Search Results for Scanning probe microscopy. - Narrowed by: Nanoelectronics.
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2024-12-28T21:51:18Z
Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale
ent://SD_ILS/0/SD_ILS:110620
2024-12-28T21:51:18Z
2024-12-28T21:51:18Z
Author Kalinin, Sergei. Gruverman, Alexei.<br/>Preferred Shelf Number QH212. S33 2007 V.2<br/>Format: Books<br/>Availability Beytepe Library~2<br/>
Single-atom nanoelectronics
ent://SD_ILS/0/SD_ILS:289082
2024-12-28T21:51:18Z
2024-12-28T21:51:18Z
Author Prati, Enrico. Shinada, Takahiro.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9789814316699">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>