TC205 .R448 2014<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781482266351">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Solid State Lighting Reliability Components to Systems ent://SD_ILS/0/SD_ILS:331314 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;van Driel, W.D. editor.&#160;Fan, X.J. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331314.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Compressors how to achieve high reliability &amp; availability ent://SD_ILS/0/SD_ILS:293579 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Bloch, Heinz P., 1933-&#160;Geitner, Fred K.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/compressors-how-to-achieve-high-reliability-availability">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Process plant equipment operation, control, and reliability ent://SD_ILS/0/SD_ILS:299085 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Holloway, Michael D., 1963-&#160;Nwaoha, Chikezie, 1984-&#160;Onyewuenyi, Oliver A., 1952-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118162569">http://onlinelibrary.wiley.com/book/10.1002/9781118162569</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118162569">http://dx.doi.org/10.1002/9781118162569</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lead-free solders materials reliability for electronics ent://SD_ILS/0/SD_ILS:305591 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Subramaniam, K. N., Ph. D.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119966203">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Offshore Wind Turbines Reliability, availability and maintenance ent://SD_ILS/0/SD_ILS:247956 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Tavner, Peter<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBRN013E">http://dx.doi.org/10.1049/PBRN013E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Telecommunications system reliability engineering, theory, and practice ent://SD_ILS/0/SD_ILS:249397 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Ayers, Mark L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Hydrosystems engineering reliability assessment and risk analysis ent://SD_ILS/0/SD_ILS:293215 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Tung, Yeou-Koung.&#160;Yen, Ben Chie, 1935-&#160;Melching, Charles S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability centered maintenance (RCM) implementation made simple ent://SD_ILS/0/SD_ILS:293571 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Bloom, Neil.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/reliability-centered-maintenance-rcm">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of Microtechnology Interconnects, Devices and Systems ent://SD_ILS/0/SD_ILS:172420 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Liu, Johan. author.&#160;Salmela, Olli. author.&#160;Sarkka, Jussi. author.&#160;Morris, James E. author.&#160;Tegehall, Per-Erik. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolution ent://SD_ILS/0/SD_ILS:191769 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Levi, Paul. author.&#160;Kernbach, Serge. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-11692-6">http://dx.doi.org/10.1007/978-3-642-11692-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability wearout mechanisms in advanced CMOS technologies ent://SD_ILS/0/SD_ILS:249574 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> VoIP handbook : applications, technologies, reliability, and security ent://SD_ILS/0/SD_ILS:547478 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Ahson, Syed.&#160;Ilyas, Mohammad, 1953-<br/>Preferred Shelf Number&#160;TK5105.8865 .V658 2009<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420070217">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Solder Joint Reliability Prediction for Multiple Environments ent://SD_ILS/0/SD_ILS:167673 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Perkins, Andrew E. author.&#160;Sitaraman, Suresh K. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Rules of thumb for maintenance and reliability engineers ent://SD_ILS/0/SD_ILS:306517 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Smith, Ricky.&#160;Mobley, R. Keith, 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quality and Reliability of Large-Eddy Simulations ent://SD_ILS/0/SD_ILS:170230 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Meyers, Johan. editor.&#160;Geurts, Bernard J. editor.&#160;Sagaut, Pierre. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-8578-9">http://dx.doi.org/10.1007/978-1-4020-8578-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> New Computational Methods in Power System Reliability ent://SD_ILS/0/SD_ILS:187983 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Elmakias, David. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-77812-7">http://dx.doi.org/10.1007/978-3-540-77812-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Rules of thumb for maintenance and reliability engineers ent://SD_ILS/0/SD_ILS:149151 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Smith, Ricky.&#160;Mobley, R. Keith, 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Emerging Nanotechnologies Test, Defect Tolerance, and Reliability ent://SD_ILS/0/SD_ILS:167204 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Tehranipoor, Mohammad. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solder Joint Technology Materials, Properties, and Reliability ent://SD_ILS/0/SD_ILS:166252 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Tu, King-Ning. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and risk models setting reliability requirements ent://SD_ILS/0/SD_ILS:295900 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Todinov, M. T.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and risk models : setting reliability requirements ent://SD_ILS/0/SD_ILS:119481 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Todinov, M. 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2026-01-11T23:29:10Z Author&#160;Grous, Ammar, author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a> Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems ent://SD_ILS/0/SD_ILS:175839 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Seong, Poong Hyun. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-384-2">http://dx.doi.org/10.1007/978-1-84800-384-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Security and Reliability of Damaged Structures and Defective Materials 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SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521137 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Guiochet, J&eacute;r&eacute;mie. editor.&#160;Tonetta, Stefano. editor.&#160;Schoitsch, Erwin. editor.&#160;Roy, Matthieu. editor.&#160;Bitsch, Friedemann. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-40953-0">https://doi.org/10.1007/978-3-031-40953-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, Safety, and Security of Railway Systems. 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Volume 1, Performance and background ent://SD_ILS/0/SD_ILS:585932 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Maciel, Paulo Romero Martins, author.<br/>Preferred Shelf Number&#160;QA76<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003306016">https://www.taylorfrancis.com/books/9781003306016</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Performance, reliability, and availability evaluation of computational systems. Volume 2, Reliability, availability modeling, measuring, and data analysis ent://SD_ILS/0/SD_ILS:585933 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Maciel, Paulo Romero Martins, author.<br/>Preferred Shelf Number&#160;QA76<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003306030">https://www.taylorfrancis.com/books/9781003306030</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Information technology in contemporary organizations : redefining IT management for organizational reliability ent://SD_ILS/0/SD_ILS:590844 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Tworek, Katarzyna, author.<br/>Preferred Shelf Number&#160;HD30.213<br/>Electronic Access&#160;Taylor & Francis <a 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Resources<br/>Availability&#160;Online Library~1<br/> Organizational reliability : human resources, information technology and management ent://SD_ILS/0/SD_ILS:558536 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Bie&#324;kowska, Agnieszka, author.&#160;Tworek, Katarzyna, author.&#160;Zab&#322;ocka-Kluczka, Anna, author.<br/>Preferred Shelf Number&#160;HF5549 .B4594 2020<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003047995">https://www.taylorfrancis.com/books/9781003047995</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Synesis : the unification of productivity, quality, safety and reliability ent://SD_ILS/0/SD_ILS:570100 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Hollnagel, Erik, 1941- author.<br/>Preferred 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Proceedings ent://SD_ILS/0/SD_ILS:335005 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Bitsch, Friedemann. editor.&#160;Guiochet, J&eacute;r&eacute;mie. editor.&#160;Ka&acirc;niche, Mohamed. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(335005.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-40793-2">http://dx.doi.org/10.1007/978-3-642-40793-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples ent://SD_ILS/0/SD_ILS:365001 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Taylor, Zachary, 1959-&#160;Ranganathan, Subramanyam.&#160;IEEE Xplore (Online Service), distributor.&#160;Wiley, publisher.<br/>Preferred Shelf Number&#160;ONLINE(365001.1)<br/>Electronic Access&#160;Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optimal Stochastic Control Schemes within a Structural Reliability Framework ent://SD_ILS/0/SD_ILS:332864 2026-01-11T23:29:10Z 2026-01-11T23:29:10Z Author&#160;Leira, Bernt J. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332864.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-01405-0">http://dx.doi.org/10.1007/978-3-319-01405-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Availability, Reliability, and Security in Information Systems and HCI IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2013, Regensburg, Germany, September 2-6, 2013. 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