Search Results for Scanning probe microscopy.
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Acoustic Scanning Probe Microscopy
ent://SD_ILS/0/SD_ILS:333153
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Author Marinello, Francesco. editor. Passeri, Daniele. editor. Savio, Enrico. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333153.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-27494-7">http://dx.doi.org/10.1007/978-3-642-27494-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning probe microscopy for energy research
ent://SD_ILS/0/SD_ILS:281095
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Author Bonnell, Dawn A. Kalinin, Sergei V.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564537">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564537</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Exploring scanning probe microscopy with mathematica
ent://SD_ILS/0/SD_ILS:303456
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Author Sarid, Dror. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Volltext <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/114123590">http://www3.interscience.wiley.com/cgi-bin/bookhome/114123590</a>
Volltext <a href="http://onlinelibrary.wiley.com/book/10.1002/9783527610068">http://onlinelibrary.wiley.com/book/10.1002/9783527610068</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527610068">http://dx.doi.org/10.1002/9783527610068</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Roadmap of Scanning Probe Microscopy
ent://SD_ILS/0/SD_ILS:184007
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Author Morita, Seizo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-34315-8">http://dx.doi.org/10.1007/978-3-540-34315-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy in Nanoscience and Nanotechnology
ent://SD_ILS/0/SD_ILS:190654
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Author Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-03535-7">http://dx.doi.org/10.1007/978-3-642-03535-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.
ent://SD_ILS/0/SD_ILS:459965
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Author Klapetek, Petr.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128133477">https://www.sciencedirect.com/science/book/9780128133477</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
ent://SD_ILS/0/SD_ILS:333137
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Author Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333137.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-25414-7">http://dx.doi.org/10.1007/978-3-642-25414-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning probe microscopy of soft matter fundamentals and practices
ent://SD_ILS/0/SD_ILS:306145
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Author T͡Sukruk, V. V. (Vladimir Vasilʹevich) Singamaneni, Srikanth. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527639953">An electronic book accessible through the World Wide Web; click for information</a>
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Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy
ent://SD_ILS/0/SD_ILS:172791
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Author Kalinin, Sergei V. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-7167-8">http://dx.doi.org/10.1007/978-1-4419-7167-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ent://SD_ILS/0/SD_ILS:191386
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Author Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-10497-8">http://dx.doi.org/10.1007/978-3-642-10497-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:188564
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Author Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:187050
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Author Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:184523
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Author Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
ent://SD_ILS/0/SD_ILS:165534
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Author Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale
ent://SD_ILS/0/SD_ILS:110620
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Author Kalinin, Sergei. Gruverman, Alexei.<br/>Preferred Shelf Number QH212. S33 2007 V.2<br/>Format: Books<br/>Availability Beytepe Library~2<br/>
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
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Author Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:181412
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Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
ent://SD_ILS/0/SD_ILS:168790
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Author Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning probe microscopy : the lab on a tip
ent://SD_ILS/0/SD_ILS:93921
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Author Meyer, Ernst, 1962- Hug, Hans J. (Hans Josef), 1964- ort.yaz. Bennewitz, Roland, 1967- ort.yaz.<br/>Preferred Shelf Number QH 212.S33 M49 2004<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Hybridizing surface probe microscopies towards a full description of the meso- and nanoworlds
ent://SD_ILS/0/SD_ILS:286263
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Author Moreno-Flores, Susan. Toca-Herrera, Jos ̌L. (Jos ̌Luis), 1967-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439871010">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Single-atom nanoelectronics
ent://SD_ILS/0/SD_ILS:289082
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Author Prati, Enrico. Shinada, Takahiro.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9789814316699">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Instrumental community probe microscopy and the path to nanotechnology
ent://SD_ILS/0/SD_ILS:247553
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Author Mody, Cyrus C. M. (Cyrus Cawas Maneck), 1974- Project Muse.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://muse.jhu.edu/books/9780262298186/">Full text available: </a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Physical chemistry chemical kinetics and reaction mechanisms
ent://SD_ILS/0/SD_ILS:288137
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Author Trimm, Harold H. (Harold Henry), 1955-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781466559813">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of surface and interface analysis methods for problem-solving
ent://SD_ILS/0/SD_ILS:284733
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Author Rivir̈e, J. C. Myhra, S. (Sverre), 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420007800">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Force microscopy applications in biology and medicine
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Author Jena, Bhanu P. Hörber, J. K. Heinrich. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www3.interscience.wiley.com/cgi-bin/browsebyproduct?type=2">http://www3.interscience.wiley.com/cgi-bin/browsebyproduct?type=2</a>
John Wiley <a href="http://dx.doi.org/10.1002/0470007702">http://dx.doi.org/10.1002/0470007702</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112139511">http://www3.interscience.wiley.com/cgi-bin/bookhome/112139511</a>
Volltext <a href="http://onlinelibrary.wiley.com/book/10.1002/0470007702">http://onlinelibrary.wiley.com/book/10.1002/0470007702</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning probe microscopies beyond imaging manipulation of molecules and nanostructures
ent://SD_ILS/0/SD_ILS:303414
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Author Samorì, Paolo. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/3527608516">http://dx.doi.org/10.1002/3527608516</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112683146">http://www3.interscience.wiley.com/cgi-bin/bookhome/112683146</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Carbon nanotubes properties and applications
ent://SD_ILS/0/SD_ILS:284655
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Author O'Connell, Michael (Michael J.)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420004212">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning probe microscopes applications in science and technology
ent://SD_ILS/0/SD_ILS:290115
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Author Birdi, K. S., 1934-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203011072">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electrochemical nanotechnology in-situ local probe techniques at electrochemical interfaces
ent://SD_ILS/0/SD_ILS:300642
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Author Lorenz, W. J. Plieth, W. (Waldfried) International Union of Pure and Applied Chemistry. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481756">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481756</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527612154">http://dx.doi.org/10.1002/9783527612154</a>
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