Search Results for Scanning probe microscopy. - Narrowed by: Nanoelectronics. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dScanning$002bprobe$002bmicroscopy.$0026qf$003dSUBJECT$002509Subject$002509Nanoelectronics.$002509Nanoelectronics.$0026te$003dILS$0026ps$003d300?dt=list 2024-12-24T02:19:01Z Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale ent://SD_ILS/0/SD_ILS:110620 2024-12-24T02:19:01Z 2024-12-24T02:19:01Z Author&#160;Kalinin, Sergei.&#160;Gruverman, Alexei.<br/>Preferred Shelf Number&#160;QH212. S33 2007 V.2<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~2<br/> Single-atom nanoelectronics ent://SD_ILS/0/SD_ILS:289082 2024-12-24T02:19:01Z 2024-12-24T02:19:01Z Author&#160;Prati, Enrico.&#160;Shinada, Takahiro.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9789814316699">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>