Search Results for Risk assessment -- Mathematics. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dRisk$002bassessment$002b--$002bMathematics.$0026ic$003dtrue$0026ps$003d300?dt=list 2026-06-02T22:14:04Z Artificial Intelligence in Education. Posters and Late Breaking Results, Workshops and Tutorials, Industry and Innovation Tracks, Practitioners, Doctoral Consortium and Blue Sky 24th International Conference, AIED 2023, Tokyo, Japan, July 3-7, 2023, Proceedings ent://SD_ILS/0/SD_ILS:520682 2026-06-02T22:14:04Z 2026-06-02T22:14:04Z Author&#160;Wang, Ning. editor.&#160;Rebolledo-Mendez, Genaro. editor.&#160;Dimitrova, Vania. editor.&#160;Matsuda, Noboru. editor.&#160;Santos, Olga C. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-36336-8">https://doi.org/10.1007/978-3-031-36336-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Oil and gas processing equipment : risk assessment with Bayesian networks ent://SD_ILS/0/SD_ILS:581614 2026-06-02T22:14:04Z 2026-06-02T22:14:04Z Author&#160;U&#7751;&#7751;ikr&#805;&#7779;&#7751;an, Ji., 1944- author.<br/>Preferred Shelf Number&#160;TP752<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429287800">https://www.taylorfrancis.com/books/9780429287800</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Counterparty Risk and Funding : A Tale of Two Puzzles ent://SD_ILS/0/SD_ILS:547512 2026-06-02T22:14:04Z 2026-06-02T22:14:04Z Author&#160;Cr&eacute;pey, St&eacute;phane, author.&#160;Bielecki, Tomasz R., author.&#160;Brigo, Damiano, author.&#160;Taylor and Francis.<br/>Preferred Shelf Number&#160;HG106<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781315373621">Click here to view.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Risk and uncertainty reduction by using algebraic inequalities ent://SD_ILS/0/SD_ILS:577835 2026-06-02T22:14:04Z 2026-06-02T22:14:04Z Author&#160;Todinov, M. T., author.<br/>Preferred Shelf Number&#160;TA169.55 .R57<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003032502">https://www.taylorfrancis.com/books/9781003032502</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dynamic vulnerability assessment and intelligent control for sustainable power systems ent://SD_ILS/0/SD_ILS:594059 2026-06-02T22:14:04Z 2026-06-02T22:14:04Z Author&#160;Rueda Torres, Jos&eacute; L., 1980- author.&#160;Gonzalez-Longatt, Francisco, 1972- author.<br/>Preferred Shelf Number&#160;TK3081<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214984">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214984</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of safety principles ent://SD_ILS/0/SD_ILS:594034 2026-06-02T22:14:04Z 2026-06-02T22:14:04Z Author&#160;M&ouml;ller, Niklas, editor.&#160;Hansson, Sven Ove, 1951- editor.&#160;Holmberg, Jan-Erik, editor.<br/>Preferred Shelf Number&#160;HD7261 .H36 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119443070">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119443070</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Wiley handbook of diversity in special education ent://SD_ILS/0/SD_ILS:593268 2026-06-02T22:14:04Z 2026-06-02T22:14:04Z Author&#160;Tejero Hughes, Marie, 1965- editor.&#160;Talbott, Elizabeth, 1960- editor.<br/>Preferred Shelf Number&#160;LC4019 .H355 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118768778">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118768778</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Static electricity : understanding, controlling, applying ent://SD_ILS/0/SD_ILS:593939 2026-06-02T22:14:04Z 2026-06-02T22:14:04Z Author&#160;L&uuml;ttgens, G&uuml;nter, author.&#160;L&uuml;ttgens, Sylvia, author.&#160;Schubert, Wolfgang, author.<br/>Preferred Shelf Number&#160;QC571<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527803330">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527803330</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Engineering risk assessment with subset simulation ent://SD_ILS/0/SD_ILS:341527 2026-06-02T22:14:04Z 2026-06-02T22:14:04Z Author&#160;Au, Siu-Kui.&#160;Wang, Yu, 1977-<br/>Preferred Shelf Number&#160;ONLINE(341527.1)<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658802">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658802</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118398050">http://dx.doi.org/10.1002/9781118398050</a> MyiLibrary <a href="http://www.myilibrary.com?id=586315">http://www.myilibrary.com?id=586315</a> <a href="http://lib.myilibrary.com/detail.asp?id=586315">http://lib.myilibrary.com/detail.asp?id=586315</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Information security management handbook ent://SD_ILS/0/SD_ILS:538782 2026-06-02T22:14:04Z 2026-06-02T22:14:04Z Author&#160;Tipton, Harold F.&#160;Nozaki, Micki Krause.<br/>Preferred Shelf Number&#160;QA76.9 .A25 I54165<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439853467">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Medical device reliability and associated areas ent://SD_ILS/0/SD_ILS:540912 2026-06-02T22:14:04Z 2026-06-02T22:14:04Z Author&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;R855.3 .D47 2000<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Design reliability : fundamentals and applications ent://SD_ILS/0/SD_ILS:540572 2026-06-02T22:14:04Z 2026-06-02T22:14:04Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;TA174 .D4929 1999<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>