Search Results for SCIENCE -- Reference. - Narrowed by: Metrology.
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2026-01-23T03:36:31Z
Handbook of Metrology and Applications
ent://SD_ILS/0/SD_ILS:528422
2026-01-23T03:36:31Z
2026-01-23T03:36:31Z
Author Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-2074-7">https://doi.org/10.1007/978-981-99-2074-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Metrology and standardization of nanotechnology : protocols and industrial innovations
ent://SD_ILS/0/SD_ILS:593319
2026-01-23T03:36:31Z
2026-01-23T03:36:31Z
Author Mansfield, Elisabeth, (Research chemist), editor. Kaiser, Debra L., editor. Fujita, Daisuke (Materials scientist), editor. Voorde, M. H. van de (Marcel H.), editor.<br/>Preferred Shelf Number T174.7<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>