Search Results for Risk Assessment -- methods - Narrowed by: 2017 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dRisk$002bAssessment$002b--$002bmethods$0026qf$003dPUBDATE$002509Publication$002bDate$0025092017$0025092017$0026ic$003dtrue$0026ps$003d300? 2026-01-26T11:18:01Z Introduction to environmental toxicology : molecular substructures to ecological landscapes ent://SD_ILS/0/SD_ILS:542437 2026-01-26T11:18:01Z 2026-01-26T11:18:01Z Author&#160;Landis, Wayne G., author&#160;Sofield, Ruth M., author.&#160;Yu, Ming-Ho, 1928- author.<br/>Preferred Shelf Number&#160;QH545 .A1 L35 2017<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781315117867">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> The Essential Handbook of Ground-Water Sampling. ent://SD_ILS/0/SD_ILS:547707 2026-01-26T11:18:01Z 2026-01-26T11:18:01Z Author&#160;Nielsen, David M., author.<br/>Preferred Shelf Number&#160;GB1001.72 .S3<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781420042795">https://www.taylorfrancis.com/books/e/9781420042795</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9780429143861">https://www.taylorfrancis.com/books/e/9780429143861</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429143861">https://www.taylorfrancis.com/books/9780429143861</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Comprehensive quality by design for pharmaceutical product development and manufacture ent://SD_ILS/0/SD_ILS:593698 2026-01-26T11:18:01Z 2026-01-26T11:18:01Z Author&#160;Reklaitis, G. V., 1942- editor.&#160;Garc&iacute;a-Munoz, Salvador, 1971- editor.&#160;Seymour, Christine, 1967- editor.<br/>Preferred Shelf Number&#160;RS420<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119356189">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119356189</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Metrology and standardization of nanotechnology : protocols and industrial innovations ent://SD_ILS/0/SD_ILS:593319 2026-01-26T11:18:01Z 2026-01-26T11:18:01Z Author&#160;Mansfield, Elisabeth, (Research chemist), editor.&#160;Kaiser, Debra L., editor.&#160;Fujita, Daisuke (Materials scientist), editor.&#160;Voorde, M. H. van de (Marcel H.), editor.<br/>Preferred Shelf Number&#160;T174.7<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>