Search Results for Robust statistics.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dRobust$002bstatistics.$0026te$003dILS$0026ps$003d300?2024-11-12T03:02:50ZRobust statisticsent://SD_ILS/0/SD_ILS:2976872024-11-12T03:02:50Z2024-11-12T03:02:50ZAuthor Huber, Peter J. Ronchetti, Elvezio.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470434697">http://dx.doi.org/10.1002/9780470434697</a>
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<a href="http://site.ebrary.com/lib/alltitles/docDetail.action?docID=10307899">http://site.ebrary.com/lib/alltitles/docDetail.action?docID=10307899</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Methodology in robust and nonparametric statisticsent://SD_ILS/0/SD_ILS:2916442024-11-12T03:02:50Z2024-11-12T03:02:50ZAuthor Jure?kov,̀ Jana, 1940- Sen, Pranab Kumar, 1937- Picek, Jan, 1965-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439840696">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Robust statistics theory and methodsent://SD_ILS/0/SD_ILS:2966442024-11-12T03:02:50Z2024-11-12T03:02:50ZAuthor Maronna, Ricardo A. Martin, R. Douglas. Yohai, Víctor J. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470010940">http://dx.doi.org/10.1002/0470010940</a>
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Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley046/2004266770.html">http://catdir.loc.gov/catdir/bios/wiley046/2004266770.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Robust statistics the approach based on influence functionsent://SD_ILS/0/SD_ILS:3003622024-11-12T03:02:50Z2024-11-12T03:02:50ZAuthor Hampel, Frank R., 1941- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118186435">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Measures of Complexity Festschrift for Alexey Chervonenkisent://SD_ILS/0/SD_ILS:5183542024-11-12T03:02:50Z2024-11-12T03:02:50ZAuthor Vovk, Vladimir. editor. Papadopoulos, Harris. editor. Gammerman, Alexander. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(518354.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-21852-6">https://doi.org/10.1007/978-3-319-21852-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Patch-Based Techniques in Medical Imaging First International Workshop, Patch-MI 2015, Held in Conjunction with MICCAI 2015, Munich, Germany, October 9, 2015, Revised Selected Papersent://SD_ILS/0/SD_ILS:5188872024-11-12T03:02:50Z2024-11-12T03:02:50ZAuthor Wu, Guorong. editor. Coupé, Pierrick. editor. Zhan, Yiqiang. editor. Munsell, Brent. editor. Rueckert, Daniel. editor.<br/>Preferred Shelf Number XX(518887.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-28194-0">https://doi.org/10.1007/978-3-319-28194-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probabilistic design for optimization and robustness for engineersent://SD_ILS/0/SD_ILS:3417962024-11-12T03:02:50Z2024-11-12T03:02:50ZAuthor Dodson, Bryan, 1962- author. Hammett, Patrick C., author. Klerx, Rene, author.<br/>Preferred Shelf Number ONLINE(341796.1)<br/>Electronic Access <a href="http://proquest.safaribooksonline.com/?fpi=9781118796306">Available by subscription from Safari Books Online</a>
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