Search Results for SCIENCE -- Reference. - Narrowed by: Metrology. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSCIENCE$002b--$002bReference.$0026qf$003dSUBJECT$002509Subject$002509Metrology.$002509Metrology.$0026ps$003d300? 2026-01-22T23:59:04Z Handbook of Metrology and Applications ent://SD_ILS/0/SD_ILS:528422 2026-01-22T23:59:04Z 2026-01-22T23:59:04Z Author&#160;Aswal, Dinesh K. editor.&#160;Yadav, Sanjay. editor.&#160;Takatsuji, Toshiyuki. editor.&#160;Rachakonda, Prem. editor.&#160;Kumar, Harish. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-99-2074-7">https://doi.org/10.1007/978-981-99-2074-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Metrology and standardization of nanotechnology : protocols and industrial innovations ent://SD_ILS/0/SD_ILS:593319 2026-01-22T23:59:04Z 2026-01-22T23:59:04Z Author&#160;Mansfield, Elisabeth, (Research chemist), editor.&#160;Kaiser, Debra L., editor.&#160;Fujita, Daisuke (Materials scientist), editor.&#160;Voorde, M. H. van de (Marcel H.), editor.<br/>Preferred Shelf Number&#160;T174.7<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>